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2024 Index IEEE Technology and Society Magazine Vol. 43
IF 2.1 4区 工程技术 Q3 ENGINEERING, ELECTRICAL & ELECTRONIC Pub Date : 2025-01-23 DOI: 10.1109/MTS.2025.3533118
{"title":"2024 Index IEEE Technology and Society Magazine Vol. 43","authors":"","doi":"10.1109/MTS.2025.3533118","DOIUrl":"https://doi.org/10.1109/MTS.2025.3533118","url":null,"abstract":"","PeriodicalId":55016,"journal":{"name":"IEEE Technology and Society Magazine","volume":"43 4","pages":"1-12"},"PeriodicalIF":2.1,"publicationDate":"2025-01-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=10852034","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"143106683","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
From Campus to Market: The Algorithmic Influence on Academic Capitalism 从校园到市场:算法对学术资本主义的影响
IF 2.1 4区 工程技术 Q3 ENGINEERING, ELECTRICAL & ELECTRONIC Pub Date : 2025-01-17 DOI: 10.1109/MTS.2024.3494661
Chan Aristella Lu;Xiaoming Zhai
{"title":"From Campus to Market: The Algorithmic Influence on Academic Capitalism","authors":"Chan Aristella Lu;Xiaoming Zhai","doi":"10.1109/MTS.2024.3494661","DOIUrl":"https://doi.org/10.1109/MTS.2024.3494661","url":null,"abstract":"","PeriodicalId":55016,"journal":{"name":"IEEE Technology and Society Magazine","volume":"43 4","pages":"38-42"},"PeriodicalIF":2.1,"publicationDate":"2025-01-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=10845001","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"143184437","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
IEEE Membership
IF 2.1 4区 工程技术 Q3 ENGINEERING, ELECTRICAL & ELECTRONIC Pub Date : 2025-01-17 DOI: 10.1109/MTS.2024.3522717
{"title":"IEEE Membership","authors":"","doi":"10.1109/MTS.2024.3522717","DOIUrl":"https://doi.org/10.1109/MTS.2024.3522717","url":null,"abstract":"","PeriodicalId":55016,"journal":{"name":"IEEE Technology and Society Magazine","volume":"43 4","pages":"10-10"},"PeriodicalIF":2.1,"publicationDate":"2025-01-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=10844999","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"143183855","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
My Social Implications of Technology
IF 2.1 4区 工程技术 Q3 ENGINEERING, ELECTRICAL & ELECTRONIC Pub Date : 2025-01-17 DOI: 10.1109/MTS.2024.3512694
Luis Kun
{"title":"My Social Implications of Technology","authors":"Luis Kun","doi":"10.1109/MTS.2024.3512694","DOIUrl":"https://doi.org/10.1109/MTS.2024.3512694","url":null,"abstract":"","PeriodicalId":55016,"journal":{"name":"IEEE Technology and Society Magazine","volume":"43 4","pages":"4-10"},"PeriodicalIF":2.1,"publicationDate":"2025-01-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=10845000","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"143184430","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
IEEE Collabratec
IF 2.1 4区 工程技术 Q3 ENGINEERING, ELECTRICAL & ELECTRONIC Pub Date : 2025-01-17 DOI: 10.1109/MTS.2025.3526489
{"title":"IEEE Collabratec","authors":"","doi":"10.1109/MTS.2025.3526489","DOIUrl":"https://doi.org/10.1109/MTS.2025.3526489","url":null,"abstract":"","PeriodicalId":55016,"journal":{"name":"IEEE Technology and Society Magazine","volume":"43 4","pages":"43-43"},"PeriodicalIF":2.1,"publicationDate":"2025-01-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=10845004","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"143184438","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Ethics for People Who Work in Tech—Marc Steen (Boca Raton, FL, USA: CRC Press, 2023, 215 pp.)
IF 2.1 4区 工程技术 Q3 ENGINEERING, ELECTRICAL & ELECTRONIC Pub Date : 2025-01-17 DOI: 10.1109/MTS.2024.3493923
Jacob Ossar
Presents reviews for the following list of books, Ethics for People Who Work in Tech—Marc Steen (Boca Raton, FL, USA: CRC Press, 2023, 215 pp.).
{"title":"Ethics for People Who Work in Tech—Marc Steen (Boca Raton, FL, USA: CRC Press, 2023, 215 pp.)","authors":"Jacob Ossar","doi":"10.1109/MTS.2024.3493923","DOIUrl":"https://doi.org/10.1109/MTS.2024.3493923","url":null,"abstract":"Presents reviews for the following list of books, Ethics for People Who Work in Tech—Marc Steen (Boca Raton, FL, USA: CRC Press, 2023, 215 pp.).","PeriodicalId":55016,"journal":{"name":"IEEE Technology and Society Magazine","volume":"43 4","pages":"50-52"},"PeriodicalIF":2.1,"publicationDate":"2025-01-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=10845011","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"143184179","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
IEEE Foundation
IF 2.1 4区 工程技术 Q3 ENGINEERING, ELECTRICAL & ELECTRONIC Pub Date : 2025-01-17 DOI: 10.1109/MTS.2024.3522791
{"title":"IEEE Foundation","authors":"","doi":"10.1109/MTS.2024.3522791","DOIUrl":"https://doi.org/10.1109/MTS.2024.3522791","url":null,"abstract":"","PeriodicalId":55016,"journal":{"name":"IEEE Technology and Society Magazine","volume":"43 4","pages":"31-31"},"PeriodicalIF":2.1,"publicationDate":"2025-01-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=10845010","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"143184432","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
IEEE Women in Engineering 电气和电子工程师学会工程界妇女
IF 2.1 4区 工程技术 Q3 ENGINEERING, ELECTRICAL & ELECTRONIC Pub Date : 2025-01-17 DOI: 10.1109/MTS.2025.3526487
{"title":"IEEE Women in Engineering","authors":"","doi":"10.1109/MTS.2025.3526487","DOIUrl":"https://doi.org/10.1109/MTS.2025.3526487","url":null,"abstract":"","PeriodicalId":55016,"journal":{"name":"IEEE Technology and Society Magazine","volume":"43 4","pages":"55-55"},"PeriodicalIF":2.1,"publicationDate":"2025-01-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=10845023","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"143184439","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
IEEE App
IF 2.1 4区 工程技术 Q3 ENGINEERING, ELECTRICAL & ELECTRONIC Pub Date : 2025-01-17 DOI: 10.1109/MTS.2024.3522719
{"title":"IEEE App","authors":"","doi":"10.1109/MTS.2024.3522719","DOIUrl":"https://doi.org/10.1109/MTS.2024.3522719","url":null,"abstract":"","PeriodicalId":55016,"journal":{"name":"IEEE Technology and Society Magazine","volume":"43 4","pages":"23-23"},"PeriodicalIF":2.1,"publicationDate":"2025-01-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=10845021","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"143184434","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
What AI Owners Can Learn From Journalism
IF 2.1 4区 工程技术 Q3 ENGINEERING, ELECTRICAL & ELECTRONIC Pub Date : 2025-01-17 DOI: 10.1109/MTS.2024.3515192
Marybeth Sandell
{"title":"What AI Owners Can Learn From Journalism","authors":"Marybeth Sandell","doi":"10.1109/MTS.2024.3515192","DOIUrl":"https://doi.org/10.1109/MTS.2024.3515192","url":null,"abstract":"","PeriodicalId":55016,"journal":{"name":"IEEE Technology and Society Magazine","volume":"43 4","pages":"32-37"},"PeriodicalIF":2.1,"publicationDate":"2025-01-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=10844998","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"143184435","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
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IEEE Technology and Society Magazine
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