Pub Date : 2022-06-30DOI: 10.5573/jsts.2022.22.3.177
Seon-Yeong Jo, Jinhyung Lee, Myeong-Jae Park, D. Jeong, Jaeha Kim
{"title":"A Quadrature Error Corrector for Aperiodic, Quarter-rate Data Strobe Signals in HBM3 Interfaces","authors":"Seon-Yeong Jo, Jinhyung Lee, Myeong-Jae Park, D. Jeong, Jaeha Kim","doi":"10.5573/jsts.2022.22.3.177","DOIUrl":"https://doi.org/10.5573/jsts.2022.22.3.177","url":null,"abstract":"","PeriodicalId":17067,"journal":{"name":"Journal of Semiconductor Technology and Science","volume":"222 1","pages":""},"PeriodicalIF":0.4,"publicationDate":"2022-06-30","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"73186767","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2022-06-30DOI: 10.5573/jsts.2022.22.3.168
Hyunwon Moon
{"title":"High Resolution CMOS Frequency-to-digital Converter for a Fine Dust Sensor using a MEMS Resonator","authors":"Hyunwon Moon","doi":"10.5573/jsts.2022.22.3.168","DOIUrl":"https://doi.org/10.5573/jsts.2022.22.3.168","url":null,"abstract":"","PeriodicalId":17067,"journal":{"name":"Journal of Semiconductor Technology and Science","volume":"44 1","pages":""},"PeriodicalIF":0.4,"publicationDate":"2022-06-30","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"80706177","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2022-06-30DOI: 10.5573/jsts.2022.22.3.188
H. Kwon, W. Choi
{"title":"Nanoelectromechanical (NEM) Devices for Logic and Memory Applications","authors":"H. Kwon, W. Choi","doi":"10.5573/jsts.2022.22.3.188","DOIUrl":"https://doi.org/10.5573/jsts.2022.22.3.188","url":null,"abstract":"","PeriodicalId":17067,"journal":{"name":"Journal of Semiconductor Technology and Science","volume":"33 3 1","pages":""},"PeriodicalIF":0.4,"publicationDate":"2022-06-30","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"78232735","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2022-06-30DOI: 10.5573/jsts.2022.22.3.133
Ho-Jun Kim, Won-Cheol Lee, Hong-June Park
{"title":"Extension of DRAM Retention Time at 77 Kelvin by Replacing Weak Rows with Large GIDL Current","authors":"Ho-Jun Kim, Won-Cheol Lee, Hong-June Park","doi":"10.5573/jsts.2022.22.3.133","DOIUrl":"https://doi.org/10.5573/jsts.2022.22.3.133","url":null,"abstract":"","PeriodicalId":17067,"journal":{"name":"Journal of Semiconductor Technology and Science","volume":"19 1","pages":""},"PeriodicalIF":0.4,"publicationDate":"2022-06-30","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"84909575","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2022-06-30DOI: 10.5573/jsts.2022.22.3.139
Yu-Jin Kim, Jun-Young Park
{"title":"Investigation of Mechanical Stability during Electro-thermal Annealing in a 3D NAND Flash Memory String","authors":"Yu-Jin Kim, Jun-Young Park","doi":"10.5573/jsts.2022.22.3.139","DOIUrl":"https://doi.org/10.5573/jsts.2022.22.3.139","url":null,"abstract":"","PeriodicalId":17067,"journal":{"name":"Journal of Semiconductor Technology and Science","volume":"32 1","pages":""},"PeriodicalIF":0.4,"publicationDate":"2022-06-30","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"81333096","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2022-04-30DOI: 10.5573/jsts.2022.22.2.53
R. J., E. N, N. Asokan
{"title":"Implementation and Performance Analysis of Elliptic Curve Cryptography using an Efficient Multiplier","authors":"R. J., E. N, N. Asokan","doi":"10.5573/jsts.2022.22.2.53","DOIUrl":"https://doi.org/10.5573/jsts.2022.22.2.53","url":null,"abstract":"","PeriodicalId":17067,"journal":{"name":"Journal of Semiconductor Technology and Science","volume":"113 1","pages":""},"PeriodicalIF":0.4,"publicationDate":"2022-04-30","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"75332192","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2022-04-30DOI: 10.5573/jsts.2022.22.2.61
Min-Gyu Jeon, Kang-rock Lee, Sangwan Kim, Garam Kim, J. Kim
{"title":"Doping-less Tunnel Field-effect Transistor with a Gate Insulator Stack to Adjust Tunnel Barrier","authors":"Min-Gyu Jeon, Kang-rock Lee, Sangwan Kim, Garam Kim, J. Kim","doi":"10.5573/jsts.2022.22.2.61","DOIUrl":"https://doi.org/10.5573/jsts.2022.22.2.61","url":null,"abstract":"","PeriodicalId":17067,"journal":{"name":"Journal of Semiconductor Technology and Science","volume":"78 1","pages":""},"PeriodicalIF":0.4,"publicationDate":"2022-04-30","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"73921240","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2022-04-30DOI: 10.5573/jsts.2022.22.2.84
Lin Cheng, Hongliang Lu, Yuming Zhang, Yimen Zhang
{"title":"A Compact Macromodeling Method for Characterizing Large-signal DC and AC Performance of InP and GaAs HBTs","authors":"Lin Cheng, Hongliang Lu, Yuming Zhang, Yimen Zhang","doi":"10.5573/jsts.2022.22.2.84","DOIUrl":"https://doi.org/10.5573/jsts.2022.22.2.84","url":null,"abstract":"","PeriodicalId":17067,"journal":{"name":"Journal of Semiconductor Technology and Science","volume":"25 1","pages":""},"PeriodicalIF":0.4,"publicationDate":"2022-04-30","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"79941239","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2022-04-30DOI: 10.5573/jsts.2022.22.2.105
H. An, J. Bae, Sin‐Hyung Lee, I. Kang, S. Min, Sang-Ho Lee, Jin Park, G. Kim, Y. Yoon, J. Seo, M. Cho, Jaewon Jang
{"title":"Fabrication and Performances of Recessed Gate AlGaN/GaN MOSFETs with Si₃N₄/TiO₂ Stacked Dual Gate Dielectric","authors":"H. An, J. Bae, Sin‐Hyung Lee, I. Kang, S. Min, Sang-Ho Lee, Jin Park, G. Kim, Y. Yoon, J. Seo, M. Cho, Jaewon Jang","doi":"10.5573/jsts.2022.22.2.105","DOIUrl":"https://doi.org/10.5573/jsts.2022.22.2.105","url":null,"abstract":"","PeriodicalId":17067,"journal":{"name":"Journal of Semiconductor Technology and Science","volume":"20 1","pages":""},"PeriodicalIF":0.4,"publicationDate":"2022-04-30","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"90210862","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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