Pub Date : 2022-02-01DOI: 10.1007/s10836-022-05987-z
Dengli Bu, Junjie Yan, Pengjie Tang, Haohao Yuan
{"title":"Synthesis of Reversible Circuits with Reduced Nearest-Neighbor Cost Using Kronecker Functional Decision Diagrams","authors":"Dengli Bu, Junjie Yan, Pengjie Tang, Haohao Yuan","doi":"10.1007/s10836-022-05987-z","DOIUrl":"https://doi.org/10.1007/s10836-022-05987-z","url":null,"abstract":"","PeriodicalId":54841,"journal":{"name":"Journal of Electronic Testing-Theory and Applications","volume":null,"pages":null},"PeriodicalIF":0.9,"publicationDate":"2022-02-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"43034492","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2022-01-01DOI: 10.1007/s12529-022-10063-z
V. Krovi
{"title":"2021 Reviewers","authors":"V. Krovi","doi":"10.1007/s12529-022-10063-z","DOIUrl":"https://doi.org/10.1007/s12529-022-10063-z","url":null,"abstract":"","PeriodicalId":54841,"journal":{"name":"Journal of Electronic Testing-Theory and Applications","volume":null,"pages":null},"PeriodicalIF":0.9,"publicationDate":"2022-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"44255553","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2021-12-01DOI: 10.1007/s10836-021-05976-8
Md Toufiq Hasan Anik, Mohammad Ebrahimabadi, J. Danger, S. Guilley, Naghmeh Karimi
{"title":"Reducing Aging Impacts in Digital Sensors via Run-Time Calibration","authors":"Md Toufiq Hasan Anik, Mohammad Ebrahimabadi, J. Danger, S. Guilley, Naghmeh Karimi","doi":"10.1007/s10836-021-05976-8","DOIUrl":"https://doi.org/10.1007/s10836-021-05976-8","url":null,"abstract":"","PeriodicalId":54841,"journal":{"name":"Journal of Electronic Testing-Theory and Applications","volume":null,"pages":null},"PeriodicalIF":0.9,"publicationDate":"2021-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"48461810","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2021-12-01DOI: 10.1007/s10836-021-05983-9
V. Agrawal
{"title":"Editorial","authors":"V. Agrawal","doi":"10.1007/s10836-021-05983-9","DOIUrl":"https://doi.org/10.1007/s10836-021-05983-9","url":null,"abstract":"","PeriodicalId":54841,"journal":{"name":"Journal of Electronic Testing-Theory and Applications","volume":null,"pages":null},"PeriodicalIF":0.9,"publicationDate":"2021-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"47337247","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2021-12-01DOI: 10.1007/s10836-021-05982-w
{"title":"2020 JETTA-TTTC Best Paper Award","authors":"","doi":"10.1007/s10836-021-05982-w","DOIUrl":"https://doi.org/10.1007/s10836-021-05982-w","url":null,"abstract":"","PeriodicalId":54841,"journal":{"name":"Journal of Electronic Testing-Theory and Applications","volume":null,"pages":null},"PeriodicalIF":0.9,"publicationDate":"2021-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"42168285","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2021-12-01DOI: 10.1007/s10836-021-05973-x
Zsombor Pethő, Intiyaz Khan, Arpad Torok
{"title":"Analysis of Security Vulnerability Levels of In-Vehicle Network Topologies Applying Graph Representations","authors":"Zsombor Pethő, Intiyaz Khan, Arpad Torok","doi":"10.1007/s10836-021-05973-x","DOIUrl":"https://doi.org/10.1007/s10836-021-05973-x","url":null,"abstract":"","PeriodicalId":54841,"journal":{"name":"Journal of Electronic Testing-Theory and Applications","volume":null,"pages":null},"PeriodicalIF":0.9,"publicationDate":"2021-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"46175498","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2021-12-01DOI: 10.1007/s10836-021-05980-y
S. K. Jena, S. Biswas, J. Deka
{"title":"Retesting Defective Circuits to Allow Acceptable Faults for Yield Enhancement","authors":"S. K. Jena, S. Biswas, J. Deka","doi":"10.1007/s10836-021-05980-y","DOIUrl":"https://doi.org/10.1007/s10836-021-05980-y","url":null,"abstract":"","PeriodicalId":54841,"journal":{"name":"Journal of Electronic Testing-Theory and Applications","volume":null,"pages":null},"PeriodicalIF":0.9,"publicationDate":"2021-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"49549292","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2021-12-01DOI: 10.1007/s10836-021-05977-7
Nikolaos Georgoulopoulos, Alkiviadis A. Hatzopoulos
{"title":"Parameterizable Real Number Models for Mixed-Signal Designs Using SystemVerilog","authors":"Nikolaos Georgoulopoulos, Alkiviadis A. Hatzopoulos","doi":"10.1007/s10836-021-05977-7","DOIUrl":"https://doi.org/10.1007/s10836-021-05977-7","url":null,"abstract":"","PeriodicalId":54841,"journal":{"name":"Journal of Electronic Testing-Theory and Applications","volume":null,"pages":null},"PeriodicalIF":0.9,"publicationDate":"2021-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"42682682","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2021-11-19DOI: 10.1007/s10836-021-05974-w
Xiaoyan Yang, Chenglin Yang, Houjun Wang
{"title":"A Test Generation Method of R-2R Digital-to-Analog Converters Based on Genetic Algorithm","authors":"Xiaoyan Yang, Chenglin Yang, Houjun Wang","doi":"10.1007/s10836-021-05974-w","DOIUrl":"https://doi.org/10.1007/s10836-021-05974-w","url":null,"abstract":"","PeriodicalId":54841,"journal":{"name":"Journal of Electronic Testing-Theory and Applications","volume":null,"pages":null},"PeriodicalIF":0.9,"publicationDate":"2021-11-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"46546693","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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