W. Pfeiffer, N. S. Mueller, R. Hillenbrand, I. Niehues, P. Kusch
Nanoscale optical imaging has unlocked unprecedented opportunities for exploring the structural, electronic, and optical properties of low-dimensional materials with spatial resolutions far beyond the diffraction limit. Techniques such as tip-enhanced, and tip-assisted photoluminescence (TEPL and TAPL), as well as scattering-type scanning near-field optical microscopy (s-SNOM) offer unique insights into local strain distributions, exciton dynamics, and dielectric heterogeneities that are inaccessible through conventional far-field approaches, however their combination within the same setup remains challenging. Here we present the realisation of correlative TEPL/TAPL and s-SNOM measurements within a single side-illuminated near-field optical microscope. We address the key experimental challenges inherent to the side-illumination geometry, including precise laser focus alignment, suppression of far-field background signals, and the mitigation of competing scattering pathways. Utilising monolayer WSe2 as a model system, we demonstrate correlative imaging of material topography, strain-induced photoluminescence shifts, and dielectric function variations. We visualise nanoscale heterogeneities on a bubble-like structure, highlighting the complementary information from TAPL and s-SNOM. This correlative approach bridges the gap between nanoscale optical spectroscopy and near-field imaging, offering a powerful tool for probing local strain, doping, exciton behaviour, and dielectric inhomogeneities in low-dimensional materials.
{"title":"Correlation of near-field optical microscopy and tip-assisted photoluminescence","authors":"W. Pfeiffer, N. S. Mueller, R. Hillenbrand, I. Niehues, P. Kusch","doi":"10.1111/jmi.70037","DOIUrl":"10.1111/jmi.70037","url":null,"abstract":"<p>Nanoscale optical imaging has unlocked unprecedented opportunities for exploring the structural, electronic, and optical properties of low-dimensional materials with spatial resolutions far beyond the diffraction limit. Techniques such as tip-enhanced, and tip-assisted photoluminescence (TEPL and TAPL), as well as scattering-type scanning near-field optical microscopy (s-SNOM) offer unique insights into local strain distributions, exciton dynamics, and dielectric heterogeneities that are inaccessible through conventional far-field approaches, however their combination within the same setup remains challenging. Here we present the realisation of correlative TEPL/TAPL and s-SNOM measurements within a single side-illuminated near-field optical microscope. We address the key experimental challenges inherent to the side-illumination geometry, including precise laser focus alignment, suppression of far-field background signals, and the mitigation of competing scattering pathways. Utilising monolayer WSe<sub>2</sub> as a model system, we demonstrate correlative imaging of material topography, strain-induced photoluminescence shifts, and dielectric function variations. We visualise nanoscale heterogeneities on a bubble-like structure, highlighting the complementary information from TAPL and s-SNOM. This correlative approach bridges the gap between nanoscale optical spectroscopy and near-field imaging, offering a powerful tool for probing local strain, doping, exciton behaviour, and dielectric inhomogeneities in low-dimensional materials.</p>","PeriodicalId":16484,"journal":{"name":"Journal of microscopy","volume":"301 1","pages":"20-29"},"PeriodicalIF":1.9,"publicationDate":"2025-09-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://www.ncbi.nlm.nih.gov/pmc/articles/PMC12746352/pdf/","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"145175637","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"OA","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Hatsuki Yamauchi, Lucy Davidson, Christine McCarthy, David J. Prior, Jacob A. Tielke, Benjamin K. Holtzman
Etch-pitting replication is a classical method to characterise the microstructure of ice crystals. In this method, a solution of polyvinyl formal (Formvar) is applied to a polished surface of ice. A plastic film, created after the solvent is dried, ‘replicates’ microstructural features of the ice. By examining the replica film, we can identify the orientation of crystals and existence of dislocations in ice. However, with the recent rise of advanced techniques such as cryo-EBSD (electron backscatter diffraction) analyses, this classical method has been left in the shadows, especially from the perspective of quantification of microstructural features in polycrystalline ice. In this study we revive and thoroughly re-examine the utility of the replication method to quantify crystal orientations and dislocation density of ice. We applied our optimised protocols of the replication method to several laboratory-fabricated and natural-glacier polycrystalline ice samples with various types of crystal preferred orientation (CPO) and various levels of strain. Using high-resolution scanning electron microscope (SEM) images of the obtained replica films, we quantified the extent of CPO and dislocation density of these ice samples. Our results of CPO patterns and dislocation density show good agreement with cryo-EBSD results from the same ice samples or samples at a similar strain level. Although further improvements are needed to make the present method more efficient, our results show promise for using this method to easily, quickly, and affordably quantify microstructural features in polycrystalline ice and to help interpret deformation mechanism of ice.
{"title":"Microstructural characterisation of polycrystalline ice with an etch-pitting replication method","authors":"Hatsuki Yamauchi, Lucy Davidson, Christine McCarthy, David J. Prior, Jacob A. Tielke, Benjamin K. Holtzman","doi":"10.1111/jmi.70031","DOIUrl":"10.1111/jmi.70031","url":null,"abstract":"<p>Etch-pitting replication is a classical method to characterise the microstructure of ice crystals. In this method, a solution of polyvinyl formal (Formvar) is applied to a polished surface of ice. A plastic film, created after the solvent is dried, ‘replicates’ microstructural features of the ice. By examining the replica film, we can identify the orientation of crystals and existence of dislocations in ice. However, with the recent rise of advanced techniques such as cryo-EBSD (electron backscatter diffraction) analyses, this classical method has been left in the shadows, especially from the perspective of quantification of microstructural features in polycrystalline ice. In this study we revive and thoroughly re-examine the utility of the replication method to quantify crystal orientations and dislocation density of ice. We applied our optimised protocols of the replication method to several laboratory-fabricated and natural-glacier polycrystalline ice samples with various types of crystal preferred orientation (CPO) and various levels of strain. Using high-resolution scanning electron microscope (SEM) images of the obtained replica films, we quantified the extent of CPO and dislocation density of these ice samples. Our results of CPO patterns and dislocation density show good agreement with cryo-EBSD results from the same ice samples or samples at a similar strain level. Although further improvements are needed to make the present method more efficient, our results show promise for using this method to easily, quickly, and affordably quantify microstructural features in polycrystalline ice and to help interpret deformation mechanism of ice.</p>","PeriodicalId":16484,"journal":{"name":"Journal of microscopy","volume":"301 1","pages":"69-90"},"PeriodicalIF":1.9,"publicationDate":"2025-09-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"145124519","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Rafael Nadas, Lucas Liberal, Gabriel Bargas, Kenji Watanabe, Takashi Taniguchi, Leonardo C. Campos, Ado Jorio
Transition metal dichalcogenides (TMDs) are promising two-dimensional materials whose properties are strongly influenced by substrate interactions. While conventional Raman spectroscopy probes these effects, its diffraction-limited resolution often averages out local variations such as strain, masking intrinsic behaviours. Here, we employ tip-enhanced Raman spectroscopy (TERS) to investigate the vibrational properties of monolayer