Pub Date : 2014-10-01DOI: 10.1109/SMICND.2014.6966444
Valeriu Beiu, M. Tache, F. Kharbash
Noises and variations are ubiquitous, but are ill-understood and in most cases analyzed simplistically, leading to substantial overdesign costs. A novel reliability-centric design method based on unconventionally sizing transistors has been suggested lately. In this paper our aim is to design, simulate, and compare the benefits of unconventional sizing when applied to SRAM bit-cells. The unconventionally sized SRAM bit-cells achieve higher SNMs, having the potential to work correctly at supply voltages lower than those achieved using classically sized SRAM bit-cells.
{"title":"Reliability enhanced SRAM bit-cells","authors":"Valeriu Beiu, M. Tache, F. Kharbash","doi":"10.1109/SMICND.2014.6966444","DOIUrl":"https://doi.org/10.1109/SMICND.2014.6966444","url":null,"abstract":"Noises and variations are ubiquitous, but are ill-understood and in most cases analyzed simplistically, leading to substantial overdesign costs. A novel reliability-centric design method based on unconventionally sizing transistors has been suggested lately. In this paper our aim is to design, simulate, and compare the benefits of unconventional sizing when applied to SRAM bit-cells. The unconventionally sized SRAM bit-cells achieve higher SNMs, having the potential to work correctly at supply voltages lower than those achieved using classically sized SRAM bit-cells.","PeriodicalId":6616,"journal":{"name":"2014 International Semiconductor Conference (CAS)","volume":"112 1","pages":"229-232"},"PeriodicalIF":0.0,"publicationDate":"2014-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"75861819","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2014-10-01DOI: 10.1109/SMICND.2014.6966403
M. Andrei, G. Buica, M. Burlibașa, D. Gheorghe, C. Pȋrvu
The paper aims on microfabrication and corrosion processes evaluation of three different metal-ceramic crowns with CoCrMo substructures. The samples have different exposed metal surface and the electrochemical investigations are Tafel analysis and Electrochemical Impedance Spectroscopy (EIS).
{"title":"Monitoring on short-term the corrosion processes of three different metal-ceramic crowns","authors":"M. Andrei, G. Buica, M. Burlibașa, D. Gheorghe, C. Pȋrvu","doi":"10.1109/SMICND.2014.6966403","DOIUrl":"https://doi.org/10.1109/SMICND.2014.6966403","url":null,"abstract":"The paper aims on microfabrication and corrosion processes evaluation of three different metal-ceramic crowns with CoCrMo substructures. The samples have different exposed metal surface and the electrochemical investigations are Tafel analysis and Electrochemical Impedance Spectroscopy (EIS).","PeriodicalId":6616,"journal":{"name":"2014 International Semiconductor Conference (CAS)","volume":"5 1","pages":"99-102"},"PeriodicalIF":0.0,"publicationDate":"2014-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"79066841","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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