Pub Date : 2023-01-24DOI: 10.1007/s10836-023-06053-y
Carolyn Seepersad
{"title":"2022 Reviewers","authors":"Carolyn Seepersad","doi":"10.1007/s10836-023-06053-y","DOIUrl":"https://doi.org/10.1007/s10836-023-06053-y","url":null,"abstract":"","PeriodicalId":54841,"journal":{"name":"Journal of Electronic Testing-Theory and Applications","volume":null,"pages":null},"PeriodicalIF":0.9,"publicationDate":"2023-01-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"47933947","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2023-01-23DOI: 10.1007/s10836-023-06043-0
Jake Elliot, Jason Brown
{"title":"An Investigation into the Failure Characteristics of External PCB Traces with Different Angle Bends","authors":"Jake Elliot, Jason Brown","doi":"10.1007/s10836-023-06043-0","DOIUrl":"https://doi.org/10.1007/s10836-023-06043-0","url":null,"abstract":"","PeriodicalId":54841,"journal":{"name":"Journal of Electronic Testing-Theory and Applications","volume":null,"pages":null},"PeriodicalIF":0.9,"publicationDate":"2023-01-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"42984465","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2023-01-10DOI: 10.1007/s10836-013-5422-8
T. Theocharides
{"title":"Test Technology Newsletter","authors":"T. Theocharides","doi":"10.1007/s10836-013-5422-8","DOIUrl":"https://doi.org/10.1007/s10836-013-5422-8","url":null,"abstract":"","PeriodicalId":54841,"journal":{"name":"Journal of Electronic Testing-Theory and Applications","volume":null,"pages":null},"PeriodicalIF":0.9,"publicationDate":"2023-01-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1007/s10836-013-5422-8","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"49290853","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2023-01-01DOI: 10.1007/s10836-023-06050-1
Raghavendra Kumar Sakali, S. Mahammad
{"title":"Intrinsic Based Self-healing Adder Design Using Chromosome Reconstruction Algorithm","authors":"Raghavendra Kumar Sakali, S. Mahammad","doi":"10.1007/s10836-023-06050-1","DOIUrl":"https://doi.org/10.1007/s10836-023-06050-1","url":null,"abstract":"","PeriodicalId":54841,"journal":{"name":"Journal of Electronic Testing-Theory and Applications","volume":null,"pages":null},"PeriodicalIF":0.9,"publicationDate":"2023-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"52281017","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2022-12-01DOI: 10.1007/s10836-022-06033-8
S. Chandra, S. S. Sankar, H. S. Anand
{"title":"Smell Detection Agent Optimization Approach to Path Generation in Automated Software Testing","authors":"S. Chandra, S. S. Sankar, H. S. Anand","doi":"10.1007/s10836-022-06033-8","DOIUrl":"https://doi.org/10.1007/s10836-022-06033-8","url":null,"abstract":"","PeriodicalId":54841,"journal":{"name":"Journal of Electronic Testing-Theory and Applications","volume":null,"pages":null},"PeriodicalIF":0.9,"publicationDate":"2022-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"42294109","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2022-12-01DOI: 10.1007/s10836-022-06035-6
Richa Sharma, G. K. Sharma, M. Pattanaik
{"title":"A CatBoost Based Approach to Detect Label Flipping Poisoning Attack in Hardware Trojan Detection Systems","authors":"Richa Sharma, G. K. Sharma, M. Pattanaik","doi":"10.1007/s10836-022-06035-6","DOIUrl":"https://doi.org/10.1007/s10836-022-06035-6","url":null,"abstract":"","PeriodicalId":54841,"journal":{"name":"Journal of Electronic Testing-Theory and Applications","volume":null,"pages":null},"PeriodicalIF":0.9,"publicationDate":"2022-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"44207507","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2022-12-01DOI: 10.1007/s10836-022-06039-2
Praise O. Farayola, Isaac Bruce, Shravan K. Chaganti, Abalhassan Sheikh, S. Ravi, Degang Chen
{"title":"A Polynomial Transform Method for Hardware Systematic Error Identification and Correction in Semiconductor Multi-Site Testing","authors":"Praise O. Farayola, Isaac Bruce, Shravan K. Chaganti, Abalhassan Sheikh, S. Ravi, Degang Chen","doi":"10.1007/s10836-022-06039-2","DOIUrl":"https://doi.org/10.1007/s10836-022-06039-2","url":null,"abstract":"","PeriodicalId":54841,"journal":{"name":"Journal of Electronic Testing-Theory and Applications","volume":null,"pages":null},"PeriodicalIF":0.9,"publicationDate":"2022-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"42253730","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2022-12-01DOI: 10.1007/s10836-022-06037-4
Jean de Dieu Nguimfack-Ndongmo, Kevin Kentsa Zana, D. Asoh, Nicole Adélaïde Kengnou Telem, René Kuaté-Fochie, G. Kenné
{"title":"Development of a Simplified Programming Kit Based 16LF18856 for Embedded Systems Testing and Education in Developing Countries","authors":"Jean de Dieu Nguimfack-Ndongmo, Kevin Kentsa Zana, D. Asoh, Nicole Adélaïde Kengnou Telem, René Kuaté-Fochie, G. Kenné","doi":"10.1007/s10836-022-06037-4","DOIUrl":"https://doi.org/10.1007/s10836-022-06037-4","url":null,"abstract":"","PeriodicalId":54841,"journal":{"name":"Journal of Electronic Testing-Theory and Applications","volume":null,"pages":null},"PeriodicalIF":0.9,"publicationDate":"2022-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"43367326","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2022-12-01DOI: 10.1007/s10836-022-06034-7
R. Naveenkumar, N. M. Sivamangai, A. Napolean, S. Priya
{"title":"Design and Evaluation of XOR Arbiter Physical Unclonable Function and its Implementation on FPGA in Hardware Security Applications","authors":"R. Naveenkumar, N. M. Sivamangai, A. Napolean, S. Priya","doi":"10.1007/s10836-022-06034-7","DOIUrl":"https://doi.org/10.1007/s10836-022-06034-7","url":null,"abstract":"","PeriodicalId":54841,"journal":{"name":"Journal of Electronic Testing-Theory and Applications","volume":null,"pages":null},"PeriodicalIF":0.9,"publicationDate":"2022-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"49530643","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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