Pub Date : 1992-01-01DOI: 10.1109/ISEMC.1992.626107
B. Livshits, K. Harpell
Aktract-This paper presents results of the characterization of five different, qualified Open Area Test Sites (OATS). These sites were evaluated using the site attenuation procedure from MP-4 [l] and a large EUT. Significant deviations in the emissions levels from the EUT were observed. These were found to correlate with the deviation in the height of the receive antenna in the site attenuation procedure relative to the theoretical height. It is recommended that the deviation of the receiver antenna elevation be calculated during site attenuation measurements. . This parameter may be used to quantify the anomalies of the OATS, give an objective measure of site to site repeatability and validate the volumetric site attenuation process.
{"title":"Note To The Open Field Site Characterization","authors":"B. Livshits, K. Harpell","doi":"10.1109/ISEMC.1992.626107","DOIUrl":"https://doi.org/10.1109/ISEMC.1992.626107","url":null,"abstract":"Aktract-This paper presents results of the characterization of five different, qualified Open Area Test Sites (OATS). These sites were evaluated using the site attenuation procedure from MP-4 [l] and a large EUT. Significant deviations in the emissions levels from the EUT were observed. These were found to correlate with the deviation in the height of the receive antenna in the site attenuation procedure relative to the theoretical height. It is recommended that the deviation of the receiver antenna elevation be calculated during site attenuation measurements. . This parameter may be used to quantify the anomalies of the OATS, give an objective measure of site to site repeatability and validate the volumetric site attenuation process.","PeriodicalId":93568,"journal":{"name":"IEEE International Symposium on Electromagnetic Compatibility : [proceedings]. IEEE International Symposium on Electromagnetic Compatibility","volume":"19 1","pages":"352-355"},"PeriodicalIF":0.0,"publicationDate":"1992-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"82067090","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1992-01-01DOI: 10.1109/ISEMC.1992.626092
R. Guirado, M. Valcarcel, J. Carpio, F. Garnacho, A. Valladolid
In this paper the results of the comparison between three different discontinuous interference measuring devices, used in household appliances and similar testing, are shown. Conclusions are made with respect to the device under test, test times, reliability and equipment costs. The basic configuration of these equipment are: CISPR standard measuring receiver and oscilloscope, CISPR standard measuring receiver and automatic discontinuous interference analyzer and spectrum analyzer and automatic discontinuous interference analyzer.
{"title":"EMC Conducteyi Interference Clicks Produced By Household Appliances And Similars. Comparison Between Different Measuring Devices.","authors":"R. Guirado, M. Valcarcel, J. Carpio, F. Garnacho, A. Valladolid","doi":"10.1109/ISEMC.1992.626092","DOIUrl":"https://doi.org/10.1109/ISEMC.1992.626092","url":null,"abstract":"In this paper the results of the comparison between three different discontinuous interference measuring devices, used in household appliances and similar testing, are shown. Conclusions are made with respect to the device under test, test times, reliability and equipment costs. The basic configuration of these equipment are: CISPR standard measuring receiver and oscilloscope, CISPR standard measuring receiver and automatic discontinuous interference analyzer and spectrum analyzer and automatic discontinuous interference analyzer.","PeriodicalId":93568,"journal":{"name":"IEEE International Symposium on Electromagnetic Compatibility : [proceedings]. IEEE International Symposium on Electromagnetic Compatibility","volume":"66 1","pages":"269-273"},"PeriodicalIF":0.0,"publicationDate":"1992-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"87457084","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1992-01-01DOI: 10.1109/ISEMC.1992.626055
G. Koepke, L. D. Driver, K. Cavcey, Keith D. Masterson, R. Johnk, Motohisa Kanda
We have developed a spherical dipole electromagnetic source that can be characterized both by theory and experiment and integrated into modern automated test systems. The frequency and amplitude of the radiated electromagnetic field are established remotely using a signal generator. This signal and all other control features are transmitted to and from the sphere using optical fiber cable. The field measurements show good agreement with predictions over much of the frequency band.
{"title":"New spherical dipole source","authors":"G. Koepke, L. D. Driver, K. Cavcey, Keith D. Masterson, R. Johnk, Motohisa Kanda","doi":"10.1109/ISEMC.1992.626055","DOIUrl":"https://doi.org/10.1109/ISEMC.1992.626055","url":null,"abstract":"We have developed a spherical dipole electromagnetic source that can be characterized both by theory and experiment and integrated into modern automated test systems. The frequency and amplitude of the radiated electromagnetic field are established remotely using a signal generator. This signal and all other control features are transmitted to and from the sphere using optical fiber cable. The field measurements show good agreement with predictions over much of the frequency band.","PeriodicalId":93568,"journal":{"name":"IEEE International Symposium on Electromagnetic Compatibility : [proceedings]. IEEE International Symposium on Electromagnetic Compatibility","volume":"31 1","pages":"98-105"},"PeriodicalIF":0.0,"publicationDate":"1992-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"76619012","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1992-01-01DOI: 10.1109/ISEMC.1992.626083
J. DeMarinis
Evolving standards (ie: ANSI '263.4) regarding the qualification of Radiated EM1 Test Sites could cause the disqualification of many existing test facilities. A solution is needed, which is both technically and economically sound. This paper suggests that the present criteria for Radiated EM1 Test Site acceptance based on absolute limits of Normalized Site Attenuation (NSA) error, could be replaced by the concept of a Safety Factor (or Site Uncertainty Factor) derived from statistical processing of Volumetric NSA data. Among the issues explored, are repeatability of Volumetric NSA measurements and an examination of the robustness of various statistical processing algorithms under the stress of NSA measurement variability. A specific algorithm is recommended.
{"title":"Ualification Of Radiated EMI Test Sites Using Statistical Methods","authors":"J. DeMarinis","doi":"10.1109/ISEMC.1992.626083","DOIUrl":"https://doi.org/10.1109/ISEMC.1992.626083","url":null,"abstract":"Evolving standards (ie: ANSI '263.4) regarding the qualification of Radiated EM1 Test Sites could cause the disqualification of many existing test facilities. A solution is needed, which is both technically and economically sound. This paper suggests that the present criteria for Radiated EM1 Test Site acceptance based on absolute limits of Normalized Site Attenuation (NSA) error, could be replaced by the concept of a Safety Factor (or Site Uncertainty Factor) derived from statistical processing of Volumetric NSA data. Among the issues explored, are repeatability of Volumetric NSA measurements and an examination of the robustness of various statistical processing algorithms under the stress of NSA measurement variability. A specific algorithm is recommended.","PeriodicalId":93568,"journal":{"name":"IEEE International Symposium on Electromagnetic Compatibility : [proceedings]. IEEE International Symposium on Electromagnetic Compatibility","volume":"10 1","pages":"226-228"},"PeriodicalIF":0.0,"publicationDate":"1992-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"72867633","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1992-01-01DOI: 10.1109/ISEMC.1992.626090
B. Archambeault, M. Seth
The lack of a standard emission source make shielding effectiveness measurements difficult to perform with any degree of repeatability. This lack of repeatability tends to make EM1 engineers reluctant to place too much reliance on shielding effectiveness measurements. This paper describes a new standard radiator that can be used in making shielding effectiveness measurements that are repeatable. This source is physically small, battery powered, and operates over a frequency range of 10 MHz to >1 GHz. The radiator produces a standard dipole radiation pattern, and radiates sufficient energy to test most shielded enclosures. Introduction The need to predict the performance of an EM1 shielded device has become more important than ever. As the speed of computers and other devices increase, existing 'rule-of-thumb' shielding designs are no longer sufficient. Traditional methods to quantify the effectiveness of designs to control EM1 are becoming outmoded. One of the major contributors to this problem is measuring the performance of shielded enclosures or boxes. It is becoming accepted throughout the industry that shielding effectiveness measurements have limited use. However, shielding effectiveness measurements continue to be used by many people as a measure of 'goodness' of a particular shielded enclosure or box. This paper will describe a new standard source that may be used in evaluating the shielding effectiveness of enclosures. It will also discuss some of the problems associated with shielding effectiveness measurements and show how this new radiator improves the the repeatability of measurements. This new standard radiator was developed 'ointly between the National Institute of Standards and Tecknology (NIST), the U.S. Navy, and Digital Equipment Corporation. This new radiator is physically small (IO cm diameter), battery operated, operates over a frequency range of 10 MHz to above 1 GHz, and has no metal connection between the radiator element and the control unit. Di ita1 has successfully used this radiator to correlate the &AI performance changes with enclosure modifications, for both large and small enclosures. Shieldina Effectiveness The term 'Shielding Effectiveness' is commonly misused by most engineers and managers. Shielding effectiveness is really a relative term, having meaning only when Mark Seth Seth Industries, Inc. two similar constructions are compared. Unfortunately, they have become very familiar with the term, and they feel very comfortable using shielding effectiveness values without considering the difference between the tested configuration and the target configuration. It is not uncommon for an engineer to measure the radiation from a particular circuit board, note the difference between the received level and the desired limit, and decide on the number of dB of shielding effectiveness needed to meet the desired limit. Since the presence of the shield will change the radiation source characteristics, and since the shieldi
{"title":"A New Standard Radiator For Shielding Effectiveness Measurements","authors":"B. Archambeault, M. Seth","doi":"10.1109/ISEMC.1992.626090","DOIUrl":"https://doi.org/10.1109/ISEMC.1992.626090","url":null,"abstract":"The lack of a standard emission source make shielding effectiveness measurements difficult to perform with any degree of repeatability. This lack of repeatability tends to make EM1 engineers reluctant to place too much reliance on shielding effectiveness measurements. This paper describes a new standard radiator that can be used in making shielding effectiveness measurements that are repeatable. This source is physically small, battery powered, and operates over a frequency range of 10 MHz to >1 GHz. The radiator produces a standard dipole radiation pattern, and radiates sufficient energy to test most shielded enclosures. Introduction The need to predict the performance of an EM1 shielded device has become more important than ever. As the speed of computers and other devices increase, existing 'rule-of-thumb' shielding designs are no longer sufficient. Traditional methods to quantify the effectiveness of designs to control EM1 are becoming outmoded. One of the major contributors to this problem is measuring the performance of shielded enclosures or boxes. It is becoming accepted throughout the industry that shielding effectiveness measurements have limited use. However, shielding effectiveness measurements continue to be used by many people as a measure of 'goodness' of a particular shielded enclosure or box. This paper will describe a new standard source that may be used in evaluating the shielding effectiveness of enclosures. It will also discuss some of the problems associated with shielding effectiveness measurements and show how this new radiator improves the the repeatability of measurements. This new standard radiator was developed 'ointly between the National Institute of Standards and Tecknology (NIST), the U.S. Navy, and Digital Equipment Corporation. This new radiator is physically small (IO cm diameter), battery operated, operates over a frequency range of 10 MHz to above 1 GHz, and has no metal connection between the radiator element and the control unit. Di ita1 has successfully used this radiator to correlate the &AI performance changes with enclosure modifications, for both large and small enclosures. Shieldina Effectiveness The term 'Shielding Effectiveness' is commonly misused by most engineers and managers. Shielding effectiveness is really a relative term, having meaning only when Mark Seth Seth Industries, Inc. two similar constructions are compared. Unfortunately, they have become very familiar with the term, and they feel very comfortable using shielding effectiveness values without considering the difference between the tested configuration and the target configuration. It is not uncommon for an engineer to measure the radiation from a particular circuit board, note the difference between the received level and the desired limit, and decide on the number of dB of shielding effectiveness needed to meet the desired limit. Since the presence of the shield will change the radiation source characteristics, and since the shieldi","PeriodicalId":93568,"journal":{"name":"IEEE International Symposium on Electromagnetic Compatibility : [proceedings]. IEEE International Symposium on Electromagnetic Compatibility","volume":"1 1","pages":"256-265"},"PeriodicalIF":0.0,"publicationDate":"1992-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"85501522","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1992-01-01DOI: 10.1109/ISEMC.1992.626145
T.J. Ritenour, F. Gisin
Mean Time Between Undesired Response (MTBUR) is a statistically based figure of merit that quantitatively defines how well a product will perform in a given operating environment. It represents a fundamental departure from the more traditional methods of interpreting ESD test results (e.g. IEC 801-2) where a fixed number of simulated discharges are used to determine compliance. This paper examines how the probabilistic aspects of ESD events, variations in product responses to ESD events, and statistical sampling methods are used in Method B of the new ANSI C63.16-1991 ESD test guide to obtain a product's MTBUR. Examples of results from actual product tests are used to show how Method B is used to find MTBUR.
平均不良反应间隔时间(Mean Time Between unexpected Response, MTBUR)是一个基于统计的价值指标，它定量地定义了产品在给定操作环境中的表现。它从根本上背离了更传统的解释ESD测试结果的方法(例如IEC 801-2)，其中使用固定数量的模拟放电来确定合规性。本文研究了如何在新的ANSI C63.16-1991 ESD测试指南的方法B中使用ESD事件的概率方面，产品对ESD事件的响应变化以及统计抽样方法来获得产品的MTBUR。本文使用实际产品测试结果的示例来说明如何使用方法B来查找MTBUR。
{"title":"Performing statistical ESD tests using the new ANSI C63.1 6-1991 guide for ESD test methodologies","authors":"T.J. Ritenour, F. Gisin","doi":"10.1109/ISEMC.1992.626145","DOIUrl":"https://doi.org/10.1109/ISEMC.1992.626145","url":null,"abstract":"Mean Time Between Undesired Response (MTBUR) is a statistically based figure of merit that quantitatively defines how well a product will perform in a given operating environment. It represents a fundamental departure from the more traditional methods of interpreting ESD test results (e.g. IEC 801-2) where a fixed number of simulated discharges are used to determine compliance. This paper examines how the probabilistic aspects of ESD events, variations in product responses to ESD events, and statistical sampling methods are used in Method B of the new ANSI C63.16-1991 ESD test guide to obtain a product's MTBUR. Examples of results from actual product tests are used to show how Method B is used to find MTBUR.","PeriodicalId":93568,"journal":{"name":"IEEE International Symposium on Electromagnetic Compatibility : [proceedings]. IEEE International Symposium on Electromagnetic Compatibility","volume":"14 1","pages":"464-468"},"PeriodicalIF":0.0,"publicationDate":"1992-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"85146697","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1992-01-01DOI: 10.1109/isemc.1992.626139
S. Zaky, K. Balmain, G. Dubois
The concept of susceptibility mapping is introduced. A susceptibility map is created by scanning a signal source (loop antenna) over a circuit board, and at each point raising the signal level until failure occurs. Maps obtained with CW EM1 reveal design problems such as tight circuit timing or small static noise margins. They also reveal manufacturing problems, such as bad contacts and faulty chips. This leads to the concept of electromagnetic stress testing. Maps obtained with transient EM1 require tight synchronization for repeatability and are useful in studying specific software-dependent failures.
{"title":"Susceptibility Mapping","authors":"S. Zaky, K. Balmain, G. Dubois","doi":"10.1109/isemc.1992.626139","DOIUrl":"https://doi.org/10.1109/isemc.1992.626139","url":null,"abstract":"The concept of susceptibility mapping is introduced. A susceptibility map is created by scanning a signal source (loop antenna) over a circuit board, and at each point raising the signal level until failure occurs. Maps obtained with CW EM1 reveal design problems such as tight circuit timing or small static noise margins. They also reveal manufacturing problems, such as bad contacts and faulty chips. This leads to the concept of electromagnetic stress testing. Maps obtained with transient EM1 require tight synchronization for repeatability and are useful in studying specific software-dependent failures.","PeriodicalId":93568,"journal":{"name":"IEEE International Symposium on Electromagnetic Compatibility : [proceedings]. IEEE International Symposium on Electromagnetic Compatibility","volume":"9 1","pages":"439-442"},"PeriodicalIF":0.0,"publicationDate":"1992-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"85301494","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1992-01-01DOI: 10.1109/ISEMC.1992.626100
L. Hoeft, J. Hofstra
The surface transfer impedance of multi-wire cables and cable assemblies can be measured using techniques that are adaptations of those used to characterize simple coaxial samples. Surface transfer impedance measurements of multi-wire cables are generally less ideal than those of simple coaxial samples, but they are generally adequate for characterizing the overall quality of the cable's shield. At low frequencies or when the sample is electrically short, the measurements of multi-wire cable assemblies are equivalent to simpler samples. Geometric and material nonuniformities introduce uncertainties in the high frequency measurements. Since multi-wire cables have many possible configurations, it is important to remember to measure the properties of the shield, not the wires.
{"title":"Measurement Of Surface Transfer Impedance Of Multi-wire Cables, Connectors And Cable Assemblies","authors":"L. Hoeft, J. Hofstra","doi":"10.1109/ISEMC.1992.626100","DOIUrl":"https://doi.org/10.1109/ISEMC.1992.626100","url":null,"abstract":"The surface transfer impedance of multi-wire cables and cable assemblies can be measured using techniques that are adaptations of those used to characterize simple coaxial samples. Surface transfer impedance measurements of multi-wire cables are generally less ideal than those of simple coaxial samples, but they are generally adequate for characterizing the overall quality of the cable's shield. At low frequencies or when the sample is electrically short, the measurements of multi-wire cable assemblies are equivalent to simpler samples. Geometric and material nonuniformities introduce uncertainties in the high frequency measurements. Since multi-wire cables have many possible configurations, it is important to remember to measure the properties of the shield, not the wires.","PeriodicalId":93568,"journal":{"name":"IEEE International Symposium on Electromagnetic Compatibility : [proceedings]. IEEE International Symposium on Electromagnetic Compatibility","volume":"75 1","pages":"308-314"},"PeriodicalIF":0.0,"publicationDate":"1992-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"82304667","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1992-01-01DOI: 10.1109/ISEMC.1992.626151
H. Garn, W. Mullner, H. Kremser
We lhave investigated possible sources of uncertainties in antenna Iictors determined per ANSI C63.S. standard site method. Errors (:ai pnrticularly occur due to height-dependent antenna factors in the r'requericy ratige o f 30-200 MHz. Suggested improvements iiiclude I he use of i i n "antenna 2" having a height-independent antenna factor. selection of the assignment of "antenna 1 ". "2" and "3" to the iiiitenna under calibration directed to the specific application. tletei~tnination of antenn;i factors as functions of polarization and height above ground. and use of higher frequency resolution.
我们已经调查了根据ANSI C63.S确定的天线矢量中可能的不确定性来源。标准现场方法。在频率范围为30- 200mhz的情况下，高度相关的天线因素尤其会产生误差。建议的改进包括在具有与高度无关的天线因子的“天线2”中使用I I I。选择“天线1”的分配。“2”和“3”到被校准的天线，指向特定的应用。天线的偏振度。偏振度和离地高度的函数。并使用更高的频率分辨率。
{"title":"A critical evaluation of uncertainties associated with the ANSI C63.5 antenna calibration method and a proposal for improvements","authors":"H. Garn, W. Mullner, H. Kremser","doi":"10.1109/ISEMC.1992.626151","DOIUrl":"https://doi.org/10.1109/ISEMC.1992.626151","url":null,"abstract":"We lhave investigated possible sources of uncertainties in antenna Iictors determined per ANSI C63.S. standard site method. Errors (:ai pnrticularly occur due to height-dependent antenna factors in the r'requericy ratige o f 30-200 MHz. Suggested improvements iiiclude I he use of i i n \"antenna 2\" having a height-independent antenna factor. selection of the assignment of \"antenna 1 \". \"2\" and \"3\" to the iiiitenna under calibration directed to the specific application. tletei~tnination of antenn;i factors as functions of polarization and height above ground. and use of higher frequency resolution.","PeriodicalId":93568,"journal":{"name":"IEEE International Symposium on Electromagnetic Compatibility : [proceedings]. IEEE International Symposium on Electromagnetic Compatibility","volume":"46 1","pages":"485-490"},"PeriodicalIF":0.0,"publicationDate":"1992-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"90041794","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1992-01-01DOI: 10.1109/ISEMC.1992.626154
A. Bhattacharyya
The problem of transient electromagnetic scattering from a plane wedge with arbitrary impedances on the two faces is addressed in this presentation. Analytical formulations have been developed for the transient response of the wedge based on the time-domain version of the frequency domain diffraction coefficient for the wedge with two face impedances originally presented by Tiberio and his coworkers (1985). The bistatic fields due to such an impedance weldge have been plotted for arbitrary wedge angles, polarizations and surface impedances. The special case of time domain scattering of the impedance half plane, impedance full plane and an impedance right-angled wedge have also been treated. The analysis has been applied in a practical example of time domain scattering from a two-face impedance and a coated plate.
{"title":"Transient Response Of A Wedge With Two-face Impedances: A Uniform Time-donfafn GTD Solution And Applications","authors":"A. Bhattacharyya","doi":"10.1109/ISEMC.1992.626154","DOIUrl":"https://doi.org/10.1109/ISEMC.1992.626154","url":null,"abstract":"The problem of transient electromagnetic scattering from a plane wedge with arbitrary impedances on the two faces is addressed in this presentation. Analytical formulations have been developed for the transient response of the wedge based on the time-domain version of the frequency domain diffraction coefficient for the wedge with two face impedances originally presented by Tiberio and his coworkers (1985). The bistatic fields due to such an impedance weldge have been plotted for arbitrary wedge angles, polarizations and surface impedances. The special case of time domain scattering of the impedance half plane, impedance full plane and an impedance right-angled wedge have also been treated. The analysis has been applied in a practical example of time domain scattering from a two-face impedance and a coated plate.","PeriodicalId":93568,"journal":{"name":"IEEE International Symposium on Electromagnetic Compatibility : [proceedings]. IEEE International Symposium on Electromagnetic Compatibility","volume":"33 1","pages":"499-502"},"PeriodicalIF":0.0,"publicationDate":"1992-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"89224697","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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