Pub Date : 2015-04-03DOI: 10.1080/15599612.2015.1034902
Hani Al Hajjar, L. Petit, F. Lamarque, B. Fracasso
In this article, an optical fiber switch based on a digital actuator is presented. Four discrete positions are obtained through a magnetic holding of a Mobile Permanent Magnet (MPM) placed in a fixed square cavity. The MPM can switch, thanks to Lorentz's force, between the four corners of the cavity. A 1X4 optical fiber switch is obtained by fixing a prismatic mirror on the top side of the MPM and an N × N switch array can be obtained using a matrix of this unit. After a presentation of the actuator principle, the optical switch is detailed and characterized for telecommunication purpose.
{"title":"1X4 Optical Switch Based on Digital Actuator","authors":"Hani Al Hajjar, L. Petit, F. Lamarque, B. Fracasso","doi":"10.1080/15599612.2015.1034902","DOIUrl":"https://doi.org/10.1080/15599612.2015.1034902","url":null,"abstract":"In this article, an optical fiber switch based on a digital actuator is presented. Four discrete positions are obtained through a magnetic holding of a Mobile Permanent Magnet (MPM) placed in a fixed square cavity. The MPM can switch, thanks to Lorentz's force, between the four corners of the cavity. A 1X4 optical fiber switch is obtained by fixing a prismatic mirror on the top side of the MPM and an N × N switch array can be obtained using a matrix of this unit. After a presentation of the actuator principle, the optical switch is detailed and characterized for telecommunication purpose.","PeriodicalId":50296,"journal":{"name":"International Journal of Optomechatronics","volume":"9 1","pages":"141 - 150"},"PeriodicalIF":5.5,"publicationDate":"2015-04-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1080/15599612.2015.1034902","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"60483150","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2015-04-03DOI: 10.1080/15599612.2015.1034903
Le Cui, É. Marchand
A scanning electron microscope (SEM) calibrating approach based on non-linear minimization procedure is presented in this article1 1A part of this article has been published in IEEE International Conference on Robotics and Automation (ICRA), 2014.. Both the intrinsic parameters and the extrinsic parameters estimations are achieved simultaneously by minimizing the registration error. The proposed approach considers multi-images of a multi-scale calibration pattern view from different positions and orientations. Since the projection geometry of the scanning electron microscope is different from that of a classical optical sensor, the perspective projection model and the parallel projection model are considered and compared with distortion models. Experiments are realized by varying the position and the orientation of a multi-scale chessboard calibration pattern from 300× to 10,000×. The experimental results show the efficiency and the accuracy of this approach.
{"title":"Scanning Electron Microscope Calibration Using a Multi-Image Non-Linear Minimization Process","authors":"Le Cui, É. Marchand","doi":"10.1080/15599612.2015.1034903","DOIUrl":"https://doi.org/10.1080/15599612.2015.1034903","url":null,"abstract":"A scanning electron microscope (SEM) calibrating approach based on non-linear minimization procedure is presented in this article1 1A part of this article has been published in IEEE International Conference on Robotics and Automation (ICRA), 2014.. Both the intrinsic parameters and the extrinsic parameters estimations are achieved simultaneously by minimizing the registration error. The proposed approach considers multi-images of a multi-scale calibration pattern view from different positions and orientations. Since the projection geometry of the scanning electron microscope is different from that of a classical optical sensor, the perspective projection model and the parallel projection model are considered and compared with distortion models. Experiments are realized by varying the position and the orientation of a multi-scale chessboard calibration pattern from 300× to 10,000×. The experimental results show the efficiency and the accuracy of this approach.","PeriodicalId":50296,"journal":{"name":"International Journal of Optomechatronics","volume":"9 1","pages":"151 - 169"},"PeriodicalIF":5.5,"publicationDate":"2015-04-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1080/15599612.2015.1034903","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"60482861","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2015-04-03DOI: 10.1080/15599612.2015.1034900
R. Ansari, T. Pourashraf, R. Gholami, S. Sahmani, M. Ashrafi
In the present study, the resonant frequency and flexural sensitivity of atomic force microscope (AFM) microcantilevers are predicted incorporating size effects. To this end, the modified strain gradient elasticity theory is applied to the classical Euler-Bernoulli beam theory to develop a non-classical beam model which has the capability to capture size-dependent behavior of microcantilevers. On the basis of Hamilton's principle, the size-dependent analytical expressions corresponding to the frequency response and sensitivity of AFM cantilevers are derived. It is observed that by increasing the contact stiffness, the resonant frequencies of AFM cantilevers firstly increase and then tend to remain constant at an especial value. Moreover, the resonant frequencies of AFM cantilevers obtained via the developed non-classical model is higher than those of the classical beam theory, especially for the values of beam thickness close to the internal material length scale parameter.
{"title":"Size-Dependent Resonant Frequency and Flexural Sensitivity of Atomic Force Microscope Microcantilevers Based on the Modified Strain Gradient Theory","authors":"R. Ansari, T. Pourashraf, R. Gholami, S. Sahmani, M. Ashrafi","doi":"10.1080/15599612.2015.1034900","DOIUrl":"https://doi.org/10.1080/15599612.2015.1034900","url":null,"abstract":"In the present study, the resonant frequency and flexural sensitivity of atomic force microscope (AFM) microcantilevers are predicted incorporating size effects. To this end, the modified strain gradient elasticity theory is applied to the classical Euler-Bernoulli beam theory to develop a non-classical beam model which has the capability to capture size-dependent behavior of microcantilevers. On the basis of Hamilton's principle, the size-dependent analytical expressions corresponding to the frequency response and sensitivity of AFM cantilevers are derived. It is observed that by increasing the contact stiffness, the resonant frequencies of AFM cantilevers firstly increase and then tend to remain constant at an especial value. Moreover, the resonant frequencies of AFM cantilevers obtained via the developed non-classical model is higher than those of the classical beam theory, especially for the values of beam thickness close to the internal material length scale parameter.","PeriodicalId":50296,"journal":{"name":"International Journal of Optomechatronics","volume":"4 1","pages":"111 - 130"},"PeriodicalIF":5.5,"publicationDate":"2015-04-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1080/15599612.2015.1034900","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"60483192","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2015-04-03DOI: 10.1080/15599612.2015.1034901
Shin-ichi Ueda, M. Michihata, T. Hayashi, Y. Takaya
When a microsphere is trapped near a surface by single-beam gradient force trapping, the standing wave is generated between the microsphere and the surface, where abrupt motion along the optical axis (jumping) is observed corresponding to displacement of the surface. This jumping distance is on the order of a few hundred nanometers. In the vicinity of the surface, intensity of retro-reflected light is increased so that the averaged position of the jumping is shifted up on the order of several micrometers. Therefore wide-range and high-resolution position measurement technique is required. In this article, we proposed to apply a chromatic confocal sensor to measure the axial position of the microsphere in the standing wave. It was experimentally validated that the position of the microsphere could be measured with a resolution of 10 nm and a measuring range of 3 µm.
{"title":"Wide-Range Axial Position Measurement for Jumping Behavior of Optically Trapped Microsphere Near Surface Using Chromatic Confocal Sensor","authors":"Shin-ichi Ueda, M. Michihata, T. Hayashi, Y. Takaya","doi":"10.1080/15599612.2015.1034901","DOIUrl":"https://doi.org/10.1080/15599612.2015.1034901","url":null,"abstract":"When a microsphere is trapped near a surface by single-beam gradient force trapping, the standing wave is generated between the microsphere and the surface, where abrupt motion along the optical axis (jumping) is observed corresponding to displacement of the surface. This jumping distance is on the order of a few hundred nanometers. In the vicinity of the surface, intensity of retro-reflected light is increased so that the averaged position of the jumping is shifted up on the order of several micrometers. Therefore wide-range and high-resolution position measurement technique is required. In this article, we proposed to apply a chromatic confocal sensor to measure the axial position of the microsphere in the standing wave. It was experimentally validated that the position of the microsphere could be measured with a resolution of 10 nm and a measuring range of 3 µm.","PeriodicalId":50296,"journal":{"name":"International Journal of Optomechatronics","volume":"9 1","pages":"131 - 140"},"PeriodicalIF":5.5,"publicationDate":"2015-04-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1080/15599612.2015.1034901","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"60483266","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2015-01-02DOI: 10.1080/15599612.2014.944292
T. Matsuoka
The short history of the development in nitride semiconductors is described. As key issues for the future progress are concreted from this history, the polarity of crystal, the substrate for the epitaxial growth of nitride semiconductors, and emerging material, InN are introduced. The device applications including optical devices and transport devices are reviewed. Finally, this article looks into the future prospect of nitride semiconductors.
{"title":"Overview of Nitride Semiconductors","authors":"T. Matsuoka","doi":"10.1080/15599612.2014.944292","DOIUrl":"https://doi.org/10.1080/15599612.2014.944292","url":null,"abstract":"The short history of the development in nitride semiconductors is described. As key issues for the future progress are concreted from this history, the polarity of crystal, the substrate for the epitaxial growth of nitride semiconductors, and emerging material, InN are introduced. The device applications including optical devices and transport devices are reviewed. Finally, this article looks into the future prospect of nitride semiconductors.","PeriodicalId":50296,"journal":{"name":"International Journal of Optomechatronics","volume":"9 1","pages":"1 - 8"},"PeriodicalIF":5.5,"publicationDate":"2015-01-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1080/15599612.2014.944292","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"60482697","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2015-01-02DOI: 10.1080/15599612.2014.988386
Yoshiki Kaneoka, Kentaro Nishigaki, Y. Mizutani, T. Iwata
We propose a modified method for thickness measurement of a dielectric coating layer on metal based on Otto optical configuration (O-configuration). This method enables us to estimate the coating thickness that typically ranges from several tens of nanometers to more than one micrometer with precision less than a few nanometers. The common method to measure the thickness of dielectric coating layer is to utilize the frustrated total-internal reflection. In order to measure the thickness of several tens of nanometers, one can apply the surface-plasmon-resonance (SPR) phenomenon generated by the p-polarized light. For thickness larger than one hundred nanometers, a metal-clad leaky-waveguide (MCLW) mode generated by the p- or the s-polarized light can be employed without significant changes to the optical setup. The numerical and experimental verifications of the modified O-configuration reveals its effectiveness for precise measurement of moderately-thick dielectric coating layer on the metal.
{"title":"Precise Measurement of the Thickness of a Dielectric Layer on a Metal Surface by Use of a Modified Otto Optical Configuration","authors":"Yoshiki Kaneoka, Kentaro Nishigaki, Y. Mizutani, T. Iwata","doi":"10.1080/15599612.2014.988386","DOIUrl":"https://doi.org/10.1080/15599612.2014.988386","url":null,"abstract":"We propose a modified method for thickness measurement of a dielectric coating layer on metal based on Otto optical configuration (O-configuration). This method enables us to estimate the coating thickness that typically ranges from several tens of nanometers to more than one micrometer with precision less than a few nanometers. The common method to measure the thickness of dielectric coating layer is to utilize the frustrated total-internal reflection. In order to measure the thickness of several tens of nanometers, one can apply the surface-plasmon-resonance (SPR) phenomenon generated by the p-polarized light. For thickness larger than one hundred nanometers, a metal-clad leaky-waveguide (MCLW) mode generated by the p- or the s-polarized light can be employed without significant changes to the optical setup. The numerical and experimental verifications of the modified O-configuration reveals its effectiveness for precise measurement of moderately-thick dielectric coating layer on the metal.","PeriodicalId":50296,"journal":{"name":"International Journal of Optomechatronics","volume":"9 1","pages":"48 - 61"},"PeriodicalIF":5.5,"publicationDate":"2015-01-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1080/15599612.2014.988386","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"60483121","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2015-01-02DOI: 10.1080/15599612.2014.916370
H. Divya, G. R. Reddy, C. Sobhan
The application of digital interferometric techniques in the measurement of forced convection in compact channels is examined. Michelson Interferometry and Mach–Zehnder Interferometry have been compared and contrasted, in terms of the suitability for temperature measurements. A wedge-fringe setting parallel to the heated surface has been utilized as the basis of the fringe analysis, for effective measurement in small dimension channels. Michelson interferometry was found to provide a larger number of data points in the visualization field, thus proving to be a better method of measurement in compact passages. Heat transfer parameters, useful in heat sink design, were also calculated.
{"title":"Digital Interferometric Measurement of Forced Convection Fields in Compact Channels","authors":"H. Divya, G. R. Reddy, C. Sobhan","doi":"10.1080/15599612.2014.916370","DOIUrl":"https://doi.org/10.1080/15599612.2014.916370","url":null,"abstract":"The application of digital interferometric techniques in the measurement of forced convection in compact channels is examined. Michelson Interferometry and Mach–Zehnder Interferometry have been compared and contrasted, in terms of the suitability for temperature measurements. A wedge-fringe setting parallel to the heated surface has been utilized as the basis of the fringe analysis, for effective measurement in small dimension channels. Michelson interferometry was found to provide a larger number of data points in the visualization field, thus proving to be a better method of measurement in compact passages. Heat transfer parameters, useful in heat sink design, were also calculated.","PeriodicalId":50296,"journal":{"name":"International Journal of Optomechatronics","volume":"9 1","pages":"34 - 9"},"PeriodicalIF":5.5,"publicationDate":"2015-01-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1080/15599612.2014.916370","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"60481484","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2015-01-02DOI: 10.1080/15599612.2014.972599
Zhizheng Wu, Yang Li, Pei Wang, Mei Liu
In the near-field recording (NFR) system, the gap between the lens and disk will drop down to 100 nm. However, the disk vibration and force disturbance make it difficult to maintain the desired flying height during disk operation, and the lens-disk collision can easily occur. It is proposed in this article to design a hybrid actuator system which combines both advantages of the flying slider used in hard disk drives and the voice coil actuator used in optical disk drives. The dynamic head-disk interface model of the hybrid actuator is first developed, then an adaptive regulation approach is proposed to control the flying height at its desired value despite the unknown disturbances. Simulation and experimental results are presented to illustrate the effectiveness of the proposed flying height control approach.
{"title":"Dynamic Head-Disk Interface Modeling and Adaptive Control of a Hybrid Actuator for Optical Data Storage Systems","authors":"Zhizheng Wu, Yang Li, Pei Wang, Mei Liu","doi":"10.1080/15599612.2014.972599","DOIUrl":"https://doi.org/10.1080/15599612.2014.972599","url":null,"abstract":"In the near-field recording (NFR) system, the gap between the lens and disk will drop down to 100 nm. However, the disk vibration and force disturbance make it difficult to maintain the desired flying height during disk operation, and the lens-disk collision can easily occur. It is proposed in this article to design a hybrid actuator system which combines both advantages of the flying slider used in hard disk drives and the voice coil actuator used in optical disk drives. The dynamic head-disk interface model of the hybrid actuator is first developed, then an adaptive regulation approach is proposed to control the flying height at its desired value despite the unknown disturbances. Simulation and experimental results are presented to illustrate the effectiveness of the proposed flying height control approach.","PeriodicalId":50296,"journal":{"name":"International Journal of Optomechatronics","volume":"12 1","pages":"62 - 88"},"PeriodicalIF":5.5,"publicationDate":"2015-01-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1080/15599612.2014.972599","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"60482882","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2015-01-02DOI: 10.1080/15599612.2014.988387
Kuan-Yu Chen, Chien-Hung Chen, Sung-Chi Yang
This article presents an intelligent surveillance system based on stereovision for dynamic tracking of moving objects with autofocus and lossless zoom capabilities. The core technology of the system combines a modified stereovision algorithm with an autofocus search method. First, in order to reduce the effect of changing the lens focal length, the modified stereovision algorithm provides an obvious advantage in accuracy of depth estimation. Then the estimated depth not only can be used for adjusting the appropriate zoom level of cameras but also for shortening the search range of focal points. Moreover, the autofocus search method can simplify the image sharpness curve to a single peak. Therefore, by using spline interpolation, the focus position can be efficiently and accurately estimated. Finally, experimental results show that the proposed scheme has the ability to improve the accuracy of depth estimation and provide more clear images of moving objects.
{"title":"Development of a Stereovision-Based Tracking System by Applying a Hybrid Autofocus Technology","authors":"Kuan-Yu Chen, Chien-Hung Chen, Sung-Chi Yang","doi":"10.1080/15599612.2014.988387","DOIUrl":"https://doi.org/10.1080/15599612.2014.988387","url":null,"abstract":"This article presents an intelligent surveillance system based on stereovision for dynamic tracking of moving objects with autofocus and lossless zoom capabilities. The core technology of the system combines a modified stereovision algorithm with an autofocus search method. First, in order to reduce the effect of changing the lens focal length, the modified stereovision algorithm provides an obvious advantage in accuracy of depth estimation. Then the estimated depth not only can be used for adjusting the appropriate zoom level of cameras but also for shortening the search range of focal points. Moreover, the autofocus search method can simplify the image sharpness curve to a single peak. Therefore, by using spline interpolation, the focus position can be efficiently and accurately estimated. Finally, experimental results show that the proposed scheme has the ability to improve the accuracy of depth estimation and provide more clear images of moving objects.","PeriodicalId":50296,"journal":{"name":"International Journal of Optomechatronics","volume":"9 1","pages":"109 - 89"},"PeriodicalIF":5.5,"publicationDate":"2015-01-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1080/15599612.2014.988387","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"60483132","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2015-01-02DOI: 10.1080/15599612.2014.928391
Shengji Li, Xuefeng Huang
This article presents the manipulation and combustion of carbon-based micro particles (polystyrene, active carbon) by optical tweezers. Trap, ignition, and combustion of micro particles are well demonstrated. For polystyrene in water, polystyrene micro particles of 2.9 µm are trapped with increasing laser power. The polystyrene takes reaction and combusts as the laser power of 520 mW. For active carbon in air, both single active carbon and active carbon bundle can be trapped, dragged, oxidized, ignited, and combusted. The drag speed and burning rate of single active carbon of 7.0 µm are 103.7 µm/s and 14.0 µm/s as the minimum ignition power of 3.2 mW. Combustions of single active carbon and bundle are flameless at minimum ignition power. As the power is further enhanced, strenuous oxidation and combustion flame can be observed. For active carbon bundle of 215.7 µm, combustion process sustains 0.72 s as the laser power of 90 mW.
{"title":"The Manipulation and Combustion of Carbon-Based Micro Particles by Optical Tweezers","authors":"Shengji Li, Xuefeng Huang","doi":"10.1080/15599612.2014.928391","DOIUrl":"https://doi.org/10.1080/15599612.2014.928391","url":null,"abstract":"This article presents the manipulation and combustion of carbon-based micro particles (polystyrene, active carbon) by optical tweezers. Trap, ignition, and combustion of micro particles are well demonstrated. For polystyrene in water, polystyrene micro particles of 2.9 µm are trapped with increasing laser power. The polystyrene takes reaction and combusts as the laser power of 520 mW. For active carbon in air, both single active carbon and active carbon bundle can be trapped, dragged, oxidized, ignited, and combusted. The drag speed and burning rate of single active carbon of 7.0 µm are 103.7 µm/s and 14.0 µm/s as the minimum ignition power of 3.2 mW. Combustions of single active carbon and bundle are flameless at minimum ignition power. As the power is further enhanced, strenuous oxidation and combustion flame can be observed. For active carbon bundle of 215.7 µm, combustion process sustains 0.72 s as the laser power of 90 mW.","PeriodicalId":50296,"journal":{"name":"International Journal of Optomechatronics","volume":"9 1","pages":"35 - 47"},"PeriodicalIF":5.5,"publicationDate":"2015-01-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1080/15599612.2014.928391","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"60482197","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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