Pub Date : 2014-10-02DOI: 10.1109/CPEM.2014.6898597
Mun-Seog Kim, Wan-Seop Kim, Young Gyun Kim, Y. Chong, Kyu-Tae Kim, P. Park
This paper describes system setup, based on a Josephson sampling voltmeter for precision power calibration. The waveforms generated by voltage and current sources, which are applied to a power meter under test, are transformed to 1-V level voltage signals and measured by a single Josephson voltmeter with a uncertainty (k = 2) less than 0.5 μV/V.
{"title":"Power calibration system based on Josephson sampling voltmeter","authors":"Mun-Seog Kim, Wan-Seop Kim, Young Gyun Kim, Y. Chong, Kyu-Tae Kim, P. Park","doi":"10.1109/CPEM.2014.6898597","DOIUrl":"https://doi.org/10.1109/CPEM.2014.6898597","url":null,"abstract":"This paper describes system setup, based on a Josephson sampling voltmeter for precision power calibration. The waveforms generated by voltage and current sources, which are applied to a power meter under test, are transformed to 1-V level voltage signals and measured by a single Josephson voltmeter with a uncertainty (k = 2) less than 0.5 μV/V.","PeriodicalId":256575,"journal":{"name":"29th Conference on Precision Electromagnetic Measurements (CPEM 2014)","volume":"300 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2014-10-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121983523","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2014-10-02DOI: 10.1109/CPEM.2014.6898529
L. Alves
The establishment of the ultraviolet irradiance responsivity scale for the purpose of calibration of commercial UVA and UVB radiometers depends on well-characterized broadband UV radiometers as radiometric scale transfer standards. The UV enhanced silicon photodiodes used for the construction of such transfer standards have been characterized with respect to spectral responsivity and spatial uniformity in the visible spectral region. The shunt resistance of such photodiodes had also been measured.
{"title":"Characterization of photodiodes in the visible spectral region","authors":"L. Alves","doi":"10.1109/CPEM.2014.6898529","DOIUrl":"https://doi.org/10.1109/CPEM.2014.6898529","url":null,"abstract":"The establishment of the ultraviolet irradiance responsivity scale for the purpose of calibration of commercial UVA and UVB radiometers depends on well-characterized broadband UV radiometers as radiometric scale transfer standards. The UV enhanced silicon photodiodes used for the construction of such transfer standards have been characterized with respect to spectral responsivity and spatial uniformity in the visible spectral region. The shunt resistance of such photodiodes had also been measured.","PeriodicalId":256575,"journal":{"name":"29th Conference on Precision Electromagnetic Measurements (CPEM 2014)","volume":"33 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2014-10-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125032259","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2014-10-02DOI: 10.1109/CPEM.2014.6898302
T. Menegotto, T. Ferreira da Silva, M. Simoes, W. A. Sousa, G. Borghi
We present the characterization of the properties of the silicon trap detectors used in the construction of the traceability chain for radiometry at the Brazilian Institute of Metrology - Inmetro. These devices are used as standards for radiometry and photometry in the transfer of the optical power scale of the primary cryogenic radiometer standard. The experimental results for the spatial non-uniformity, polarization dependence and spectral responsivity are shown and discussed.
{"title":"Characterization of radiometric transfer standards based on silicon trap detectors","authors":"T. Menegotto, T. Ferreira da Silva, M. Simoes, W. A. Sousa, G. Borghi","doi":"10.1109/CPEM.2014.6898302","DOIUrl":"https://doi.org/10.1109/CPEM.2014.6898302","url":null,"abstract":"We present the characterization of the properties of the silicon trap detectors used in the construction of the traceability chain for radiometry at the Brazilian Institute of Metrology - Inmetro. These devices are used as standards for radiometry and photometry in the transfer of the optical power scale of the primary cryogenic radiometer standard. The experimental results for the spatial non-uniformity, polarization dependence and spectral responsivity are shown and discussed.","PeriodicalId":256575,"journal":{"name":"29th Conference on Precision Electromagnetic Measurements (CPEM 2014)","volume":"6 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2014-10-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125089861","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2014-10-02DOI: 10.1109/CPEM.2014.6898285
B. Trinchera, A. Sosso, U. Pogliano, V. Lacquaniti, E. Monticone, M. Fretto, R. Rocci, L. Roncaglione Tet, D. Serazio
This work deals with the use of high precision digital modular systems, employed towards a wideband chassis, for use with PJVS devices. A key feature of digital modular systems lies on their fast software reconfigurability, exploited to better adapt characteristics as well as performances of different boards (e.g., DACs, ADCs, timing and synchronization) to a specific experimental setup. A compact and modular wideband measurement system suitable to interact dynamically with series array of Josephson junctions is developed. Synchronous digital modules for digital synthesis of isofrequential LF triangular and RF rectangular patterns and precise sampling are used for realtime characterization of sections of a PJVS chip, which operates in a two-stage (4 K) cryocooler system. A suitable synchronous program has been developed and new algorithms are being tested for synthesis of arbitrary LF quantum waveforms, that will be used for direct traceability of digital systems.
{"title":"Wideband digital modular system for dynamic characterization of PJVS","authors":"B. Trinchera, A. Sosso, U. Pogliano, V. Lacquaniti, E. Monticone, M. Fretto, R. Rocci, L. Roncaglione Tet, D. Serazio","doi":"10.1109/CPEM.2014.6898285","DOIUrl":"https://doi.org/10.1109/CPEM.2014.6898285","url":null,"abstract":"This work deals with the use of high precision digital modular systems, employed towards a wideband chassis, for use with PJVS devices. A key feature of digital modular systems lies on their fast software reconfigurability, exploited to better adapt characteristics as well as performances of different boards (e.g., DACs, ADCs, timing and synchronization) to a specific experimental setup. A compact and modular wideband measurement system suitable to interact dynamically with series array of Josephson junctions is developed. Synchronous digital modules for digital synthesis of isofrequential LF triangular and RF rectangular patterns and precise sampling are used for realtime characterization of sections of a PJVS chip, which operates in a two-stage (4 K) cryocooler system. A suitable synchronous program has been developed and new algorithms are being tested for synthesis of arbitrary LF quantum waveforms, that will be used for direct traceability of digital systems.","PeriodicalId":256575,"journal":{"name":"29th Conference on Precision Electromagnetic Measurements (CPEM 2014)","volume":"118 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2014-10-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123204567","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2014-10-02DOI: 10.1109/CPEM.2014.6898235
J. Hoffmann, J. Ruefenacht, M. Zeier
Offset short calibration schemes for vector network analyzers require the exact knowledge of the propagation constant of the offsetting lines. The propagation constant is difficult to compute from first principles and thus a method to indirectly determine the propagation constant is presented. At 50 GHz, the method achieves improvements of accuracy of at least 0.013 in linear S-parameters for a 2.4mm offset short with length 13 mm.
{"title":"The propagation constant of coaxial offset shorts with rough surfaces","authors":"J. Hoffmann, J. Ruefenacht, M. Zeier","doi":"10.1109/CPEM.2014.6898235","DOIUrl":"https://doi.org/10.1109/CPEM.2014.6898235","url":null,"abstract":"Offset short calibration schemes for vector network analyzers require the exact knowledge of the propagation constant of the offsetting lines. The propagation constant is difficult to compute from first principles and thus a method to indirectly determine the propagation constant is presented. At 50 GHz, the method achieves improvements of accuracy of at least 0.013 in linear S-parameters for a 2.4mm offset short with length 13 mm.","PeriodicalId":256575,"journal":{"name":"29th Conference on Precision Electromagnetic Measurements (CPEM 2014)","volume":"10 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2014-10-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123396785","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2014-10-02DOI: 10.1109/CPEM.2014.6898357
Shih-Fang Chen, Y. Amagai, M. Maruyama, N. Kaneko
We have evaluated the uncertainty in the differential sampling measurement of 10 Vrms waveform synthesis based on an AC-programmable Josephson voltage standard (AC-PJVS) with a modified digital voltmeter (DVM). The error due to sampling timer is much reduced with an external 20 MHz frequency reference for the DVM. The type B uncertainty level of smaller than 1 μV/V is expected for the differential sampling measurement of a 10 Vrms sine wave generated by a calibrator.
{"title":"Uncertainty evaluation of sampling measurement system using AC-programmable Josephson voltage standard","authors":"Shih-Fang Chen, Y. Amagai, M. Maruyama, N. Kaneko","doi":"10.1109/CPEM.2014.6898357","DOIUrl":"https://doi.org/10.1109/CPEM.2014.6898357","url":null,"abstract":"We have evaluated the uncertainty in the differential sampling measurement of 10 Vrms waveform synthesis based on an AC-programmable Josephson voltage standard (AC-PJVS) with a modified digital voltmeter (DVM). The error due to sampling timer is much reduced with an external 20 MHz frequency reference for the DVM. The type B uncertainty level of smaller than 1 μV/V is expected for the differential sampling measurement of a 10 Vrms sine wave generated by a calibrator.","PeriodicalId":256575,"journal":{"name":"29th Conference on Precision Electromagnetic Measurements (CPEM 2014)","volume":"01 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2014-10-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128243378","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2014-10-02DOI: 10.1109/CPEM.2014.6898444
N. Fletcher, G. Rietveld, J. Olthoff, I. Budovsky
This paper considers the impact of the planned redefinition of the SI on electrical traceability, with a focus on resistance and voltage calibration. The new SI will replace the 1990 values for the critical constants RK and KJ. With the present state of experimental data, we can say with good confidence that the required relative changes will be of order the 2 × 10-8 for RK and 10 × 10-8 for KJ. These changes will only be visible for a small number of top-level standards in NMIs and industry. Thus, no disruption in traceability is anticipated due to this change, and this paper is part of a communication campaign by the CCEM to ensure a smooth transition.
{"title":"Predicted impact of latest h and e values on resistance and voltage traceability in the new SI (système international)","authors":"N. Fletcher, G. Rietveld, J. Olthoff, I. Budovsky","doi":"10.1109/CPEM.2014.6898444","DOIUrl":"https://doi.org/10.1109/CPEM.2014.6898444","url":null,"abstract":"This paper considers the impact of the planned redefinition of the SI on electrical traceability, with a focus on resistance and voltage calibration. The new SI will replace the 1990 values for the critical constants R<sub>K</sub> and K<sub>J</sub>. With the present state of experimental data, we can say with good confidence that the required relative changes will be of order the 2 × 10<sup>-8</sup> for R<sub>K</sub> and 10 × 10<sup>-8</sup> for K<sub>J</sub>. These changes will only be visible for a small number of top-level standards in NMIs and industry. Thus, no disruption in traceability is anticipated due to this change, and this paper is part of a communication campaign by the CCEM to ensure a smooth transition.","PeriodicalId":256575,"journal":{"name":"29th Conference on Precision Electromagnetic Measurements (CPEM 2014)","volume":"22 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2014-10-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122287830","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2014-10-02DOI: 10.1109/CPEM.2014.6898257
Yi-Jiun Huang, H. Tsao
The two-way satellite time and frequency transfer (TWSTFT) was a technique with sub-ns precision of time comparison between long-baseline laboratories. The precision was limited by the diurnal effect. To mitigate the effect, we designed a TWSTFT receiver and evaluated it by measuring the time difference of arrival (TDOA) in this paper. We found the TDOA of the proposed receiver had less daily variation than that of conventional receivers. Therefore, it is possible that the receiver design would be an important source of the diurnal effect on TWSTFT.
{"title":"Design and evaluate an open-loop receiver on TWSTFT application","authors":"Yi-Jiun Huang, H. Tsao","doi":"10.1109/CPEM.2014.6898257","DOIUrl":"https://doi.org/10.1109/CPEM.2014.6898257","url":null,"abstract":"The two-way satellite time and frequency transfer (TWSTFT) was a technique with sub-ns precision of time comparison between long-baseline laboratories. The precision was limited by the diurnal effect. To mitigate the effect, we designed a TWSTFT receiver and evaluated it by measuring the time difference of arrival (TDOA) in this paper. We found the TDOA of the proposed receiver had less daily variation than that of conventional receivers. Therefore, it is possible that the receiver design would be an important source of the diurnal effect on TWSTFT.","PeriodicalId":256575,"journal":{"name":"29th Conference on Precision Electromagnetic Measurements (CPEM 2014)","volume":"25 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2014-10-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132445725","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2014-10-02DOI: 10.1109/CPEM.2014.6898254
Y. Amagai, H. Fujiki
We have measured the temperature distribution of a thin-wire metal due to the Thomson effect at room temperature when a DC current is applied. To measure the Thomson effect, we have developed new test equipment for a thin-wire sample. We have clearly observed the small heat generation and absorption in a thin Pt wire on the order of a few millikelvins under the existence of Joule heating. These measured data are well-fitted by simulation data based on the heat-conduction equation.
{"title":"Measurement of the Thomson heat distribution in a thin-wire metal","authors":"Y. Amagai, H. Fujiki","doi":"10.1109/CPEM.2014.6898254","DOIUrl":"https://doi.org/10.1109/CPEM.2014.6898254","url":null,"abstract":"We have measured the temperature distribution of a thin-wire metal due to the Thomson effect at room temperature when a DC current is applied. To measure the Thomson effect, we have developed new test equipment for a thin-wire sample. We have clearly observed the small heat generation and absorption in a thin Pt wire on the order of a few millikelvins under the existence of Joule heating. These measured data are well-fitted by simulation data based on the heat-conduction equation.","PeriodicalId":256575,"journal":{"name":"29th Conference on Precision Electromagnetic Measurements (CPEM 2014)","volume":"37 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2014-10-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133534150","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2014-10-02DOI: 10.1109/CPEM.2014.6898523
Huangyan, Y. Jun, Gao Yuan, Zhang Han, Ding Xiang
To test satellite navigation devices, the establishing scheme of local time standard steered by national time standard is proposed. The scheme establishes a GPS common-view time transfer system, traces the local atomic clock to UTC(NIM) by data comparison, determines which factors can influence the comparison accuracy, solves a predict equation, and ultimately implements the real-time value transfer. Experiments show that local time standard and national time standard synchronize within ±10 ns, and the accuracy and stability of local time standard are improved.
{"title":"Research on the establishing scheme of local time standard","authors":"Huangyan, Y. Jun, Gao Yuan, Zhang Han, Ding Xiang","doi":"10.1109/CPEM.2014.6898523","DOIUrl":"https://doi.org/10.1109/CPEM.2014.6898523","url":null,"abstract":"To test satellite navigation devices, the establishing scheme of local time standard steered by national time standard is proposed. The scheme establishes a GPS common-view time transfer system, traces the local atomic clock to UTC(NIM) by data comparison, determines which factors can influence the comparison accuracy, solves a predict equation, and ultimately implements the real-time value transfer. Experiments show that local time standard and national time standard synchronize within ±10 ns, and the accuracy and stability of local time standard are improved.","PeriodicalId":256575,"journal":{"name":"29th Conference on Precision Electromagnetic Measurements (CPEM 2014)","volume":"52 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2014-10-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130092317","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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