Pub Date : 1998-06-22DOI: 10.1109/ICSD.1998.709267
K. Kim, J. Lim, W. Ryu, J. Lee
Low dielectric constant fluorocarbonated siliceous films were deposited by PECVD (plasma enhanced chemical vapor deposition) using 2% SiH/sub 4//N/sub 2/ and CF/sub 4/ gases in the chamber with parallel plate electrode of 13.56 MHz RF. The effects of RF power, chamber pressure and gas composition on the deposition rate were studied and the morphology of the films was tested by AES, XPS, AFM and SEM. The dielectric constant of the film determined by the capacitance-voltage measurements was 2.3.
{"title":"Dielectric properties of SiCF film deposited by PECVD with low dielectric constants","authors":"K. Kim, J. Lim, W. Ryu, J. Lee","doi":"10.1109/ICSD.1998.709267","DOIUrl":"https://doi.org/10.1109/ICSD.1998.709267","url":null,"abstract":"Low dielectric constant fluorocarbonated siliceous films were deposited by PECVD (plasma enhanced chemical vapor deposition) using 2% SiH/sub 4//N/sub 2/ and CF/sub 4/ gases in the chamber with parallel plate electrode of 13.56 MHz RF. The effects of RF power, chamber pressure and gas composition on the deposition rate were studied and the morphology of the films was tested by AES, XPS, AFM and SEM. The dielectric constant of the film determined by the capacitance-voltage measurements was 2.3.","PeriodicalId":13148,"journal":{"name":"ICSD'98. Proceedings of the 1998 IEEE 6th International Conference on Conduction and Breakdown in Solid Dielectrics (Cat. No.98CH36132)","volume":"39 1","pages":"229-232"},"PeriodicalIF":0.0,"publicationDate":"1998-06-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"84993772","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1998-06-22DOI: 10.1109/ICSD.1998.709346
T. Koyama, Y. Zhu, T. Otsuka, T. Takada, Y. Murooka
We have developed a new high-speed and sensitive 2-Dimensional automatic measurement system with which the birefringence vector distribution corresponding to the internal stress distribution in a PMMA disk can be measured. The results obtained in a series of this experiment are compared with that obtained using the finite element calculation method.
{"title":"An automatic measurement system for 2-dimensional birefringence vector distribution","authors":"T. Koyama, Y. Zhu, T. Otsuka, T. Takada, Y. Murooka","doi":"10.1109/ICSD.1998.709346","DOIUrl":"https://doi.org/10.1109/ICSD.1998.709346","url":null,"abstract":"We have developed a new high-speed and sensitive 2-Dimensional automatic measurement system with which the birefringence vector distribution corresponding to the internal stress distribution in a PMMA disk can be measured. The results obtained in a series of this experiment are compared with that obtained using the finite element calculation method.","PeriodicalId":13148,"journal":{"name":"ICSD'98. Proceedings of the 1998 IEEE 6th International Conference on Conduction and Breakdown in Solid Dielectrics (Cat. No.98CH36132)","volume":"55 1","pages":"557-560"},"PeriodicalIF":0.0,"publicationDate":"1998-06-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"84469753","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1998-06-22DOI: 10.1109/ICSD.1998.709265
A. Kawamoto, Y. Suzuoki, T. Ikejiri, T. Mizutani, M. Ieda
In order to clarify the asymmetric properties on the basis of electronic levels, it is necessary to establish the methods for estimating electronic levels in polymers. In this paper, electronic levels in insulating polymers were estimated by contact potential difference, XPS, UPS in air and photoinjection current and the correlation among the estimated levels was investigated.
{"title":"Electronic levels insulating polymers estimated by XPS and UPS","authors":"A. Kawamoto, Y. Suzuoki, T. Ikejiri, T. Mizutani, M. Ieda","doi":"10.1109/ICSD.1998.709265","DOIUrl":"https://doi.org/10.1109/ICSD.1998.709265","url":null,"abstract":"In order to clarify the asymmetric properties on the basis of electronic levels, it is necessary to establish the methods for estimating electronic levels in polymers. In this paper, electronic levels in insulating polymers were estimated by contact potential difference, XPS, UPS in air and photoinjection current and the correlation among the estimated levels was investigated.","PeriodicalId":13148,"journal":{"name":"ICSD'98. Proceedings of the 1998 IEEE 6th International Conference on Conduction and Breakdown in Solid Dielectrics (Cat. No.98CH36132)","volume":"59 1","pages":"221-224"},"PeriodicalIF":0.0,"publicationDate":"1998-06-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"82986164","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1998-06-22DOI: 10.1109/ICSD.1998.709353
M. Yoshiura, F. Yoshida, Y. Kamitani, S. Maeta
We report the results of thermally stimulated current (TSC) measurements of polyaniline thin films with electric conducting or insulating property and the latest application of the analytical estimation methods for TSC signals.
{"title":"TSC of polyaniline thin film","authors":"M. Yoshiura, F. Yoshida, Y. Kamitani, S. Maeta","doi":"10.1109/ICSD.1998.709353","DOIUrl":"https://doi.org/10.1109/ICSD.1998.709353","url":null,"abstract":"We report the results of thermally stimulated current (TSC) measurements of polyaniline thin films with electric conducting or insulating property and the latest application of the analytical estimation methods for TSC signals.","PeriodicalId":13148,"journal":{"name":"ICSD'98. Proceedings of the 1998 IEEE 6th International Conference on Conduction and Breakdown in Solid Dielectrics (Cat. No.98CH36132)","volume":"68 1","pages":"585-588"},"PeriodicalIF":0.0,"publicationDate":"1998-06-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"80848837","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1998-06-22DOI: 10.1109/ICSD.1998.709332
M. Araoka, H. Yoneda, Y. Ohki
We investigated dielectric properties of new-type polyethylene polymerized with a single-site catalyst. The new polyethylene has a much higher dielectric strength and a volume resistivity than the conventional low-density polyethylene and linear low-density polyethylene. The increase in the density is considered to be responsible for the increase in dielectric strength. The type of the comonomer and melt flow rate (MFR) scarcely affect the dielectric properties.
{"title":"Dielectric properties of new-type polyethylene polymerized using a single-site catalyst","authors":"M. Araoka, H. Yoneda, Y. Ohki","doi":"10.1109/ICSD.1998.709332","DOIUrl":"https://doi.org/10.1109/ICSD.1998.709332","url":null,"abstract":"We investigated dielectric properties of new-type polyethylene polymerized with a single-site catalyst. The new polyethylene has a much higher dielectric strength and a volume resistivity than the conventional low-density polyethylene and linear low-density polyethylene. The increase in the density is considered to be responsible for the increase in dielectric strength. The type of the comonomer and melt flow rate (MFR) scarcely affect the dielectric properties.","PeriodicalId":13148,"journal":{"name":"ICSD'98. Proceedings of the 1998 IEEE 6th International Conference on Conduction and Breakdown in Solid Dielectrics (Cat. No.98CH36132)","volume":"71 1","pages":"493-497"},"PeriodicalIF":0.0,"publicationDate":"1998-06-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"91226544","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1998-06-22DOI: 10.1109/ICSD.1998.709302
H. Kato, S. Sakai, A. Takami, Y. Ohki, K. Ishii
Fluorine-doped thin silicon dioxide films were synthesized by plasma-enhanced chemical vapor deposition of tetraethoxysilane and CF/sub 4/, and the dielectric strength was measured with a self-healing breakdown technique by applying short duration voltage pulses. As a result, the film containing a higher amount of fluorine has a higher dielectric strength. The reason for this increase is discussed from various aspects, and two persuasive mechanisms are presented.
{"title":"Dielectric breakdown in F-doped SiO/sub 2/ films formed by plasma-enhanced chemical vapor deposition","authors":"H. Kato, S. Sakai, A. Takami, Y. Ohki, K. Ishii","doi":"10.1109/ICSD.1998.709302","DOIUrl":"https://doi.org/10.1109/ICSD.1998.709302","url":null,"abstract":"Fluorine-doped thin silicon dioxide films were synthesized by plasma-enhanced chemical vapor deposition of tetraethoxysilane and CF/sub 4/, and the dielectric strength was measured with a self-healing breakdown technique by applying short duration voltage pulses. As a result, the film containing a higher amount of fluorine has a higher dielectric strength. The reason for this increase is discussed from various aspects, and two persuasive mechanisms are presented.","PeriodicalId":13148,"journal":{"name":"ICSD'98. Proceedings of the 1998 IEEE 6th International Conference on Conduction and Breakdown in Solid Dielectrics (Cat. No.98CH36132)","volume":"60 1","pages":"368-371"},"PeriodicalIF":0.0,"publicationDate":"1998-06-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"91011762","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1998-06-22DOI: 10.1109/ICSD.1998.709333
Jorgen Svahn, Kabeldon
The aim of this work was to investigate the influence of metallic particles on the AC breakdown strength in EPDM rubber. Filled and unfilled EPDM rubbers were contaminated with two different particle sizes (50 /spl mu/m and 165 /spl mu/m) and different particle concentrations, to ascertain their influence on the breakdown strength. The inclusions were irregularly shaped iron particles. The breakdown tests were carried out by using /spl sim/0.7 mm thick circular rubber slabs between cylindrical electrodes. The result yielded the characteristic AC breakdown strengths of 78 kV/mm and 86 kV/mm respectively for non-contaminated filled and unfilled rubbers. The electric strength was considerably lowered for larger inclusions but not in the case of smaller ones. A statistical evaluation of the results is also provided.
{"title":"Influence of metal inclusions on AC breakdown strength in EPDM","authors":"Jorgen Svahn, Kabeldon","doi":"10.1109/ICSD.1998.709333","DOIUrl":"https://doi.org/10.1109/ICSD.1998.709333","url":null,"abstract":"The aim of this work was to investigate the influence of metallic particles on the AC breakdown strength in EPDM rubber. Filled and unfilled EPDM rubbers were contaminated with two different particle sizes (50 /spl mu/m and 165 /spl mu/m) and different particle concentrations, to ascertain their influence on the breakdown strength. The inclusions were irregularly shaped iron particles. The breakdown tests were carried out by using /spl sim/0.7 mm thick circular rubber slabs between cylindrical electrodes. The result yielded the characteristic AC breakdown strengths of 78 kV/mm and 86 kV/mm respectively for non-contaminated filled and unfilled rubbers. The electric strength was considerably lowered for larger inclusions but not in the case of smaller ones. A statistical evaluation of the results is also provided.","PeriodicalId":13148,"journal":{"name":"ICSD'98. Proceedings of the 1998 IEEE 6th International Conference on Conduction and Breakdown in Solid Dielectrics (Cat. No.98CH36132)","volume":"12 1","pages":"498-501"},"PeriodicalIF":0.0,"publicationDate":"1998-06-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"85924448","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1998-06-22DOI: 10.1109/ICSD.1998.709240
Z. Nadolny, J. Braun, R. Densley
The understanding of degradation processes in transmission-class cable joints is very important to the reliability of the operating system. Degradation caused by partial discharges (PD) and their associated characteristics were investigated in model "pre-fabricated" cable joints. Time to breakdown and PD pulse parameters such as rise time, width, fall time, amplitude and frequency were studied. The paper further describes PD pulse parameters occurring within different part of cable joints, such as within the epoxy casting near the high voltage electrode and along the EPR-epoxy interfaces.
{"title":"Investigation of partial discharge pulse shapes occurring at interfaces in model joints","authors":"Z. Nadolny, J. Braun, R. Densley","doi":"10.1109/ICSD.1998.709240","DOIUrl":"https://doi.org/10.1109/ICSD.1998.709240","url":null,"abstract":"The understanding of degradation processes in transmission-class cable joints is very important to the reliability of the operating system. Degradation caused by partial discharges (PD) and their associated characteristics were investigated in model \"pre-fabricated\" cable joints. Time to breakdown and PD pulse parameters such as rise time, width, fall time, amplitude and frequency were studied. The paper further describes PD pulse parameters occurring within different part of cable joints, such as within the epoxy casting near the high voltage electrode and along the EPR-epoxy interfaces.","PeriodicalId":13148,"journal":{"name":"ICSD'98. Proceedings of the 1998 IEEE 6th International Conference on Conduction and Breakdown in Solid Dielectrics (Cat. No.98CH36132)","volume":"74 1","pages":"119-122"},"PeriodicalIF":0.0,"publicationDate":"1998-06-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"86589848","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1998-06-22DOI: 10.1109/ICSD.1998.709310
T. Sorqvist, A. Vlastós
Two silicone rubber based polymeric materials for outdoor insulation were studied under field conditions for about nine years. Then they were evaluated in the laboratory. The field test was conducted in an environment of light coastal pollution where the materials were non-energized as well as energized with both HVAC and HVDC. The long-term study focused on the hydrophobicity and the material changes of the insulator surfaces combined with the leakage current performance of the insulators. In general, the results presented in this paper show that the surface ageing of the two types of silicone rubbers was relatively moderate and that both the non-energized and energized materials remained highly water repellent. Moreover, no substantial differences in the hydrophobicity between the two material types were observed after almost nine-years in the field. However, the leakage currents of the insulators differed. This indicates that the hydrophobicity, as it is usually measured, is not a good indicator of the surface resistance of the insulator material.
{"title":"Outdoor ageing of silicone rubber based polymeric materials","authors":"T. Sorqvist, A. Vlastós","doi":"10.1109/ICSD.1998.709310","DOIUrl":"https://doi.org/10.1109/ICSD.1998.709310","url":null,"abstract":"Two silicone rubber based polymeric materials for outdoor insulation were studied under field conditions for about nine years. Then they were evaluated in the laboratory. The field test was conducted in an environment of light coastal pollution where the materials were non-energized as well as energized with both HVAC and HVDC. The long-term study focused on the hydrophobicity and the material changes of the insulator surfaces combined with the leakage current performance of the insulators. In general, the results presented in this paper show that the surface ageing of the two types of silicone rubbers was relatively moderate and that both the non-energized and energized materials remained highly water repellent. Moreover, no substantial differences in the hydrophobicity between the two material types were observed after almost nine-years in the field. However, the leakage currents of the insulators differed. This indicates that the hydrophobicity, as it is usually measured, is not a good indicator of the surface resistance of the insulator material.","PeriodicalId":13148,"journal":{"name":"ICSD'98. Proceedings of the 1998 IEEE 6th International Conference on Conduction and Breakdown in Solid Dielectrics (Cat. No.98CH36132)","volume":"52 1","pages":"401-405"},"PeriodicalIF":0.0,"publicationDate":"1998-06-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"84011687","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1998-06-22DOI: 10.1109/ICSD.1998.709294
S. Nikolajevic
This paper presents the results of an investigation into changing of crosslinked polyethylene (XLPE) ethylene-propylene rubber (EPR) cable insulations on electrical characteristics due to water absorption. The experimental set up was made for the following XLPE and EPR cable insulations: steam and dry cured with water tree retardant crosslinked polyethylene (TR-XLPE) and steam cured EPR. During tests, the tap water was injected (1) into the cable conductor with cable ends closed, (2) into the cable conductor with cable ends opened and into the metallic screen with the cable ends closed. The presence of water in TR XLPE and EPR cables was subjected to electrical stress and heating. The tests of electrical characteristics of TR XLPE and EPR cable insulations were performed as a function of aging time at different aging temperatures.
{"title":"Accelerated aging of XLPE and EPR cable insulations in wet conditions and its influence on electrical characteristics","authors":"S. Nikolajevic","doi":"10.1109/ICSD.1998.709294","DOIUrl":"https://doi.org/10.1109/ICSD.1998.709294","url":null,"abstract":"This paper presents the results of an investigation into changing of crosslinked polyethylene (XLPE) ethylene-propylene rubber (EPR) cable insulations on electrical characteristics due to water absorption. The experimental set up was made for the following XLPE and EPR cable insulations: steam and dry cured with water tree retardant crosslinked polyethylene (TR-XLPE) and steam cured EPR. During tests, the tap water was injected (1) into the cable conductor with cable ends closed, (2) into the cable conductor with cable ends opened and into the metallic screen with the cable ends closed. The presence of water in TR XLPE and EPR cables was subjected to electrical stress and heating. The tests of electrical characteristics of TR XLPE and EPR cable insulations were performed as a function of aging time at different aging temperatures.","PeriodicalId":13148,"journal":{"name":"ICSD'98. Proceedings of the 1998 IEEE 6th International Conference on Conduction and Breakdown in Solid Dielectrics (Cat. No.98CH36132)","volume":"7 1","pages":"337-340"},"PeriodicalIF":0.0,"publicationDate":"1998-06-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"79077630","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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