The mechanism of conduction between a Ta/sub 2/O/sub 5/ film and a metal electrode was studied by means of photocurrent measurements. The nature of the metal/Ta/sub 2/O/sub 5/ interface is shown as well as the energy diagram deduced from the results. Transient current decaying with time has been observed in the Al/Ta/sub 2/O/sub 5/ interface and explained in terms of the space charge effect due to the blocking barrier of Al/sub 2/O/sub 3/ formed at the interface.<>
{"title":"Transient photocurrents in tantalum pentoxide films","authors":"K. Miyairi","doi":"10.1109/ICSD.1989.69179","DOIUrl":"https://doi.org/10.1109/ICSD.1989.69179","url":null,"abstract":"The mechanism of conduction between a Ta/sub 2/O/sub 5/ film and a metal electrode was studied by means of photocurrent measurements. The nature of the metal/Ta/sub 2/O/sub 5/ interface is shown as well as the energy diagram deduced from the results. Transient current decaying with time has been observed in the Al/Ta/sub 2/O/sub 5/ interface and explained in terms of the space charge effect due to the blocking barrier of Al/sub 2/O/sub 3/ formed at the interface.<<ETX>>","PeriodicalId":184126,"journal":{"name":"Proceedings of the 3rd International Conference on Conduction and Breakdown in Solid Dielectrics","volume":"9 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1989-07-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129537535","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Experiments were conducted on samples of four types of PET (polyethylene terephthalate) film from two different manufacturers. The thermal aging of the PET films was shown to have a complex nature, expressed most markedly during the TSD measurements by changes of the space-charge peak maximum value. This behavior was found for all types of film. The peak change rate can be represented as a linear function of both the aging temperature and the expected time to withstand that thermal stress, estimated on the basis of the IEC 216 standard test. It is not possible at the present stage of study to estimate directly from the TSD measurements an equivalent to the temperature index, despite an existing correlation. Therefore, the method seems to be suitable for accelerated periodic monitoring of PET films whose thermal endurance characteristics are already known.<>
{"title":"On the possibility of the TSD measuring techniques application for PET films thermal endurance estimation","authors":"A. Gubanski, S. Gubanski","doi":"10.1109/ICSD.1989.69200","DOIUrl":"https://doi.org/10.1109/ICSD.1989.69200","url":null,"abstract":"Experiments were conducted on samples of four types of PET (polyethylene terephthalate) film from two different manufacturers. The thermal aging of the PET films was shown to have a complex nature, expressed most markedly during the TSD measurements by changes of the space-charge peak maximum value. This behavior was found for all types of film. The peak change rate can be represented as a linear function of both the aging temperature and the expected time to withstand that thermal stress, estimated on the basis of the IEC 216 standard test. It is not possible at the present stage of study to estimate directly from the TSD measurements an equivalent to the temperature index, despite an existing correlation. Therefore, the method seems to be suitable for accelerated periodic monitoring of PET films whose thermal endurance characteristics are already known.<<ETX>>","PeriodicalId":184126,"journal":{"name":"Proceedings of the 3rd International Conference on Conduction and Breakdown in Solid Dielectrics","volume":"447 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1989-07-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123874307","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
To obtain a waterstop in the longitudinal direction of a three-phase belted cable, a thin nonwoven tape was applied to the core insulation and to the interstices between the belt insulation and the core insulation. As these tapes are very poor dielectrics with low breakdown stress, it was expected that the breakdown tests would be impaired. On the contrary, the life expectancy was raised from less than 10 years to more than 30 years at 10 kV. Further study revealed that this dielectric improvement was caused by a considerable reduction of the discharges in the interstices of the cable; reductions of several hundred times were measured. The fibers at the air-dielectric interface appear to act as barriers for the surface discharges.<>
{"title":"Discharge phenomena in voids filled with fibrous materials","authors":"P. Morshuis, F. H. Kreuger","doi":"10.1109/ICSD.1989.69172","DOIUrl":"https://doi.org/10.1109/ICSD.1989.69172","url":null,"abstract":"To obtain a waterstop in the longitudinal direction of a three-phase belted cable, a thin nonwoven tape was applied to the core insulation and to the interstices between the belt insulation and the core insulation. As these tapes are very poor dielectrics with low breakdown stress, it was expected that the breakdown tests would be impaired. On the contrary, the life expectancy was raised from less than 10 years to more than 30 years at 10 kV. Further study revealed that this dielectric improvement was caused by a considerable reduction of the discharges in the interstices of the cable; reductions of several hundred times were measured. The fibers at the air-dielectric interface appear to act as barriers for the surface discharges.<<ETX>>","PeriodicalId":184126,"journal":{"name":"Proceedings of the 3rd International Conference on Conduction and Breakdown in Solid Dielectrics","volume":"52 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1989-07-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124948214","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
T. Nakano, M. Fukuyama, H. Hayashi, K. Ishii, Y. Ohki
It has been suggested that when dielectric breakdown is caused by an electronic process, the scattering of electrons will increase the dielectric strength. To confirm this, polar groups were introduced into plasma-polymer films, assuming that the polar groups would act as scattering centers, and the dielectric strength was measured. It was found that when the breakdown process is electronic, the breakdown field increases due to the introduction of an appropriate number of electron scattering centers such as nitrogen and fluorine.<>
{"title":"Electronic breakdown process of plasma polymer films","authors":"T. Nakano, M. Fukuyama, H. Hayashi, K. Ishii, Y. Ohki","doi":"10.1109/ICSD.1989.69166","DOIUrl":"https://doi.org/10.1109/ICSD.1989.69166","url":null,"abstract":"It has been suggested that when dielectric breakdown is caused by an electronic process, the scattering of electrons will increase the dielectric strength. To confirm this, polar groups were introduced into plasma-polymer films, assuming that the polar groups would act as scattering centers, and the dielectric strength was measured. It was found that when the breakdown process is electronic, the breakdown field increases due to the introduction of an appropriate number of electron scattering centers such as nitrogen and fluorine.<<ETX>>","PeriodicalId":184126,"journal":{"name":"Proceedings of the 3rd International Conference on Conduction and Breakdown in Solid Dielectrics","volume":"36 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1989-07-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121966847","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
The author reviews the various experimental techniques used to measure charge distributions in dielectrics. He then focuses on the pressure wave propagation method, discussing the principle of the method and techniques of pressure-wave generation. Examples of applications of the pressure-wave propagation method can be found in the fields of high-voltage insulation, piezoelectricity, irradiated materials, and space charge effects are given.<>
{"title":"Direct determination of space charge distributions in dielectrics: the pressure wave propagation method","authors":"J. Lewiner","doi":"10.1109/ICSD.1989.69257","DOIUrl":"https://doi.org/10.1109/ICSD.1989.69257","url":null,"abstract":"The author reviews the various experimental techniques used to measure charge distributions in dielectrics. He then focuses on the pressure wave propagation method, discussing the principle of the method and techniques of pressure-wave generation. Examples of applications of the pressure-wave propagation method can be found in the fields of high-voltage insulation, piezoelectricity, irradiated materials, and space charge effects are given.<<ETX>>","PeriodicalId":184126,"journal":{"name":"Proceedings of the 3rd International Conference on Conduction and Breakdown in Solid Dielectrics","volume":"58 24 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1989-07-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127869156","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
The author studied the influence of the length of the conducting particle of the filler on the electrical conductivity of the composites obtained by embedding into polyester polymer needlelike conducting crystals of quinoline salt of tetracyanoquinodimethane. The results clearly demonstrated the importance of shape factors for the formation of a conducting network and percolative charge transport in composite systems. The results are in agreement with the previous data, which have shown that very low values of threshold contents of conducting fillers are observed for large particle-length-to-diameter ratios. Other results confirmed the assumption that the decrease of electrical conductivity of samples after the critical field is exceeded is caused by breaks of the conduction network at the weak points, and that the electrical conduction of low-conduction samples is probably dominated by injection of charge carriers, fluctuation-induced tunneling, and prebreakdown effects.<>
{"title":"The electrical conductivity and breakdown phenomena in polyester polymer-quinoline salt of tetracyanoquinodimethane composites","authors":"A. Kuczkowski","doi":"10.1109/ICSD.1989.69180","DOIUrl":"https://doi.org/10.1109/ICSD.1989.69180","url":null,"abstract":"The author studied the influence of the length of the conducting particle of the filler on the electrical conductivity of the composites obtained by embedding into polyester polymer needlelike conducting crystals of quinoline salt of tetracyanoquinodimethane. The results clearly demonstrated the importance of shape factors for the formation of a conducting network and percolative charge transport in composite systems. The results are in agreement with the previous data, which have shown that very low values of threshold contents of conducting fillers are observed for large particle-length-to-diameter ratios. Other results confirmed the assumption that the decrease of electrical conductivity of samples after the critical field is exceeded is caused by breaks of the conduction network at the weak points, and that the electrical conduction of low-conduction samples is probably dominated by injection of charge carriers, fluctuation-induced tunneling, and prebreakdown effects.<<ETX>>","PeriodicalId":184126,"journal":{"name":"Proceedings of the 3rd International Conference on Conduction and Breakdown in Solid Dielectrics","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1989-07-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125790053","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Studies of the influence of strongly bound water on electrical properties of plasma-deposited organosilicon films indicate that two types of hopping centers exist in the films. The first type can be destroyed by water molecules and the second is stable. In SiNSi films both types of hopping centers exist, but in SiOSi films only the second type exists. However, in both SiNSi and SiOSi films, water molecules activate initially inactive intrinsic acceptor centers. As a result the electrical conductivity increases in organosilicon films in the presence of absorbed water.<>
{"title":"Influence of absorbed water on electronic transport in organosilicon plasma polymers","authors":"J. Tyczkowski, J. Sielski","doi":"10.1109/ICSD.1989.69184","DOIUrl":"https://doi.org/10.1109/ICSD.1989.69184","url":null,"abstract":"Studies of the influence of strongly bound water on electrical properties of plasma-deposited organosilicon films indicate that two types of hopping centers exist in the films. The first type can be destroyed by water molecules and the second is stable. In SiNSi films both types of hopping centers exist, but in SiOSi films only the second type exists. However, in both SiNSi and SiOSi films, water molecules activate initially inactive intrinsic acceptor centers. As a result the electrical conductivity increases in organosilicon films in the presence of absorbed water.<<ETX>>","PeriodicalId":184126,"journal":{"name":"Proceedings of the 3rd International Conference on Conduction and Breakdown in Solid Dielectrics","volume":"38 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1989-07-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126661926","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
A. Bulinski, S. Bamji, R. Densley, J. Crine, B. Noirhomme, B. Bernstein
The authors have undertaken a detailed Fourier transform infrared spectroscopy study of more than 250 water trees from more than twenty field-aged cables supplied by different utilities in the US and Canada. Most of these cables, removed from service after six to fifteen years, contained large water trees. The results give an ambiguous picture of the role of oxidation on water treeing. The experimental difficulties in the detection and evaluation of the amount of oxidation in water trees are discussed. The results of water tree growth tests on XLPE cable insulation preoxidized in air to the level similar to that observed in field-aged cables after many years of service show that increased oxidation does not affect the initiation of vented water trees but it does affect the water tree growth rate. This is very important as it may result in significantly reduced times to breakdown in actual cables. Results of water tree tests performed in a nitrogen atmosphere are also presented. The initiation of vented water trees was not affected by the gas atmosphere, but the trees grew twice as fast as in air.<>
{"title":"Influence of oxidation on water tree initiation and growth in XLPE cables","authors":"A. Bulinski, S. Bamji, R. Densley, J. Crine, B. Noirhomme, B. Bernstein","doi":"10.1109/ICSD.1989.69233","DOIUrl":"https://doi.org/10.1109/ICSD.1989.69233","url":null,"abstract":"The authors have undertaken a detailed Fourier transform infrared spectroscopy study of more than 250 water trees from more than twenty field-aged cables supplied by different utilities in the US and Canada. Most of these cables, removed from service after six to fifteen years, contained large water trees. The results give an ambiguous picture of the role of oxidation on water treeing. The experimental difficulties in the detection and evaluation of the amount of oxidation in water trees are discussed. The results of water tree growth tests on XLPE cable insulation preoxidized in air to the level similar to that observed in field-aged cables after many years of service show that increased oxidation does not affect the initiation of vented water trees but it does affect the water tree growth rate. This is very important as it may result in significantly reduced times to breakdown in actual cables. Results of water tree tests performed in a nitrogen atmosphere are also presented. The initiation of vented water trees was not affected by the gas atmosphere, but the trees grew twice as fast as in air.<<ETX>>","PeriodicalId":184126,"journal":{"name":"Proceedings of the 3rd International Conference on Conduction and Breakdown in Solid Dielectrics","volume":"70 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1989-07-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115200465","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
The principles underlying the use of the acoustic probe and electrostriction methods for the nondestructive measurement of the volume distribution of the electric field intensity and charge density in solids are discussed. Acoustic probing consists of recording an electric signal generated by a charge or polarized sample under the action of a mechanical pulse causing a compression wave. The electrostriction method is based on recording an acoustic signal in the surface of an electrified sample which is affected by an electric pulse. Analysis shows that the two methods are equivalent as regards their physical basis and information provided. The fields of application of these two methods are shown to be somewhat different. Acoustic probing is more correct and technically simple when high-ohmic materials with a long charge relaxation time are under investigation. As an example, the study of diffusion in the nitric-acid-polyethylene system is considered.<>
{"title":"Diagnostics of the volume distribution of conductivity in solids by electroacoustic methods","authors":"A. G. Rozno, V. Gromov, A. S. Lukhin, A. Romanov","doi":"10.1109/ICSD.1989.69260","DOIUrl":"https://doi.org/10.1109/ICSD.1989.69260","url":null,"abstract":"The principles underlying the use of the acoustic probe and electrostriction methods for the nondestructive measurement of the volume distribution of the electric field intensity and charge density in solids are discussed. Acoustic probing consists of recording an electric signal generated by a charge or polarized sample under the action of a mechanical pulse causing a compression wave. The electrostriction method is based on recording an acoustic signal in the surface of an electrified sample which is affected by an electric pulse. Analysis shows that the two methods are equivalent as regards their physical basis and information provided. The fields of application of these two methods are shown to be somewhat different. Acoustic probing is more correct and technically simple when high-ohmic materials with a long charge relaxation time are under investigation. As an example, the study of diffusion in the nitric-acid-polyethylene system is considered.<<ETX>>","PeriodicalId":184126,"journal":{"name":"Proceedings of the 3rd International Conference on Conduction and Breakdown in Solid Dielectrics","volume":"8 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1989-07-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129596972","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
The authors have shown previously (1987) that a thin layer of plasma-polymerized ethylene deposited on the surface of high-density polyethylene suppresses the injection of carriers from the electrodes. Here they report the effect of this coating on the dielectric strength of high-density polyethylene. The polyethylene used is additive-free blown film with a density of 0.950 g/cm/sup 3/ and a melt flow rate of 0.9 g/10 min. The plasma-polymer coated sample studied is shown to have a higher breakdown strength than one without plasma-coating. The plasma-polymerized ethylene is amorphous, with many localized states in the forbidden band. These states act as trapping sites for electrons injected from the cathode. The trapped electrons, in turn, suppress the succeeding carrier injection from the cathode. The trapping centers seem to have an injection-suppressing effect even for the application of short-duration voltages such as impulse voltages. It is concluded that the suppression of electron injection by the coating brings about an increase in breakdown voltage.<>
{"title":"Effect of plasma polymer coating on the dielectric strength of polyethylene","authors":"T. Nakano, T. Kihira, Y. Ohki","doi":"10.1109/ICSD.1989.69223","DOIUrl":"https://doi.org/10.1109/ICSD.1989.69223","url":null,"abstract":"The authors have shown previously (1987) that a thin layer of plasma-polymerized ethylene deposited on the surface of high-density polyethylene suppresses the injection of carriers from the electrodes. Here they report the effect of this coating on the dielectric strength of high-density polyethylene. The polyethylene used is additive-free blown film with a density of 0.950 g/cm/sup 3/ and a melt flow rate of 0.9 g/10 min. The plasma-polymer coated sample studied is shown to have a higher breakdown strength than one without plasma-coating. The plasma-polymerized ethylene is amorphous, with many localized states in the forbidden band. These states act as trapping sites for electrons injected from the cathode. The trapped electrons, in turn, suppress the succeeding carrier injection from the cathode. The trapping centers seem to have an injection-suppressing effect even for the application of short-duration voltages such as impulse voltages. It is concluded that the suppression of electron injection by the coating brings about an increase in breakdown voltage.<<ETX>>","PeriodicalId":184126,"journal":{"name":"Proceedings of the 3rd International Conference on Conduction and Breakdown in Solid Dielectrics","volume":"33 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1989-07-03","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123557059","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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