Pub Date : 1900-01-01DOI: 10.1109/ICEMIC.1999.871637
R. Ganesan, S.K. Das, K. R. Kini
This paper describes the criticality in quantifying the electrical parameters of ESD, EFT and High Energy Surge simulators. It also addresses the effort taken by SAMEER-CEM in establishing an in-house calibration facility with a Custom Oriented Calibration Program for calibrating the specialized EMC Test and Measuring Equipments in line with the requirement of ISO 9000 certification. It also highlights the importance of setting up a National Calibration Laboratory at SAMEER-CEM, Chennai to calibrate all the specialized EMC Test and Measuring Equipments held by various EMC test laboratories across the country.
{"title":"Calibration of transient EMI simulators","authors":"R. Ganesan, S.K. Das, K. R. Kini","doi":"10.1109/ICEMIC.1999.871637","DOIUrl":"https://doi.org/10.1109/ICEMIC.1999.871637","url":null,"abstract":"This paper describes the criticality in quantifying the electrical parameters of ESD, EFT and High Energy Surge simulators. It also addresses the effort taken by SAMEER-CEM in establishing an in-house calibration facility with a Custom Oriented Calibration Program for calibrating the specialized EMC Test and Measuring Equipments in line with the requirement of ISO 9000 certification. It also highlights the importance of setting up a National Calibration Laboratory at SAMEER-CEM, Chennai to calibrate all the specialized EMC Test and Measuring Equipments held by various EMC test laboratories across the country.","PeriodicalId":104361,"journal":{"name":"Proceedings of the International Conference on Electromagnetic Interference and Compatibility","volume":"96 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128590843","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1900-01-01DOI: 10.1109/ICEMIC.1999.871590
R. Sairam
This paper describes the techniques employed for hardening electronic subsystems/systems to meet stringent emission standards, both conducted and radiated, and also highlights some of the EMC solutions in hardening against electrostatic discharge and radiated susceptibility. Signal processor is used to detect and track in both range and angle and feeds errors to a stabilisation system. This paper deals with the hardening of signal processor subsystem to meet Mil-standards for conducted and radiated emission limits.
{"title":"EMI hardening of signal processor subsystem to meet military standard (a case study)","authors":"R. Sairam","doi":"10.1109/ICEMIC.1999.871590","DOIUrl":"https://doi.org/10.1109/ICEMIC.1999.871590","url":null,"abstract":"This paper describes the techniques employed for hardening electronic subsystems/systems to meet stringent emission standards, both conducted and radiated, and also highlights some of the EMC solutions in hardening against electrostatic discharge and radiated susceptibility. Signal processor is used to detect and track in both range and angle and feeds errors to a stabilisation system. This paper deals with the hardening of signal processor subsystem to meet Mil-standards for conducted and radiated emission limits.","PeriodicalId":104361,"journal":{"name":"Proceedings of the International Conference on Electromagnetic Interference and Compatibility","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115327428","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1900-01-01DOI: 10.1109/ICEMIC.1999.871613
V. Rajan, K. Raju
This paper concentrates on the phenomena of cross-talk that takes place in the densely packed microstrip transmission line like structures encountered in VLSI systems. A sensitivity analysis is performed for the normalized inter-layer unbalanced cross-talk voltage with respect to all the dimensional parameters on which it depends and the corresponding sensitivity curves plotted. Based on the calculations and resulting figures, conclusions are drawn for minimizing the cross-talk. The role of the dielectric constant of the substrate in the cross-talk is also mentioned and the ways to minimize cross-talk are discussed.
{"title":"Sensitivity analysis of the cross-talk in microstrip transmission lines","authors":"V. Rajan, K. Raju","doi":"10.1109/ICEMIC.1999.871613","DOIUrl":"https://doi.org/10.1109/ICEMIC.1999.871613","url":null,"abstract":"This paper concentrates on the phenomena of cross-talk that takes place in the densely packed microstrip transmission line like structures encountered in VLSI systems. A sensitivity analysis is performed for the normalized inter-layer unbalanced cross-talk voltage with respect to all the dimensional parameters on which it depends and the corresponding sensitivity curves plotted. Based on the calculations and resulting figures, conclusions are drawn for minimizing the cross-talk. The role of the dielectric constant of the substrate in the cross-talk is also mentioned and the ways to minimize cross-talk are discussed.","PeriodicalId":104361,"journal":{"name":"Proceedings of the International Conference on Electromagnetic Interference and Compatibility","volume":"34 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115433889","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1900-01-01DOI: 10.1109/ICEMIC.1999.871607
A. Bhattacharya, A. Chakraborty
The active admittance of an electronically scanned antenna fluctuates widely with scan angle, particularly at the onset of grating lobe. To stabilise the antenna against such fluctuations, dielectric inserts are plugged inside the array elements. Due to mutual coupling the element pattern of each element changes dynamically at scan. The whole problem is analysed by finding the overall scattering matrix of the entire structure by employing the method of moments and finding thereby the exact aperture field corresponding to every beamshape and scan angle. This model is suitable to stabilise the antenna admittance against wide scan and synthesis of any desired beam shape.
{"title":"EMI modeling of dielectric plugged waveguide array in the perspective of WAIM","authors":"A. Bhattacharya, A. Chakraborty","doi":"10.1109/ICEMIC.1999.871607","DOIUrl":"https://doi.org/10.1109/ICEMIC.1999.871607","url":null,"abstract":"The active admittance of an electronically scanned antenna fluctuates widely with scan angle, particularly at the onset of grating lobe. To stabilise the antenna against such fluctuations, dielectric inserts are plugged inside the array elements. Due to mutual coupling the element pattern of each element changes dynamically at scan. The whole problem is analysed by finding the overall scattering matrix of the entire structure by employing the method of moments and finding thereby the exact aperture field corresponding to every beamshape and scan angle. This model is suitable to stabilise the antenna admittance against wide scan and synthesis of any desired beam shape.","PeriodicalId":104361,"journal":{"name":"Proceedings of the International Conference on Electromagnetic Interference and Compatibility","volume":"16 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116244644","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1900-01-01DOI: 10.1109/ICEMIC.1999.871686
P. Ron
This article discusses briefly the characteristics of intense electromagnetic pulses (EMP) vis NEMP, SGEMP and IIPM vis-a-vis their vulnerable effects on electronics systems and protection technology involving electromagnetic shielding and fast surge suppressors. The salient features of intense EMP simulators for the laboratory testing of electronics systems are also covered. Intense pulse power systems with capabilities for generation of electrical pulses of short durations with peak powers at multi-gigawatts are required as energy sources for the generation of intense EMP. The typical electrical pulse parameters are 0.1-10 MV, 10-100 ns and 0.1 GW-100 TW. This article discusses at some depth the concepts and techniques involved in the design and construction of intense pulse power sources viz: primary capacitor storage, primary-intermediate capacitor storage, primary-intermediate-fast capacitor storage, primary inductor storage, cascaded inductor storage, magnetic pulse compression, inductive cavity cell multiplier and induction linac.
{"title":"Configurations of intense pulse power systems for generation of intense electromagnetic pulses","authors":"P. Ron","doi":"10.1109/ICEMIC.1999.871686","DOIUrl":"https://doi.org/10.1109/ICEMIC.1999.871686","url":null,"abstract":"This article discusses briefly the characteristics of intense electromagnetic pulses (EMP) vis NEMP, SGEMP and IIPM vis-a-vis their vulnerable effects on electronics systems and protection technology involving electromagnetic shielding and fast surge suppressors. The salient features of intense EMP simulators for the laboratory testing of electronics systems are also covered. Intense pulse power systems with capabilities for generation of electrical pulses of short durations with peak powers at multi-gigawatts are required as energy sources for the generation of intense EMP. The typical electrical pulse parameters are 0.1-10 MV, 10-100 ns and 0.1 GW-100 TW. This article discusses at some depth the concepts and techniques involved in the design and construction of intense pulse power sources viz: primary capacitor storage, primary-intermediate capacitor storage, primary-intermediate-fast capacitor storage, primary inductor storage, cascaded inductor storage, magnetic pulse compression, inductive cavity cell multiplier and induction linac.","PeriodicalId":104361,"journal":{"name":"Proceedings of the International Conference on Electromagnetic Interference and Compatibility","volume":"62 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124918404","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1900-01-01DOI: 10.1109/ICEMIC.1999.871603
K. Ravindra, A. D. Sarma
This paper deals with the modelling of mobile signals propagated through, around and reflected from buildings and other structures common to a city in the near field region. In the modelling, upper microwave and lower mm wave propagation data available in the open literature at frequencies 9.6, 28.8 and 57.6 GHz are considered. A strong interference zone has been noticed in the near field region from 0.2 to 0.6 km. Three methods are proposed to predict the path loss to validate data in the near field region. The results predicted from the simulations are well compared with measured data. The standard deviations of the predictions made by these models in the near field region are within 7 dB at all three frequencies.
{"title":"Modelling path loss in the near field region for cm and mm wave mobile communication","authors":"K. Ravindra, A. D. Sarma","doi":"10.1109/ICEMIC.1999.871603","DOIUrl":"https://doi.org/10.1109/ICEMIC.1999.871603","url":null,"abstract":"This paper deals with the modelling of mobile signals propagated through, around and reflected from buildings and other structures common to a city in the near field region. In the modelling, upper microwave and lower mm wave propagation data available in the open literature at frequencies 9.6, 28.8 and 57.6 GHz are considered. A strong interference zone has been noticed in the near field region from 0.2 to 0.6 km. Three methods are proposed to predict the path loss to validate data in the near field region. The results predicted from the simulations are well compared with measured data. The standard deviations of the predictions made by these models in the near field region are within 7 dB at all three frequencies.","PeriodicalId":104361,"journal":{"name":"Proceedings of the International Conference on Electromagnetic Interference and Compatibility","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130301425","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1900-01-01DOI: 10.1109/ICEMIC.1999.871616
R. Debnath, V.W. Karve
Most conventional approaches to electromagnetic conflict (EC) are "hard" in nature, which presume EC to be a static, predictable encounter. This forms the basis of the standalone design philosophy for EC equipment adopted to date, from which flow various EMI/EMC and MIL standards. This reductionist approach is doomed to failure in complex electromagnetic environments. The ultimate objective of EC is to affect the man, preferably the decision maker, and not the individual system(s) per se. In modern conflict, any model of the prevalent EC environment also depends on non-quantifiable factors, such as training, morale and the uncertainties of combat, which contribute to system entropy and emphasize the importance of the human decision maker. The EC subsystem of a C/sup 2/W system can therefore be classified as a human activity system (HAS). The authors propose a holistic system design philosophy for EC systems, based on the system dynamics (SD) approach, incorporating the soft systems methodology (SSM), to achieve a realistic representation of the futuristic electromagnetic environment. The SSM-SD paradigm is systematically developed, using the CATWOE model, system root definition (RD), cybernetic holons and system dynamics archetypes.
{"title":"Design of futuristic electromagnetic conflict (EC) systems using soft systems modelling-system dynamics (SSM-SD) methodology","authors":"R. Debnath, V.W. Karve","doi":"10.1109/ICEMIC.1999.871616","DOIUrl":"https://doi.org/10.1109/ICEMIC.1999.871616","url":null,"abstract":"Most conventional approaches to electromagnetic conflict (EC) are \"hard\" in nature, which presume EC to be a static, predictable encounter. This forms the basis of the standalone design philosophy for EC equipment adopted to date, from which flow various EMI/EMC and MIL standards. This reductionist approach is doomed to failure in complex electromagnetic environments. The ultimate objective of EC is to affect the man, preferably the decision maker, and not the individual system(s) per se. In modern conflict, any model of the prevalent EC environment also depends on non-quantifiable factors, such as training, morale and the uncertainties of combat, which contribute to system entropy and emphasize the importance of the human decision maker. The EC subsystem of a C/sup 2/W system can therefore be classified as a human activity system (HAS). The authors propose a holistic system design philosophy for EC systems, based on the system dynamics (SD) approach, incorporating the soft systems methodology (SSM), to achieve a realistic representation of the futuristic electromagnetic environment. The SSM-SD paradigm is systematically developed, using the CATWOE model, system root definition (RD), cybernetic holons and system dynamics archetypes.","PeriodicalId":104361,"journal":{"name":"Proceedings of the International Conference on Electromagnetic Interference and Compatibility","volume":"33 5 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133792059","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1900-01-01DOI: 10.1109/ICEMIC.1999.871665
A. Sajeev, S. Karunakaran
Present generation electronics is found to replace metallic enclosures with moulded plastic ones for obvious advantages. On the other hand, radiation hazards from commonly used electronic equipment like TVs, computer monitors, etc. and their immunity to external electromagnetic (EM) fields has become more serious due to their proliferation into every walk of life. To comply with regulations, related to radiation hazards to ensure safety for the users and EM immunity, plastic/glass materials used for making commercial equipment enclosures are coated with conductive material for achieving electromagnetic shielding. In this context, a simple low cost test method for measuring the shielding effectiveness (SE) of metalised plastics become essential. The paper analyses the standard test procedure in use for the above-said SE measurement and brings out the difficulties in following the same. It describes a simple alternative based on the same principle. The test method has been validated up to 1 GHz. The method can be used to measure the shielding effectiveness of any specimen like glass, plastics, leather, etc. with conductive coating.
{"title":"Shielding effectiveness evaluation of metalised plastics with signal source inside test console","authors":"A. Sajeev, S. Karunakaran","doi":"10.1109/ICEMIC.1999.871665","DOIUrl":"https://doi.org/10.1109/ICEMIC.1999.871665","url":null,"abstract":"Present generation electronics is found to replace metallic enclosures with moulded plastic ones for obvious advantages. On the other hand, radiation hazards from commonly used electronic equipment like TVs, computer monitors, etc. and their immunity to external electromagnetic (EM) fields has become more serious due to their proliferation into every walk of life. To comply with regulations, related to radiation hazards to ensure safety for the users and EM immunity, plastic/glass materials used for making commercial equipment enclosures are coated with conductive material for achieving electromagnetic shielding. In this context, a simple low cost test method for measuring the shielding effectiveness (SE) of metalised plastics become essential. The paper analyses the standard test procedure in use for the above-said SE measurement and brings out the difficulties in following the same. It describes a simple alternative based on the same principle. The test method has been validated up to 1 GHz. The method can be used to measure the shielding effectiveness of any specimen like glass, plastics, leather, etc. with conductive coating.","PeriodicalId":104361,"journal":{"name":"Proceedings of the International Conference on Electromagnetic Interference and Compatibility","volume":"117 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134570692","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1900-01-01DOI: 10.1109/ICEMIC.1999.871610
S. Kundu, G. Deb
In this paper, near field and far field radiation patterns from a d.c. distribution bus on a printed circuit board containing a high speed switching device (1 GHz) are studied using finite element based solvers. First the geometric model of the PCB is drawn and material properties are assigned. Then the source and boundary conditions are defined. The simulation software uses the finite element method to solve the full, unsimplified Maxwell's equation in the frequency domain. It computes the three dimensional electromagnetic fields as a function of frequency within and around the radiating structures, the far field radiation and the S-parameters are computed and plots of fields are viewed. The results obtained using simulation technique are given graphically. The value of the fields obtained from this method is compared with the value obtained from direct mathematical calculations.
{"title":"Prediction of radiated EMI from a d.c. bus in digital equipment using software simulation technique-a case study","authors":"S. Kundu, G. Deb","doi":"10.1109/ICEMIC.1999.871610","DOIUrl":"https://doi.org/10.1109/ICEMIC.1999.871610","url":null,"abstract":"In this paper, near field and far field radiation patterns from a d.c. distribution bus on a printed circuit board containing a high speed switching device (1 GHz) are studied using finite element based solvers. First the geometric model of the PCB is drawn and material properties are assigned. Then the source and boundary conditions are defined. The simulation software uses the finite element method to solve the full, unsimplified Maxwell's equation in the frequency domain. It computes the three dimensional electromagnetic fields as a function of frequency within and around the radiating structures, the far field radiation and the S-parameters are computed and plots of fields are viewed. The results obtained using simulation technique are given graphically. The value of the fields obtained from this method is compared with the value obtained from direct mathematical calculations.","PeriodicalId":104361,"journal":{"name":"Proceedings of the International Conference on Electromagnetic Interference and Compatibility","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130961166","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1900-01-01DOI: 10.1109/ICEMIC.1999.871632
T. Y. Takpere
Summary form only given, as follows. Distribution lines present a finite impedance to harmonic currents. They are transformed into harmonic voltages that can be resonant at some frequency. Harmonic voltages render the following adverse effects: (i) insulation impairment; (ii) thermal (long-term) effects as conductor losses, losses in the iron of magnetic circuits and dielectric losses; all of which are caused by the circulation of harmonic currents; (iii) charge disruption, which is a phenomenon that can be defined as abnormal operation or failure, caused by voltage distortion (for example, relays and zero crossing synchronised devices); (iv) and consumption of harmonic reactive power that cannot be compensated. This paper describes limits and methods of harmonic emissions measurement as per EN 61000-3-2 specification which is mandatory as per the EMC Directive.
{"title":"Harmonic emissions measurements as per EN 61000-3-2","authors":"T. Y. Takpere","doi":"10.1109/ICEMIC.1999.871632","DOIUrl":"https://doi.org/10.1109/ICEMIC.1999.871632","url":null,"abstract":"Summary form only given, as follows. Distribution lines present a finite impedance to harmonic currents. They are transformed into harmonic voltages that can be resonant at some frequency. Harmonic voltages render the following adverse effects: (i) insulation impairment; (ii) thermal (long-term) effects as conductor losses, losses in the iron of magnetic circuits and dielectric losses; all of which are caused by the circulation of harmonic currents; (iii) charge disruption, which is a phenomenon that can be defined as abnormal operation or failure, caused by voltage distortion (for example, relays and zero crossing synchronised devices); (iv) and consumption of harmonic reactive power that cannot be compensated. This paper describes limits and methods of harmonic emissions measurement as per EN 61000-3-2 specification which is mandatory as per the EMC Directive.","PeriodicalId":104361,"journal":{"name":"Proceedings of the International Conference on Electromagnetic Interference and Compatibility","volume":"22 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134435228","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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