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Benchmarking-Charge-Conserving, Unconditionally Stable, Electromagnetic Finite-Element Particle-in-Cell Codes: Validating 3D nonlinear multiphysics simulations 电荷守恒、无条件稳定的电磁有限元粒子内单元代码基准测试:验证三维非线性多物理场仿真
IF 4.2 4区 计算机科学 Q2 ENGINEERING, ELECTRICAL & ELECTRONIC Pub Date : 2025-04-22 DOI: 10.1109/MAP.2025.3537958
Omkar H. Ramachandran;B. Shanker
To a large extent, particle-in-cell (PIC) methods have become the default means of understanding plasma physics. As a result, there are a spate of codes, public and otherwise, that are heavily used. Most of these codes fall under two categories: 1) they largely deal with electrostatic problems or 2) are 1D/2D. As a result, there is a paucity of benchmarking tests that can be used to validate codes and methods that are used to analyze 3D problems. This is especially true when designing methods that seek to break conventional analysis methods, like using unstructured meshes or implicit time-stepping schemes. This review seeks to address this need. We present a number of results that one can use to validate and benchmark 3D electromagnetic finite-element method PIC (EM-FEMPIC) codes for collisionless plasma and beam dynamics systems. Three test cases are presented in significant detail, including beam expansion due to static space-charge expansion, the acceleration of a relativistic bunch by an radio-frequency (RF)-accelerating structure, and benchmarks of accuracy and energy conservation of the particle push. The presented results are compared against either analytical data or those from other codes.
在很大程度上,粒子池(PIC)方法已经成为理解等离子体物理的默认手段。因此,有大量的代码,无论是公开的还是其他的,都被大量使用。这些代码大多分为两类:1)它们主要处理静电问题或2)是1D/2D。因此,缺乏可用于验证用于分析3D问题的代码和方法的基准测试。当设计方法试图打破传统的分析方法时尤其如此,比如使用非结构化网格或隐式时间步进方案。本次审查旨在解决这一需求。我们提出了一些结果,人们可以用来验证和基准三维电磁有限元方法PIC (EM-FEMPIC)代码,用于无碰撞等离子体和光束动力学系统。详细介绍了三种测试案例,包括静态空间电荷膨胀引起的光束膨胀、射频加速结构对相对论束的加速以及粒子推力的精度和能量守恒基准。给出的结果与分析数据或其他代码的结果进行了比较。
{"title":"Benchmarking-Charge-Conserving, Unconditionally Stable, Electromagnetic Finite-Element Particle-in-Cell Codes: Validating 3D nonlinear multiphysics simulations","authors":"Omkar H. Ramachandran;B. Shanker","doi":"10.1109/MAP.2025.3537958","DOIUrl":"https://doi.org/10.1109/MAP.2025.3537958","url":null,"abstract":"To a large extent, particle-in-cell (PIC) methods have become the default means of understanding plasma physics. As a result, there are a spate of codes, public and otherwise, that are heavily used. Most of these codes fall under two categories: 1) they largely deal with electrostatic problems or 2) are 1D/2D. As a result, there is a paucity of benchmarking tests that can be used to validate codes and methods that are used to analyze 3D problems. This is especially true when designing methods that seek to break conventional analysis methods, like using unstructured meshes or implicit time-stepping schemes. This review seeks to address this need. We present a number of results that one can use to validate and benchmark 3D electromagnetic finite-element method PIC (EM-FEMPIC) codes for collisionless plasma and beam dynamics systems. Three test cases are presented in significant detail, including beam expansion due to static space-charge expansion, the acceleration of a relativistic bunch by an radio-frequency (RF)-accelerating structure, and benchmarks of accuracy and energy conservation of the particle push. The presented results are compared against either analytical data or those from other codes.","PeriodicalId":13090,"journal":{"name":"IEEE Antennas and Propagation Magazine","volume":"67 2","pages":"76-86"},"PeriodicalIF":4.2,"publicationDate":"2025-04-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"143860928","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
IEEE Moving IEEE移动
IF 4.2 4区 计算机科学 Q2 ENGINEERING, ELECTRICAL & ELECTRONIC Pub Date : 2025-04-22 DOI: 10.1109/MAP.2025.3552889
{"title":"IEEE Moving","authors":"","doi":"10.1109/MAP.2025.3552889","DOIUrl":"https://doi.org/10.1109/MAP.2025.3552889","url":null,"abstract":"","PeriodicalId":13090,"journal":{"name":"IEEE Antennas and Propagation Magazine","volume":"67 2","pages":"133-133"},"PeriodicalIF":4.2,"publicationDate":"2025-04-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=10973144","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"143865283","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
13th Asia-Pacific Conference on Antennas and Propagation - 13th Asia-Pacific Conference on Antennas and Propagation 第十三届亚太天线与传播会议-第十三届亚太天线与传播会议
IF 4.2 4区 计算机科学 Q2 ENGINEERING, ELECTRICAL & ELECTRONIC Pub Date : 2025-04-22 DOI: 10.1109/MAP.2025.3539165
{"title":"13th Asia-Pacific Conference on Antennas and Propagation - 13th Asia-Pacific Conference on Antennas and Propagation","authors":"","doi":"10.1109/MAP.2025.3539165","DOIUrl":"https://doi.org/10.1109/MAP.2025.3539165","url":null,"abstract":"","PeriodicalId":13090,"journal":{"name":"IEEE Antennas and Propagation Magazine","volume":"67 2","pages":"119-119"},"PeriodicalIF":4.2,"publicationDate":"2025-04-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=10973142","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"143865310","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
IEEE Proceeding IEEE进行
IF 4.2 4区 计算机科学 Q2 ENGINEERING, ELECTRICAL & ELECTRONIC Pub Date : 2025-04-22 DOI: 10.1109/MAP.2025.3552888
{"title":"IEEE Proceeding","authors":"","doi":"10.1109/MAP.2025.3552888","DOIUrl":"https://doi.org/10.1109/MAP.2025.3552888","url":null,"abstract":"","PeriodicalId":13090,"journal":{"name":"IEEE Antennas and Propagation Magazine","volume":"67 2","pages":"127-127"},"PeriodicalIF":4.2,"publicationDate":"2025-04-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=10973199","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"143865322","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
[Hidden Word] (隐藏的词)
IF 4.2 4区 计算机科学 Q2 ENGINEERING, ELECTRICAL & ELECTRONIC Pub Date : 2025-04-22 DOI: 10.1109/MAP.2025.3537415
Fred E. Gardiol
{"title":"[Hidden Word]","authors":"Fred E. Gardiol","doi":"10.1109/MAP.2025.3537415","DOIUrl":"https://doi.org/10.1109/MAP.2025.3537415","url":null,"abstract":"","PeriodicalId":13090,"journal":{"name":"IEEE Antennas and Propagation Magazine","volume":"67 2","pages":"150-150"},"PeriodicalIF":4.2,"publicationDate":"2025-04-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=10973210","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"143865311","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
IEEE Foundation IEEE基金会
IF 4.2 4区 计算机科学 Q2 ENGINEERING, ELECTRICAL & ELECTRONIC Pub Date : 2025-04-22 DOI: 10.1109/MAP.2025.3552886
{"title":"IEEE Foundation","authors":"","doi":"10.1109/MAP.2025.3552886","DOIUrl":"https://doi.org/10.1109/MAP.2025.3552886","url":null,"abstract":"","PeriodicalId":13090,"journal":{"name":"IEEE Antennas and Propagation Magazine","volume":"67 2","pages":"116-116"},"PeriodicalIF":4.2,"publicationDate":"2025-04-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=10973193","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"143860773","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Benchmarking and Reproducibility in Computational and Experimental Characterization of Electronic Packages for Signal/Power Integrity: Four benchmarks serve as standardized cases 信号/电源完整性电子封装的计算和实验表征中的基准和可重复性:四个基准作为标准化案例
IF 4.2 4区 计算机科学 Q2 ENGINEERING, ELECTRICAL & ELECTRONIC Pub Date : 2025-04-22 DOI: 10.1109/MAP.2025.3537412
Heidi Barnes;Kemal Aygün;Michael J. Hill;Zhichao Zhang;Kaisheng Hu;Jonatan Aronsson;Pavel Paladhi;Jayaprakash Balachandran;Bobi Shi;Rohit Sharma;José E. Schutt-Ainé;Vladimir I. Okhmatovski
This article describes current initiatives to form benchmarks for the characterization of electronic packages. Four available benchmarks representing typical cases for signal integrity (SI) and power integrity (PI) analysis and varying in complexity from simple microstrip line to a full package model are intended to serve as standardized cases for testing the performance and accuracy of the modeling tools. While the benchmarks, consisting of CAD model files as well as simulated and measured network parameters, are publicly available and described in the accompanying manual, the emphasis in this article is on the description of challenges encountered in creating measured data, the development of modeling capabilities in the computational tools essential for accurate and expedient electromagnetic (EM) analysis of the benchmarks, and common practices going into matching of the simulated to the measured data. Ongoing efforts toward the standardization of densely packed interconnects for die-to-die interfacing on advanced packages, also known as heterogeneous integration (HI), are discussed in the context of the Open Compute Project (OCP). Emerging needs for benchmarking and standardization of test cases and training datasets for machine learning (ML)-assisted characterization of high-speed channels are also outlined.
本文描述了目前形成电子封装特性基准的计划。四个可用基准代表信号完整性(SI)和功率完整性(PI)分析的典型案例,从简单的微带线到全封装模型的复杂程度各不相同,旨在作为测试建模工具的性能和准确性的标准化案例。虽然由CAD模型文件以及模拟和测量的网络参数组成的基准是公开可用的,并在附带的手册中进行了描述,但本文的重点是描述在创建测量数据时遇到的挑战,以及在计算工具中建模能力的发展,这些计算工具对于准确和方便的电磁(EM)分析基准至关重要。并对模拟数据与实测数据的匹配进行了探讨。在开放计算项目(OCP)的背景下,正在进行的针对高级封装上的模对模接口的密集封装互连的标准化工作,也称为异构集成(HI)。本文还概述了对机器学习(ML)辅助高速通道表征的测试用例和训练数据集的基准测试和标准化的新需求。
{"title":"Benchmarking and Reproducibility in Computational and Experimental Characterization of Electronic Packages for Signal/Power Integrity: Four benchmarks serve as standardized cases","authors":"Heidi Barnes;Kemal Aygün;Michael J. Hill;Zhichao Zhang;Kaisheng Hu;Jonatan Aronsson;Pavel Paladhi;Jayaprakash Balachandran;Bobi Shi;Rohit Sharma;José E. Schutt-Ainé;Vladimir I. Okhmatovski","doi":"10.1109/MAP.2025.3537412","DOIUrl":"https://doi.org/10.1109/MAP.2025.3537412","url":null,"abstract":"This article describes current initiatives to form benchmarks for the characterization of electronic packages. Four available benchmarks representing typical cases for signal integrity (SI) and power integrity (PI) analysis and varying in complexity from simple microstrip line to a full package model are intended to serve as standardized cases for testing the performance and accuracy of the modeling tools. While the benchmarks, consisting of CAD model files as well as simulated and measured network parameters, are publicly available and described in the accompanying manual, the emphasis in this article is on the description of challenges encountered in creating measured data, the development of modeling capabilities in the computational tools essential for accurate and expedient electromagnetic (EM) analysis of the benchmarks, and common practices going into matching of the simulated to the measured data. Ongoing efforts toward the standardization of densely packed interconnects for die-to-die interfacing on advanced packages, also known as <italic>heterogeneous integration</i> (<italic>HI</i>), are discussed in the context of the Open Compute Project (OCP). Emerging needs for benchmarking and standardization of test cases and training datasets for machine learning (ML)-assisted characterization of high-speed channels are also outlined.","PeriodicalId":13090,"journal":{"name":"IEEE Antennas and Propagation Magazine","volume":"67 2","pages":"51-63"},"PeriodicalIF":4.2,"publicationDate":"2025-04-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"143860857","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
The European Defence Agency Workshop “Radar Signatures & EM Benchmarks”: A scientific forum for comparison and evaluation of electromagnetic simulations 欧洲防御局 "雷达特征与电磁基准 "研讨会:比较和评估电磁模拟的科学论坛
IF 4.2 4区 计算机科学 Q2 ENGINEERING, ELECTRICAL & ELECTRONIC Pub Date : 2025-04-22 DOI: 10.1109/MAP.2025.3537408
Frank Weinmann;Magnus Gustavsson;Åsa Andersson;Fredrik Laurén;Andrey V. Osipov;Johannes Bökler;Andrej Konforta;Victoria Gómez-Guillamón Buendía;Stefania Monni;David Poyatos Martínez;David Escot Bocanegra
The workshop “Radar Signatures & EM Benchmarks” has been established by the European Defence Agency (EDA) in 2017, with the aim of bringing together scientific experts in the field of electromagnetic scattering simulations, specifically in the context of radar signatures. The 3rd workshop was held in 2023, and a few months prior to the workshop, several test cases were published on the workshop’s webpage, which served as benchmarks to compare results obtained by different simulation codes. It turned out that such activities are extremely important for the community, both for the comparison of simulation results and evaluation of tools as well as for the interesting discussions among the leading experts in the field. This paper will provide insights into the workshop by presenting some of the recent test cases and showing some exemplary evaluation of the data computed by the participants.
“雷达特征和电磁基准”研讨会由欧洲防务局(EDA)于2017年建立,旨在汇集电磁散射模拟领域的科学专家,特别是在雷达特征的背景下。第三次研讨会于2023年举行,在研讨会前几个月,研讨会网页上发布了几个测试用例,作为比较不同仿真代码获得结果的基准。事实证明,这样的活动对社区来说非常重要,无论是对模拟结果的比较和工具的评估,还是对该领域领先专家之间有趣的讨论。本文将通过展示一些最近的测试用例,并展示参与者计算的数据的一些示例性评估,来提供对研讨会的深入了解。
{"title":"The European Defence Agency Workshop “Radar Signatures & EM Benchmarks”: A scientific forum for comparison and evaluation of electromagnetic simulations","authors":"Frank Weinmann;Magnus Gustavsson;Åsa Andersson;Fredrik Laurén;Andrey V. Osipov;Johannes Bökler;Andrej Konforta;Victoria Gómez-Guillamón Buendía;Stefania Monni;David Poyatos Martínez;David Escot Bocanegra","doi":"10.1109/MAP.2025.3537408","DOIUrl":"https://doi.org/10.1109/MAP.2025.3537408","url":null,"abstract":"The workshop “Radar Signatures & EM Benchmarks” has been established by the European Defence Agency (EDA) in 2017, with the aim of bringing together scientific experts in the field of electromagnetic scattering simulations, specifically in the context of radar signatures. The 3<sup>rd</sup> workshop was held in 2023, and a few months prior to the workshop, several test cases were published on the workshop’s webpage, which served as benchmarks to compare results obtained by different simulation codes. It turned out that such activities are extremely important for the community, both for the comparison of simulation results and evaluation of tools as well as for the interesting discussions among the leading experts in the field. This paper will provide insights into the workshop by presenting some of the recent test cases and showing some exemplary evaluation of the data computed by the participants.","PeriodicalId":13090,"journal":{"name":"IEEE Antennas and Propagation Magazine","volume":"67 2","pages":"43-50"},"PeriodicalIF":4.2,"publicationDate":"2025-04-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"143860999","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
IEEE Feedback IEEE 反馈
IF 4.2 4区 计算机科学 Q2 ENGINEERING, ELECTRICAL & ELECTRONIC Pub Date : 2025-04-22 DOI: 10.1109/MAP.2025.3552914
{"title":"IEEE Feedback","authors":"","doi":"10.1109/MAP.2025.3552914","DOIUrl":"https://doi.org/10.1109/MAP.2025.3552914","url":null,"abstract":"","PeriodicalId":13090,"journal":{"name":"IEEE Antennas and Propagation Magazine","volume":"67 2","pages":"4-4"},"PeriodicalIF":4.2,"publicationDate":"2025-04-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=10973209","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"143860925","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
History and the Latest Progress in Antenna Packaging Technology: Part 1: Multilayer solutions 天线封装技术的历史与最新进展:第一部分:多层封装解决方案
IF 4.2 4区 计算机科学 Q2 ENGINEERING, ELECTRICAL & ELECTRONIC Pub Date : 2025-03-01 DOI: 10.1109/MAP.2025.3560852
Seung Yoon Lee;Dongseop Lee;Yueping Zhang;Wonbin Hong;Nima Ghalichechian
The demand for millimeter-wave (mmWave) bands is growing due to the need for high-throughput communications, high-resolution sensing, and data-intensive applications such as massive Internet of Things (IoT), virtual reality, augmented reality, and metaverse platforms. Designing antennas for mmWave bands, unlike traditional microwave bands, requires multidimensional considerations such as antenna design methodologies, appropriate material selection, high-performance packaging technologies, and integration with surrounding circuitry. Antenna-in-package (AiP), which integrates transceiver (TRX) dies and antennas into a standard surface-mount package, effectively leverages advanced antenna engineering and heterogeneous integration processes. Codesigned with silicon integrated circuits (ICs) and built on the same silicon dies, antenna-on-chip (AoC) benefits significantly from frequency increases into the terahertz (THz) range. AoC takes advantage of silicon’s low surface roughness and monolithic integration to effectively incorporate antennas alongside peripheral ICs. Glass technology is emerging as a strong candidate for large-volume high-performance applications due to its low dielectric loss, similar thermal expansion coefficient to silicon, large-area panel/wafer size, and low surface roughness. Glass core AiP, which utilizes the low dielectric loss of glass, and antenna-on-display (AoD), which exploits the optical transparency of glass, are both promising concepts for 5G/6G mmWave applications. In this two-part article, we provide a comprehensive overview of antennas in packaging technologies in the mmWave band. In Part 1, we investigate design methodologies and features from different perspectives: material (organic or inorganic) and application [base station (BS) or user mobile terminal (UMT)]. We also review the historical development of multilayer antenna packaging. We then discuss the packaging integration of antenna arrays and radio-frequency ICs (RFICs), which are silicon-based phased-array systems. In Part 2, we focus on emerging techniques for antenna packaging, such as silicon, glass, and 3D integration.
由于需要高通量通信,高分辨率传感和数据密集型应用(如大规模物联网(IoT),虚拟现实,增强现实和元宇宙平台),对毫米波(mmWave)频段的需求正在增长。与传统微波频段不同,毫米波频段天线的设计需要多方面的考虑,如天线设计方法、合适的材料选择、高性能封装技术以及与周围电路的集成。封装天线(AiP)将收发器(TRX)芯片和天线集成到一个标准的表面贴装封装中,有效地利用了先进的天线工程和异构集成工艺。与硅集成电路(ic)共同设计并构建在相同的硅模具上,天线片(AoC)从频率增加到太赫兹(THz)范围中受益匪浅。AoC利用硅的低表面粗糙度和单片集成来有效地将天线与外围ic结合在一起。由于其介电损耗低、与硅相似的热膨胀系数、大面积面板/晶圆尺寸和低表面粗糙度,玻璃技术正成为大容量高性能应用的有力候选者。利用玻璃低介质损耗的玻璃芯AiP和利用玻璃光学透明度的天线显示(AoD)都是5G/6G毫米波应用的有前途的概念。在这篇由两部分组成的文章中,我们提供了毫米波频段中天线封装技术的全面概述。在第一部分中,我们从不同的角度研究设计方法和特征:材料(有机或无机)和应用[基站(BS)或用户移动终端(UMT)]。我们还回顾了多层天线封装的历史发展。然后我们讨论了天线阵列和射频集成电路(rfic)的封装集成,它们是硅基相控阵系统。在第2部分中,我们将重点介绍天线封装的新兴技术,如硅、玻璃和3D集成。
{"title":"History and the Latest Progress in Antenna Packaging Technology: Part 1: Multilayer solutions","authors":"Seung Yoon Lee;Dongseop Lee;Yueping Zhang;Wonbin Hong;Nima Ghalichechian","doi":"10.1109/MAP.2025.3560852","DOIUrl":"https://doi.org/10.1109/MAP.2025.3560852","url":null,"abstract":"The demand for millimeter-wave (mmWave) bands is growing due to the need for high-throughput communications, high-resolution sensing, and data-intensive applications such as massive Internet of Things (IoT), virtual reality, augmented reality, and metaverse platforms. Designing antennas for mmWave bands, unlike traditional microwave bands, requires multidimensional considerations such as antenna design methodologies, appropriate material selection, high-performance packaging technologies, and integration with surrounding circuitry. Antenna-in-package (AiP), which integrates transceiver (TRX) dies and antennas into a standard surface-mount package, effectively leverages advanced antenna engineering and heterogeneous integration processes. Codesigned with silicon integrated circuits (ICs) and built on the same silicon dies, antenna-on-chip (AoC) benefits significantly from frequency increases into the terahertz (THz) range. AoC takes advantage of silicon’s low surface roughness and monolithic integration to effectively incorporate antennas alongside peripheral ICs. Glass technology is emerging as a strong candidate for large-volume high-performance applications due to its low dielectric loss, similar thermal expansion coefficient to silicon, large-area panel/wafer size, and low surface roughness. Glass core AiP, which utilizes the low dielectric loss of glass, and antenna-on-display (AoD), which exploits the optical transparency of glass, are both promising concepts for 5G/6G mmWave applications. In this two-part article, we provide a comprehensive overview of antennas in packaging technologies in the mmWave band. In Part 1, we investigate design methodologies and features from different perspectives: material (organic or inorganic) and application [base station (BS) or user mobile terminal (UMT)]. We also review the historical development of multilayer antenna packaging. We then discuss the packaging integration of antenna arrays and radio-frequency ICs (RFICs), which are silicon-based phased-array systems. In Part 2, we focus on emerging techniques for antenna packaging, such as silicon, glass, and 3D integration.","PeriodicalId":13090,"journal":{"name":"IEEE Antennas and Propagation Magazine","volume":"67 3","pages":"48-61"},"PeriodicalIF":4.2,"publicationDate":"2025-03-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"144536492","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"计算机科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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IEEE Antennas and Propagation Magazine
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