Pub Date : 1998-06-22DOI: 10.1109/ICSD.1998.709239
R. Patsch, M. Hoof
Partial discharge phenomena in which solid dielectrics are involved can be simulated by a mainly deterministic physical model. The comparison of computer simulations with measured partial discharge data shows that in each case only one or two of the model parameters are responsible for the different behaviour of different defects.
{"title":"Physical modeling of partial discharge patterns","authors":"R. Patsch, M. Hoof","doi":"10.1109/ICSD.1998.709239","DOIUrl":"https://doi.org/10.1109/ICSD.1998.709239","url":null,"abstract":"Partial discharge phenomena in which solid dielectrics are involved can be simulated by a mainly deterministic physical model. The comparison of computer simulations with measured partial discharge data shows that in each case only one or two of the model parameters are responsible for the different behaviour of different defects.","PeriodicalId":13148,"journal":{"name":"ICSD'98. Proceedings of the 1998 IEEE 6th International Conference on Conduction and Breakdown in Solid Dielectrics (Cat. No.98CH36132)","volume":"72 1","pages":"114-118"},"PeriodicalIF":0.0,"publicationDate":"1998-06-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"75662792","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1998-06-22DOI: 10.1109/ICSD.1998.709318
P. Conner, J.P. Jones, J. Llewellyn, T. J. Lewis
The failure of polyolifinic solids, such as polyethylene and polypropylene, by fracture under mechanical stress has been studied extensively. The initial stages of such failure are considered to involve the scission of the main polymeric bonds, the generation of free radicals which induce bond-breaking chain reactions and the consequent growth of a population of sub-microscopic voids which ultimately coalesce into a propagating crack. Accompanying these processes is so-called fracto-emission, the generation of charged particles and electromagnetic radiation by fracture. All these features bear such remarkable resemblance to those occurring in the early stages of electrical breakdown of these same polymers that it becomes imperative to consider whether electrical breakdown has a mechanical origin. It has been suggested already that an electrical field in a dielectric will set up a mechanical stress which can become significant when the field approaches breakdown values (>10/sup 8/ V/m). The presence of this mechanical stress, which must be taken into account when considering the internal equilibrium of a dielectric, is not intuitively obvious but a number of results support its existence. In this paper, we outline the main features of the theoretical model for this stress and then describe new experiments which strikingly demonstrate its presence in polyethylene and polypropylene films under electrical stress. The implications of this demonstration for electrical ageing and breakdown are clear.
{"title":"A mechanical origin for electrical ageing and breakdown in polymeric insulation","authors":"P. Conner, J.P. Jones, J. Llewellyn, T. J. Lewis","doi":"10.1109/ICSD.1998.709318","DOIUrl":"https://doi.org/10.1109/ICSD.1998.709318","url":null,"abstract":"The failure of polyolifinic solids, such as polyethylene and polypropylene, by fracture under mechanical stress has been studied extensively. The initial stages of such failure are considered to involve the scission of the main polymeric bonds, the generation of free radicals which induce bond-breaking chain reactions and the consequent growth of a population of sub-microscopic voids which ultimately coalesce into a propagating crack. Accompanying these processes is so-called fracto-emission, the generation of charged particles and electromagnetic radiation by fracture. All these features bear such remarkable resemblance to those occurring in the early stages of electrical breakdown of these same polymers that it becomes imperative to consider whether electrical breakdown has a mechanical origin. It has been suggested already that an electrical field in a dielectric will set up a mechanical stress which can become significant when the field approaches breakdown values (>10/sup 8/ V/m). The presence of this mechanical stress, which must be taken into account when considering the internal equilibrium of a dielectric, is not intuitively obvious but a number of results support its existence. In this paper, we outline the main features of the theoretical model for this stress and then describe new experiments which strikingly demonstrate its presence in polyethylene and polypropylene films under electrical stress. The implications of this demonstration for electrical ageing and breakdown are clear.","PeriodicalId":13148,"journal":{"name":"ICSD'98. Proceedings of the 1998 IEEE 6th International Conference on Conduction and Breakdown in Solid Dielectrics (Cat. No.98CH36132)","volume":"89 1","pages":"434-438"},"PeriodicalIF":0.0,"publicationDate":"1998-06-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"75258697","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1998-06-22DOI: 10.1109/ICSD.1998.709241
H. Kaneiwa, Y. Suzuoki, T. Mizutani
In an attempt to clarify the mechanism of electrical treeing degradation and tree propagation, partial discharge (PD) characteristics in an artificially-simulated tree channel in a low-density polyethylene (LDPE) sample were investigated. The PD's formed PD pulse trains whose magnitude changed with time. In the samples where tree propagation was seen at the tip of the artificial channel, pulse trains with large PD magnitude sometimes occurred and the region of light emission reached the vicinity of the channel tip before tree propagation. In the samples where tree propagation was not seen, the region of light emission due to PD did not reach the channel tip. These results suggest that tree propagation takes place when PD's with large magnitude and long luminous region occur in an artificial channel and damage the channel tip.
{"title":"Partial discharge characteristics and tree propagation in artificially-simulated tree channel","authors":"H. Kaneiwa, Y. Suzuoki, T. Mizutani","doi":"10.1109/ICSD.1998.709241","DOIUrl":"https://doi.org/10.1109/ICSD.1998.709241","url":null,"abstract":"In an attempt to clarify the mechanism of electrical treeing degradation and tree propagation, partial discharge (PD) characteristics in an artificially-simulated tree channel in a low-density polyethylene (LDPE) sample were investigated. The PD's formed PD pulse trains whose magnitude changed with time. In the samples where tree propagation was seen at the tip of the artificial channel, pulse trains with large PD magnitude sometimes occurred and the region of light emission reached the vicinity of the channel tip before tree propagation. In the samples where tree propagation was not seen, the region of light emission due to PD did not reach the channel tip. These results suggest that tree propagation takes place when PD's with large magnitude and long luminous region occur in an artificial channel and damage the channel tip.","PeriodicalId":13148,"journal":{"name":"ICSD'98. Proceedings of the 1998 IEEE 6th International Conference on Conduction and Breakdown in Solid Dielectrics (Cat. No.98CH36132)","volume":"7 1","pages":"123-126"},"PeriodicalIF":0.0,"publicationDate":"1998-06-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"75455664","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1998-06-22DOI: 10.1109/ICSD.1998.709337
M. Morcos, K. Srivastava
The statistical nature of high voltage testing of electrical insulation has long been recognized . A brief overview of the application of statistical methods to establish the insulation strength and life time of solid dielectrics is reported. Accelerated aging tests on solid dielectrics are statistical tests which have to be rigorously analyzed in order to justify any valid conclusions. The application of Weibull statistics for the description of dielectric breakdown is presented. The breakdown probability of the test voltages is a function of the test method, of their parameters, of the nature of the breakdown probability function, and of the assumed physical processes. Proper test methods and their parameters can be selected to determine the breakdown voltages and time to breakdown.
{"title":"On the statistical testing of solid dielectrics","authors":"M. Morcos, K. Srivastava","doi":"10.1109/ICSD.1998.709337","DOIUrl":"https://doi.org/10.1109/ICSD.1998.709337","url":null,"abstract":"The statistical nature of high voltage testing of electrical insulation has long been recognized . A brief overview of the application of statistical methods to establish the insulation strength and life time of solid dielectrics is reported. Accelerated aging tests on solid dielectrics are statistical tests which have to be rigorously analyzed in order to justify any valid conclusions. The application of Weibull statistics for the description of dielectric breakdown is presented. The breakdown probability of the test voltages is a function of the test method, of their parameters, of the nature of the breakdown probability function, and of the assumed physical processes. Proper test methods and their parameters can be selected to determine the breakdown voltages and time to breakdown.","PeriodicalId":13148,"journal":{"name":"ICSD'98. Proceedings of the 1998 IEEE 6th International Conference on Conduction and Breakdown in Solid Dielectrics (Cat. No.98CH36132)","volume":"89 1","pages":"514-519"},"PeriodicalIF":0.0,"publicationDate":"1998-06-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"80318193","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1998-06-22DOI: 10.1109/ICSD.1998.709223
T. Maeno, K. Fukunaga
In a multilayer insulator made of two or more materials with different dielectric constants and conductivities, internal space charge accumulates at their interfaces. If the local field is increased by the accumulated charge, the electric durability of the insulator should be decreased. In this paper, we describe the space charge accumulation measured when using oil-impregnated PPLP (polypropylene laminated paper)-which consists triple layers; kraft paper, polypropylene (PP), kraft paper-was subjected to a strong dc electric field. The experimental results suggest that internal space charge accumulates at both surfaces of a PP layer and that the electric field in the kraft paper layers disappears.
{"title":"Transient phenomena of space charge distributions in polypropylene laminated paper","authors":"T. Maeno, K. Fukunaga","doi":"10.1109/ICSD.1998.709223","DOIUrl":"https://doi.org/10.1109/ICSD.1998.709223","url":null,"abstract":"In a multilayer insulator made of two or more materials with different dielectric constants and conductivities, internal space charge accumulates at their interfaces. If the local field is increased by the accumulated charge, the electric durability of the insulator should be decreased. In this paper, we describe the space charge accumulation measured when using oil-impregnated PPLP (polypropylene laminated paper)-which consists triple layers; kraft paper, polypropylene (PP), kraft paper-was subjected to a strong dc electric field. The experimental results suggest that internal space charge accumulates at both surfaces of a PP layer and that the electric field in the kraft paper layers disappears.","PeriodicalId":13148,"journal":{"name":"ICSD'98. Proceedings of the 1998 IEEE 6th International Conference on Conduction and Breakdown in Solid Dielectrics (Cat. No.98CH36132)","volume":"157 1","pages":"43-46"},"PeriodicalIF":0.0,"publicationDate":"1998-06-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"76835085","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1998-06-22DOI: 10.1109/ICSD.1998.709323
B. Du, S. Kobayashi
The use of organic insulating materials in environments such as space and nuclear power stations is spreading rapidly. There is increasing concern about the reliability of electrical insulation in these environments due to radiation effects on the surface characteristics of polymeric materials. Irradiation effects on tracking resistance should be investigated due to the increasing usage of organic materials in radiation-prone environments. This paper presents a study on the DC tracking resistance of gamma-ray irradiated polyethylene and modified-polycarbonate materials by use of the International Electrotechnical Commission (IEC) Publication (Publ.) 112 method. Polyethylene and modified-polycarbonate materials were irradiated in air up to 1/spl times/10/sup 7/ R and 1/spl times/10/sup 8/ R with dosage rates of 10/sup 6/ R/hr using a /sup 60/Co gamma source as the test samples. The total radiation effects on erosion depth and scintillation discharge energy levels were studied. A gaussian wavelet analysis was applied to show these scintillation discharge energy levels.
{"title":"Wavelet analysis of scintillation discharge current on DC tracking resistance of gamma-ray irradiated polyethylene and modified polycarbonate","authors":"B. Du, S. Kobayashi","doi":"10.1109/ICSD.1998.709323","DOIUrl":"https://doi.org/10.1109/ICSD.1998.709323","url":null,"abstract":"The use of organic insulating materials in environments such as space and nuclear power stations is spreading rapidly. There is increasing concern about the reliability of electrical insulation in these environments due to radiation effects on the surface characteristics of polymeric materials. Irradiation effects on tracking resistance should be investigated due to the increasing usage of organic materials in radiation-prone environments. This paper presents a study on the DC tracking resistance of gamma-ray irradiated polyethylene and modified-polycarbonate materials by use of the International Electrotechnical Commission (IEC) Publication (Publ.) 112 method. Polyethylene and modified-polycarbonate materials were irradiated in air up to 1/spl times/10/sup 7/ R and 1/spl times/10/sup 8/ R with dosage rates of 10/sup 6/ R/hr using a /sup 60/Co gamma source as the test samples. The total radiation effects on erosion depth and scintillation discharge energy levels were studied. A gaussian wavelet analysis was applied to show these scintillation discharge energy levels.","PeriodicalId":13148,"journal":{"name":"ICSD'98. Proceedings of the 1998 IEEE 6th International Conference on Conduction and Breakdown in Solid Dielectrics (Cat. No.98CH36132)","volume":"38 1","pages":"456-459"},"PeriodicalIF":0.0,"publicationDate":"1998-06-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"86475540","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1998-06-22DOI: 10.1109/ICSD.1998.709260
Y. Kamitani, S. Maeta, M. Yoshiura, F. Yoshida
An original theory that three parameters, the energy depths of carrier traps E/sub t/, the escape frequency factor /spl nu/ and the density of carrier trap site n, can be theoretically evaluated with high accuracy from partial TSC curves is proposed. How the standard can be constructed has been a most important resultant point.
{"title":"Proposal of reconstructing method of partial TSC curves to some full curves for accurate evaluation","authors":"Y. Kamitani, S. Maeta, M. Yoshiura, F. Yoshida","doi":"10.1109/ICSD.1998.709260","DOIUrl":"https://doi.org/10.1109/ICSD.1998.709260","url":null,"abstract":"An original theory that three parameters, the energy depths of carrier traps E/sub t/, the escape frequency factor /spl nu/ and the density of carrier trap site n, can be theoretically evaluated with high accuracy from partial TSC curves is proposed. How the standard can be constructed has been a most important resultant point.","PeriodicalId":13148,"journal":{"name":"ICSD'98. Proceedings of the 1998 IEEE 6th International Conference on Conduction and Breakdown in Solid Dielectrics (Cat. No.98CH36132)","volume":"6 1","pages":"202-205"},"PeriodicalIF":0.0,"publicationDate":"1998-06-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"87941813","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1998-06-22DOI: 10.1109/ICSD.1998.709236
K. Fukunaga, T. Maeno, K. Okamoto
The space charge profiles of a metal-base printed wiring board were observed. The space charge of an aged sample formed the same distribution as that of copper migration inside the insulation layer. It is found that space charge observation by means of the pulsed electroacoustic method is useful for investigating the aging phenomena of a printed wiring board.
{"title":"Space charge behaviour in the insulation layer of a metal-base printed wiring board","authors":"K. Fukunaga, T. Maeno, K. Okamoto","doi":"10.1109/ICSD.1998.709236","DOIUrl":"https://doi.org/10.1109/ICSD.1998.709236","url":null,"abstract":"The space charge profiles of a metal-base printed wiring board were observed. The space charge of an aged sample formed the same distribution as that of copper migration inside the insulation layer. It is found that space charge observation by means of the pulsed electroacoustic method is useful for investigating the aging phenomena of a printed wiring board.","PeriodicalId":13148,"journal":{"name":"ICSD'98. Proceedings of the 1998 IEEE 6th International Conference on Conduction and Breakdown in Solid Dielectrics (Cat. No.98CH36132)","volume":"27 1","pages":"102-105"},"PeriodicalIF":0.0,"publicationDate":"1998-06-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"85138526","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1998-06-22DOI: 10.1109/ICSD.1998.709286
A. Malinovski, M. Noskov, M. Sack, A. Schwab
An off-lattice three-dimensional stochastic-deterministic model of electrical tree growth in solid insulation and of the partial discharges within the tree has been developed. The electrical tree growth is described by a stochastic propagation of the channel structure in the insulator. The channel growth is driven by the electric field and an irreversible damage accumulation in the insulation. The damage accumulation is considered to be a local process in the dielectric material surrounding the tree channels. The rate of the damage accumulation is proportional to the energy release within the channels. The charge redistribution results from the partial discharge inside the electrical tree. The partial discharge starts, when the electric field along the channels exceeds a specified inception value and stops, when the field falls below the threshold quenching value. The model has been used for computer simulations of partial discharge and tree growth under sinusoidal and triangular voltage in the needle-plane geometry. Phase-resolved and time-sequence patterns of partial discharges for different forms of electrical trees at different stages of their growth have been obtained. The simulation results have been compared with experimental data.
{"title":"Simulation of partial discharges and electrical tree growth in solid insulation under ac voltage","authors":"A. Malinovski, M. Noskov, M. Sack, A. Schwab","doi":"10.1109/ICSD.1998.709286","DOIUrl":"https://doi.org/10.1109/ICSD.1998.709286","url":null,"abstract":"An off-lattice three-dimensional stochastic-deterministic model of electrical tree growth in solid insulation and of the partial discharges within the tree has been developed. The electrical tree growth is described by a stochastic propagation of the channel structure in the insulator. The channel growth is driven by the electric field and an irreversible damage accumulation in the insulation. The damage accumulation is considered to be a local process in the dielectric material surrounding the tree channels. The rate of the damage accumulation is proportional to the energy release within the channels. The charge redistribution results from the partial discharge inside the electrical tree. The partial discharge starts, when the electric field along the channels exceeds a specified inception value and stops, when the field falls below the threshold quenching value. The model has been used for computer simulations of partial discharge and tree growth under sinusoidal and triangular voltage in the needle-plane geometry. Phase-resolved and time-sequence patterns of partial discharges for different forms of electrical trees at different stages of their growth have been obtained. The simulation results have been compared with experimental data.","PeriodicalId":13148,"journal":{"name":"ICSD'98. Proceedings of the 1998 IEEE 6th International Conference on Conduction and Breakdown in Solid Dielectrics (Cat. No.98CH36132)","volume":"54 1","pages":"305-308"},"PeriodicalIF":0.0,"publicationDate":"1998-06-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"91155699","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1998-06-22DOI: 10.1109/ICSD.1998.709285
N. Shimizu, M. Izumitani
XLPE was impregnated with 4 kinds of dielectric liquids to fill up free volume (>several 10 nm). This treatment removes space for electron to be accelerated to high energy. The experimental results show that liquid impregnation drastically increases ac tree resistance of XLPE.
{"title":"Effect of liquid impregnation on electrical tree initiation in XLPE","authors":"N. Shimizu, M. Izumitani","doi":"10.1109/ICSD.1998.709285","DOIUrl":"https://doi.org/10.1109/ICSD.1998.709285","url":null,"abstract":"XLPE was impregnated with 4 kinds of dielectric liquids to fill up free volume (>several 10 nm). This treatment removes space for electron to be accelerated to high energy. The experimental results show that liquid impregnation drastically increases ac tree resistance of XLPE.","PeriodicalId":13148,"journal":{"name":"ICSD'98. Proceedings of the 1998 IEEE 6th International Conference on Conduction and Breakdown in Solid Dielectrics (Cat. No.98CH36132)","volume":"22 1","pages":"301-304"},"PeriodicalIF":0.0,"publicationDate":"1998-06-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"84110159","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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