Pub Date : 2025-05-05DOI: 10.1134/S1063774524602636
P. A. Vorontsov, V. D. Salnikov, V. V. Savin, S. A. Vorontsov, L. V. Panina, P. A. Ershov, V. V. Rodionova
The phase transition in composites based on polyvinylidene fluoride and cobalt ferrite nanoparticles under uniaxial stretching at 100, 200, and 300% has been investigated. It was found that, when the composite is stretched at 300%, there is a maximum increase in the β-phase fraction: from 1% for the unstretched sample to 91%, while the fraction of the electrically active phase increases from 74 to 92%. It was also established that tensile stretching of the composites leads to an increase in the tensile strength: from 5.7 to 85.0 MPa. This tensile pattern also contributes to the increase in coercivity, which is due to the increase in the interparticle distance in the composite structure. These results emphasize the importance of the mechanical properties and phase changes in ferrite-containing polymer composites for their future applications.
{"title":"Phase Transitions in Poly(Vinylidene Fluoride)-Based Composite under Mechanical Stresses","authors":"P. A. Vorontsov, V. D. Salnikov, V. V. Savin, S. A. Vorontsov, L. V. Panina, P. A. Ershov, V. V. Rodionova","doi":"10.1134/S1063774524602636","DOIUrl":"10.1134/S1063774524602636","url":null,"abstract":"<p>The phase transition in composites based on polyvinylidene fluoride and cobalt ferrite nanoparticles under uniaxial stretching at 100, 200, and 300% has been investigated. It was found that, when the composite is stretched at 300%, there is a maximum increase in the β-phase fraction: from 1% for the unstretched sample to 91%, while the fraction of the electrically active phase increases from 74 to 92%. It was also established that tensile stretching of the composites leads to an increase in the tensile strength: from 5.7 to 85.0 MPa. This tensile pattern also contributes to the increase in coercivity, which is due to the increase in the interparticle distance in the composite structure. These results emphasize the importance of the mechanical properties and phase changes in ferrite-containing polymer composites for their future applications.</p>","PeriodicalId":527,"journal":{"name":"Crystallography Reports","volume":"70 1","pages":"24 - 30"},"PeriodicalIF":0.6,"publicationDate":"2025-05-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"143908819","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"材料科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2025-05-05DOI: 10.1134/S1063774524602570
D. A. Banaru
An additive model has been developed for calculating the combinatorial (Shannon-like) complexity of the signature of a natural tiling, which is used to describe the topological properties of micro- and mesoporous materials, in particular, zeolites. To calculate the complexity of this type, a Python program code has been compiled. The code was tested for zeolite-type tilings. Correlations of the calculated complexity of the signature of the tiling and the combinatorial complexity of the structure-generating tiling were found.
{"title":"Combinatorial Complexity of the Signature of a Natural Tiling","authors":"D. A. Banaru","doi":"10.1134/S1063774524602570","DOIUrl":"10.1134/S1063774524602570","url":null,"abstract":"<p>An additive model has been developed for calculating the combinatorial (Shannon-like) complexity of the signature of a natural tiling, which is used to describe the topological properties of micro- and mesoporous materials, in particular, zeolites. To calculate the complexity of this type, a Python program code has been compiled. The code was tested for zeolite-type tilings. Correlations of the calculated complexity of the signature of the tiling and the combinatorial complexity of the structure-generating tiling were found.</p>","PeriodicalId":527,"journal":{"name":"Crystallography Reports","volume":"70 1","pages":"151 - 157"},"PeriodicalIF":0.6,"publicationDate":"2025-05-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"143908676","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"材料科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2025-05-05DOI: 10.1134/S106377452460265X
T. G. Golovina, A. F. Konstantinova, E. V. Zabelina, N. S. Kozlova, V. M. Kasimova
The effect of the imperfections of the polarizer, analyzer, and photomultiplier tube (PMT) on the results of measuring the spectral transmission dependences of catangasite (Ca3TaGa3Si2O14) crystals cut perpendicular to the optical axis has been theoretically and experimentally investigated. There is a difference between the spectra obtained for the p and s polarizations of incident light; jumps are also observed on the curves at λ = 1050 nm. This is due to the imperfection of the PMT and the optical activity of the crystal. The PMT parameters are estimated in dependence of the light wavelength proceeding from experimental data. The influence of the imperfection of the PMT and polarizers on the results of calculating the rotation of the plane of polarization ρ is studied. It is shown that transmission spectra must be measured at angles between the polarizer and analyzer of ±45° in order to to calculate exactly the ρ value. The measurement errors are determined by the set of optical elements in a particular device.
{"title":"Allowance for the Imperfection of the Spectrophotometric Complex Optical Elements When Measuring Transmission Spectra of Gyrotropic Uniaxial Crystals. I: Samples Are Cut Perpendicular to the Optical Axis","authors":"T. G. Golovina, A. F. Konstantinova, E. V. Zabelina, N. S. Kozlova, V. M. Kasimova","doi":"10.1134/S106377452460265X","DOIUrl":"10.1134/S106377452460265X","url":null,"abstract":"<p>The effect of the imperfections of the polarizer, analyzer, and photomultiplier tube (PMT) on the results of measuring the spectral transmission dependences of catangasite (Ca<sub>3</sub>TaGa<sub>3</sub>Si<sub>2</sub>O<sub>14</sub>) crystals cut perpendicular to the optical axis has been theoretically and experimentally investigated. There is a difference between the spectra obtained for the <i>p</i> and <i>s</i> polarizations of incident light; jumps are also observed on the curves at λ = 1050 nm. This is due to the imperfection of the PMT and the optical activity of the crystal. The PMT parameters are estimated in dependence of the light wavelength proceeding from experimental data. The influence of the imperfection of the PMT and polarizers on the results of calculating the rotation of the plane of polarization ρ is studied. It is shown that transmission spectra must be measured at angles between the polarizer and analyzer of ±45° in order to to calculate exactly the ρ value. The measurement errors are determined by the set of optical elements in a particular device.</p>","PeriodicalId":527,"journal":{"name":"Crystallography Reports","volume":"70 1","pages":"39 - 49"},"PeriodicalIF":0.6,"publicationDate":"2025-05-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"143908821","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"材料科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2025-05-05DOI: 10.1134/S1063774524602491
V. B. Dudnikova, E. V. Zharikov, N. N. Eremin
The structure and properties of sanmartinite ZnWO4 have been simulated by the method of empirical interatomic potentials. A system of coordinated interatomic potentials has been developed, which makes it possible to describe the structural, elastic, and thermodynamic properties of zinc tungstate and simulate more complex composite media containing this component.
{"title":"Simulation of Sanmartinite ZnWO4 by the Method of Interatomic Potentials","authors":"V. B. Dudnikova, E. V. Zharikov, N. N. Eremin","doi":"10.1134/S1063774524602491","DOIUrl":"10.1134/S1063774524602491","url":null,"abstract":"<p>The structure and properties of sanmartinite ZnWO<sub>4</sub> have been simulated by the method of empirical interatomic potentials. A system of coordinated interatomic potentials has been developed, which makes it possible to describe the structural, elastic, and thermodynamic properties of zinc tungstate and simulate more complex composite media containing this component.</p>","PeriodicalId":527,"journal":{"name":"Crystallography Reports","volume":"70 1","pages":"1 - 7"},"PeriodicalIF":0.6,"publicationDate":"2025-05-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"143908849","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"材料科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2025-05-05DOI: 10.1134/S1063774524602764
E. A. Klimov, A. N. Klochkov, S. S. Pushkarev
The crystal structures of the epitaxial multilayer films {In0.1Ga0.9As/GaAs} × 10 and {In0.2Ga0.8As/GaAs} × 10 grown on GaAs substrates with different orientations, (100), (110), and (111)А, were studied in order to elucidate specific features, which can be related to the previously found efficiency of the terahertz emission generation in films with (110) and (111)А orientations. Significant concentrations of twins and stacking faults were found on non-standard GaAs (110) and (111)А substrates. The composition and thickness of individual layers of heterostructures on GaAs (100) substrates were refined based on the analysis of interference oscillations in X-ray diffraction curves.
{"title":"Crystal Structure Analysis of Epitaxial Nanoheterostructures with Multiple Pseudomorphic Quantum Wells {InхGa(_{{{mathbf{1}}-x}})As/GaAs} on GaAs (100), (110), and (111)А Substrates","authors":"E. A. Klimov, A. N. Klochkov, S. S. Pushkarev","doi":"10.1134/S1063774524602764","DOIUrl":"10.1134/S1063774524602764","url":null,"abstract":"<p>The crystal structures of the epitaxial multilayer films {In<sub>0.1</sub>Ga<sub>0.9</sub>As/GaAs} × 10 and {In<sub>0.2</sub>Ga<sub>0.8</sub>As/GaAs} × 10 grown on GaAs substrates with different orientations, (100), (110), and (111)<i>А</i>, were studied in order to elucidate specific features, which can be related to the previously found efficiency of the terahertz emission generation in films with (110) and (111)<i>А</i> orientations. Significant concentrations of twins and stacking faults were found on non-standard GaAs (110) and (111)<i>А</i> substrates. The composition and thickness of individual layers of heterostructures on GaAs (100) substrates were refined based on the analysis of interference oscillations in X-ray diffraction curves.</p>","PeriodicalId":527,"journal":{"name":"Crystallography Reports","volume":"70 1","pages":"122 - 128"},"PeriodicalIF":0.6,"publicationDate":"2025-05-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"143908675","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"材料科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2025-05-05DOI: 10.1134/S1063774524602661
A. K. Ivanov-Schitz
The specific features of the ion transport in paratellurite α-TeO2 crystals under an external dc electric field have been investigated by the molecular dynamics method. It is shown that the ion transport anisotropy is more pronounced when the field E is directed along the c axis: at E = 350 kV/mm the diffusion is enhanced by a factor of about 2 in crystals with oxygen vacancies and by a factor of 3 in samples with additional oxygen interstitials.
{"title":"Atomistic Simulation of Paratellurite α-TeO2 Crystal. III: Anisotropy of Ion Transport under External DC Electrical Field","authors":"A. K. Ivanov-Schitz","doi":"10.1134/S1063774524602661","DOIUrl":"10.1134/S1063774524602661","url":null,"abstract":"<p>The specific features of the ion transport in paratellurite α-TeO<sub>2</sub> crystals under an external dc electric field have been investigated by the molecular dynamics method. It is shown that the ion transport anisotropy is more pronounced when the field <i>E</i> is directed along the <i>c</i> axis: at <i>E</i> = 350 kV/mm the diffusion is enhanced by a factor of about 2 in crystals with oxygen vacancies and by a factor of 3 in samples with additional oxygen interstitials.</p>","PeriodicalId":527,"journal":{"name":"Crystallography Reports","volume":"70 1","pages":"64 - 67"},"PeriodicalIF":0.6,"publicationDate":"2025-05-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"143908831","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"材料科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2025-05-05DOI: 10.1134/S1063774524602533
E. K. Stolyarova, T. F. Mukhina, A. M. Ismagulov, P. A. Volkov, A. G. Kulikov, E. Yu. Tereschenko, E. B. Yatsishina
The basic composition of polychrome enamels of three bronze items, found on the territory of Vladimir and Suzdal Opolye (a temporal pendant, a pendant icon, and a cross), dating from the 12th–13th centuries, has been studied by atomic emission spectroscopy and energy-dispersive X-ray microanalysis. The items have a rich color, which made it possible to investigate the technological features of a wide range of colored enamels: white, black, gray, light gray, deep blue, red-brown, brown, green, blue-green, turquoise, and yellow. The obtained results suggest the Byzantine origin of the enamels and local production of the items themselves.
{"title":"Chemical Composition of Polychrome Enamels of Three Ancient Russian Bronze Items from Vladimir–Suzdal Rus’","authors":"E. K. Stolyarova, T. F. Mukhina, A. M. Ismagulov, P. A. Volkov, A. G. Kulikov, E. Yu. Tereschenko, E. B. Yatsishina","doi":"10.1134/S1063774524602533","DOIUrl":"10.1134/S1063774524602533","url":null,"abstract":"<p>The basic composition of polychrome enamels of three bronze items, found on the territory of Vladimir and Suzdal Opolye (a temporal pendant, a pendant icon, and a cross), dating from the 12th–13th centuries, has been studied by atomic emission spectroscopy and energy-dispersive X-ray microanalysis. The items have a rich color, which made it possible to investigate the technological features of a wide range of colored enamels: white, black, gray, light gray, deep blue, red-brown, brown, green, blue-green, turquoise, and yellow. The obtained results suggest the Byzantine origin of the enamels and local production of the items themselves.</p>","PeriodicalId":527,"journal":{"name":"Crystallography Reports","volume":"70 1","pages":"129 - 150"},"PeriodicalIF":0.6,"publicationDate":"2025-05-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"143908722","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"材料科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2025-05-05DOI: 10.1134/S1063774524602739
T. G. Golovina, A. F. Konstantinova, E. V. Zabelina, N. S. Kozlova, V. M. Kasimova
The effect of the imperfections of the polarizer, analyzer, and photomultiplier tube (PMT) on the results of measuring the spectral transmission dependences for langasite family crystals cut parallel to the optical axis has been theoretically and experimentally investigated. It is shown that, in the absence of analyzer, oscillations arise on the transmission spectra, whose amplitude depends on the crystal rotation. These oscillations are associated with linear birefringence and occur because of the imperfection of the PMT, which plays the role of a partial analyzer. The PMT parameters in dependence of wavelength are calculated from the obtained spectra. The birefringence of the studied crystals was calculated, and the error of this calculation was estimated. It is shown that the imperfection of optical elements does not lead to any additional errors in the calculation of the birefringence. Thus, when the plate is cut perpendicular (parallel) to the optical axis, circular (linear) birefringence manifests itself.
{"title":"Allowance for the Imperfection of the Spectrophotometric Complex Optical Elements When Measuring Transmission Spectra of Gyrotropic Uniaxial Crystals. II: Samples Are Cut Parallel to the Optical Axis","authors":"T. G. Golovina, A. F. Konstantinova, E. V. Zabelina, N. S. Kozlova, V. M. Kasimova","doi":"10.1134/S1063774524602739","DOIUrl":"10.1134/S1063774524602739","url":null,"abstract":"<p>The effect of the imperfections of the polarizer, analyzer, and photomultiplier tube (PMT) on the results of measuring the spectral transmission dependences for langasite family crystals cut <i>parallel</i> to the optical axis has been theoretically and experimentally investigated. It is shown that, in the absence of analyzer, oscillations arise on the transmission spectra, whose amplitude depends on the crystal rotation. These oscillations are associated with linear birefringence and occur because of the imperfection of the PMT, which plays the role of a partial analyzer. The PMT parameters in dependence of wavelength are calculated from the obtained spectra. The birefringence of the studied crystals was calculated, and the error of this calculation was estimated. It is shown that the imperfection of optical elements does not lead to any additional errors in the calculation of the birefringence. Thus, when the plate is cut perpendicular (parallel) to the optical axis, circular (linear) birefringence manifests itself.</p>","PeriodicalId":527,"journal":{"name":"Crystallography Reports","volume":"70 1","pages":"50 - 57"},"PeriodicalIF":0.6,"publicationDate":"2025-05-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"143908724","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"材料科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2025-05-05DOI: 10.1134/S1063774524602715
B. E. Vintaikin, Ya. V. Cherenkov, A. E. Smirnov, S. G. Vasiliev
A technique for forming true distributions of X-ray diffraction intensity using X-ray diffractometry has been developed to reveal inhomogeneous deformations of a curvilinear surface with a periodic relief by separating the effects related to the influence of this surface on the diffraction profile shape. True intensity distribution profiles, related to only inhomogeneous surface deformations and sizes of crystalline blocks, were obtained; the parameters and specific features of the distribution functions of these deformations were determined. The proposed approach makes it possible to select, in particular, the contribution from only a curvilinear surface with a regular sample relief to the shape of the intensity distribution profile.
{"title":"Investigation of the Inhomogeneous Deformations of Crystal Lattices during Deformational Cutting of 08Kh18N10T Steel Samples with a Periodic Surface Relief","authors":"B. E. Vintaikin, Ya. V. Cherenkov, A. E. Smirnov, S. G. Vasiliev","doi":"10.1134/S1063774524602715","DOIUrl":"10.1134/S1063774524602715","url":null,"abstract":"<p>A technique for forming true distributions of X-ray diffraction intensity using X-ray diffractometry has been developed to reveal inhomogeneous deformations of a curvilinear surface with a periodic relief by separating the effects related to the influence of this surface on the diffraction profile shape. True intensity distribution profiles, related to only inhomogeneous surface deformations and sizes of crystalline blocks, were obtained; the parameters and specific features of the distribution functions of these deformations were determined. The proposed approach makes it possible to select, in particular, the contribution from only a curvilinear surface with a regular sample relief to the shape of the intensity distribution profile.</p>","PeriodicalId":527,"journal":{"name":"Crystallography Reports","volume":"70 1","pages":"83 - 89"},"PeriodicalIF":0.6,"publicationDate":"2025-05-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"143908823","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"材料科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2025-05-05DOI: 10.1134/S1063774524601928
S. M. Shkornyakov
The reflectance of medium-energy (~10 KeV) electrons at their normal incidence onto a growing single-crystal thin film has been calculated. It is shown that in this case a quantum size effect occurs, which manifests itself in harmonic oscillations of the reflected beam intensity. The oscillation amplitude and period depend on the thickness of the growing film and the energy of the incident electrons. The results obtained are graphically illustrated.
{"title":"Quantum Size Effect under Normal Incidence of a Medium-Energy Electron Beam onto a Growing Heteroepitaxial Film","authors":"S. M. Shkornyakov","doi":"10.1134/S1063774524601928","DOIUrl":"10.1134/S1063774524601928","url":null,"abstract":"<p>The reflectance of medium-energy (~10 KeV) electrons at their normal incidence onto a growing single-crystal thin film has been calculated. It is shown that in this case a quantum size effect occurs, which manifests itself in harmonic oscillations of the reflected beam intensity. The oscillation amplitude and period depend on the thickness of the growing film and the energy of the incident electrons. The results obtained are graphically illustrated.</p>","PeriodicalId":527,"journal":{"name":"Crystallography Reports","volume":"70 1","pages":"90 - 95"},"PeriodicalIF":0.6,"publicationDate":"2025-05-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"143908723","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"材料科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}