Key message: The tonoplast-localized transporter TaTPK1-5D, interacting with TaCIPK23-4D , enhances low K⁺ tolerance in wheat by promoting vacuolar K⁺ efflux, providing a key genetic target for improving K⁺-use efficiency in breeding. Bread wheat (Triticum aestivum L.) serves as a staple food for more than one-third of the global population, and potassium (K+) is critical for wheat yield and quality. However, the molecular mechanisms underlying wheat survival under low-K+ conditions remain poorly understood. In this study, a phenotypic screening of 712 wheat accessions identified a low-K+ sensitive genotype (H735) and a low-K+ tolerant genotype (H467, namely Zhengmai 136). Measurements of K+ concentration and non-invasive micro-test technology revealed that the differential tolerance between the two genotypes was not attributable to root K+ uptake capacity, but rather to a higher vacuolar K+ efflux rate in H467 compared to H735. Through transcriptomic-assisted differential expression and co-expression network analysis, a tonoplast-localized K⁺ efflux transporter, TaTPK1-5D, was identified as a key candidate underlying differential low-K⁺ tolerance in wheat. Functional disruption of TaTPK1-5DH467, but not TaTPK2-3DH467/2-4DH467/3-5DH467, significantly reduced both low-K+ tolerance and vacuolar K+ efflux in H467. High TaTPK1-5D expression was consistently observed in several other K+-efficient wheat accessions. Importantly, yeast two-hybrid screening, bimolecular fluorescence complementation, and pull-down assays demonstrated that TaTPK1-5D interacted with the protein kinase TaCIPK23-4D. Functional disruption of TaCIPK23-4D led to dramatic sensitivity to low-K+ stress. These findings establish TaTPK1-5D as a major vacuolar K+ efflux transporter facilitating subcellular K+ remobilization under low-K+ conditions.
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