首页 > 最新文献

IEEE Transactions on Applied Superconductivity最新文献

英文 中文
Inversion of Equivalent Contact Resistivities of Parallel-Wound Metal-Insulation HTS Coil Based on Experimental Data and Multilevel Simulation 基于实验数据和多级仿真的并联绕线金属绝缘高温超导线圈等效接触电阻率反演
IF 1.8 3区 物理与天体物理 Q3 ENGINEERING, ELECTRICAL & ELECTRONIC Pub Date : 2026-01-05 DOI: 10.1109/TASC.2025.3650502
Hongzhuo Zeng;Qiuliang Wang;Yong Chen;Kangshuai Wang;Benzhe Zhou;Xiaoyu Ji;Fangliang Dong;Shunzhong Chen;Yinming Dai;Zili Zhang;Lei Wang;Jianhua Liu;Lei Qi
Equivalent contact resistivity is a key parameter that affects the dynamic process and overcurrent characteristic of the non-insulation (NI) high-temperature superconducting coil. Adding stainless steel material between turns of a parallel-wound NI coil results in the formation of various types of internal contact interfaces. Therefore, describing the shunt behavior of the coil, i.e., the parallel-wound metal-insulation (PWMI) coil, requires more than one equivalent contact resistivity, which makes it difficult to determine their specific values only through coil inductance and time constant. To handle this problem, we propose a method to acquire distinct equivalent contact resistivities of the PWMI coil. In this method, the equivalent contact resistivities are inverted based on the measured coil voltage or magnetic field. The bridge to connect the experimental data and equivalent contact resistivities is the streamlined field–circuit coupling model based on the T–A formulation, which can reflect the complex electromagnetic topology and the distribution of equivalent contact resistivities of the PWMI coil. After obtaining the measurement results, the least-squares method is used to optimize the equivalent contact resistivities until the simulation curve is sufficiently consistent with the experimental curve. In order to improve the efficiency of the optimization, we construct the lumped circuit model of the PWMI coil. Before the optimization process begins, the initial values of equivalent contact resistivities can be obtained based on this model, which can reduce the search scope of the optimization. The results of multiprocess testing indicate that using the equivalent contact resistivities obtained by the proposed method can effectively predict the transient behavior of the coil.
等效接触电阻率是影响非绝缘高温超导线圈动态过程和过流特性的关键参数。在并联NI线圈的匝数之间加入不锈钢材料可形成各种类型的内部接触界面。因此,描述线圈的分流行为,即并联金属绝缘(PWMI)线圈,需要多个等效接触电阻率,这使得仅通过线圈电感和时间常数很难确定它们的具体值。为了解决这一问题,我们提出了一种获取PWMI线圈不同等效接触电阻率的方法。在这种方法中,等效接触电阻率根据测量的线圈电压或磁场进行反转。连接实验数据和等效接触电阻率的桥梁是基于T-A公式的流线型场路耦合模型,该模型能够反映PWMI线圈复杂的电磁拓扑结构和等效接触电阻率的分布。得到测量结果后,利用最小二乘法对等效接触电阻率进行优化,直至仿真曲线与实验曲线充分吻合。为了提高优化效率,我们建立了PWMI线圈的集总电路模型。在优化过程开始之前,基于该模型可以获得等效接触电阻率的初始值,从而减小了优化的搜索范围。多过程测试结果表明,利用该方法得到的等效接触电阻率可以有效地预测线圈的瞬态行为。
{"title":"Inversion of Equivalent Contact Resistivities of Parallel-Wound Metal-Insulation HTS Coil Based on Experimental Data and Multilevel Simulation","authors":"Hongzhuo Zeng;Qiuliang Wang;Yong Chen;Kangshuai Wang;Benzhe Zhou;Xiaoyu Ji;Fangliang Dong;Shunzhong Chen;Yinming Dai;Zili Zhang;Lei Wang;Jianhua Liu;Lei Qi","doi":"10.1109/TASC.2025.3650502","DOIUrl":"https://doi.org/10.1109/TASC.2025.3650502","url":null,"abstract":"Equivalent contact resistivity is a key parameter that affects the dynamic process and overcurrent characteristic of the non-insulation (NI) high-temperature superconducting coil. Adding stainless steel material between turns of a parallel-wound NI coil results in the formation of various types of internal contact interfaces. Therefore, describing the shunt behavior of the coil, i.e., the parallel-wound metal-insulation (PWMI) coil, requires more than one equivalent contact resistivity, which makes it difficult to determine their specific values only through coil inductance and time constant. To handle this problem, we propose a method to acquire distinct equivalent contact resistivities of the PWMI coil. In this method, the equivalent contact resistivities are inverted based on the measured coil voltage or magnetic field. The bridge to connect the experimental data and equivalent contact resistivities is the streamlined field–circuit coupling model based on the <italic>T</i>–<italic>A</i> formulation, which can reflect the complex electromagnetic topology and the distribution of equivalent contact resistivities of the PWMI coil. After obtaining the measurement results, the least-squares method is used to optimize the equivalent contact resistivities until the simulation curve is sufficiently consistent with the experimental curve. In order to improve the efficiency of the optimization, we construct the lumped circuit model of the PWMI coil. Before the optimization process begins, the initial values of equivalent contact resistivities can be obtained based on this model, which can reduce the search scope of the optimization. The results of multiprocess testing indicate that using the equivalent contact resistivities obtained by the proposed method can effectively predict the transient behavior of the coil.","PeriodicalId":13104,"journal":{"name":"IEEE Transactions on Applied Superconductivity","volume":"36 2","pages":"1-12"},"PeriodicalIF":1.8,"publicationDate":"2026-01-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"146026575","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Enhancing Equivalent Circuit Simulation of Intrinsic Josephson Junction Stacks Using Modularization of LTspice Elements 利用LTspice元件模块化增强内禀约瑟夫森结堆等效电路仿真
IF 1.8 3区 物理与天体物理 Q3 ENGINEERING, ELECTRICAL & ELECTRONIC Pub Date : 2026-01-05 DOI: 10.1109/TASC.2026.3650872
Rintaro Mori;Ryota Kobayashi;Itsuhiro Kakeya
In this article, we have developed a construction method of equivalent circuits for an intrinsic Josephson junction stack using the modularization feature in LTspice. This method improves the readability of circuit diagrams in circuit simulations of terahertz (THz)-radiating Josephson plasma emitters and enhances scalability, such as modifying the number of coherently oscillating junctions. These improvements enable easier simulation of complex models and parameter sweeps, contributing to device optimization for practical THz emitters.
在本文中,我们开发了一种利用LTspice的模块化特性构建等效电路的方法。该方法提高了太赫兹(THz)辐射约瑟夫森等离子体发射器电路仿真中电路图的可读性,并增强了可扩展性,例如修改相干振荡结的数量。这些改进使复杂模型和参数扫描的模拟更容易,有助于实际太赫兹发射器的器件优化。
{"title":"Enhancing Equivalent Circuit Simulation of Intrinsic Josephson Junction Stacks Using Modularization of LTspice Elements","authors":"Rintaro Mori;Ryota Kobayashi;Itsuhiro Kakeya","doi":"10.1109/TASC.2026.3650872","DOIUrl":"https://doi.org/10.1109/TASC.2026.3650872","url":null,"abstract":"In this article, we have developed a construction method of equivalent circuits for an intrinsic Josephson junction stack using the modularization feature in LTspice. This method improves the readability of circuit diagrams in circuit simulations of terahertz (THz)-radiating Josephson plasma emitters and enhances scalability, such as modifying the number of coherently oscillating junctions. These improvements enable easier simulation of complex models and parameter sweeps, contributing to device optimization for practical THz emitters.","PeriodicalId":13104,"journal":{"name":"IEEE Transactions on Applied Superconductivity","volume":"36 4","pages":"1-5"},"PeriodicalIF":1.8,"publicationDate":"2026-01-05","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"146175917","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Development of a Microwave SQUID Multiplexer for Magnetic Microbolometers 磁微辐射热计用微波SQUID多路复用器的研制
IF 1.8 3区 物理与天体物理 Q3 ENGINEERING, ELECTRICAL & ELECTRONIC Pub Date : 2025-12-31 DOI: 10.1109/TASC.2025.3649716
N. Müller;J. Bonilla-Neira;J. Geria;M. García Redondo;L. Ferreyro;M. Hampel;M. Wegner;A. Almela;S. Kempf
The search for primordial B-modes in the cosmic microwave background (CMB) requires highly sensitive and scalable detector systems. The magnetic microbolometer (MMB) is an emerging detector concept that exploits the magnetic properties of paramagnetic materials at sub-kelvin temperatures, offering bolometers with a high dynamic range and low intrinsic noise. In recent years, the microwave SQUID multiplexer ($mu$MUX) has become a key technology to efficiently read large low-temperature detector arrays, enabling the readout of hundreds to thousands of detectors over a single transmission line with low noise and minimal power dissipation while reducing the cryogenic setup complexity. In this work, we report the design, fabrication and characterization of a $mu$MUX optimized for MMB detectors and share our latest experimental results from a bolometer prototype. These findings provide valuable insight of the $mu$MUX in advancing next-generation CMB instrumentation and also demonstrate its suitability for novel detector technologies such as the MMB.
在宇宙微波背景(CMB)中寻找原始b模需要高灵敏度和可扩展的探测器系统。磁性微辐射热计(MMB)是一种新兴的探测器概念,它利用顺磁性材料在亚开尔文温度下的磁性,提供具有高动态范围和低固有噪声的辐射热计。近年来,微波SQUID多路复用器($mu$MUX)已成为高效读取大型低温探测器阵列的关键技术,能够在一条传输线上读取数百到数千个探测器,具有低噪声和最小功耗,同时降低了低温设置的复杂性。在这项工作中,我们报告了为MMB探测器优化的$mu$MUX的设计,制造和表征,并分享了我们从一个测热计原型中获得的最新实验结果。这些发现提供了$mu$MUX在推进下一代CMB仪器方面的有价值的见解,也证明了它适用于新的探测器技术,如MMB。
{"title":"Development of a Microwave SQUID Multiplexer for Magnetic Microbolometers","authors":"N. Müller;J. Bonilla-Neira;J. Geria;M. García Redondo;L. Ferreyro;M. Hampel;M. Wegner;A. Almela;S. Kempf","doi":"10.1109/TASC.2025.3649716","DOIUrl":"https://doi.org/10.1109/TASC.2025.3649716","url":null,"abstract":"The search for primordial B-modes in the cosmic microwave background (CMB) requires highly sensitive and scalable detector systems. The magnetic microbolometer (MMB) is an emerging detector concept that exploits the magnetic properties of paramagnetic materials at sub-kelvin temperatures, offering bolometers with a high dynamic range and low intrinsic noise. In recent years, the microwave SQUID multiplexer (<inline-formula><tex-math>$mu$</tex-math></inline-formula>MUX) has become a key technology to efficiently read large low-temperature detector arrays, enabling the readout of hundreds to thousands of detectors over a single transmission line with low noise and minimal power dissipation while reducing the cryogenic setup complexity. In this work, we report the design, fabrication and characterization of a <inline-formula><tex-math>$mu$</tex-math></inline-formula>MUX optimized for MMB detectors and share our latest experimental results from a bolometer prototype. These findings provide valuable insight of the <inline-formula><tex-math>$mu$</tex-math></inline-formula>MUX in advancing next-generation CMB instrumentation and also demonstrate its suitability for novel detector technologies such as the MMB.","PeriodicalId":13104,"journal":{"name":"IEEE Transactions on Applied Superconductivity","volume":"36 6","pages":"1-5"},"PeriodicalIF":1.8,"publicationDate":"2025-12-31","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"146175901","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Polycrystalline Phase Formation of Co-Doped BaFe2As2 Studied by In-Situ 4D-STEM 原位4D-STEM研究共掺杂BaFe2As2的多晶相形成
IF 1.8 3区 物理与天体物理 Q3 ENGINEERING, ELECTRICAL & ELECTRONIC Pub Date : 2025-12-31 DOI: 10.1109/TASC.2025.3649784
Yiming Ma;Yusuke Shimada;Hongye Gao;Yuta Hasegawa;Shinnosuke Tokuta;Akiyasu Yamamoto;Akinori Yamanaka;Satoshi Hata
For polycrystalline cobalt-doped BaFe2As2 (Ba122:Co) superconductors, controlling their microstructure, such as grain size, crystallographic texture, is crucial for achieving high critical current densities (Jc). A prevailing academic view holds that heat treatment is a key step in forming a desired crystallographic texture. This study performed in-situ heating and four-dimensional scanning transmission electron microscopy (4D-STEM) observation to characterize microstructural evolution in precursor Ba122:Co powders prepared by high-energy ball milling and subsequent spark plasma sintering. A formation path for the Ba122 phase was revealed: a crystallographic orientation relationship was recognized between fine Ba122 grains and adjacent larger FeAs grains in the precursor powders, which suggests epitaxial growth of the Ba122 phase from the FeAs phase. However, in the subsequent in-situ heating process, the microstructural changes in the thin foil specimens of the precursor powders exhibited a different trend from that of bulk specimens of the precursor powders: the fine Ba122 grains did not coarsen but exhibit grain refinement and amorphization. The observed results described above were discussed from the viewpoints of the microstructural control of polycrystalline Ba122:Co.
对于多晶钴掺杂BaFe2As2 (Ba122:Co)超导体,控制其微观结构,如晶粒尺寸,晶体织构,是实现高临界电流密度(Jc)的关键。一种流行的学术观点认为,热处理是形成所需晶体结构的关键步骤。本研究采用原位加热和四维扫描透射电子显微镜(4D-STEM)观察了高能球磨和放电等离子烧结制备的Ba122:Co前驱体粉末的微观结构演变。揭示了Ba122相的形成路径:在前驱体粉末中,细小的Ba122晶粒与相邻较大的FeAs晶粒之间存在晶体取向关系,表明Ba122相是由FeAs相外延生长而来。然而,在随后的原位加热过程中,前驱体粉末的薄片试样的显微组织变化趋势与前驱体粉末的大块试样不同:细小的Ba122晶粒没有变粗,而是呈现出晶粒细化和非晶化。从多晶Ba122:Co的微观组织控制角度对上述观察结果进行了讨论。
{"title":"Polycrystalline Phase Formation of Co-Doped BaFe2As2 Studied by In-Situ 4D-STEM","authors":"Yiming Ma;Yusuke Shimada;Hongye Gao;Yuta Hasegawa;Shinnosuke Tokuta;Akiyasu Yamamoto;Akinori Yamanaka;Satoshi Hata","doi":"10.1109/TASC.2025.3649784","DOIUrl":"https://doi.org/10.1109/TASC.2025.3649784","url":null,"abstract":"For polycrystalline cobalt-doped BaFe<sub>2</sub>As<sub>2</sub> (Ba122:Co) superconductors, controlling their microstructure, such as grain size, crystallographic texture, is crucial for achieving high critical current densities (<italic>J</i><sub>c</sub>). A prevailing academic view holds that heat treatment is a key step in forming a desired crystallographic texture. This study performed in-situ heating and four-dimensional scanning transmission electron microscopy (4D-STEM) observation to characterize microstructural evolution in precursor Ba122:Co powders prepared by high-energy ball milling and subsequent spark plasma sintering. A formation path for the Ba122 phase was revealed: a crystallographic orientation relationship was recognized between fine Ba122 grains and adjacent larger FeAs grains in the precursor powders, which suggests epitaxial growth of the Ba122 phase from the FeAs phase. However, in the subsequent in-situ heating process, the microstructural changes in the thin foil specimens of the precursor powders exhibited a different trend from that of bulk specimens of the precursor powders: the fine Ba122 grains did not coarsen but exhibit grain refinement and amorphization. The observed results described above were discussed from the viewpoints of the microstructural control of polycrystalline Ba122:Co.","PeriodicalId":13104,"journal":{"name":"IEEE Transactions on Applied Superconductivity","volume":"36 5","pages":"1-5"},"PeriodicalIF":1.8,"publicationDate":"2025-12-31","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"146026519","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Effects of Edge Geometry and Interface Characteristics on Delamination Strength of REBCO Tapes Under Transverse Tension Using Anvil Method 边缘几何形状和界面特性对横向拉伸下REBCO带分层强度的影响
IF 1.8 3区 物理与天体物理 Q3 ENGINEERING, ELECTRICAL & ELECTRONIC Pub Date : 2025-12-31 DOI: 10.1109/TASC.2025.3649790
Richard Pascua;Michael de Leon;Sang Heon Lee;Hyung-Seop Shin
Multilayer REBCO-coated conductor (CC) tapes undergo various stresses and strains when utilized in superconducting devices such as high-field magnets and coils. The stresses encountered by REBCO tapes include radial transverse tensile stresses from Lorenz forces and thermal stresses arising from differences in the thermal expansion coefficients of the constituent layers during quenching. These stresses can cause delamination at multiple interfaces within the REBCO CC tape’s multilayer architecture, compromising its integrity and leading to catastrophic failure of the superconducting device. Meanwhile, the Cu stabilizer surrounding the CC tape plays a key role in preventing delamination failure by binding multiple constituent layers with different mechanical properties and maintaining structural stability against transverse external forces. However, the effect of slit edges created during CC tape manufacturing on delamination resistance under transverse loading remains unclear. To address this critical research gap, we conducted comprehensive delamination tests using the anvil method. We compared the effects of the slit edge geometry and the Cu layer at the edges on the mechanical delamination strength of REBCO CC tapes. By conducting a comprehensive analysis, we aimed to examine the roles of edge geometry and interfacial properties in the delamination behavior of REBCO CC tapes. This will offer valuable insights for optimizing the design and fabrication of these high-field coils, contributing to the development of more robust and reliable superconducting devices.
多层rebco涂层导体(CC)带在高场磁体和线圈等超导器件中使用时,承受各种应力和应变。REBCO带遇到的应力包括来自洛伦兹力的径向横向拉伸应力和淬火过程中组成层热膨胀系数差异引起的热应力。这些应力会导致REBCO CC胶带多层结构中的多个界面发生分层,损害其完整性并导致超导器件的灾难性故障。同时,CC胶带周围的Cu稳定剂通过结合具有不同力学性能的多个组成层,保持结构在横向外力作用下的稳定性,对防止分层失效起着关键作用。然而,在CC胶带制造过程中产生的狭缝边缘对横向载荷下的分层阻力的影响仍不清楚。为了解决这一关键的研究空白,我们使用砧法进行了全面的分层试验。我们比较了缝边几何形状和边缘Cu层对REBCO CC带机械分层强度的影响。通过进行全面的分析,我们旨在研究边缘几何形状和界面性质在REBCO CC胶带分层行为中的作用。这将为优化这些高场线圈的设计和制造提供有价值的见解,有助于开发更坚固可靠的超导器件。
{"title":"Effects of Edge Geometry and Interface Characteristics on Delamination Strength of REBCO Tapes Under Transverse Tension Using Anvil Method","authors":"Richard Pascua;Michael de Leon;Sang Heon Lee;Hyung-Seop Shin","doi":"10.1109/TASC.2025.3649790","DOIUrl":"https://doi.org/10.1109/TASC.2025.3649790","url":null,"abstract":"Multilayer REBCO-coated conductor (CC) tapes undergo various stresses and strains when utilized in superconducting devices such as high-field magnets and coils. The stresses encountered by REBCO tapes include radial transverse tensile stresses from Lorenz forces and thermal stresses arising from differences in the thermal expansion coefficients of the constituent layers during quenching. These stresses can cause delamination at multiple interfaces within the REBCO CC tape’s multilayer architecture, compromising its integrity and leading to catastrophic failure of the superconducting device. Meanwhile, the Cu stabilizer surrounding the CC tape plays a key role in preventing delamination failure by binding multiple constituent layers with different mechanical properties and maintaining structural stability against transverse external forces. However, the effect of slit edges created during CC tape manufacturing on delamination resistance under transverse loading remains unclear. To address this critical research gap, we conducted comprehensive delamination tests using the anvil method. We compared the effects of the slit edge geometry and the Cu layer at the edges on the mechanical delamination strength of REBCO CC tapes. By conducting a comprehensive analysis, we aimed to examine the roles of edge geometry and interfacial properties in the delamination behavior of REBCO CC tapes. This will offer valuable insights for optimizing the design and fabrication of these high-field coils, contributing to the development of more robust and reliable superconducting devices.","PeriodicalId":13104,"journal":{"name":"IEEE Transactions on Applied Superconductivity","volume":"36 5","pages":"1-5"},"PeriodicalIF":1.8,"publicationDate":"2025-12-31","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"145982242","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
IEEE Transactions on Applied Superconductivity Information for Authors IEEE应用超导信息汇刊
IF 1.8 3区 物理与天体物理 Q3 ENGINEERING, ELECTRICAL & ELECTRONIC Pub Date : 2025-12-29 DOI: 10.1109/TASC.2025.3644628
{"title":"IEEE Transactions on Applied Superconductivity Information for Authors","authors":"","doi":"10.1109/TASC.2025.3644628","DOIUrl":"https://doi.org/10.1109/TASC.2025.3644628","url":null,"abstract":"","PeriodicalId":13104,"journal":{"name":"IEEE Transactions on Applied Superconductivity","volume":"36 1","pages":"C4-C4"},"PeriodicalIF":1.8,"publicationDate":"2025-12-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=11318111","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"145879970","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
IEEE Membership IEEE会员
IF 1.8 3区 物理与天体物理 Q3 ENGINEERING, ELECTRICAL & ELECTRONIC Pub Date : 2025-12-29 DOI: 10.1109/TASC.2025.3648613
{"title":"IEEE Membership","authors":"","doi":"10.1109/TASC.2025.3648613","DOIUrl":"https://doi.org/10.1109/TASC.2025.3648613","url":null,"abstract":"","PeriodicalId":13104,"journal":{"name":"IEEE Transactions on Applied Superconductivity","volume":"36 1","pages":"1-1"},"PeriodicalIF":1.8,"publicationDate":"2025-12-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=11318089","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"145886625","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
IEEE Transactions on Applied Superconductivity Subject Categories for Article Numbering Information 用于物品编号信息的应用超导主题分类
IF 1.8 3区 物理与天体物理 Q3 ENGINEERING, ELECTRICAL & ELECTRONIC Pub Date : 2025-12-29 DOI: 10.1109/TASC.2025.3644634
{"title":"IEEE Transactions on Applied Superconductivity Subject Categories for Article Numbering Information","authors":"","doi":"10.1109/TASC.2025.3644634","DOIUrl":"https://doi.org/10.1109/TASC.2025.3644634","url":null,"abstract":"","PeriodicalId":13104,"journal":{"name":"IEEE Transactions on Applied Superconductivity","volume":"36 1","pages":"C3-C3"},"PeriodicalIF":1.8,"publicationDate":"2025-12-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=11318110","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"145886627","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
IEEE Transactions on Applied Superconductivity Publication Information IEEE应用超导学报出版信息
IF 1.8 3区 物理与天体物理 Q3 ENGINEERING, ELECTRICAL & ELECTRONIC Pub Date : 2025-12-29 DOI: 10.1109/TASC.2025.3644630
{"title":"IEEE Transactions on Applied Superconductivity Publication Information","authors":"","doi":"10.1109/TASC.2025.3644630","DOIUrl":"https://doi.org/10.1109/TASC.2025.3644630","url":null,"abstract":"","PeriodicalId":13104,"journal":{"name":"IEEE Transactions on Applied Superconductivity","volume":"36 1","pages":"C2-C2"},"PeriodicalIF":1.8,"publicationDate":"2025-12-29","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://ieeexplore.ieee.org/stamp/stamp.jsp?tp=&arnumber=11318112","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"145886640","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Accelerating Storage Lifetime Testing of Microcalorimeter Arrays for NewAthena X-IFU NewAthena X-IFU微热计阵列的加速存储寿命测试
IF 1.8 3区 物理与天体物理 Q3 ENGINEERING, ELECTRICAL & ELECTRONIC Pub Date : 2025-12-26 DOI: 10.1109/TASC.2025.3648679
Joshua D. Fuhrman;Fred M. Finkbeiner;Joseph S. Adams;Simon R. Bandler;Rachel B. Borrelli;James A. Chervenak;Tannaz Farrahi;Felipe A. Colazo Petit;Renata S. Cumbee;Samuel V. Hull;Richard L. Kelley;Caroline A. Kilbourne;Haruka Muramatsu;Frederick Scott Porter;Asha Rani;Kazuhiro Sakai;Stephen J. Smith;Ambarish C. Venkatasubraman;Nicholas A. Wakeham;Edward J. Wassell;Michael C. Witthoeft;Sang H. Yoon
The X-IFU instrument for ESA’s upcoming flagship mission Athena will use Mo/Au bilayer transition-edge sensors (TES) with Au/Bi X-ray absorbers to form a kilopixel microcalorimeter array. Such detectors require careful calibration to maintain their best possible performance, but such calibrations can change over long periods of time when exposed to certain environmental conditions. We have previously reported the effects of humidity and elevated temperature on prototype array characteristics. In that study, storage of a prototype array at 60 $^{circ }$C for ten days under vacuum produced an unexpected shift in the TES critical temperature T$_{c}$ (+13% to +19%) and normal resistance R$_{n}$ (+4%). In this work, we continue investigating shifts in array characteristics after long-duration temperature exposures so that safe storage and handling conditions for X-IFU flight arrays can be set. A prototype array exposed to 35 $^{circ }$C under vacuum for 26 days gradually increased in TES normal resistance. The energy scale of a second prototype array was measured before aging and then recovered to within 0.5 eV following a similar aging induced R$_{n}$ increase. Aging of the TES was studied directly by applying the same thermal conditions exclusively to Mo/Au bilayers on Si substrate. These measurements allow a better understanding of the cause of the observed shift by decoupling the TES bilayer from the remaining device structures, such as the SiNx membrane and the absorber. Four-point resistance measurements were used to readout the bilayer samples at 4.2 K. Bilayers aged in a vacuum generally saw no change or a slight increase in resistance, while bilayers aged in nitrogen gas decreased in resistance. Finally, we conclude with a comparative overview of all test results on prototype arrays and TES bilayers, elaborate on possible mechanisms for the observed shifts in characteristics, and make recommendations for maintaining the long-term stability of our devices.
ESA即将推出的旗舰任务雅典娜的X-IFU仪器将使用Mo/Au双层过渡边缘传感器(TES)和Au/Bi x射线吸收器形成千像素微热量计阵列。这种探测器需要仔细校准以保持其最佳性能,但是当暴露在某些环境条件下时,这种校准可能会在长时间内发生变化。我们之前已经报道了湿度和温度升高对原型阵列特性的影响。在该研究中,在真空条件下,将原型阵列在60 $ {circ}$C下存储10天,产生了TES临界温度T$ {C}$(+13%至+19%)和正常电阻R$ {n}$(+4%)的意外变化。在这项工作中,我们将继续研究长时间温度暴露后阵列特性的变化,以便为X-IFU飞行阵列设置安全存储和处理条件。样品阵列在真空条件下暴露于35 $^{circ}$C下26天,TES正常电阻逐渐增加。第二个原型阵列的能量尺度在老化前测量,然后在类似的老化诱导R$_{n}$增加后恢复到0.5 eV以内。通过对Si衬底上的Mo/Au双分子层施加相同的热条件,直接研究了TES的老化。通过将TES双分子层与其他器件结构(如SiNx膜和吸收器)解耦,这些测量可以更好地理解所观察到的位移的原因。采用四点电阻测量来读取4.2 K下的双层样品。在真空中老化的双层膜的电阻一般没有变化或略有增加,而在氮气中老化的双层膜的电阻则有所下降。最后,我们总结了在原型阵列和TES双层上的所有测试结果的比较概述,详细阐述了观察到的特性变化的可能机制,并提出了保持我们设备长期稳定性的建议。
{"title":"Accelerating Storage Lifetime Testing of Microcalorimeter Arrays for NewAthena X-IFU","authors":"Joshua D. Fuhrman;Fred M. Finkbeiner;Joseph S. Adams;Simon R. Bandler;Rachel B. Borrelli;James A. Chervenak;Tannaz Farrahi;Felipe A. Colazo Petit;Renata S. Cumbee;Samuel V. Hull;Richard L. Kelley;Caroline A. Kilbourne;Haruka Muramatsu;Frederick Scott Porter;Asha Rani;Kazuhiro Sakai;Stephen J. Smith;Ambarish C. Venkatasubraman;Nicholas A. Wakeham;Edward J. Wassell;Michael C. Witthoeft;Sang H. Yoon","doi":"10.1109/TASC.2025.3648679","DOIUrl":"https://doi.org/10.1109/TASC.2025.3648679","url":null,"abstract":"The X-IFU instrument for ESA’s upcoming flagship mission Athena will use Mo/Au bilayer transition-edge sensors (TES) with Au/Bi X-ray absorbers to form a kilopixel microcalorimeter array. Such detectors require careful calibration to maintain their best possible performance, but such calibrations can change over long periods of time when exposed to certain environmental conditions. We have previously reported the effects of humidity and elevated temperature on prototype array characteristics. In that study, storage of a prototype array at 60 <inline-formula><tex-math>$^{circ }$</tex-math></inline-formula>C for ten days under vacuum produced an unexpected shift in the TES critical temperature T<inline-formula><tex-math>$_{c}$</tex-math></inline-formula> (+13% to +19%) and normal resistance R<inline-formula><tex-math>$_{n}$</tex-math></inline-formula> (+4%). In this work, we continue investigating shifts in array characteristics after long-duration temperature exposures so that safe storage and handling conditions for X-IFU flight arrays can be set. A prototype array exposed to 35 <inline-formula><tex-math>$^{circ }$</tex-math></inline-formula>C under vacuum for 26 days gradually increased in TES normal resistance. The energy scale of a second prototype array was measured before aging and then recovered to within 0.5 eV following a similar aging induced R<inline-formula><tex-math>$_{n}$</tex-math></inline-formula> increase. Aging of the TES was studied directly by applying the same thermal conditions exclusively to Mo/Au bilayers on Si substrate. These measurements allow a better understanding of the cause of the observed shift by decoupling the TES bilayer from the remaining device structures, such as the SiNx membrane and the absorber. Four-point resistance measurements were used to readout the bilayer samples at 4.2 K. Bilayers aged in a vacuum generally saw no change or a slight increase in resistance, while bilayers aged in nitrogen gas decreased in resistance. Finally, we conclude with a comparative overview of all test results on prototype arrays and TES bilayers, elaborate on possible mechanisms for the observed shifts in characteristics, and make recommendations for maintaining the long-term stability of our devices.","PeriodicalId":13104,"journal":{"name":"IEEE Transactions on Applied Superconductivity","volume":"36 6","pages":"1-7"},"PeriodicalIF":1.8,"publicationDate":"2025-12-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"146057653","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":3,"RegionCategory":"物理与天体物理","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
期刊
IEEE Transactions on Applied Superconductivity
全部 Acc. Chem. Res. ACS Applied Bio Materials ACS Appl. Electron. Mater. ACS Appl. Energy Mater. ACS Appl. Mater. Interfaces ACS Appl. Nano Mater. ACS Appl. Polym. Mater. ACS BIOMATER-SCI ENG ACS Catal. ACS Cent. Sci. ACS Chem. Biol. ACS Chemical Health & Safety ACS Chem. Neurosci. ACS Comb. Sci. ACS Earth Space Chem. ACS Energy Lett. ACS Infect. Dis. ACS Macro Lett. ACS Mater. Lett. ACS Med. Chem. Lett. ACS Nano ACS Omega ACS Photonics ACS Sens. ACS Sustainable Chem. Eng. ACS Synth. Biol. Anal. Chem. BIOCHEMISTRY-US Bioconjugate Chem. BIOMACROMOLECULES Chem. Res. Toxicol. Chem. Rev. Chem. Mater. CRYST GROWTH DES ENERG FUEL Environ. Sci. Technol. Environ. Sci. Technol. Lett. Eur. J. Inorg. Chem. IND ENG CHEM RES Inorg. Chem. J. Agric. Food. Chem. J. Chem. Eng. Data J. Chem. Educ. J. Chem. Inf. Model. J. Chem. Theory Comput. J. Med. Chem. J. Nat. Prod. J PROTEOME RES J. Am. Chem. Soc. LANGMUIR MACROMOLECULES Mol. Pharmaceutics Nano Lett. Org. Lett. ORG PROCESS RES DEV ORGANOMETALLICS J. Org. Chem. J. Phys. Chem. J. Phys. Chem. A J. Phys. Chem. B J. Phys. Chem. C J. Phys. Chem. Lett. Analyst Anal. Methods Biomater. Sci. Catal. Sci. Technol. Chem. Commun. Chem. Soc. Rev. CHEM EDUC RES PRACT CRYSTENGCOMM Dalton Trans. Energy Environ. Sci. ENVIRON SCI-NANO ENVIRON SCI-PROC IMP ENVIRON SCI-WAT RES Faraday Discuss. Food Funct. Green Chem. Inorg. Chem. Front. Integr. Biol. J. Anal. At. Spectrom. J. Mater. Chem. A J. Mater. Chem. B J. Mater. Chem. C Lab Chip Mater. Chem. Front. Mater. Horiz. MEDCHEMCOMM Metallomics Mol. Biosyst. Mol. Syst. Des. Eng. Nanoscale Nanoscale Horiz. Nat. Prod. Rep. New J. Chem. Org. Biomol. Chem. Org. Chem. Front. PHOTOCH PHOTOBIO SCI PCCP Polym. Chem.
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
0
微信
客服QQ
Book学术公众号 扫码关注我们
反馈
×
意见反馈
请填写您的意见或建议
请填写您的手机或邮箱
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
现在去查看 取消
×
提示
确定
Book学术官方微信
Book学术文献互助
Book学术文献互助群
群 号:604180095
Book学术
文献互助 智能选刊 最新文献 互助须知 联系我们:info@booksci.cn
Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。
Copyright © 2023 Book学术 All rights reserved.
ghs 京公网安备 11010802042870号 京ICP备2023020795号-1