Pub Date : 2025-12-18DOI: 10.1109/MTS.2025.3633784
{"title":"IEEE App","authors":"","doi":"10.1109/MTS.2025.3633784","DOIUrl":"https://doi.org/10.1109/MTS.2025.3633784","url":null,"abstract":"","PeriodicalId":55016,"journal":{"name":"IEEE Technology and Society Magazine","volume":"44 4","pages":"82-82"},"PeriodicalIF":1.9,"publicationDate":"2025-12-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=11303447","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"145772078","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2025-12-18DOI: 10.1109/MTS.2025.3625687
A. David Wunsch
Presents reviews for the following list of books, American Poison: A Deadly Invention and the Woman Who Battled for Environmental Justice—Daniel Stone (New York, NY, USA: Dutton Publishers, 2025, 351 pp.).
{"title":"American Poison: A Deadly Invention and the Woman Who Battled for Environmental Justice—Daniel Stone (New York, NY, USA: Dutton Publishers, 2025, 351 pp.)","authors":"A. David Wunsch","doi":"10.1109/MTS.2025.3625687","DOIUrl":"https://doi.org/10.1109/MTS.2025.3625687","url":null,"abstract":"Presents reviews for the following list of books, American Poison: A Deadly Invention and the Woman Who Battled for Environmental Justice—Daniel Stone (New York, NY, USA: Dutton Publishers, 2025, 351 pp.).","PeriodicalId":55016,"journal":{"name":"IEEE Technology and Society Magazine","volume":"44 4","pages":"47-49"},"PeriodicalIF":1.9,"publicationDate":"2025-12-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=11303445","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"145772058","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2025-12-18DOI: 10.1109/MTS.2025.3625686
Nathaniel Knopf
Presents reviews for the following list of books, Everything Is Tuberculosis: The History and Persistence of Our Deadliest Infection—John Green (New York, NY, USA: Crash Course Books, Hardcover Edition, 2025, 208 pp.).
{"title":"Everything Is Tuberculosis: The History and Persistence of Our Deadliest Infection—John Green (New York, NY, USA: Crash Course Books, Hardcover Edition, 2025, 208 pp.)","authors":"Nathaniel Knopf","doi":"10.1109/MTS.2025.3625686","DOIUrl":"https://doi.org/10.1109/MTS.2025.3625686","url":null,"abstract":"Presents reviews for the following list of books, Everything Is Tuberculosis: The History and Persistence of Our Deadliest Infection—John Green (New York, NY, USA: Crash Course Books, Hardcover Edition, 2025, 208 pp.).","PeriodicalId":55016,"journal":{"name":"IEEE Technology and Society Magazine","volume":"44 4","pages":"44-46"},"PeriodicalIF":1.9,"publicationDate":"2025-12-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=11303537","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"145772062","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2025-12-18DOI: 10.1109/MTS.2025.3594385
A. David Wunsch
Presents reviews for the following list of books, Empire of Ruins: American Culture, Photography and the Spectacle of Destruction—Miles Orvell (Oxford, U.K.: Oxford Univ. Press, 2021).
{"title":"Empire of Ruins: American Culture, Photography and the Spectacle of Destruction—Miles Orvell (Oxford, U.K.: Oxford Univ. Press, 2021)","authors":"A. David Wunsch","doi":"10.1109/MTS.2025.3594385","DOIUrl":"https://doi.org/10.1109/MTS.2025.3594385","url":null,"abstract":"Presents reviews for the following list of books, Empire of Ruins: American Culture, Photography and the Spectacle of Destruction—Miles Orvell (Oxford, U.K.: Oxford Univ. Press, 2021).","PeriodicalId":55016,"journal":{"name":"IEEE Technology and Society Magazine","volume":"44 4","pages":"38-40"},"PeriodicalIF":1.9,"publicationDate":"2025-12-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=11303556","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"145772095","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2025-12-18DOI: 10.1109/MTS.2025.3633788
{"title":"IEEE Connects You to a Universe of Information!","authors":"","doi":"10.1109/MTS.2025.3633788","DOIUrl":"https://doi.org/10.1109/MTS.2025.3633788","url":null,"abstract":"","PeriodicalId":55016,"journal":{"name":"IEEE Technology and Society Magazine","volume":"44 4","pages":"21-21"},"PeriodicalIF":1.9,"publicationDate":"2025-12-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=11303448","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"145772074","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2025-12-18DOI: 10.1109/MTS.2025.3604348
Colin Ashruf
In this article, I examine the moral considerations surrounding the practice known as “fake it till you make it (FITYMI)” within the technology business, a phenomenon I have encountered throughout my work as an independent consultant since 2000. I briefly explore methods to counter this practice and restore trust, drawing from approaches I have found effective in practice. The findings presented are based on interviews, personal experience, informal conversations, and literature research.
在这篇文章中,我研究了在技术行业中被称为“fake it until you make it (FITYMI)”的实践的道德考虑,这是我自2000年以来作为独立顾问在工作中遇到的一种现象。我简要地探讨了一些方法来对抗这种做法并恢复信任,这些方法都是我在实践中发现的有效方法。本文的研究结果基于访谈、个人经历、非正式谈话和文献研究。
{"title":"On the Morality of “Fake It Till You Make It” in High-Tech","authors":"Colin Ashruf","doi":"10.1109/MTS.2025.3604348","DOIUrl":"https://doi.org/10.1109/MTS.2025.3604348","url":null,"abstract":"In this article, I examine the moral considerations surrounding the practice known as “fake it till you make it (FITYMI)” within the technology business, a phenomenon I have encountered throughout my work as an independent consultant since 2000. I briefly explore methods to counter this practice and restore trust, drawing from approaches I have found effective in practice. The findings presented are based on interviews, personal experience, informal conversations, and literature research.","PeriodicalId":55016,"journal":{"name":"IEEE Technology and Society Magazine","volume":"44 4","pages":"9-21"},"PeriodicalIF":1.9,"publicationDate":"2025-12-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=11303446","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"145772069","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2025-12-18DOI: 10.1109/MTS.2025.3625689
A. David Wunsch
Presents reviews for the following list of books, A Brief History of Stuff: The Extraordinary Stories of Ordinary Objects—DK, Forward by Nihal Arthanayake (New York, NY, USA: Penguin Random House, 2024, 231 pp.).
{"title":"A Brief History of Stuff: The Extraordinary Stories of Ordinary Objects—DK, Forward by Nihal Arthanayake (New York, NY, USA: Penguin Random House, 2024, 231 pp.)","authors":"A. David Wunsch","doi":"10.1109/MTS.2025.3625689","DOIUrl":"https://doi.org/10.1109/MTS.2025.3625689","url":null,"abstract":"Presents reviews for the following list of books, A Brief History of Stuff: The Extraordinary Stories of Ordinary Objects—DK, Forward by Nihal Arthanayake (New York, NY, USA: Penguin Random House, 2024, 231 pp.).","PeriodicalId":55016,"journal":{"name":"IEEE Technology and Society Magazine","volume":"44 4","pages":"50-52"},"PeriodicalIF":1.9,"publicationDate":"2025-12-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=11303444","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"145772053","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2025-12-18DOI: 10.1109/MTS.2025.3629960
{"title":"Upcoming 2026 SSIT Sponsored and Cosponsored Conferences","authors":"","doi":"10.1109/MTS.2025.3629960","DOIUrl":"https://doi.org/10.1109/MTS.2025.3629960","url":null,"abstract":"","PeriodicalId":55016,"journal":{"name":"IEEE Technology and Society Magazine","volume":"44 4","pages":"C2-C2"},"PeriodicalIF":1.9,"publicationDate":"2025-12-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=11303555","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"145772021","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2025-12-18DOI: 10.1109/MTS.2025.3633790
{"title":"IEEE Membership","authors":"","doi":"10.1109/MTS.2025.3633790","DOIUrl":"https://doi.org/10.1109/MTS.2025.3633790","url":null,"abstract":"","PeriodicalId":55016,"journal":{"name":"IEEE Technology and Society Magazine","volume":"44 4","pages":"5-5"},"PeriodicalIF":1.9,"publicationDate":"2025-12-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=11303538","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"145772100","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2025-11-19DOI: 10.1109/MTS.2025.3628085
V. Sridhar;Amrita Mishra;Asheef Iqubbal
While the fifth-generation (5G) technologies and networks are being deployed worldwide, the global telecom sector is already forecasting the ground-breaking potential of sixth-generation (6G) mobile networks and services that are expected to be standardized by 2030. By offering enhanced human–machine and machine–machine connectivities, with superior low latency and faster speeds than 5G, this next-generation technology is expected to reshape consumer experiences, economies, and societal structures. However, 6G introduces unique challenges, including cybersecurity, privacy, ethical, and responsible use. This article highlights the challenges in these areas by conducting an exhaustive literature survey and interaction with experts in the field. It provides technical and regulatory guidelines to be well-prepared to deploy sustainable and socially beneficial 6G networks and services for the next decade.
{"title":"Social and Ethical Challenges in Future 6G Networks","authors":"V. Sridhar;Amrita Mishra;Asheef Iqubbal","doi":"10.1109/MTS.2025.3628085","DOIUrl":"https://doi.org/10.1109/MTS.2025.3628085","url":null,"abstract":"While the fifth-generation (5G) technologies and networks are being deployed worldwide, the global telecom sector is already forecasting the ground-breaking potential of sixth-generation (6G) mobile networks and services that are expected to be standardized by 2030. By offering enhanced human–machine and machine–machine connectivities, with superior low latency and faster speeds than 5G, this next-generation technology is expected to reshape consumer experiences, economies, and societal structures. However, 6G introduces unique challenges, including cybersecurity, privacy, ethical, and responsible use. This article highlights the challenges in these areas by conducting an exhaustive literature survey and interaction with experts in the field. It provides technical and regulatory guidelines to be well-prepared to deploy sustainable and socially beneficial 6G networks and services for the next decade.","PeriodicalId":55016,"journal":{"name":"IEEE Technology and Society Magazine","volume":"44 4","pages":"93-100"},"PeriodicalIF":1.9,"publicationDate":"2025-11-19","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"145772097","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}