Lanxiang Wang, G. Han, S. Su, Qian Zhou, Yue Yang, P. Guo, Wei Wang, Y. Tong, P. S. Lim, B. Liu, E. Kong, C. Xue, Qiming Wang, B. Cheng, Y. Yeo
We demonstrate a novel metal stanogermanide contact metallization process for high mobility germanium-tin (GeSn) channel MOSFETs. The multi-phase nickel-platinum stanogermanide [Ni(GeSn)+Ptx(GeSn)y] contacts are formed by reacting Ni-Pt alloy with Ge0.947Sn0.053 alloy, which is epitaxially grown on Ge (100) substrate by solid source molecular beam epitaxy (MBE). Compared with nickel stanogermanide [Ni(GeSn)] contacts, the Pt-incorporated contacts, i.e. [Ni(GeSn)+Ptx(GeSn)y], exhibit enhanced thermal stability in a wide range of formation temperatures and have superior surface morphology even after thermal processing. The proposed contacts are attractive for the integration in high mobility GeSn MOSFETs.
{"title":"Thermally Stable Multi-Phase Nickel-Platinum Stanogermanide Contacts for Germanium-Tin Channel MOSFETs","authors":"Lanxiang Wang, G. Han, S. Su, Qian Zhou, Yue Yang, P. Guo, Wei Wang, Y. Tong, P. S. Lim, B. Liu, E. Kong, C. Xue, Qiming Wang, B. Cheng, Y. Yeo","doi":"10.1149/2.014206ESL","DOIUrl":"https://doi.org/10.1149/2.014206ESL","url":null,"abstract":"We demonstrate a novel metal stanogermanide contact metallization process for high mobility germanium-tin (GeSn) channel MOSFETs. The multi-phase nickel-platinum stanogermanide [Ni(GeSn)+Ptx(GeSn)y] contacts are formed by reacting Ni-Pt alloy with Ge0.947Sn0.053 alloy, which is epitaxially grown on Ge (100) substrate by solid source molecular beam epitaxy (MBE). Compared with nickel stanogermanide [Ni(GeSn)] contacts, the Pt-incorporated contacts, i.e. [Ni(GeSn)+Ptx(GeSn)y], exhibit enhanced thermal stability in a wide range of formation temperatures and have superior surface morphology even after thermal processing. The proposed contacts are attractive for the integration in high mobility GeSn MOSFETs.","PeriodicalId":11627,"journal":{"name":"Electrochemical and Solid State Letters","volume":"140 1","pages":""},"PeriodicalIF":0.0,"publicationDate":"2012-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"77446241","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Direct Determination of Oxide Surface Free Energy through Potentiometric Measurements","authors":"Kevin Croué, J. Jolivet, D. Larcher","doi":"10.1149/2.011201ESL","DOIUrl":"https://doi.org/10.1149/2.011201ESL","url":null,"abstract":"","PeriodicalId":11627,"journal":{"name":"Electrochemical and Solid State Letters","volume":"40 1","pages":""},"PeriodicalIF":0.0,"publicationDate":"2012-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"86334797","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Experimental To obtain the electrode material used in this work, a new VARTA LIC 18650 WC lithium-ion battery was unsealed and dismantled. After evaporation of the electrolyte, a piece was extracted from the cathodeandpreparedforFIB/SEMbysputteringaplatinumlayeronto the surface of the sample to gain a more planar area as a starting point for the FIB. Additionally, two reference lines, one orthogonal and the other with an angle of 48.2 ◦ in relation to the cutting plane, were imprinted into the platinum layer, providing a method independent of surface skew or irregularities to determine slice thickness (Fig. 1). With the help of an FEI Quanta three-dimensional dual-beam FIBSEM at Fraunhofer IZM, Berlin, a cavity was cut into the sample as a starting point and subsequently one side of the cuboid was ablated slice by slice, while the SEM, with an angle of 38 ◦ relative to the sample surface, generated one image per slice.
{"title":"Three-Dimensional Reconstruction of a LiCoO2 Li-Ion Battery Cathode","authors":"T. Hutzenlaub, S. Thiele, R. Zengerle, C. Ziegler","doi":"10.1149/2.002203ESL","DOIUrl":"https://doi.org/10.1149/2.002203ESL","url":null,"abstract":"Experimental To obtain the electrode material used in this work, a new VARTA LIC 18650 WC lithium-ion battery was unsealed and dismantled. After evaporation of the electrolyte, a piece was extracted from the cathodeandpreparedforFIB/SEMbysputteringaplatinumlayeronto the surface of the sample to gain a more planar area as a starting point for the FIB. Additionally, two reference lines, one orthogonal and the other with an angle of 48.2 ◦ in relation to the cutting plane, were imprinted into the platinum layer, providing a method independent of surface skew or irregularities to determine slice thickness (Fig. 1). With the help of an FEI Quanta three-dimensional dual-beam FIBSEM at Fraunhofer IZM, Berlin, a cavity was cut into the sample as a starting point and subsequently one side of the cuboid was ablated slice by slice, while the SEM, with an angle of 38 ◦ relative to the sample surface, generated one image per slice.","PeriodicalId":11627,"journal":{"name":"Electrochemical and Solid State Letters","volume":"33 1","pages":""},"PeriodicalIF":0.0,"publicationDate":"2012-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"83176457","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Alkaline Fuel Cell Membranes from Electrospun Fiber Mats","authors":"Andrew M. Park, P. Pintauro","doi":"10.1149/2.010203ESL","DOIUrl":"https://doi.org/10.1149/2.010203ESL","url":null,"abstract":"","PeriodicalId":11627,"journal":{"name":"Electrochemical and Solid State Letters","volume":"101 1","pages":""},"PeriodicalIF":0.0,"publicationDate":"2012-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"79944618","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"The Effect of H2O2 and 2-MT on the Chemical Mechanical Polishing of Cobalt Adhesion Layer in Acid Slurry","authors":"Hai-Sheng Lu, Jing-Xuan Wang, Xu Zeng, Fei Chen, Xiao-Meng Zhang, Wenjun Zhang, X. Qu","doi":"10.1149/2.017204ESL","DOIUrl":"https://doi.org/10.1149/2.017204ESL","url":null,"abstract":"","PeriodicalId":11627,"journal":{"name":"Electrochemical and Solid State Letters","volume":"11 7 1","pages":""},"PeriodicalIF":0.0,"publicationDate":"2012-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"83509209","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"SnSe Nanoparticles Anchored on TiO2 Nanotube Arrays by Pulsed Electrochemical Deposition","authors":"Y. Liang, Z. Cui, S. L. Zhu, X. J. Yang","doi":"10.1149/2.003201ESL","DOIUrl":"https://doi.org/10.1149/2.003201ESL","url":null,"abstract":"","PeriodicalId":11627,"journal":{"name":"Electrochemical and Solid State Letters","volume":"20 1","pages":""},"PeriodicalIF":0.0,"publicationDate":"2012-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"86907603","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
We report on the use of in-situ optical emission spectrometry to monitor the Al3+ loss rate during the anodic oxidation of aluminum in phosphoric acid. Three distinct stages were observed, the highest rate being measured during barrier layer growth. The evolution of the loss rate is markedly different from the evolution previously reported for sulfuric acid anodizing. We speculate that this may be related to the different pore morphologies obtained in these electrolytes. Our measurements also indicate that below 2 mA/cm2, field-assisted dissolution is the predominant contribution to Al3+ loss, while direct cation ejection is predominant at higher current densities.
{"title":"In Situ Optical Emission Spectrometry during Porous Anodic Alumina Initiation and Growth in Phosphoric Acid","authors":"Q. Overmeere, D. Mercier, R. Santoro, J. Proost","doi":"10.1149/2.009201ESL","DOIUrl":"https://doi.org/10.1149/2.009201ESL","url":null,"abstract":"We report on the use of in-situ optical emission spectrometry to monitor the Al3+ loss rate during the anodic oxidation of aluminum in phosphoric acid. Three distinct stages were observed, the highest rate being measured during barrier layer growth. The evolution of the loss rate is markedly different from the evolution previously reported for sulfuric acid anodizing. We speculate that this may be related to the different pore morphologies obtained in these electrolytes. Our measurements also indicate that below 2 mA/cm2, field-assisted dissolution is the predominant contribution to Al3+ loss, while direct cation ejection is predominant at higher current densities.","PeriodicalId":11627,"journal":{"name":"Electrochemical and Solid State Letters","volume":"41 1","pages":""},"PeriodicalIF":0.0,"publicationDate":"2012-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"86503930","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Cheng Peng, P. Yang, Liangcai Wu, Zhitang Song, F. Rao, Jian'an Xu, Xilin Zhou, Min Zhu, Bo Liu, J. Chu
Nitrogen incorporated Si0.6Sb2Te3 film shows higher crystallization temperature (similar to 185 degrees C) than Ge2Sb2Te5 (similar to 150 degrees C). No separated Si or Te phase is observed within crystalline nitrogen-doped Si0.6Sb2Te3 material (SST-N). N
{"title":"N-Doped Si0.6Sb2Te3 Material for Applications of Phase-Change Memory","authors":"Cheng Peng, P. Yang, Liangcai Wu, Zhitang Song, F. Rao, Jian'an Xu, Xilin Zhou, Min Zhu, Bo Liu, J. Chu","doi":"10.1149/2.022204ESL","DOIUrl":"https://doi.org/10.1149/2.022204ESL","url":null,"abstract":"Nitrogen incorporated Si0.6Sb2Te3 film shows higher crystallization temperature (similar to 185 degrees C) than Ge2Sb2Te5 (similar to 150 degrees C). No separated Si or Te phase is observed within crystalline nitrogen-doped Si0.6Sb2Te3 material (SST-N). N","PeriodicalId":11627,"journal":{"name":"Electrochemical and Solid State Letters","volume":"40 1","pages":""},"PeriodicalIF":0.0,"publicationDate":"2012-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"76479633","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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