Pub Date : 1991-05-20DOI: 10.1109/NAECON.1991.165867
E. M. Sims, K. B. Donovan
It is noted that the specifics of visual systems, and related visionics systems, is one of the most difficult aspects of flight trainer procurement. The common goal for the services and industry is to establish specification terms which ensure the most cost-effective training systems. There has been a shift in specifications from terms of graphics primitives, such as polygons and lights, to terms of training cues, such as terrain fidelity. The authors describe the impact of this new specification method for three key areas of visionics system performance: terrain fidelity, feature fidelity, and system resolution.<>
{"title":"Specifying performance for a new generation of visionics simulators","authors":"E. M. Sims, K. B. Donovan","doi":"10.1109/NAECON.1991.165867","DOIUrl":"https://doi.org/10.1109/NAECON.1991.165867","url":null,"abstract":"It is noted that the specifics of visual systems, and related visionics systems, is one of the most difficult aspects of flight trainer procurement. The common goal for the services and industry is to establish specification terms which ensure the most cost-effective training systems. There has been a shift in specifications from terms of graphics primitives, such as polygons and lights, to terms of training cues, such as terrain fidelity. The authors describe the impact of this new specification method for three key areas of visionics system performance: terrain fidelity, feature fidelity, and system resolution.<<ETX>>","PeriodicalId":247766,"journal":{"name":"Proceedings of the IEEE 1991 National Aerospace and Electronics Conference NAECON 1991","volume":"37 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1991-05-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127781248","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1991-05-20DOI: 10.1109/NAECON.1991.165884
L. Whitaker, G. Cuqlock-Knopp
Sixteen interviews were conducted with civilian orienteers and military scouts using a semi-structured interview technique. Each interviewee was asked to describe a specific incident in which his (her) skill as a navigator had been tested. Subsequent probe questions explored these descriptions, eliciting cues and strategies employed by those navigators in successfully solving their navigational problems. The tabulations of these cues and problem-solving strategies are reported for a randomly selected half of the sample. Implications for the development of a decision-support system are provided.<>
{"title":"Command and control navigation: a decision support system","authors":"L. Whitaker, G. Cuqlock-Knopp","doi":"10.1109/NAECON.1991.165884","DOIUrl":"https://doi.org/10.1109/NAECON.1991.165884","url":null,"abstract":"Sixteen interviews were conducted with civilian orienteers and military scouts using a semi-structured interview technique. Each interviewee was asked to describe a specific incident in which his (her) skill as a navigator had been tested. Subsequent probe questions explored these descriptions, eliciting cues and strategies employed by those navigators in successfully solving their navigational problems. The tabulations of these cues and problem-solving strategies are reported for a randomly selected half of the sample. Implications for the development of a decision-support system are provided.<<ETX>>","PeriodicalId":247766,"journal":{"name":"Proceedings of the IEEE 1991 National Aerospace and Electronics Conference NAECON 1991","volume":"24-25 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1991-05-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114915352","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1991-05-20DOI: 10.1109/NAECON.1991.165748
P. Swart
One of the major problems in current technology in the military environment is the identification of failures that occur in airborne electronics while on a mission that cannot be reproduced on the ground-in other words, return tested OK (RTOK). A module that monitors environmental conditions, real time, called the Time Stress Measurement Module (TSMM) is described. TSMM monitors environmental conditions affecting electronics modules and within electronic systems for test, maintenance, and AVIP purposes. The current TSMM provides for monitoring of temperatures, vibration, shock, voltage variations, and transients. The sensor data can be accessed across the PI-bus at any time before, during, or after a mission while the module is installed, allowing an expert system to take extreme environmental conditions and predict failures or correlate that data against failures that have already occurred. The sensor data can be retained after loss of power.<>
{"title":"RTOK elimination with TSMM","authors":"P. Swart","doi":"10.1109/NAECON.1991.165748","DOIUrl":"https://doi.org/10.1109/NAECON.1991.165748","url":null,"abstract":"One of the major problems in current technology in the military environment is the identification of failures that occur in airborne electronics while on a mission that cannot be reproduced on the ground-in other words, return tested OK (RTOK). A module that monitors environmental conditions, real time, called the Time Stress Measurement Module (TSMM) is described. TSMM monitors environmental conditions affecting electronics modules and within electronic systems for test, maintenance, and AVIP purposes. The current TSMM provides for monitoring of temperatures, vibration, shock, voltage variations, and transients. The sensor data can be accessed across the PI-bus at any time before, during, or after a mission while the module is installed, allowing an expert system to take extreme environmental conditions and predict failures or correlate that data against failures that have already occurred. The sensor data can be retained after loss of power.<<ETX>>","PeriodicalId":247766,"journal":{"name":"Proceedings of the IEEE 1991 National Aerospace and Electronics Conference NAECON 1991","volume":"98 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1991-05-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132528795","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1991-05-20DOI: 10.1109/NAECON.1991.165925
D. O'Conchuir, J. Mccurdy, V. Casey
Non-destructive techniques for solder joint inspection are surveyed. Both commercially available systems and methods still under research are described. The techniques are divided into visual, thermal, X-ray, and acoustic inspection. The mode of operation for each method is described and its good and bad points are looked at. It is seen that each method is suited to a particular inspection need, and no one technique fulfils all the requirements for a perfect system.<>
{"title":"Survey of non-destructive inspection methods for solder joint integrity","authors":"D. O'Conchuir, J. Mccurdy, V. Casey","doi":"10.1109/NAECON.1991.165925","DOIUrl":"https://doi.org/10.1109/NAECON.1991.165925","url":null,"abstract":"Non-destructive techniques for solder joint inspection are surveyed. Both commercially available systems and methods still under research are described. The techniques are divided into visual, thermal, X-ray, and acoustic inspection. The mode of operation for each method is described and its good and bad points are looked at. It is seen that each method is suited to a particular inspection need, and no one technique fulfils all the requirements for a perfect system.<<ETX>>","PeriodicalId":247766,"journal":{"name":"Proceedings of the IEEE 1991 National Aerospace and Electronics Conference NAECON 1991","volume":" 16","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1991-05-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132012212","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1991-05-20DOI: 10.1109/NAECON.1991.165835
A. McAuley, A. Coker, K. Saruhan
An image may be reduced to a small number of moment invariants such that these are independent of the shift, scale, and rotation of an object in the image. However, noise interferes with the ability to provide invariance. The authors examine the effects of noise on the invariance provided by the moment invariants. They then show that rotation invariance is maintained in low levels of noise. They then show that a neural network may be used to provide robustness against noise. The moment invariants, computed for different levels of noise, are used to train a neural network to identify two aircraft. A split inversion algorithm is used because it is much faster than back propagation. The resulting network provides accurate classification in high levels of noise.<>
{"title":"Effect of noise in moment invariant neural network aircraft classification","authors":"A. McAuley, A. Coker, K. Saruhan","doi":"10.1109/NAECON.1991.165835","DOIUrl":"https://doi.org/10.1109/NAECON.1991.165835","url":null,"abstract":"An image may be reduced to a small number of moment invariants such that these are independent of the shift, scale, and rotation of an object in the image. However, noise interferes with the ability to provide invariance. The authors examine the effects of noise on the invariance provided by the moment invariants. They then show that rotation invariance is maintained in low levels of noise. They then show that a neural network may be used to provide robustness against noise. The moment invariants, computed for different levels of noise, are used to train a neural network to identify two aircraft. A split inversion algorithm is used because it is much faster than back propagation. The resulting network provides accurate classification in high levels of noise.<<ETX>>","PeriodicalId":247766,"journal":{"name":"Proceedings of the IEEE 1991 National Aerospace and Electronics Conference NAECON 1991","volume":"162 8","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1991-05-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134362799","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1991-05-20DOI: 10.1109/NAECON.1991.165725
K.R. Gillam, K. Jones
The authors present the design and architecture of a VLSI floating-point adder (FPA). The multi-mode FPA is capable of both single-precision (32-b) and double-precision (64-b) arithmetic and was developed using CMOS technology. The adder is designed for a 40-MHz clock using a pipelined architecture with a two-cycle latency. Area is minimized as hardware is shared for both single-precision and double-precision operations. Two single-precision operations in parallel are possible providing 80-MFLOPS operation. Double-precision operations yield 40-MFLOPS. With the exception of denormalized number representation, the FPA is fully compliant with the IEEE Standard, for floating-point arithmetic. In addition to floating-point operations, the FPA is capable of performing 32-b integer operations. Five format conversions can be performed by the FPA on the four formats that are supported: single-precision, double-precision, integer and block floating-point.<>
{"title":"Design and architecture for a multi-mode pipelined, floating-point adder","authors":"K.R. Gillam, K. Jones","doi":"10.1109/NAECON.1991.165725","DOIUrl":"https://doi.org/10.1109/NAECON.1991.165725","url":null,"abstract":"The authors present the design and architecture of a VLSI floating-point adder (FPA). The multi-mode FPA is capable of both single-precision (32-b) and double-precision (64-b) arithmetic and was developed using CMOS technology. The adder is designed for a 40-MHz clock using a pipelined architecture with a two-cycle latency. Area is minimized as hardware is shared for both single-precision and double-precision operations. Two single-precision operations in parallel are possible providing 80-MFLOPS operation. Double-precision operations yield 40-MFLOPS. With the exception of denormalized number representation, the FPA is fully compliant with the IEEE Standard, for floating-point arithmetic. In addition to floating-point operations, the FPA is capable of performing 32-b integer operations. Five format conversions can be performed by the FPA on the four formats that are supported: single-precision, double-precision, integer and block floating-point.<<ETX>>","PeriodicalId":247766,"journal":{"name":"Proceedings of the IEEE 1991 National Aerospace and Electronics Conference NAECON 1991","volume":"45 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1991-05-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133105108","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1991-05-20DOI: 10.1109/NAECON.1991.165782
L. Hong
An optimal reduced-order filter is developed which can provide a full vector of state estimates for the case where the dimension of the measurement vector is smaller than that of the state vector and no measurements are noise-free. The reduced-order filter consists of an observer type subfilter and a complementary subfilter, each of which provides a subset of the optimal estimate. A two-step L-K transformation is employed to minimize the estimate error covariance of each subfilter. A target tracking problem is studied as an example.<>
{"title":"Optimal reduced-order filtering","authors":"L. Hong","doi":"10.1109/NAECON.1991.165782","DOIUrl":"https://doi.org/10.1109/NAECON.1991.165782","url":null,"abstract":"An optimal reduced-order filter is developed which can provide a full vector of state estimates for the case where the dimension of the measurement vector is smaller than that of the state vector and no measurements are noise-free. The reduced-order filter consists of an observer type subfilter and a complementary subfilter, each of which provides a subset of the optimal estimate. A two-step L-K transformation is employed to minimize the estimate error covariance of each subfilter. A target tracking problem is studied as an example.<<ETX>>","PeriodicalId":247766,"journal":{"name":"Proceedings of the IEEE 1991 National Aerospace and Electronics Conference NAECON 1991","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1991-05-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129331569","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1991-05-20DOI: 10.1109/NAECON.1991.165820
B. Hall
A description is given of SPIL (system, process, I/O, logic), a graphical software design notation developed by the authors for use on avionics projects and intended to be used to describe software design. Some of the elements which it incorporates in user-friendly diagrams are: design from the viewpoint of the process; logic and control at the module/process level; data structures and data flow; and hierarchical diagram structures with decomposition analogous to that provided by the Structured Analysis and Design Technique (SADT).<>
{"title":"SPIL: a new graphical design notation","authors":"B. Hall","doi":"10.1109/NAECON.1991.165820","DOIUrl":"https://doi.org/10.1109/NAECON.1991.165820","url":null,"abstract":"A description is given of SPIL (system, process, I/O, logic), a graphical software design notation developed by the authors for use on avionics projects and intended to be used to describe software design. Some of the elements which it incorporates in user-friendly diagrams are: design from the viewpoint of the process; logic and control at the module/process level; data structures and data flow; and hierarchical diagram structures with decomposition analogous to that provided by the Structured Analysis and Design Technique (SADT).<<ETX>>","PeriodicalId":247766,"journal":{"name":"Proceedings of the IEEE 1991 National Aerospace and Electronics Conference NAECON 1991","volume":"108 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1991-05-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"117288992","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1991-05-20DOI: 10.1109/NAECON.1991.165920
R. R. Hill
The author summarizes research results of a research effort in decision support system (DSS) technology for ULCE (Unified Life Cycle Engineering). Among the topics addressed were ULCE architectural issues, design measurement and methods research, ULCE-related design technique survey papers, and investigations into group support system technology. The technical papers produced influenced concurrent engineering efforts. The end result of this summary effort is to encapsulate the four-year research effort into a set of generalized findings and recommendations. Since the ULCE research program was a precursor to the current initiative in concurrent engineering (CE), or integrated product development (IPD), this set of findings and recommendations are discussed particularly with respect to an effort called the Requirements Analysis Process In Design (RAPID) program.<>
{"title":"Engineering research technology for concurrent engineering from unified life cycle engineering","authors":"R. R. Hill","doi":"10.1109/NAECON.1991.165920","DOIUrl":"https://doi.org/10.1109/NAECON.1991.165920","url":null,"abstract":"The author summarizes research results of a research effort in decision support system (DSS) technology for ULCE (Unified Life Cycle Engineering). Among the topics addressed were ULCE architectural issues, design measurement and methods research, ULCE-related design technique survey papers, and investigations into group support system technology. The technical papers produced influenced concurrent engineering efforts. The end result of this summary effort is to encapsulate the four-year research effort into a set of generalized findings and recommendations. Since the ULCE research program was a precursor to the current initiative in concurrent engineering (CE), or integrated product development (IPD), this set of findings and recommendations are discussed particularly with respect to an effort called the Requirements Analysis Process In Design (RAPID) program.<<ETX>>","PeriodicalId":247766,"journal":{"name":"Proceedings of the IEEE 1991 National Aerospace and Electronics Conference NAECON 1991","volume":"74 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1991-05-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116252730","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1991-05-20DOI: 10.1109/NAECON.1991.165843
D. E. Snyder, M. McNeese, B. S. Zaff
The authors present some of the analytical and design foundations for an integrated analysis structure for knowledge acquisition and design Concept maps, IDEF (integrated computer-aided manufacturing definition), and storyboards are combined into an integrated structure for knowledge representation, called cognitive maps, and a hypermedia-based analytical framework is established using graphical spreadsheets. The authors describe the preliminary results of a project to define this hypermedia environment and integrated software.<>
{"title":"Identifying design requirements using integrated analysis structures","authors":"D. E. Snyder, M. McNeese, B. S. Zaff","doi":"10.1109/NAECON.1991.165843","DOIUrl":"https://doi.org/10.1109/NAECON.1991.165843","url":null,"abstract":"The authors present some of the analytical and design foundations for an integrated analysis structure for knowledge acquisition and design Concept maps, IDEF (integrated computer-aided manufacturing definition), and storyboards are combined into an integrated structure for knowledge representation, called cognitive maps, and a hypermedia-based analytical framework is established using graphical spreadsheets. The authors describe the preliminary results of a project to define this hypermedia environment and integrated software.<<ETX>>","PeriodicalId":247766,"journal":{"name":"Proceedings of the IEEE 1991 National Aerospace and Electronics Conference NAECON 1991","volume":"65 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1991-05-20","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126628858","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
京公网安备 11010802042870号
京ICP备2023020795号-1
扫码关注我们
求助内容：
应助结果提醒方式：