X-ray imaging is a powerful technique to scan samples in a variety of contexts including biological, environmental and materials science, but commonly requires a synchrotron light source to produce X-rays at sufficient intensity. As these facilities are expensive to operate, the available beam time is limited and always in high demand. Particularly if the illuminated samples are sparse, standard raster scanning methods can be time-consuming, with a majority of that time being spent on areas of the image that carry little information. To increase the efficiency and maximize the information gain for a given time budget, we split the scanning process into a series of steps where previous measurements are used to inform the decision making and adapt the exposure distribution at later stages of the sequence. We formulate this task as a reinforcement learning problem where the goal is to produce a sequence of exposure maps that maximize a predefined scalar metric. We demonstrate the potential of this approach in simulations where the adaptive illumination can accelerate the measurement process by up to an order of magnitude compared with standard raster scanning. Finally, we present the first results from deploying the trained agents on an X-ray fluorescence beamline at the Stanford Synchrotron Radiation Lightsource.
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