Pub Date : 1900-01-01DOI: 10.1109/ICEMIC.1999.871602
A. D. Sarma, M. Prasad, S. Pandit
In this paper an attempt is made to extend Hata's method for estimating path loss to cm and mm wave lengths using adaptive propagation techniques. The measurements reported in the literature at 9.6, 28.8 and 57.6 GHz are utilized to deduce the coefficients in the adaptive propagation models for the case of rural area. Predicted results compare well with the experimental data.
{"title":"Modelling of path loss for land mobile cm and mm wave communication systems","authors":"A. D. Sarma, M. Prasad, S. Pandit","doi":"10.1109/ICEMIC.1999.871602","DOIUrl":"https://doi.org/10.1109/ICEMIC.1999.871602","url":null,"abstract":"In this paper an attempt is made to extend Hata's method for estimating path loss to cm and mm wave lengths using adaptive propagation techniques. The measurements reported in the literature at 9.6, 28.8 and 57.6 GHz are utilized to deduce the coefficients in the adaptive propagation models for the case of rural area. Predicted results compare well with the experimental data.","PeriodicalId":104361,"journal":{"name":"Proceedings of the International Conference on Electromagnetic Interference and Compatibility","volume":"117 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121246600","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1900-01-01DOI: 10.1109/ICEMIC.1999.871611
Soo-Hyung Kim, Jungyong Nam, Kyung-Il Ouh, Sang-Jun Hong, Chaewhan Rim
Reviews the approaches to improve the noise immunity at the semiconductor level and system level through the analysis of the effect of EFT (electrical fast transient) pulse input into the system on the semiconductor and the coupling path. A thermometer evaluation board applying a microcontroller device KS57P2308 was used and the failure phenomenon happening at the time of the EFT pulse application was the halt status of the system due to the malfunctioning of the micom device. Two approaches were presented to prevent such a malfunction by improving the immunity against the EFT noise. It was confirmed that the first way was to divert the noise input into the semiconductor toward the reset pin and then the second way was to properly control the conditions for activation of reset by adjusting the minimum input low width of a noise filter inside the reset pin, thereby preventing the halt status of the system due to the malfunction of the semiconductor device. An accurate analysis of the amplitude of the input noise level and duration is required for the adjustment of minimum input low width of the noise filter and the new noise filler design is required accordingly. Also, it is required to review again the bulk capacitor applied to almost all boards inside the system. The existing reset circuit failed to properly function due to reduction of the noise input from the outside because of the bulk capacitor. However, this application is only possible in the case where the system is not greatly affected even if peripherals rather than main system are reset and if the system is seriously affected by such reset, this application is not appropriate.
{"title":"Analysis of coupling mechanism and solution for EFT noise on semiconductor device level","authors":"Soo-Hyung Kim, Jungyong Nam, Kyung-Il Ouh, Sang-Jun Hong, Chaewhan Rim","doi":"10.1109/ICEMIC.1999.871611","DOIUrl":"https://doi.org/10.1109/ICEMIC.1999.871611","url":null,"abstract":"Reviews the approaches to improve the noise immunity at the semiconductor level and system level through the analysis of the effect of EFT (electrical fast transient) pulse input into the system on the semiconductor and the coupling path. A thermometer evaluation board applying a microcontroller device KS57P2308 was used and the failure phenomenon happening at the time of the EFT pulse application was the halt status of the system due to the malfunctioning of the micom device. Two approaches were presented to prevent such a malfunction by improving the immunity against the EFT noise. It was confirmed that the first way was to divert the noise input into the semiconductor toward the reset pin and then the second way was to properly control the conditions for activation of reset by adjusting the minimum input low width of a noise filter inside the reset pin, thereby preventing the halt status of the system due to the malfunction of the semiconductor device. An accurate analysis of the amplitude of the input noise level and duration is required for the adjustment of minimum input low width of the noise filter and the new noise filler design is required accordingly. Also, it is required to review again the bulk capacitor applied to almost all boards inside the system. The existing reset circuit failed to properly function due to reduction of the noise input from the outside because of the bulk capacitor. However, this application is only possible in the case where the system is not greatly affected even if peripherals rather than main system are reset and if the system is seriously affected by such reset, this application is not appropriate.","PeriodicalId":104361,"journal":{"name":"Proceedings of the International Conference on Electromagnetic Interference and Compatibility","volume":"15 5","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121003717","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1900-01-01DOI: 10.1109/ICEMIC.1999.871609
K. Singh
Situations arise where several systems operate in close proximity on a given platform like an armoured carrier, aircraft carrier, or an aircraft. In some of these systems, like radar, the radiated RF powers are high and due to close proximity with other systems, high field intensities are likely to get coupled to them through antenna to antenna coupling, antenna to box coupling, and antenna to wire coupling. For EMI prediction it is necessary to have an assessment of the coupled fields within the near field ranges of large antennas for which antenna near field prediction is required. The emitted EM fields in close proximity to the aperture are reactive, their free space impedance different than 120/spl pi/ and the E and H field phase relationship not well defined as it is in case of the far field regions. An analysis is carried out to bring about a closed form solution for the prediction of the EM fields in the near field regions of the antennas such that the results are amenable to computer coding for automated prediction analysis. For this analysis two procedures are presented. The first one is based on the far field to near field transformation using spherical wave expansion. The other is for less accuracy, yet is simpler for the computation of the near fields of a large antenna. This method is based on a notional array with antenna parameters like gain beam widths and sidelobes similar to the antenna under consideration.
{"title":"Antenna near field intensity prediction","authors":"K. Singh","doi":"10.1109/ICEMIC.1999.871609","DOIUrl":"https://doi.org/10.1109/ICEMIC.1999.871609","url":null,"abstract":"Situations arise where several systems operate in close proximity on a given platform like an armoured carrier, aircraft carrier, or an aircraft. In some of these systems, like radar, the radiated RF powers are high and due to close proximity with other systems, high field intensities are likely to get coupled to them through antenna to antenna coupling, antenna to box coupling, and antenna to wire coupling. For EMI prediction it is necessary to have an assessment of the coupled fields within the near field ranges of large antennas for which antenna near field prediction is required. The emitted EM fields in close proximity to the aperture are reactive, their free space impedance different than 120/spl pi/ and the E and H field phase relationship not well defined as it is in case of the far field regions. An analysis is carried out to bring about a closed form solution for the prediction of the EM fields in the near field regions of the antennas such that the results are amenable to computer coding for automated prediction analysis. For this analysis two procedures are presented. The first one is based on the far field to near field transformation using spherical wave expansion. The other is for less accuracy, yet is simpler for the computation of the near fields of a large antenna. This method is based on a notional array with antenna parameters like gain beam widths and sidelobes similar to the antenna under consideration.","PeriodicalId":104361,"journal":{"name":"Proceedings of the International Conference on Electromagnetic Interference and Compatibility","volume":"415 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116506202","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1900-01-01DOI: 10.1109/ICEMIC.1999.871588
G. Deb
The paper discusses the EMC management philosophy, technology trends and perspectives in the system design, testing, maintenance and application of the "readymade recipe" for EMI control measures.
{"title":"EMC management for an electronic system design","authors":"G. Deb","doi":"10.1109/ICEMIC.1999.871588","DOIUrl":"https://doi.org/10.1109/ICEMIC.1999.871588","url":null,"abstract":"The paper discusses the EMC management philosophy, technology trends and perspectives in the system design, testing, maintenance and application of the \"readymade recipe\" for EMI control measures.","PeriodicalId":104361,"journal":{"name":"Proceedings of the International Conference on Electromagnetic Interference and Compatibility","volume":"168 5","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114009538","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1900-01-01DOI: 10.1109/ICEMIC.1999.871672
K. Singh
The critical element in digital signal processing circuits is the analog to digital converter (ADC). The trend is to push up their operating speeds. For a given ADC, theoretically, a given signal to noise ratio (SNR) and dynamic range can be realised. The ADC performance in a practical circuit is likely to deteriorate due to several contributory factors, which raise the noise levels at the input and hence the output of the ADC. This noise level increases with the increase in the operating speeds. If the circuit principles to peg this noise down are not incorporated in the realised circuit, the expected performance from the ADC may not be available, specifically at high speeds of operation. This paper brings out the contributing factors to the noise, suggests techniques to minimize this noise in an ADC circuit and presents the salient parameters of a working high speed ADC circuit incorporating these techniques.
{"title":"Noise reduction in analog to digital converters","authors":"K. Singh","doi":"10.1109/ICEMIC.1999.871672","DOIUrl":"https://doi.org/10.1109/ICEMIC.1999.871672","url":null,"abstract":"The critical element in digital signal processing circuits is the analog to digital converter (ADC). The trend is to push up their operating speeds. For a given ADC, theoretically, a given signal to noise ratio (SNR) and dynamic range can be realised. The ADC performance in a practical circuit is likely to deteriorate due to several contributory factors, which raise the noise levels at the input and hence the output of the ADC. This noise level increases with the increase in the operating speeds. If the circuit principles to peg this noise down are not incorporated in the realised circuit, the expected performance from the ADC may not be available, specifically at high speeds of operation. This paper brings out the contributing factors to the noise, suggests techniques to minimize this noise in an ADC circuit and presents the salient parameters of a working high speed ADC circuit incorporating these techniques.","PeriodicalId":104361,"journal":{"name":"Proceedings of the International Conference on Electromagnetic Interference and Compatibility","volume":"47 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121709227","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1900-01-01DOI: 10.1109/ICEMIC.1999.871673
R. Ganesan, S.K. Das
This paper describes the basic concepts of 'grounding' in the context of meeting both safety and EMC performance requirements. It analyzes various sub-systems of the 'grounding system' and recommends proper 'system' and 'facility' grounding practices. It also covers a case study of a 'facility' grounding.
{"title":"Intricacy in system and facility grounding","authors":"R. Ganesan, S.K. Das","doi":"10.1109/ICEMIC.1999.871673","DOIUrl":"https://doi.org/10.1109/ICEMIC.1999.871673","url":null,"abstract":"This paper describes the basic concepts of 'grounding' in the context of meeting both safety and EMC performance requirements. It analyzes various sub-systems of the 'grounding system' and recommends proper 'system' and 'facility' grounding practices. It also covers a case study of a 'facility' grounding.","PeriodicalId":104361,"journal":{"name":"Proceedings of the International Conference on Electromagnetic Interference and Compatibility","volume":"26 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122045448","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1900-01-01DOI: 10.1109/ICEMIC.1999.871612
K. Sakthivel, S.K. Das, R. Ganesan
This paper describes, with experimental data and graphs, errors in the surface transfer impedance (STI) measurements that could resulted from different input power levels applied to the test cable. It also describes the causes of the errors due to other reasons and how they could be avoided. It concludes by justifying the appropriate input power level to be used while using this particular standard for STI measurements.
{"title":"Error analysis in surface transfer impedance measurements on shielded cables","authors":"K. Sakthivel, S.K. Das, R. Ganesan","doi":"10.1109/ICEMIC.1999.871612","DOIUrl":"https://doi.org/10.1109/ICEMIC.1999.871612","url":null,"abstract":"This paper describes, with experimental data and graphs, errors in the surface transfer impedance (STI) measurements that could resulted from different input power levels applied to the test cable. It also describes the causes of the errors due to other reasons and how they could be avoided. It concludes by justifying the appropriate input power level to be used while using this particular standard for STI measurements.","PeriodicalId":104361,"journal":{"name":"Proceedings of the International Conference on Electromagnetic Interference and Compatibility","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131297008","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1900-01-01DOI: 10.1109/ICEMIC.1999.871647
D. Kumar, S.K. Das, K. R. Kini
ISO 9000 is a series of standards developed by International Organisation for Standardisation (ISO) that document, structure, account for and trace products and services produced/offered by an organisation. The real life situation has been discussed in this paper emphasising on practical approach for ISO 9000 implementation and certification process for EMC services. This paper also describes/lists SAMEER's experience in going through the entire process for achieving ISO 9001 Certification for its EMC services for RVA and RAB accreditation.
{"title":"A practical approach to ISO 9000 certification for EMC services","authors":"D. Kumar, S.K. Das, K. R. Kini","doi":"10.1109/ICEMIC.1999.871647","DOIUrl":"https://doi.org/10.1109/ICEMIC.1999.871647","url":null,"abstract":"ISO 9000 is a series of standards developed by International Organisation for Standardisation (ISO) that document, structure, account for and trace products and services produced/offered by an organisation. The real life situation has been discussed in this paper emphasising on practical approach for ISO 9000 implementation and certification process for EMC services. This paper also describes/lists SAMEER's experience in going through the entire process for achieving ISO 9001 Certification for its EMC services for RVA and RAB accreditation.","PeriodicalId":104361,"journal":{"name":"Proceedings of the International Conference on Electromagnetic Interference and Compatibility","volume":"4 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122417159","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1900-01-01DOI: 10.1109/ICEMIC.1999.871668
T. K. Mitra
ECG voltage records against time in seconds reveal the electrical status of the heart. Change in the waveshapes of scalar ECG records contain the diagnostic information of clinical significance. The electrophysiological ECG biosignal is weak in nature. Interference preventive methods are discussed in this paper to improve signal to noise ratio as well as linearity and reliability of the ECG records.
{"title":"Control of EMI interference for linear ECG recording","authors":"T. K. Mitra","doi":"10.1109/ICEMIC.1999.871668","DOIUrl":"https://doi.org/10.1109/ICEMIC.1999.871668","url":null,"abstract":"ECG voltage records against time in seconds reveal the electrical status of the heart. Change in the waveshapes of scalar ECG records contain the diagnostic information of clinical significance. The electrophysiological ECG biosignal is weak in nature. Interference preventive methods are discussed in this paper to improve signal to noise ratio as well as linearity and reliability of the ECG records.","PeriodicalId":104361,"journal":{"name":"Proceedings of the International Conference on Electromagnetic Interference and Compatibility","volume":"189 2","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"120892472","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1900-01-01DOI: 10.1109/ICEMIC.1999.871642
S. Tyagi, C. Arora
A mobile RF shelter has been designed and developed indigenously to protect the sophisticated electronic systems from the adverse effects of EMI and EMP. RF and EMP coupling to antenna cable, power cable, telephone cable, data cable, and AC cables were controlled by using EMP protected connectors, filters, a 92-pin transient protected connectors etc. The shielding effectiveness (SE) measured as per MIL-STD shows adequate SE for E-field, H-field and plane waves in the frequency range of 10 kHz-200 MHz.
{"title":"Practical realisation of a mobile RF shelter","authors":"S. Tyagi, C. Arora","doi":"10.1109/ICEMIC.1999.871642","DOIUrl":"https://doi.org/10.1109/ICEMIC.1999.871642","url":null,"abstract":"A mobile RF shelter has been designed and developed indigenously to protect the sophisticated electronic systems from the adverse effects of EMI and EMP. RF and EMP coupling to antenna cable, power cable, telephone cable, data cable, and AC cables were controlled by using EMP protected connectors, filters, a 92-pin transient protected connectors etc. The shielding effectiveness (SE) measured as per MIL-STD shows adequate SE for E-field, H-field and plane waves in the frequency range of 10 kHz-200 MHz.","PeriodicalId":104361,"journal":{"name":"Proceedings of the International Conference on Electromagnetic Interference and Compatibility","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125971919","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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