Anomalously low values of the normalised variance in fluctuation electron microscopy (FEM) have been frequently reported. We present three experimental corrections for quantitative interpretation that significantly modify conventional approaches. FEM relies on measurements of intensity statistics in coherent nanodiffraction patterns. We demonstrate that sampling the nanodiffraction patterns with a pixelated detector removes high-frequency signals and reduces statistical variance. The most significant impact is on the background normalised variance, which arises from random atomic alignments and is distinct from the normalised variance peaks associated with the correlated alignments of medium-range order. Indeed, we show that if the peaks are background-subtracted, their height is much less affected by the detector effect, provided the experimental conditions are optimised. We show that shot noise correction must also be adjusted to account for the camera Modulation Transfer Function (MTF) effects. Additionally, we demonstrate through experiment that the traditional method of thickness correction for a-Si is inadequate and propose an alternative approach to address thickness variations. We speculate on the origin of the anomalous thickness effect in terms of displacement decoherence due to sample ‘fluttering’ under irradiation.
{"title":"Quantitative corrections for fluctuation electron microscopy","authors":"J. M. Gibson, M. M. J. Treacy","doi":"10.1111/jmi.70027","DOIUrl":"10.1111/jmi.70027","url":null,"abstract":"<p>Anomalously low values of the normalised variance in fluctuation electron microscopy (FEM) have been frequently reported. We present three experimental corrections for quantitative interpretation that significantly modify conventional approaches. FEM relies on measurements of intensity statistics in coherent nanodiffraction patterns. We demonstrate that sampling the nanodiffraction patterns with a pixelated detector removes high-frequency signals and reduces statistical variance. The most significant impact is on the background normalised variance, which arises from random atomic alignments and is distinct from the normalised variance peaks associated with the correlated alignments of medium-range order. Indeed, we show that if the peaks are background-subtracted, their height is much less affected by the detector effect, provided the experimental conditions are optimised. We show that shot noise correction must also be adjusted to account for the camera Modulation Transfer Function (MTF) effects. Additionally, we demonstrate through experiment that the traditional method of thickness correction for a-Si is inadequate and propose an alternative approach to address thickness variations. We speculate on the origin of the anomalous thickness effect in terms of displacement decoherence due to sample ‘fluttering’ under irradiation.</p>","PeriodicalId":16484,"journal":{"name":"Journal of microscopy","volume":"300 3","pages":"356-365"},"PeriodicalIF":1.9,"publicationDate":"2025-08-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"144957859","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Dun Wu, Jianghao Wei, Shoule Zhao, Lin Sun, Yunfeng Li
The pore structure characteristics of coal are crucial for coalbed methane adsorption and migration, carbon storage, and safety in deep coal mining. Although traditional methods can detect pore volume and distribution, they are limited in analysing pore morphology and surface properties. This study employs multiscale techniques including AFM (Atomic force microscopy), SEM (Scanning electron microscopy), and LP-N2GA (Low-Pressure nitrogen gas adsorption) to systematically analyse the impact of coal rank changes on pore structure and its evolutionary process, covering coals from medium-volatile to low-volatile bituminous and anthracite coals. AFM reveals the three-dimensional morphology and quantitative parameters of nanopores, SEM observes meso- and micropore structures, and LP-N2GA verifies pore size distribution. As coal rank increases, surface roughness decreases significantly, the number of pores increases, the average pore diameter decreases, pore morphology transforms from irregular to circular, and porosity increases. Specifically, as the rank of coal increases, the number of nanoring structures rises, while their diameters decrease. Changes in coal rank profoundly affect the nanoring structure, consistent with the evolutionary trend of surface morphology. The combination of AFM and LP-N2GA reveals the role of micropores in gas adsorption. This research not only provides a new perspective for understanding the influence of coal rank changes on pore structure characteristics but also offers a theoretical foundation for coalbed methane development, geological sequestration of carbon dioxide, design of coal-based functional materials, and coal mine safety prevention and control.
{"title":"Automatic identification and quantification of surface nanoscale pore morphology in coals of different ranks based on AFM, SEM and LP-N2GA","authors":"Dun Wu, Jianghao Wei, Shoule Zhao, Lin Sun, Yunfeng Li","doi":"10.1111/jmi.70028","DOIUrl":"10.1111/jmi.70028","url":null,"abstract":"<p>The pore structure characteristics of coal are crucial for coalbed methane adsorption and migration, carbon storage, and safety in deep coal mining. Although traditional methods can detect pore volume and distribution, they are limited in analysing pore morphology and surface properties. This study employs multiscale techniques including AFM (Atomic force microscopy), SEM (Scanning electron microscopy), and LP-N<sub>2</sub>GA (Low-Pressure nitrogen gas adsorption) to systematically analyse the impact of coal rank changes on pore structure and its evolutionary process, covering coals from medium-volatile to low-volatile bituminous and anthracite coals. AFM reveals the three-dimensional morphology and quantitative parameters of nanopores, SEM observes meso- and micropore structures, and LP-N<sub>2</sub>GA verifies pore size distribution. As coal rank increases, surface roughness decreases significantly, the number of pores increases, the average pore diameter decreases, pore morphology transforms from irregular to circular, and porosity increases. Specifically, as the rank of coal increases, the number of nanoring structures rises, while their diameters decrease. Changes in coal rank profoundly affect the nanoring structure, consistent with the evolutionary trend of surface morphology. The combination of AFM and LP-N<sub>2</sub>GA reveals the role of micropores in gas adsorption. This research not only provides a new perspective for understanding the influence of coal rank changes on pore structure characteristics but also offers a theoretical foundation for coalbed methane development, geological sequestration of carbon dioxide, design of coal-based functional materials, and coal mine safety prevention and control.</p>","PeriodicalId":16484,"journal":{"name":"Journal of microscopy","volume":"300 3","pages":"366-383"},"PeriodicalIF":1.9,"publicationDate":"2025-08-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"144957840","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Structured illumination microscopy (SIM) as a type of super-resolution optical microscopy technique has been widely used in the fields of biophysics, neuroscience, and cell biology research. However, this technique often requires high-intensity illumination and multiple image acquisitions to generate a single high-resolution image. This process not only significantly reduces the imaging speed, but also increases the exposure time of samples to intense light, leading to increased phototoxicity and photobleaching issues, especially prominent in live cell imaging. Here, we propose a lightweight Multi-Convolutional UNet (MCU-Net) aiming to maintain efficient super-resolution reconstruction performance by reducing the model parameter quantity. The algorithm integrates multiple convolutional techniques with multi-scale attention mechanisms, enhancing the model's sensitivity to information at different scales and improving its precise recognition ability for image textures and structures, thus enabling high-quality super-resolution reconstruction even under low-light conditions. The overall performance of the model is evaluated in terms of efficiency and accuracy, comparing MCU-Net with deep neural network models (UNet, ScUNet, EDSR, DFCAN) and traditional reconstruction algorithms (Wiener, HiFi, TV) across different cell types, lighting intensities, and various test sets. Experimental results show that compared to other deep learning models, MCU-Net achieves a 12.66% improvement in MS-SSIM and a 50.79% increase in NRMSE index. Its prediction accuracy remains stable even in the presence of low signal-to-noise ratio inputs. Furthermore, it strikes an optimal balance between reconstruction speed and model accuracy, with a 76.10% improvement in inference speed compared to the DFCAN model.
{"title":"Reconstruction of structured illumination microscopy for live imaging in low light with lightweight neural networks","authors":"Hesong Jiang, Peihong Wu, Juan Zhang, Xueyuan Wang, Jinkun Zhan, Hexuan Tang","doi":"10.1111/jmi.70009","DOIUrl":"10.1111/jmi.70009","url":null,"abstract":"<p>Structured illumination microscopy (SIM) as a type of super-resolution optical microscopy technique has been widely used in the fields of biophysics, neuroscience, and cell biology research. However, this technique often requires high-intensity illumination and multiple image acquisitions to generate a single high-resolution image. This process not only significantly reduces the imaging speed, but also increases the exposure time of samples to intense light, leading to increased phototoxicity and photobleaching issues, especially prominent in live cell imaging. Here, we propose a lightweight Multi-Convolutional UNet (MCU-Net) aiming to maintain efficient super-resolution reconstruction performance by reducing the model parameter quantity. The algorithm integrates multiple convolutional techniques with multi-scale attention mechanisms, enhancing the model's sensitivity to information at different scales and improving its precise recognition ability for image textures and structures, thus enabling high-quality super-resolution reconstruction even under low-light conditions. The overall performance of the model is evaluated in terms of efficiency and accuracy, comparing MCU-Net with deep neural network models (UNet, ScUNet, EDSR, DFCAN) and traditional reconstruction algorithms (Wiener, HiFi, TV) across different cell types, lighting intensities, and various test sets. Experimental results show that compared to other deep learning models, MCU-Net achieves a 12.66% improvement in MS-SSIM and a 50.79% increase in NRMSE index. Its prediction accuracy remains stable even in the presence of low signal-to-noise ratio inputs. Furthermore, it strikes an optimal balance between reconstruction speed and model accuracy, with a 76.10% improvement in inference speed compared to the DFCAN model.</p>","PeriodicalId":16484,"journal":{"name":"Journal of microscopy","volume":"300 3","pages":"325-340"},"PeriodicalIF":1.9,"publicationDate":"2025-08-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"144957875","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Zhiyuan Ding, Chen Huang, Adrián Pedrazo-Tardajos, Angus I Kirkland, Peter D Nellist
Integrated Centre-of-Mass (iCOM) is a widely used phase-contrast imaging method based on Centre-of-Mass (COM), which makes use of a 4D Scanning Transmission Electron Microscopy (STEM) dataset using an in-focus probe. In this paper, we introduce a novel approach that combines Single-Side Band (SSB) ptychography with COM and iCOM, termed Side Band masked Centre-of-Mass (SBm-COM) and integrated Centre-of-Mass (SBm-iCOM) which is applicable to weak-phase objects. This method compensates for residual aberrations in 4DSTEM datasets while also reducing the noise contribution up to the