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4区 工程技术 Q4 INSTRUMENTS & INSTRUMENTATION Pub Date : 2023-08-28 DOI: 10.1515/teme-2023-frontmatter9
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引用次数: 0
Investigation of coherence scanning Mirau interferometers with integrated vibration compensation for use in production environments 集成振动补偿的相干扫描Mirau干涉仪在生产环境中的应用研究
IF 1 4区 工程技术 Q4 INSTRUMENTS & INSTRUMENTATION Pub Date : 2023-08-18 DOI: 10.1515/teme-2023-0071
H. Serbes, P. Lehmann
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引用次数: 0
Beschleunigungsmessung als Grundlage für die Strömungsverfolgung in Bioreaktoren mit Sensorpartikeln 对撞机可以随着对撞机分解
IF 1 4区 工程技术 Q4 INSTRUMENTS & INSTRUMENTATION Pub Date : 2023-08-18 DOI: 10.1515/teme-2023-0078
L. Buntkiel, S. Reinecke, U. Hampel
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引用次数: 1
Systematische Simulationsmethode zur effizienten Abschätzung von Unsicherheiten komplexer Messungen – ein Zwischenweg von klassischem GUM und der Monte-Carlo Methode 系统模拟技术用于有效评估复杂测量——这是经典金矿和蒙特卡卡方法的中间部分
IF 1 4区 工程技术 Q4 INSTRUMENTS & INSTRUMENTATION Pub Date : 2023-08-18 DOI: 10.1515/teme-2023-0067
J. Degenhardt, R. Tutsch, G. Dai
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引用次数: 0
Titelei
IF 1 4区 工程技术 Q4 INSTRUMENTS & INSTRUMENTATION Pub Date : 2023-08-18 DOI: 10.1515/teme-2023-fm90s1
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引用次数: 0
Entwicklung von Mikrointerferometern mit Faserkopplung 以纤维产生微波干扰器
IF 1 4区 工程技术 Q4 INSTRUMENTS & INSTRUMENTATION Pub Date : 2023-08-18 DOI: 10.1515/teme-2023-0073
Mingshuai Su, Ingo Ortlepp, U. Gerhardt, D. Dontsov, E. Manske
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引用次数: 0
Development of a Self-X Sensory Electronics for Anomaly Detection and its Conceptual Implementation on an XMR-based Angular Decoder Prototype 用于异常检测的自x传感电子学的发展及其在基于xmr的角解码器原型上的概念实现
IF 1 4区 工程技术 Q4 INSTRUMENTS & INSTRUMENTATION Pub Date : 2023-08-18 DOI: 10.1515/teme-2023-0086
Elena Gerken, Q. Zaman, S. Alraho, A. König
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引用次数: 0
Specklebasierte Charakterisierung anisotroper Oberflächen 基于脂肪的平面化
IF 1 4区 工程技术 Q4 INSTRUMENTS & INSTRUMENTATION Pub Date : 2023-08-18 DOI: 10.1515/teme-2023-0056
León Schweickhardt, Dirk Stöbener, Andreas Fischer
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引用次数: 0
Vibroakustische Strukturierung von Oberflächen mit Zeitumkehrmethode …手和脚的结构构造
IF 1 4区 工程技术 Q4 INSTRUMENTS & INSTRUMENTATION Pub Date : 2023-08-18 DOI: 10.1515/teme-2023-0074
M. Simon, U. Steinmann
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引用次数: 0
Klassifikation von Zeitreihen optischer Sensoren beim Laserschneiden 对光纹进行分类
IF 1 4区 工程技术 Q4 INSTRUMENTS & INSTRUMENTATION Pub Date : 2023-08-18 DOI: 10.1515/teme-2023-0080
Johannes Steffens, Daniel Leyer, M. Heizmann
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引用次数: 0
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Tm-Technisches Messen
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