Pub Date : 2022-06-01DOI: 10.1007/s10836-022-06008-9
Bahman Arasteh, Parisa Imanzadeh, K. Arasteh, F. S. Gharehchopogh, Bagher Zarei
{"title":"A Source-code Aware Method for Software Mutation Testing Using Artificial Bee Colony Algorithm","authors":"Bahman Arasteh, Parisa Imanzadeh, K. Arasteh, F. S. Gharehchopogh, Bagher Zarei","doi":"10.1007/s10836-022-06008-9","DOIUrl":"https://doi.org/10.1007/s10836-022-06008-9","url":null,"abstract":"","PeriodicalId":54841,"journal":{"name":"Journal of Electronic Testing-Theory and Applications","volume":"38 1","pages":"289 - 302"},"PeriodicalIF":0.9,"publicationDate":"2022-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"52280954","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2022-06-01DOI: 10.1007/s10836-022-06007-w
Brett Sparkman, S. Smith, J. Di
{"title":"Built-In Self-Test for Multi-Threshold NULL Convention Logic Asynchronous Circuits using Pipeline Stage Parallelism","authors":"Brett Sparkman, S. Smith, J. Di","doi":"10.1007/s10836-022-06007-w","DOIUrl":"https://doi.org/10.1007/s10836-022-06007-w","url":null,"abstract":"","PeriodicalId":54841,"journal":{"name":"Journal of Electronic Testing-Theory and Applications","volume":"38 1","pages":"321 - 334"},"PeriodicalIF":0.9,"publicationDate":"2022-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"43120653","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2022-06-01DOI: 10.1007/s10836-022-06006-x
Wendong Wang, A. Singh, Ujjwal Guin
{"title":"A Systematic Bit Selection Method for Robust SRAM PUFs","authors":"Wendong Wang, A. Singh, Ujjwal Guin","doi":"10.1007/s10836-022-06006-x","DOIUrl":"https://doi.org/10.1007/s10836-022-06006-x","url":null,"abstract":"","PeriodicalId":54841,"journal":{"name":"Journal of Electronic Testing-Theory and Applications","volume":"38 1","pages":"235 - 246"},"PeriodicalIF":0.9,"publicationDate":"2022-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"46309035","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2022-06-01DOI: 10.1007/s10836-022-06009-8
Yindong Xiao, Yutong Zeng, Qiong Wu, Ke Liu, Yanjun Li, Chong Hu
{"title":"Research on Analog Integrated Circuit Test Parameter Set Reduction Based on XGBoost","authors":"Yindong Xiao, Yutong Zeng, Qiong Wu, Ke Liu, Yanjun Li, Chong Hu","doi":"10.1007/s10836-022-06009-8","DOIUrl":"https://doi.org/10.1007/s10836-022-06009-8","url":null,"abstract":"","PeriodicalId":54841,"journal":{"name":"Journal of Electronic Testing-Theory and Applications","volume":"38 1","pages":"279 - 288"},"PeriodicalIF":0.9,"publicationDate":"2022-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"48893647","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2022-06-01DOI: 10.1007/s10836-022-06012-z
Trevor Kroeger, Wei Cheng, J. Danger, S. Guilley, Naghmeh Karimi
{"title":"Cross-PUF Attacks: Targeting FPGA Implementation of Arbiter-PUFs","authors":"Trevor Kroeger, Wei Cheng, J. Danger, S. Guilley, Naghmeh Karimi","doi":"10.1007/s10836-022-06012-z","DOIUrl":"https://doi.org/10.1007/s10836-022-06012-z","url":null,"abstract":"","PeriodicalId":54841,"journal":{"name":"Journal of Electronic Testing-Theory and Applications","volume":"38 1","pages":"261 - 277"},"PeriodicalIF":0.9,"publicationDate":"2022-06-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"46702782","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2022-05-30DOI: 10.1007/s10836-022-06004-z
Kamran Zahid
{"title":"The Detection of Malicious Modifications in the FPGA","authors":"Kamran Zahid","doi":"10.1007/s10836-022-06004-z","DOIUrl":"https://doi.org/10.1007/s10836-022-06004-z","url":null,"abstract":"","PeriodicalId":54841,"journal":{"name":"Journal of Electronic Testing-Theory and Applications","volume":"38 1","pages":"247 - 260"},"PeriodicalIF":0.9,"publicationDate":"2022-05-30","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"45356536","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"An Accurate Estimation Algorithm for Failure Probability of Logic Circuits Using Correlation Separation","authors":"Shuo Cai, Binyong He, Sicheng Wu, Jin Wang, Weizheng Wang, Fei Yu","doi":"10.1007/s10836-022-05996-y","DOIUrl":"https://doi.org/10.1007/s10836-022-05996-y","url":null,"abstract":"","PeriodicalId":54841,"journal":{"name":"Journal of Electronic Testing-Theory and Applications","volume":"38 1","pages":"165 - 180"},"PeriodicalIF":0.9,"publicationDate":"2022-04-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"43996877","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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