Pub Date : 2021-01-01DOI: 10.1109/ISSCC42613.2021.9366009
B. Sadhu, M. Bassi, V. Giannini
{"title":"Session 14 Overview: mm-Wave Transceivers for Communication and Radar Wireless Subcommittee","authors":"B. Sadhu, M. Bassi, V. Giannini","doi":"10.1109/ISSCC42613.2021.9366009","DOIUrl":"https://doi.org/10.1109/ISSCC42613.2021.9366009","url":null,"abstract":"","PeriodicalId":6511,"journal":{"name":"2016 IEEE International Solid-State Circuits Conference (ISSCC)","volume":"22 1","pages":"216-217"},"PeriodicalIF":0.0,"publicationDate":"2021-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"72997596","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2021-01-01DOI: 10.1109/ISSCC42613.2021.9365845
Alicia Klinefelter, Huichu Liu, L. Benini, Y. Thonnart, Keith A. Bowman, Kathy Wilcox, D. Bol, Alvin Loke, Ofer Shacham
{"title":"SE2: Going Remote: Challenges and Opportunities to Remote Learning, Work, and Collaboration","authors":"Alicia Klinefelter, Huichu Liu, L. Benini, Y. Thonnart, Keith A. Bowman, Kathy Wilcox, D. Bol, Alvin Loke, Ofer Shacham","doi":"10.1109/ISSCC42613.2021.9365845","DOIUrl":"https://doi.org/10.1109/ISSCC42613.2021.9365845","url":null,"abstract":"","PeriodicalId":6511,"journal":{"name":"2016 IEEE International Solid-State Circuits Conference (ISSCC)","volume":"25 1","pages":"539-540"},"PeriodicalIF":0.0,"publicationDate":"2021-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"74697771","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2021-01-01DOI: 10.1109/ISSCC42613.2021.9365864
M. Nagatani, N. V. Helleputte, Naveen Verma
{"title":"Session 19 Overview: Optical Systems for Emerging Applications Technology Directions Subcommittee","authors":"M. Nagatani, N. V. Helleputte, Naveen Verma","doi":"10.1109/ISSCC42613.2021.9365864","DOIUrl":"https://doi.org/10.1109/ISSCC42613.2021.9365864","url":null,"abstract":"","PeriodicalId":6511,"journal":{"name":"2016 IEEE International Solid-State Circuits Conference (ISSCC)","volume":"30 1","pages":"284-285"},"PeriodicalIF":0.0,"publicationDate":"2021-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"74242741","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2021-01-01DOI: 10.1109/ISSCC42613.2021.9365991
R. Harjani, M. Chen, M. Berkhout, J. V. D. Heuvel, T. H. Lee, R. Staszewski, K. Philips, H. Luong, Vadim Ivanov
{"title":"SE3: Favorite Circuit Design and Testing Mistakes of Starting Engineers","authors":"R. Harjani, M. Chen, M. Berkhout, J. V. D. Heuvel, T. H. Lee, R. Staszewski, K. Philips, H. Luong, Vadim Ivanov","doi":"10.1109/ISSCC42613.2021.9365991","DOIUrl":"https://doi.org/10.1109/ISSCC42613.2021.9365991","url":null,"abstract":"","PeriodicalId":6511,"journal":{"name":"2016 IEEE International Solid-State Circuits Conference (ISSCC)","volume":"3 1","pages":"541-542"},"PeriodicalIF":0.0,"publicationDate":"2021-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"72978170","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2021-01-01DOI: 10.1109/ISSCC42613.2021.9365793
S. Vangal, Long Yan, F. Gianesello
{"title":"Session 12 Overview: Innovations in Low-Power and Secure IoT Technology Directions Subcommittee","authors":"S. Vangal, Long Yan, F. Gianesello","doi":"10.1109/ISSCC42613.2021.9365793","DOIUrl":"https://doi.org/10.1109/ISSCC42613.2021.9365793","url":null,"abstract":"","PeriodicalId":6511,"journal":{"name":"2016 IEEE International Solid-State Circuits Conference (ISSCC)","volume":"35 1","pages":"198-199"},"PeriodicalIF":0.0,"publicationDate":"2021-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"85489518","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2020-02-01DOI: 10.1109/ISSCC19947.2020.9063066
Caspar P. L. van Vroonhoven
Most battery-powered systems require measurement of the battery's state of charge, (SOC). A straightforward way to determine SOC is to keep track of the current flowing in and out of a battery, a method known as coulomb counting. Compared to other methods such as voltage or impedance monitoring, coulomb counting is simple to implement, does not require complex algorithms and is independent of cell chemistry. However, coulomb counters must operate continuously and essentially integrate forever; traditionally, their relatively high power consumption (several tens of µA e.g. [1]–[3]) and susceptibility to drift in the presence of offset have prevented their more widespread use.
{"title":"23.3 A 0-to-60V-Input VCM Coulomb Counter with Signal-Dependent Supply Current and ±0.5% Gain Inaccuracy from -50°C to 125°C","authors":"Caspar P. L. van Vroonhoven","doi":"10.1109/ISSCC19947.2020.9063066","DOIUrl":"https://doi.org/10.1109/ISSCC19947.2020.9063066","url":null,"abstract":"Most battery-powered systems require measurement of the battery's state of charge, (SOC). A straightforward way to determine SOC is to keep track of the current flowing in and out of a battery, a method known as coulomb counting. Compared to other methods such as voltage or impedance monitoring, coulomb counting is simple to implement, does not require complex algorithms and is independent of cell chemistry. However, coulomb counters must operate continuously and essentially integrate forever; traditionally, their relatively high power consumption (several tens of µA e.g. [1]–[3]) and susceptibility to drift in the presence of offset have prevented their more widespread use.","PeriodicalId":6511,"journal":{"name":"2016 IEEE International Solid-State Circuits Conference (ISSCC)","volume":"11 1","pages":"348-350"},"PeriodicalIF":0.0,"publicationDate":"2020-02-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"80910478","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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