Pub Date : 1998-06-22DOI: 10.1109/ICSD.1998.709280
M. Chipara, P. Notingher, J. Reyes, M. Chipara
The thermal degradation in air of PET within the glass transition range is a complex phenomenon. According to mechanical data it might be concluded that the thermooxidative degradation of PET is described by a single first order process. Due to the thickness of the sample and as the degradation temperatures were above T/sub A/, the thermooxidative degradation process is homogeneous. Thermal analysis have revealed the presence of a weak liquid-liquid transition. Both the liquid-liquid transition and the glass transition depends on degradation time and temperature. From the effect of the thermooxidative degradation on T/sub G/, it is possible to conclude that at low degradation temperatures the polymer crosslinks. At 150/spl deg/C, a transition from crosslinking to chain scissions at large degradation times (above 500 h) is noticed. Hence T/sub c/ depends on the degradation time and temperature. Dc electrical conduction measurements have revealed two competing first order relaxation processes, ascribed to crystalline and amorphous domains. Further studies are in course, in order to elucidate this behaviour.
{"title":"On the thermooxidative degradation of polyethyleneterephtalate","authors":"M. Chipara, P. Notingher, J. Reyes, M. Chipara","doi":"10.1109/ICSD.1998.709280","DOIUrl":"https://doi.org/10.1109/ICSD.1998.709280","url":null,"abstract":"The thermal degradation in air of PET within the glass transition range is a complex phenomenon. According to mechanical data it might be concluded that the thermooxidative degradation of PET is described by a single first order process. Due to the thickness of the sample and as the degradation temperatures were above T/sub A/, the thermooxidative degradation process is homogeneous. Thermal analysis have revealed the presence of a weak liquid-liquid transition. Both the liquid-liquid transition and the glass transition depends on degradation time and temperature. From the effect of the thermooxidative degradation on T/sub G/, it is possible to conclude that at low degradation temperatures the polymer crosslinks. At 150/spl deg/C, a transition from crosslinking to chain scissions at large degradation times (above 500 h) is noticed. Hence T/sub c/ depends on the degradation time and temperature. Dc electrical conduction measurements have revealed two competing first order relaxation processes, ascribed to crystalline and amorphous domains. Further studies are in course, in order to elucidate this behaviour.","PeriodicalId":13148,"journal":{"name":"ICSD'98. Proceedings of the 1998 IEEE 6th International Conference on Conduction and Breakdown in Solid Dielectrics (Cat. No.98CH36132)","volume":"134 7 1","pages":"283-285"},"PeriodicalIF":0.0,"publicationDate":"1998-06-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"79626917","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1998-06-22DOI: 10.1109/ICSD.1998.709227
K. Nagashima, X. Qin, Y. Tanaka, T. Takada
A new method is proposed to calibrate the experimental data measured by pulsed electroacoustic (PEA) method using deconvolution technique to obtain high resolution space charge distribution in coaxial cable. This new method is verified by numerical simulation.
{"title":"Calibration of accumulated space charge in power cable using PEA measurement","authors":"K. Nagashima, X. Qin, Y. Tanaka, T. Takada","doi":"10.1109/ICSD.1998.709227","DOIUrl":"https://doi.org/10.1109/ICSD.1998.709227","url":null,"abstract":"A new method is proposed to calibrate the experimental data measured by pulsed electroacoustic (PEA) method using deconvolution technique to obtain high resolution space charge distribution in coaxial cable. This new method is verified by numerical simulation.","PeriodicalId":13148,"journal":{"name":"ICSD'98. Proceedings of the 1998 IEEE 6th International Conference on Conduction and Breakdown in Solid Dielectrics (Cat. No.98CH36132)","volume":"7 1","pages":"60-63"},"PeriodicalIF":0.0,"publicationDate":"1998-06-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"84783788","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1998-06-22DOI: 10.1109/ICSD.1998.709267
K. Kim, J. Lim, W. Ryu, J. Lee
Low dielectric constant fluorocarbonated siliceous films were deposited by PECVD (plasma enhanced chemical vapor deposition) using 2% SiH/sub 4//N/sub 2/ and CF/sub 4/ gases in the chamber with parallel plate electrode of 13.56 MHz RF. The effects of RF power, chamber pressure and gas composition on the deposition rate were studied and the morphology of the films was tested by AES, XPS, AFM and SEM. The dielectric constant of the film determined by the capacitance-voltage measurements was 2.3.
{"title":"Dielectric properties of SiCF film deposited by PECVD with low dielectric constants","authors":"K. Kim, J. Lim, W. Ryu, J. Lee","doi":"10.1109/ICSD.1998.709267","DOIUrl":"https://doi.org/10.1109/ICSD.1998.709267","url":null,"abstract":"Low dielectric constant fluorocarbonated siliceous films were deposited by PECVD (plasma enhanced chemical vapor deposition) using 2% SiH/sub 4//N/sub 2/ and CF/sub 4/ gases in the chamber with parallel plate electrode of 13.56 MHz RF. The effects of RF power, chamber pressure and gas composition on the deposition rate were studied and the morphology of the films was tested by AES, XPS, AFM and SEM. The dielectric constant of the film determined by the capacitance-voltage measurements was 2.3.","PeriodicalId":13148,"journal":{"name":"ICSD'98. Proceedings of the 1998 IEEE 6th International Conference on Conduction and Breakdown in Solid Dielectrics (Cat. No.98CH36132)","volume":"39 1","pages":"229-232"},"PeriodicalIF":0.0,"publicationDate":"1998-06-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"84993772","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1998-06-22DOI: 10.1109/ICSD.1998.709216
X. Qin, K. Suzuki, M. Sazaki, Y. Tanaka, T. Takada
In this paper, we report our attempt of measuring the three-dimensional space charge distribution in a PMMA plate, which is irradiated by an electron beam, using an acoustic lens by the pressure wave propagation (PWP) method.
本文报道了用压力波传播(PWP)方法，利用声透镜测量电子束辐照PMMA板中三维空间电荷分布的尝试。
{"title":"Electric charge 3-dimensional profile measurement in dielectrics using acoustic microscope probe head","authors":"X. Qin, K. Suzuki, M. Sazaki, Y. Tanaka, T. Takada","doi":"10.1109/ICSD.1998.709216","DOIUrl":"https://doi.org/10.1109/ICSD.1998.709216","url":null,"abstract":"In this paper, we report our attempt of measuring the three-dimensional space charge distribution in a PMMA plate, which is irradiated by an electron beam, using an acoustic lens by the pressure wave propagation (PWP) method.","PeriodicalId":13148,"journal":{"name":"ICSD'98. Proceedings of the 1998 IEEE 6th International Conference on Conduction and Breakdown in Solid Dielectrics (Cat. No.98CH36132)","volume":"336 1","pages":"13-16"},"PeriodicalIF":0.0,"publicationDate":"1998-06-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"75057699","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1998-06-22DOI: 10.1109/ICSD.1998.709251
T. Medjeldi, M. Nemamcha, J. Gosse
The ability to recognize forms by means of neural networks combined with a linear prediction analyze has been developed in this paper for partial discharges (PD) sources recognition. The PD sources are artificially created on a Teflon cell having two armatures isolated by polypropylene films. This experiments have been made at LEMD/CNRS Grenoble (France). This first work has been carried out by the use of a sample of seven specimens representing seven cases of presence of cavities on the cell insulation of study. The seven defects represented by respective signals of apparent charge were processed modeled by linear prediction and then passed to a back propagation neural networks.
{"title":"Identification of partial discharges sources using a combination of linear prediction and neural networks","authors":"T. Medjeldi, M. Nemamcha, J. Gosse","doi":"10.1109/ICSD.1998.709251","DOIUrl":"https://doi.org/10.1109/ICSD.1998.709251","url":null,"abstract":"The ability to recognize forms by means of neural networks combined with a linear prediction analyze has been developed in this paper for partial discharges (PD) sources recognition. The PD sources are artificially created on a Teflon cell having two armatures isolated by polypropylene films. This experiments have been made at LEMD/CNRS Grenoble (France). This first work has been carried out by the use of a sample of seven specimens representing seven cases of presence of cavities on the cell insulation of study. The seven defects represented by respective signals of apparent charge were processed modeled by linear prediction and then passed to a back propagation neural networks.","PeriodicalId":13148,"journal":{"name":"ICSD'98. Proceedings of the 1998 IEEE 6th International Conference on Conduction and Breakdown in Solid Dielectrics (Cat. No.98CH36132)","volume":"1 1","pages":"165-167"},"PeriodicalIF":0.0,"publicationDate":"1998-06-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"76698044","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1998-06-22DOI: 10.1109/ICSD.1998.709352
S. Hobdell, T. J. Lewis, J. Llewellyn, S. Moody
The thermally stimulated current (TSC) technique is a powerful way of investigating the characteristics of injected space charge induced by high voltage poling. In this paper, TSC measurements on XLPE high-voltage cable insulation are reported which show that differences in the electrode-polymer interface conditions are responsible for differences in space charge injected under high fields.
{"title":"The influence of the semicon-insulation interface on the thermally stimulated current spectra of XLPE cable samples","authors":"S. Hobdell, T. J. Lewis, J. Llewellyn, S. Moody","doi":"10.1109/ICSD.1998.709352","DOIUrl":"https://doi.org/10.1109/ICSD.1998.709352","url":null,"abstract":"The thermally stimulated current (TSC) technique is a powerful way of investigating the characteristics of injected space charge induced by high voltage poling. In this paper, TSC measurements on XLPE high-voltage cable insulation are reported which show that differences in the electrode-polymer interface conditions are responsible for differences in space charge injected under high fields.","PeriodicalId":13148,"journal":{"name":"ICSD'98. Proceedings of the 1998 IEEE 6th International Conference on Conduction and Breakdown in Solid Dielectrics (Cat. No.98CH36132)","volume":"63 1","pages":"581-584"},"PeriodicalIF":0.0,"publicationDate":"1998-06-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"78648515","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1998-06-22DOI: 10.1109/ICSD.1998.709266
Woo-Sun Lee, Nam-Oh Kim, Y. Chung, M. Han
Effect of metal impurities in insulation layer of distribution cables was investigated. The test samples of XLPE cables were fabricated with added metal impurities of Al,Cu,Fe, and electrical conductivity was measured in the voltage range of 0-10 kV. We observed the stimulated hysteresis curve, which becomes the relationship between forward and reverse charging currents. At the voltage range of 0.5/spl sim/10 kV, the charging current between the samples with and without carbon black electrodes became larger at higher voltage levels. In addition, some effects of the curves of charging current due to impurities are discussed.
{"title":"Effects of metal impurities in insulation of distribution cables","authors":"Woo-Sun Lee, Nam-Oh Kim, Y. Chung, M. Han","doi":"10.1109/ICSD.1998.709266","DOIUrl":"https://doi.org/10.1109/ICSD.1998.709266","url":null,"abstract":"Effect of metal impurities in insulation layer of distribution cables was investigated. The test samples of XLPE cables were fabricated with added metal impurities of Al,Cu,Fe, and electrical conductivity was measured in the voltage range of 0-10 kV. We observed the stimulated hysteresis curve, which becomes the relationship between forward and reverse charging currents. At the voltage range of 0.5/spl sim/10 kV, the charging current between the samples with and without carbon black electrodes became larger at higher voltage levels. In addition, some effects of the curves of charging current due to impurities are discussed.","PeriodicalId":13148,"journal":{"name":"ICSD'98. Proceedings of the 1998 IEEE 6th International Conference on Conduction and Breakdown in Solid Dielectrics (Cat. No.98CH36132)","volume":"70 1","pages":"225-228"},"PeriodicalIF":0.0,"publicationDate":"1998-06-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"90412422","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1998-06-22DOI: 10.1109/ICSD.1998.709289
Y. Sekii, K. Maruta, T. Okada
The effects of peroxide decomposition products and antioxidant in XLPE (cross-linked polyethylene) insulation on the initiation of ac tree (the tree generated by ac voltage) and the grounded dc tree (the tree generated by the grounded dc voltage) was investigated. Both inclusions were confirmed to have the effect of suppressing ac and the grounded dc tree. The peroxide decomposition products and antioxidant were confirmed to have almost the same effect in ac tree suppression at ambient temperature, while in grounded dc tree suppression peroxide decomposition products showed a greater effect than the AO. The ac tree inception voltage of XLPE containing peroxide decomposition products decreases with the increase of temperature. This decrease could be due to the loss of the decomposition products at elevated temperature. The tree inception voltage of degassed XLPE at high temperature is found to be almost equal to the inception voltage at ambient temperature. The mechanism of tree suppression and polarity effect of the grounded dc tree was examined.
{"title":"The effect of inclusions in XLPE insulations on electrical trees generated by ac and grounded dc voltage","authors":"Y. Sekii, K. Maruta, T. Okada","doi":"10.1109/ICSD.1998.709289","DOIUrl":"https://doi.org/10.1109/ICSD.1998.709289","url":null,"abstract":"The effects of peroxide decomposition products and antioxidant in XLPE (cross-linked polyethylene) insulation on the initiation of ac tree (the tree generated by ac voltage) and the grounded dc tree (the tree generated by the grounded dc voltage) was investigated. Both inclusions were confirmed to have the effect of suppressing ac and the grounded dc tree. The peroxide decomposition products and antioxidant were confirmed to have almost the same effect in ac tree suppression at ambient temperature, while in grounded dc tree suppression peroxide decomposition products showed a greater effect than the AO. The ac tree inception voltage of XLPE containing peroxide decomposition products decreases with the increase of temperature. This decrease could be due to the loss of the decomposition products at elevated temperature. The tree inception voltage of degassed XLPE at high temperature is found to be almost equal to the inception voltage at ambient temperature. The mechanism of tree suppression and polarity effect of the grounded dc tree was examined.","PeriodicalId":13148,"journal":{"name":"ICSD'98. Proceedings of the 1998 IEEE 6th International Conference on Conduction and Breakdown in Solid Dielectrics (Cat. No.98CH36132)","volume":"4 1","pages":"317-320"},"PeriodicalIF":0.0,"publicationDate":"1998-06-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"87433084","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1998-06-22DOI: 10.1109/ICSD.1998.709222
Y. Hashimoto, N. Fujimura, K. Fukunaga, T. Maeno, T. Sakakibara
We have studied the internal space charge behavior of a new functional organic insulators such as organic photoconductor (OPC) and organic light emitting diode (OLED). In this paper, some results of the experiments are reported for the specimens which are charge transport layer (CTL) of the OPC and light emitting layer (Alq3) of the OLED with the different kinds of the electrode materials. The experimental results indicate that the electron/hole injection into the new functional organic layer from the electrodes are influenced by the Fermi level of the electrode material. We will discuss the electronic behavior of the localized energy states of the new functional organic layer based on the measurement of the internal phenomena.
{"title":"Space charge distribution in new functional organic layer","authors":"Y. Hashimoto, N. Fujimura, K. Fukunaga, T. Maeno, T. Sakakibara","doi":"10.1109/ICSD.1998.709222","DOIUrl":"https://doi.org/10.1109/ICSD.1998.709222","url":null,"abstract":"We have studied the internal space charge behavior of a new functional organic insulators such as organic photoconductor (OPC) and organic light emitting diode (OLED). In this paper, some results of the experiments are reported for the specimens which are charge transport layer (CTL) of the OPC and light emitting layer (Alq3) of the OLED with the different kinds of the electrode materials. The experimental results indicate that the electron/hole injection into the new functional organic layer from the electrodes are influenced by the Fermi level of the electrode material. We will discuss the electronic behavior of the localized energy states of the new functional organic layer based on the measurement of the internal phenomena.","PeriodicalId":13148,"journal":{"name":"ICSD'98. Proceedings of the 1998 IEEE 6th International Conference on Conduction and Breakdown in Solid Dielectrics (Cat. No.98CH36132)","volume":"9 1","pages":"40-42"},"PeriodicalIF":0.0,"publicationDate":"1998-06-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"86543657","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1998-06-22DOI: 10.1109/ICSD.1998.709353
M. Yoshiura, F. Yoshida, Y. Kamitani, S. Maeta
We report the results of thermally stimulated current (TSC) measurements of polyaniline thin films with electric conducting or insulating property and the latest application of the analytical estimation methods for TSC signals.
{"title":"TSC of polyaniline thin film","authors":"M. Yoshiura, F. Yoshida, Y. Kamitani, S. Maeta","doi":"10.1109/ICSD.1998.709353","DOIUrl":"https://doi.org/10.1109/ICSD.1998.709353","url":null,"abstract":"We report the results of thermally stimulated current (TSC) measurements of polyaniline thin films with electric conducting or insulating property and the latest application of the analytical estimation methods for TSC signals.","PeriodicalId":13148,"journal":{"name":"ICSD'98. Proceedings of the 1998 IEEE 6th International Conference on Conduction and Breakdown in Solid Dielectrics (Cat. No.98CH36132)","volume":"68 1","pages":"585-588"},"PeriodicalIF":0.0,"publicationDate":"1998-06-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"80848837","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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