Pub Date : 2015-01-01Epub Date: 2015-06-24DOI: 10.1080/15599612.2015.1059535
Yuanzheng Gong, Richard S Johnston, C David Melville, Eric J Seibel
As the rapid progress in the development of optoelectronic components and computational power, 3D optical metrology becomes more and more popular in manufacturing and quality control due to its flexibility and high speed. However, most of the optical metrology methods are limited to external surfaces. This paper proposed a new approach to measure tiny internal 3D surfaces with a scanning fiber endoscope and axial-stereo vision algorithm. A dense, accurate point cloud of internally machined threads was generated to compare with its corresponding X-ray 3D data as ground truth, and the quantification was analyzed by Iterative Closest Points algorithm.
随着光电元件和计算能力的飞速发展，三维光学计量因其灵活性和高速性在制造和质量控制领域越来越受欢迎。然而，大多数光学计量方法仅限于外部表面。本文提出了一种利用扫描光纤内窥镜和轴向立体视觉算法测量微小内部三维表面的新方法。本文生成了内部加工螺纹的高密度精确点云，并将其与相应的 X 射线三维数据作为地面实况进行比较，同时采用迭代最邻近点算法对量化结果进行了分析。
{"title":"Axial-Stereo 3-D Optical Metrology for Inner Profile of Pipes Using a Scanning Laser Endoscope.","authors":"Yuanzheng Gong, Richard S Johnston, C David Melville, Eric J Seibel","doi":"10.1080/15599612.2015.1059535","DOIUrl":"10.1080/15599612.2015.1059535","url":null,"abstract":"<p><p>As the rapid progress in the development of optoelectronic components and computational power, 3D optical metrology becomes more and more popular in manufacturing and quality control due to its flexibility and high speed. However, most of the optical metrology methods are limited to external surfaces. This paper proposed a new approach to measure tiny internal 3D surfaces with a scanning fiber endoscope and axial-stereo vision algorithm. A dense, accurate point cloud of internally machined threads was generated to compare with its corresponding X-ray 3D data as ground truth, and the quantification was analyzed by Iterative Closest Points algorithm.</p>","PeriodicalId":50296,"journal":{"name":"International Journal of Optomechatronics","volume":"9 1","pages":"238-247"},"PeriodicalIF":5.5,"publicationDate":"2015-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://www.ncbi.nlm.nih.gov/pmc/articles/PMC4670032/pdf/","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"60483399","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2014-11-18DOI: 10.1080/15599612.2015.1034905
Jialei Tang, Jintian Lin, Jiangxin Song, Z. Fang, Min Wang, Y. Liao, L. Qiao, Ya Cheng
We report on fabrication of a microtoroid resonator of a high-quality (high-Q) factor integrated with an on-chip microheater. Both the microresonator and microheater are fabricated using femtosecond laser three-dimensional (3-D) micromachining. The microheater, which is located about 200 µm away from the microresonator, has a footprint size of 200 µm × 400 µm. Tuning of the resonant wavelength in the microresonator has been achieved by varying the voltage applied on the microheater. The response time of the integrated chip is less than 10 seconds.
我们报道了一种高质量(高q)因子与片上微加热器集成的微环形谐振器的制造。微谐振器和微加热器均采用飞秒激光三维微加工技术制造。微加热器位于距离微谐振器约200 μ m的地方，占地面积为200 μ m × 400 μ m。通过改变施加在微加热器上的电压，实现了微谐振器中谐振波长的调谐。集成芯片的响应时间小于10秒。
{"title":"On-Chip Tuning of the Resonant Wavelength in a High-Q Microresonator Integrated with a Microheater","authors":"Jialei Tang, Jintian Lin, Jiangxin Song, Z. Fang, Min Wang, Y. Liao, L. Qiao, Ya Cheng","doi":"10.1080/15599612.2015.1034905","DOIUrl":"https://doi.org/10.1080/15599612.2015.1034905","url":null,"abstract":"We report on fabrication of a microtoroid resonator of a high-quality (high-Q) factor integrated with an on-chip microheater. Both the microresonator and microheater are fabricated using femtosecond laser three-dimensional (3-D) micromachining. The microheater, which is located about 200 µm away from the microresonator, has a footprint size of 200 µm × 400 µm. Tuning of the resonant wavelength in the microresonator has been achieved by varying the voltage applied on the microheater. The response time of the integrated chip is less than 10 seconds.","PeriodicalId":50296,"journal":{"name":"International Journal of Optomechatronics","volume":"9 1","pages":"187 - 194"},"PeriodicalIF":5.5,"publicationDate":"2014-11-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1080/15599612.2015.1034905","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"60483536","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2014-10-02DOI: 10.1080/15599612.2014.970842
W. Osten
Twenty-six years ago it was a joint idea with Hans Rottenkolber, a pioneer of holographic metrology, to organize a workshop dedicated to the discussion of the latest results in automatic processing of fringe patterns. This idea was promoted by the insight that automatic and high precision phase measurement techniques will play a key role in all future industrial and scientific applications of optical imaging and metrology. In the stimulating atmosphere of the first workshop conducted in 1989, the proposal came up to organize that event in an Olympic schedule. Meanwhile 7 workshops have been successfully organized and their main topics were always adapted to the most interesting subjects of the current cycle. For the Fringe 2013 the scope was markedly extended by accentuating the bridge between imaging and metrology. On the one hand, both disciplines are self-standing topics with a long tradition. On the other hand, the current trends in both disciplines show increasing dynamics and fusion stimulated by many fascinating innovations such as high resolution microscopy, computational imaging, 3D imaging, sensor fusion and nano-metrology. Consequently, modern topics like computational imaging, compressed sensing, high-resolution digital wavefront engineering and sensor fusion were included in the program and presented by internationally leading experts. The complete content of all contributions can be found in the proceedings. This special issue offers a selection of 13 papers addressing different topics of the latest Fringe workshop and fitting to the scope of the International Journal of Optomechatronics. All papers highlight their special topic in a more extended way as already presented in the above mentioned proceedings. The given selection conveys a comprehensive overview of the wide bandwidth of topics which was addressed at the workshop and reports about the latest achievements in optical imaging and metrology such as:
{"title":"Editorial: Special Issue on Advances in Optical Imaging and Metrology-Selected Papers From the Conference Fringe 2013","authors":"W. Osten","doi":"10.1080/15599612.2014.970842","DOIUrl":"https://doi.org/10.1080/15599612.2014.970842","url":null,"abstract":"Twenty-six years ago it was a joint idea with Hans Rottenkolber, a pioneer of holographic metrology, to organize a workshop dedicated to the discussion of the latest results in automatic processing of fringe patterns. This idea was promoted by the insight that automatic and high precision phase measurement techniques will play a key role in all future industrial and scientific applications of optical imaging and metrology. In the stimulating atmosphere of the first workshop conducted in 1989, the proposal came up to organize that event in an Olympic schedule. Meanwhile 7 workshops have been successfully organized and their main topics were always adapted to the most interesting subjects of the current cycle. For the Fringe 2013 the scope was markedly extended by accentuating the bridge between imaging and metrology. On the one hand, both disciplines are self-standing topics with a long tradition. On the other hand, the current trends in both disciplines show increasing dynamics and fusion stimulated by many fascinating innovations such as high resolution microscopy, computational imaging, 3D imaging, sensor fusion and nano-metrology. Consequently, modern topics like computational imaging, compressed sensing, high-resolution digital wavefront engineering and sensor fusion were included in the program and presented by internationally leading experts. The complete content of all contributions can be found in the proceedings. This special issue offers a selection of 13 papers addressing different topics of the latest Fringe workshop and fitting to the scope of the International Journal of Optomechatronics. All papers highlight their special topic in a more extended way as already presented in the above mentioned proceedings. The given selection conveys a comprehensive overview of the wide bandwidth of topics which was addressed at the workshop and reports about the latest achievements in optical imaging and metrology such as:","PeriodicalId":50296,"journal":{"name":"International Journal of Optomechatronics","volume":"8 1","pages":"229 - 230"},"PeriodicalIF":5.5,"publicationDate":"2014-10-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1080/15599612.2014.970842","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"60482385","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2014-10-02DOI: 10.1080/15599612.2014.972600
R. Pryputniewicz
Advances in emerging technology of microelectromechanical systems (MEMS) are one of the most challenging tasks in today's experimental mechanics. More specifically, development of these miniature devices requires sophisticated design, analysis, fabrication, testing, and characterization tools that have multiphysics and multiscale capabilities, especially as MEMS are being developed for use at harsh conditions. In harsh-environment and high-performance (e.g., military) guidance applications inertial sensors must be sensitive to low rates of rotation yet survive the high blast loads associated with the initial launch. In this multi-year study, a set of tuning fork gyroscopes were subjected to a series of increasing g-loads (culminating at approximately 60,000 g's) with measurements of shape made after each test. A custom set of test sample packages (aka articles) were hermetically sealed with glass lids to allow optical inspection of components while preserving the operating environment (i.e., vacuum). Initial test measurements were made upon fabrication of the articles. Optical and interferometric measurements have been made prior to and after each shock g-loading. The shape of the tuning fork gyroscope (TFG) test articles was measured using a phase shifting Michelson interferometer with compensation for package cover glass. Full field shape was determined and traces of pertinent structures were extracted for comparison. Failure of the die was observed in the form of fractures below the chip surface as well as fractures in the glass lid sealing the package. Potential causes of the failure are discussed as well as a recommendation for modified packaging techniques to mitigate future component failures.
{"title":"Survivability of MEMS Packages at High-G Loads","authors":"R. Pryputniewicz","doi":"10.1080/15599612.2014.972600","DOIUrl":"https://doi.org/10.1080/15599612.2014.972600","url":null,"abstract":"Advances in emerging technology of microelectromechanical systems (MEMS) are one of the most challenging tasks in today's experimental mechanics. More specifically, development of these miniature devices requires sophisticated design, analysis, fabrication, testing, and characterization tools that have multiphysics and multiscale capabilities, especially as MEMS are being developed for use at harsh conditions. In harsh-environment and high-performance (e.g., military) guidance applications inertial sensors must be sensitive to low rates of rotation yet survive the high blast loads associated with the initial launch. In this multi-year study, a set of tuning fork gyroscopes were subjected to a series of increasing g-loads (culminating at approximately 60,000 g's) with measurements of shape made after each test. A custom set of test sample packages (aka articles) were hermetically sealed with glass lids to allow optical inspection of components while preserving the operating environment (i.e., vacuum). Initial test measurements were made upon fabrication of the articles. Optical and interferometric measurements have been made prior to and after each shock g-loading. The shape of the tuning fork gyroscope (TFG) test articles was measured using a phase shifting Michelson interferometer with compensation for package cover glass. Full field shape was determined and traces of pertinent structures were extracted for comparison. Failure of the die was observed in the form of fractures below the chip surface as well as fractures in the glass lid sealing the package. Potential causes of the failure are discussed as well as a recommendation for modified packaging techniques to mitigate future component failures.","PeriodicalId":50296,"journal":{"name":"International Journal of Optomechatronics","volume":"18 1","pages":"391 - 399"},"PeriodicalIF":5.5,"publicationDate":"2014-10-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1080/15599612.2014.972600","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"60483018","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2014-10-02DOI: 10.1080/15599612.2014.942934
M. Kujawińska, W. Krauze, A. Kuś, J. Kostencka, T. Kozacki, B. Kemper, M. Dudek
Optical Diffraction Tomography is a technique for retrieving a 3-dimensional refractive index distribution from phase objects without destroying the structure of the samples. In the article we discuss the selection and implementation of full and limited angle version of tomographic reconstruction processes together with the analysis of different methods for gathering projections. We present two efficient implementations of full and limited angle tomographic systems including total processing paths and providing the examplary results of 3-D refractive index determination measurements of biological samples.
{"title":"Problems and Solutions in 3-D Analysis of Phase Biological Objects by Optical Diffraction Tomography","authors":"M. Kujawińska, W. Krauze, A. Kuś, J. Kostencka, T. Kozacki, B. Kemper, M. Dudek","doi":"10.1080/15599612.2014.942934","DOIUrl":"https://doi.org/10.1080/15599612.2014.942934","url":null,"abstract":"Optical Diffraction Tomography is a technique for retrieving a 3-dimensional refractive index distribution from phase objects without destroying the structure of the samples. In the article we discuss the selection and implementation of full and limited angle version of tomographic reconstruction processes together with the analysis of different methods for gathering projections. We present two efficient implementations of full and limited angle tomographic systems including total processing paths and providing the examplary results of 3-D refractive index determination measurements of biological samples.","PeriodicalId":50296,"journal":{"name":"International Journal of Optomechatronics","volume":"8 1","pages":"357 - 372"},"PeriodicalIF":5.5,"publicationDate":"2014-10-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1080/15599612.2014.942934","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"60482718","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2014-10-02DOI: 10.1080/15599612.2014.942924
P. Lehmann, J. Niehues, S. Tereschenko
For applications in micro- and nanotechnologies the lateral resolution of optical 3-D microscopes becomes an issue of increasing relevance. However, lateral resolution of 3-D microscopes is hard to define in a satisfying way. Therefore, we first study the measurement capabilities of a highly resolving white-light interference (WLI) microscope close to the limit of lateral resolution. Results of measurements and simulations demonstrate that better lateral resolution seems to be achievable based on the envelope evaluation of a WLI signal. Unfortunately, close to the lateral resolution limit errors in the measured amplitude of micro-structures appear. On the other hand, results of interferometric phase evaluation seem to be strongly low-pass filtered in this case. Furthermore, the instrument transfer characteristics and the lateral resolution capabilities of WLI instruments are also affected by polarization. TM polarized light is less sensitive to edge diffraction and thus systematic errors can be avoided. However, apart from ghost steps due to fringe order errors, the results of phase evaluation seem to be closer to the real surface topography if TE polarized light is used. The lateral resolution can be further improved by combining WLI and structured illumination microscopy. Since the measured height of rectangular profiles close to the lateral resolution limit is generally too small compared to the real height, we introduce a method based on phase evaluation which characterizes the heights of barely laterally resolved rectangular gratings correctly.
{"title":"3-D Optical Interference Microscopy at the Lateral Resolution","authors":"P. Lehmann, J. Niehues, S. Tereschenko","doi":"10.1080/15599612.2014.942924","DOIUrl":"https://doi.org/10.1080/15599612.2014.942924","url":null,"abstract":"For applications in micro- and nanotechnologies the lateral resolution of optical 3-D microscopes becomes an issue of increasing relevance. However, lateral resolution of 3-D microscopes is hard to define in a satisfying way. Therefore, we first study the measurement capabilities of a highly resolving white-light interference (WLI) microscope close to the limit of lateral resolution. Results of measurements and simulations demonstrate that better lateral resolution seems to be achievable based on the envelope evaluation of a WLI signal. Unfortunately, close to the lateral resolution limit errors in the measured amplitude of micro-structures appear. On the other hand, results of interferometric phase evaluation seem to be strongly low-pass filtered in this case. Furthermore, the instrument transfer characteristics and the lateral resolution capabilities of WLI instruments are also affected by polarization. TM polarized light is less sensitive to edge diffraction and thus systematic errors can be avoided. However, apart from ghost steps due to fringe order errors, the results of phase evaluation seem to be closer to the real surface topography if TE polarized light is used. The lateral resolution can be further improved by combining WLI and structured illumination microscopy. Since the measured height of rectangular profiles close to the lateral resolution limit is generally too small compared to the real height, we introduce a method based on phase evaluation which characterizes the heights of barely laterally resolved rectangular gratings correctly.","PeriodicalId":50296,"journal":{"name":"International Journal of Optomechatronics","volume":"8 1","pages":"231 - 241"},"PeriodicalIF":5.5,"publicationDate":"2014-10-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1080/15599612.2014.942924","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"60481801","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2014-09-25DOI: 10.1080/15599612.2014.942933
A. Albertazzi, A. Fantin, D. Willemann, M. Benedet
This article presents an alternative approach for retrieving phase information from a sequence of images with unknown phase shifts. A sequence of five or more discrete interferograms with unknown and different phase shifts are used to determine the parameters of N-dimensional Lissajous figures. A set of N-dimensional discrete points are used to calculate the relative phase shifts. Once zthe phase shifts are determined, the phase values for each image pixel are determined from a generalized phase calculation equation for irregular phase shifts. The article presents the physical and mathematical basis of the developed approach and discusses some results obtained from simulated data and real data from controlled experiments.
{"title":"Phase Maps Retrieval from Sequences of Phase Shifted Images with Unknown Phase Steps Using Generalized N-Dimensional Lissajous Figures—Principles and Applications","authors":"A. Albertazzi, A. Fantin, D. Willemann, M. Benedet","doi":"10.1080/15599612.2014.942933","DOIUrl":"https://doi.org/10.1080/15599612.2014.942933","url":null,"abstract":"This article presents an alternative approach for retrieving phase information from a sequence of images with unknown phase shifts. A sequence of five or more discrete interferograms with unknown and different phase shifts are used to determine the parameters of N-dimensional Lissajous figures. A set of N-dimensional discrete points are used to calculate the relative phase shifts. Once zthe phase shifts are determined, the phase values for each image pixel are determined from a generalized phase calculation equation for irregular phase shifts. The article presents the physical and mathematical basis of the developed approach and discusses some results obtained from simulated data and real data from controlled experiments.","PeriodicalId":50296,"journal":{"name":"International Journal of Optomechatronics","volume":"8 1","pages":"340 - 356"},"PeriodicalIF":5.5,"publicationDate":"2014-09-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1080/15599612.2014.942933","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"60482663","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2014-08-18DOI: 10.1080/15599612.2014.942931
B. Kleiner, C. Munkelt, T. Thórhallsson, G. Notni, P. Kühmstedt, U. Schneider
In this article an approach to a mobile 3-D handheld scanner with additional sensory information is proposed. It fully automatically builds a multi-view 3-D scan. Conventionally complex post processing or expensive position trackers are used to realize such a process. Therefore a combination of a visual and inertial motion tracking system is developed to deal with the position tracking. Both sensors are integrated into the 3-D scanner and their data are fused for robustness during swift scanner movements and for long term stability. This article presents an overview over the system architecture, the navigation process, surface registration aspects, and measurement results.
{"title":"Handheld 3-D Scanning with Automatic Multi-View Registration Based on Visual-Inertial Navigation","authors":"B. Kleiner, C. Munkelt, T. Thórhallsson, G. Notni, P. Kühmstedt, U. Schneider","doi":"10.1080/15599612.2014.942931","DOIUrl":"https://doi.org/10.1080/15599612.2014.942931","url":null,"abstract":"In this article an approach to a mobile 3-D handheld scanner with additional sensory information is proposed. It fully automatically builds a multi-view 3-D scan. Conventionally complex post processing or expensive position trackers are used to realize such a process. Therefore a combination of a visual and inertial motion tracking system is developed to deal with the position tracking. Both sensors are integrated into the 3-D scanner and their data are fused for robustness during swift scanner movements and for long term stability. This article presents an overview over the system architecture, the navigation process, surface registration aspects, and measurement results.","PeriodicalId":50296,"journal":{"name":"International Journal of Optomechatronics","volume":"39 1","pages":"313 - 325"},"PeriodicalIF":5.5,"publicationDate":"2014-08-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1080/15599612.2014.942931","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"60482568","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2014-08-08DOI: 10.1080/15599612.2014.942932
D. Khodadad, P. Bergström, E. Haellstig, M. Sjödahl
We present a calibration method which allows single shot dual wavelength online shape measurement in a disturbed environment. Effects of uncontrolled carrier frequency filtering are discussed as well. We demonstrate that phase maps and speckle displacements can be recovered free of chromatic aberrations. To our knowledge, this is the first time that a single shot dual wavelength calibration is reported by defining a criteria to make the spatial filtering automatic avoiding the problems of manual methods. The procedure is shown to give shape accuracy of 35 µm with negligible systematic errors using a synthetic wavelength of 1.1 mm.
{"title":"Single Shot Dual-Wavelength Digital Holography: Calibration Based on Speckle Displacements","authors":"D. Khodadad, P. Bergström, E. Haellstig, M. Sjödahl","doi":"10.1080/15599612.2014.942932","DOIUrl":"https://doi.org/10.1080/15599612.2014.942932","url":null,"abstract":"We present a calibration method which allows single shot dual wavelength online shape measurement in a disturbed environment. Effects of uncontrolled carrier frequency filtering are discussed as well. We demonstrate that phase maps and speckle displacements can be recovered free of chromatic aberrations. To our knowledge, this is the first time that a single shot dual wavelength calibration is reported by defining a criteria to make the spatial filtering automatic avoiding the problems of manual methods. The procedure is shown to give shape accuracy of 35 µm with negligible systematic errors using a synthetic wavelength of 1.1 mm.","PeriodicalId":50296,"journal":{"name":"International Journal of Optomechatronics","volume":"8 1","pages":"326 - 339"},"PeriodicalIF":5.5,"publicationDate":"2014-08-08","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1080/15599612.2014.942932","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"60482617","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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