Pub Date : 2023-03-06DOI: 10.1007/s10836-023-06055-w
Ahmad Menbari, H. Jahanirad
{"title":"A Tunable Concurrent BIST Design Based on Reconfigurable LFSR","authors":"Ahmad Menbari, H. Jahanirad","doi":"10.1007/s10836-023-06055-w","DOIUrl":"https://doi.org/10.1007/s10836-023-06055-w","url":null,"abstract":"","PeriodicalId":54841,"journal":{"name":"Journal of Electronic Testing-Theory and Applications","volume":null,"pages":null},"PeriodicalIF":0.9,"publicationDate":"2023-03-06","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"48207209","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2023-02-20DOI: 10.1007/s10836-023-06051-0
Chung-Huang Yeh, Jwu E. Chen
{"title":"Multiple Retest Systems for Screening High-Quality Chips","authors":"Chung-Huang Yeh, Jwu E. Chen","doi":"10.1007/s10836-023-06051-0","DOIUrl":"https://doi.org/10.1007/s10836-023-06051-0","url":null,"abstract":"","PeriodicalId":54841,"journal":{"name":"Journal of Electronic Testing-Theory and Applications","volume":null,"pages":null},"PeriodicalIF":0.9,"publicationDate":"2023-02-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"47328394","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2023-02-01DOI: 10.1007/s10836-023-06047-w
Isaac Bruce, Praise O. Farayola, Shravan K. Chaganti, Abalhassan Sheikh, S. Ravi, Degang Chen
{"title":"A Weighted-Bin Difference Method for Issue Site Identification in Analog and Mixed-Signal Multi-Site Testing","authors":"Isaac Bruce, Praise O. Farayola, Shravan K. Chaganti, Abalhassan Sheikh, S. Ravi, Degang Chen","doi":"10.1007/s10836-023-06047-w","DOIUrl":"https://doi.org/10.1007/s10836-023-06047-w","url":null,"abstract":"","PeriodicalId":54841,"journal":{"name":"Journal of Electronic Testing-Theory and Applications","volume":null,"pages":null},"PeriodicalIF":0.9,"publicationDate":"2023-02-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"42434197","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2023-02-01DOI: 10.1007/s10836-023-06048-9
Sourav Ghosh, Surajit Kumar Roy, C. Giri
{"title":"Fault Detection and Diagnosis of DMFB Using Concurrent Electrodes Actuation","authors":"Sourav Ghosh, Surajit Kumar Roy, C. Giri","doi":"10.1007/s10836-023-06048-9","DOIUrl":"https://doi.org/10.1007/s10836-023-06048-9","url":null,"abstract":"","PeriodicalId":54841,"journal":{"name":"Journal of Electronic Testing-Theory and Applications","volume":null,"pages":null},"PeriodicalIF":0.9,"publicationDate":"2023-02-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"41366926","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2023-02-01DOI: 10.1007/s10836-023-06049-8
Bahman Arasteh, Y. Malaiya
{"title":"Journal of Electronic Testing: Theory and Applications New Editors – 2023","authors":"Bahman Arasteh, Y. Malaiya","doi":"10.1007/s10836-023-06049-8","DOIUrl":"https://doi.org/10.1007/s10836-023-06049-8","url":null,"abstract":"","PeriodicalId":54841,"journal":{"name":"Journal of Electronic Testing-Theory and Applications","volume":null,"pages":null},"PeriodicalIF":0.9,"publicationDate":"2023-02-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"46666642","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2023-02-01DOI: 10.1007/s10836-023-06052-z
V. Agrawal
{"title":"Editorial","authors":"V. Agrawal","doi":"10.1007/s10836-023-06052-z","DOIUrl":"https://doi.org/10.1007/s10836-023-06052-z","url":null,"abstract":"","PeriodicalId":54841,"journal":{"name":"Journal of Electronic Testing-Theory and Applications","volume":null,"pages":null},"PeriodicalIF":0.9,"publicationDate":"2023-02-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"44576977","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2023-02-01DOI: 10.1007/s10836-023-06046-x
Bahareh Asadi, Syed Maqsood Zia, H. M. Al-Khafaji, Asghar Mohamadian
{"title":"Network-on-Chip and Photonic Network-on-Chip Basic Concepts: A Survey","authors":"Bahareh Asadi, Syed Maqsood Zia, H. M. Al-Khafaji, Asghar Mohamadian","doi":"10.1007/s10836-023-06046-x","DOIUrl":"https://doi.org/10.1007/s10836-023-06046-x","url":null,"abstract":"","PeriodicalId":54841,"journal":{"name":"Journal of Electronic Testing-Theory and Applications","volume":null,"pages":null},"PeriodicalIF":0.9,"publicationDate":"2023-02-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"45235166","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2023-02-01DOI: 10.1007/s10836-023-06045-y
Xiaozhi Du, Jinjin Zhang, Kai Chen, Yanrong Zhou
{"title":"DFS-KeyLevel: A Two-Layer Test Scenario Generation Approach for UML Activity Diagram","authors":"Xiaozhi Du, Jinjin Zhang, Kai Chen, Yanrong Zhou","doi":"10.1007/s10836-023-06045-y","DOIUrl":"https://doi.org/10.1007/s10836-023-06045-y","url":null,"abstract":"","PeriodicalId":54841,"journal":{"name":"Journal of Electronic Testing-Theory and Applications","volume":null,"pages":null},"PeriodicalIF":0.9,"publicationDate":"2023-02-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"48402103","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2023-02-01DOI: 10.1007/s10836-023-06056-9
{"title":"Test Technology Newsletter","authors":"","doi":"10.1007/s10836-023-06056-9","DOIUrl":"https://doi.org/10.1007/s10836-023-06056-9","url":null,"abstract":"","PeriodicalId":54841,"journal":{"name":"Journal of Electronic Testing-Theory and Applications","volume":null,"pages":null},"PeriodicalIF":0.9,"publicationDate":"2023-02-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"52281032","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2023-02-01DOI: 10.1007/s10836-023-06044-z
Zahra Paria Najafi-Haghi, H. Wunderlich
{"title":"Identifying Resistive Open Defects in Embedded Cells under Variations","authors":"Zahra Paria Najafi-Haghi, H. Wunderlich","doi":"10.1007/s10836-023-06044-z","DOIUrl":"https://doi.org/10.1007/s10836-023-06044-z","url":null,"abstract":"","PeriodicalId":54841,"journal":{"name":"Journal of Electronic Testing-Theory and Applications","volume":null,"pages":null},"PeriodicalIF":0.9,"publicationDate":"2023-02-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"45352697","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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