Pub Date : 2014-10-02DOI: 10.1109/CPEM.2014.6898612
J. Nissila, K. Ojasalo, M. Kampik, J. Kaasalainen, V. Maisi, M. Casserly, F. Overney, A. Christensen, L. Callegaro, V. D’Elia, N. T. M. Tran, F. Pourdanesh, M. Ortolano, D. Kim, J. Penttila, L. Roschier
A two-channel AC voltage source based on digital synthesis is reported. We present measurement results of some of the key properties at 1 kHz with applications like digital impedance bridges in mind. Measurements show that amplitude ratio of the channels has a stability (Allan standard deviation) of one part in 108 for a 30 min measurement. The phase difference between the channels is also stable within 0.1 μrad.
{"title":"A precise two-channel digitally synthesized AC voltage source for impedance metrology","authors":"J. Nissila, K. Ojasalo, M. Kampik, J. Kaasalainen, V. Maisi, M. Casserly, F. Overney, A. Christensen, L. Callegaro, V. D’Elia, N. T. M. Tran, F. Pourdanesh, M. Ortolano, D. Kim, J. Penttila, L. Roschier","doi":"10.1109/CPEM.2014.6898612","DOIUrl":"https://doi.org/10.1109/CPEM.2014.6898612","url":null,"abstract":"A two-channel AC voltage source based on digital synthesis is reported. We present measurement results of some of the key properties at 1 kHz with applications like digital impedance bridges in mind. Measurements show that amplitude ratio of the channels has a stability (Allan standard deviation) of one part in 108 for a 30 min measurement. The phase difference between the channels is also stable within 0.1 μrad.","PeriodicalId":256575,"journal":{"name":"29th Conference on Precision Electromagnetic Measurements (CPEM 2014)","volume":"35 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2014-10-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121749965","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2014-10-02DOI: 10.1109/CPEM.2014.6898611
W. G. Kurten Ihlenfeld, R. P. Landim
This paper describes a measurement setup employed to investigate differential voltage measurements to be done with a spectrally pure sine wave and a dc reference. The system enables adjustment, to a very high accuracy, the start phase of ac sampling. Repeatabilities of some 0.1 μV/V were obtained with the help of adaptive digital control.
{"title":"Highly accurate differential AC voltage measurements with a single DC voltage reference","authors":"W. G. Kurten Ihlenfeld, R. P. Landim","doi":"10.1109/CPEM.2014.6898611","DOIUrl":"https://doi.org/10.1109/CPEM.2014.6898611","url":null,"abstract":"This paper describes a measurement setup employed to investigate differential voltage measurements to be done with a spectrally pure sine wave and a dc reference. The system enables adjustment, to a very high accuracy, the start phase of ac sampling. Repeatabilities of some 0.1 μV/V were obtained with the help of adaptive digital control.","PeriodicalId":256575,"journal":{"name":"29th Conference on Precision Electromagnetic Measurements (CPEM 2014)","volume":"11 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2014-10-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121494997","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2014-10-02DOI: 10.1109/CPEM.2014.6898318
M. Charles, D. Allal
Metrological electromagnetic characterization of materials in the THz frequency range (refractive index and absorption coefficient) is presented in this paper. Our algorithmic models allow us to achieve these characterizations on both monolayer and multilayer materials.
{"title":"Metrological measurements in terahertz time-domain spectroscopy at LNE (from 100 GHz to 2 THz)","authors":"M. Charles, D. Allal","doi":"10.1109/CPEM.2014.6898318","DOIUrl":"https://doi.org/10.1109/CPEM.2014.6898318","url":null,"abstract":"Metrological electromagnetic characterization of materials in the THz frequency range (refractive index and absorption coefficient) is presented in this paper. Our algorithmic models allow us to achieve these characterizations on both monolayer and multilayer materials.","PeriodicalId":256575,"journal":{"name":"29th Conference on Precision Electromagnetic Measurements (CPEM 2014)","volume":"32 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2014-10-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125337673","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2014-10-02DOI: 10.1109/CPEM.2014.6898272
M. Surdu, D. Surdu
The accurate (uncertainty - better than 1 ppm, sensitivity - better than 0.1 ppm on main ranges) bridge- comparator, balanced by phase control only, is described. Bridge is aimed to measure any impedance in wide dynamic range (from 10-7 to 1017 Ohm). It operates in wide frequency range (from 10-2 to 10 kHz). Bridge balancing and uncertainty correction use the variational method and measurements of unbalance signals. Bridge compares the impedances with arbitrary phase angle, i.e. C ↔ C, R ↔ R, L ↔ L, C ↔ L, C ↔ R, R↔ L.
{"title":"Wide range bridge-comparator for accurate impedance measurements on audio- and low frequencies","authors":"M. Surdu, D. Surdu","doi":"10.1109/CPEM.2014.6898272","DOIUrl":"https://doi.org/10.1109/CPEM.2014.6898272","url":null,"abstract":"The accurate (uncertainty - better than 1 ppm, sensitivity - better than 0.1 ppm on main ranges) bridge- comparator, balanced by phase control only, is described. Bridge is aimed to measure any impedance in wide dynamic range (from 10<sup>-7</sup> to 10<sup>17</sup> Ohm). It operates in wide frequency range (from 10<sup>-2</sup> to 10 kHz). Bridge balancing and uncertainty correction use the variational method and measurements of unbalance signals. Bridge compares the impedances with arbitrary phase angle, i.e. C ↔ C, R ↔ R, L ↔ L, C ↔ L, C ↔ R, R↔ L.","PeriodicalId":256575,"journal":{"name":"29th Conference on Precision Electromagnetic Measurements (CPEM 2014)","volume":"159 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2014-10-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122501192","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2014-10-02DOI: 10.1109/CPEM.2014.6898249
F. Lafont, R. Ribeiro-Palau, Z. Han, A. Cresti, A. Cummings, S. Roche, V. Bouchiat, S. Ducourtieux, F. Schopfer, W. Poirier
We report on a study of the quantum Hall effect in large area Hall bars made of polycrystalline graphene grown by chemical vapor deposition and then transferred on SiO2/Si substrate. The longitudinal conductivity σxx measured near Landau Level filling factors ±2, ±6 evidences a strong backscattering of carriers even at T=0.3 K and B=19 T. It results that the Hall resistance is not quantized at the metrological level. σxx increases (decreases) as a function of the temperature (magnetic induction) following unexpected power laws that are not compatible with usual backscattering mechanisms like variable range hopping or inter-Landau level activation. With the support of structural characterizations and numerical simulations, we discuss the role of line defects (wrinkles and grain boundaries) crossing the Hall bar which can short-circuit the counter-propagating edge states.
{"title":"Dissipative quantum Hall effect in polycrystalline CVD graphene","authors":"F. Lafont, R. Ribeiro-Palau, Z. Han, A. Cresti, A. Cummings, S. Roche, V. Bouchiat, S. Ducourtieux, F. Schopfer, W. Poirier","doi":"10.1109/CPEM.2014.6898249","DOIUrl":"https://doi.org/10.1109/CPEM.2014.6898249","url":null,"abstract":"We report on a study of the quantum Hall effect in large area Hall bars made of polycrystalline graphene grown by chemical vapor deposition and then transferred on SiO2/Si substrate. The longitudinal conductivity σxx measured near Landau Level filling factors ±2, ±6 evidences a strong backscattering of carriers even at T=0.3 K and B=19 T. It results that the Hall resistance is not quantized at the metrological level. σxx increases (decreases) as a function of the temperature (magnetic induction) following unexpected power laws that are not compatible with usual backscattering mechanisms like variable range hopping or inter-Landau level activation. With the support of structural characterizations and numerical simulations, we discuss the role of line defects (wrinkles and grain boundaries) crossing the Hall bar which can short-circuit the counter-propagating edge states.","PeriodicalId":256575,"journal":{"name":"29th Conference on Precision Electromagnetic Measurements (CPEM 2014)","volume":"67 4 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2014-10-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122799559","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2014-10-02DOI: 10.1109/CPEM.2014.6898589
J. Díaz de Aguilar, J. R. Salinas, M. L. Romero, F. Garcia Lagos, Y. A. Sanmamed, M. Neira
A method to compensate the influence in amplitude and phase of the Analog-to-Digital Converters (ADC) and transducers used in the CEM sampling wattmeter, has been evaluated. The influence of the ADC has been tested and an algorithm to compensate for amplitude and phase has been implemented. Similar algorithm has been also developed to compensate for the influence of the shunts and resistive dividers. This method will improve the precision of the CEM digital sampling wattmeter, especially in the presence of high frequency harmonics. This paper describes the CEM digital sampling wattmeter, the evaluation of the influence of the ADC and transducer and the implemented algorithms.
{"title":"Evaluation and compensation of the Analog-to-Digital Converters and transducer influence in the CEM digital sampling wattmeter","authors":"J. Díaz de Aguilar, J. R. Salinas, M. L. Romero, F. Garcia Lagos, Y. A. Sanmamed, M. Neira","doi":"10.1109/CPEM.2014.6898589","DOIUrl":"https://doi.org/10.1109/CPEM.2014.6898589","url":null,"abstract":"A method to compensate the influence in amplitude and phase of the Analog-to-Digital Converters (ADC) and transducers used in the CEM sampling wattmeter, has been evaluated. The influence of the ADC has been tested and an algorithm to compensate for amplitude and phase has been implemented. Similar algorithm has been also developed to compensate for the influence of the shunts and resistive dividers. This method will improve the precision of the CEM digital sampling wattmeter, especially in the presence of high frequency harmonics. This paper describes the CEM digital sampling wattmeter, the evaluation of the influence of the ADC and transducer and the implemented algorithms.","PeriodicalId":256575,"journal":{"name":"29th Conference on Precision Electromagnetic Measurements (CPEM 2014)","volume":"145 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2014-10-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122918159","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2014-10-02DOI: 10.1109/CPEM.2014.6898330
C. Sasso, C. Palmisano, E. Massa, G. Mana
Owing to the impossibility of a plane-wave illumination, diffraction affects optical interferometry applied to the measuring of linear displacement. Therefore, the measurement of the beam divergence is essential to calculate the needed corrections. This paper examines a measurement method relying on the Fourier optics. Particular emphasis is given to the assessment of systematic errors in the measurement of the Si lattice parameter by combined X-ray and optical interferometry.
{"title":"Measuring the divergence of laser beams to correct interferometric displacement measurements","authors":"C. Sasso, C. Palmisano, E. Massa, G. Mana","doi":"10.1109/CPEM.2014.6898330","DOIUrl":"https://doi.org/10.1109/CPEM.2014.6898330","url":null,"abstract":"Owing to the impossibility of a plane-wave illumination, diffraction affects optical interferometry applied to the measuring of linear displacement. Therefore, the measurement of the beam divergence is essential to calculate the needed corrections. This paper examines a measurement method relying on the Fourier optics. Particular emphasis is given to the assessment of systematic errors in the measurement of the Si lattice parameter by combined X-ray and optical interferometry.","PeriodicalId":256575,"journal":{"name":"29th Conference on Precision Electromagnetic Measurements (CPEM 2014)","volume":"72 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2014-10-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127672299","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2014-10-02DOI: 10.1109/CPEM.2014.6898436
M. Maruyama, Y. Amagai, H. Yamamori, Shih-Fang Chen, C. Urano, N. Kaneko
We have succeeded in synthesizing AC waveforms with the rms voltage of greater than 10 V using an AC-programmable Josephson voltage standard (AC-PJVS) system. The system has a NbN-based junction array, which is cooled with a compact cryocooler. The array is composed of total 524 288 junctions, enabling to generate arbitrary signals with the maximum output level of about 17 V for 15.9 GHz microwave input. In this experiment, we used a modified bias circuit with 6 parts of floating channels for eliminating interferences and also saturation in the output level. We will also discuss about heating effect of the 10 Vrms chip in the situation of using a mechanical cooler.
{"title":"Generation of 10 Vrms waveforms using AC-programmable Josephson voltage standard system with 10 K cooler","authors":"M. Maruyama, Y. Amagai, H. Yamamori, Shih-Fang Chen, C. Urano, N. Kaneko","doi":"10.1109/CPEM.2014.6898436","DOIUrl":"https://doi.org/10.1109/CPEM.2014.6898436","url":null,"abstract":"We have succeeded in synthesizing AC waveforms with the rms voltage of greater than 10 V using an AC-programmable Josephson voltage standard (AC-PJVS) system. The system has a NbN-based junction array, which is cooled with a compact cryocooler. The array is composed of total 524 288 junctions, enabling to generate arbitrary signals with the maximum output level of about 17 V for 15.9 GHz microwave input. In this experiment, we used a modified bias circuit with 6 parts of floating channels for eliminating interferences and also saturation in the output level. We will also discuss about heating effect of the 10 Vrms chip in the situation of using a mechanical cooler.","PeriodicalId":256575,"journal":{"name":"29th Conference on Precision Electromagnetic Measurements (CPEM 2014)","volume":"os-1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2014-10-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127756860","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2014-10-02DOI: 10.1109/CPEM.2014.6898535
Kyu-Tae Kim, J. Jung, Young-Seob Lee, E. So
The application of a simple binary step up method for possible calibration of high current DC shunts up to a few thousand amperes in which a pair of HCDC shunts are used to evaluate the current dependence of the shunt resistance. It was found that a complex exponential linear model can be applied to separate the drifts in voltage measurements from the contribution of the current coefficient of the shunt. This approach allows one to extract the information on the current coefficient of the shunt and together with low current measurement of the shunt resistance to calibrate the current output of HCDC source, which in turn can be used as a reference for calibration of customer's shunts. In order to validate the step up method, the calibrated HCDC source was used to obtain DC current ratios which is to be compared with NRC's high current ratio measurements of a multi-ratio 3000 A reference DC CT.
{"title":"The establishment of high current DC shunt calibration system at KRISS and comparison with NRC","authors":"Kyu-Tae Kim, J. Jung, Young-Seob Lee, E. So","doi":"10.1109/CPEM.2014.6898535","DOIUrl":"https://doi.org/10.1109/CPEM.2014.6898535","url":null,"abstract":"The application of a simple binary step up method for possible calibration of high current DC shunts up to a few thousand amperes in which a pair of HCDC shunts are used to evaluate the current dependence of the shunt resistance. It was found that a complex exponential linear model can be applied to separate the drifts in voltage measurements from the contribution of the current coefficient of the shunt. This approach allows one to extract the information on the current coefficient of the shunt and together with low current measurement of the shunt resistance to calibrate the current output of HCDC source, which in turn can be used as a reference for calibration of customer's shunts. In order to validate the step up method, the calibrated HCDC source was used to obtain DC current ratios which is to be compared with NRC's high current ratio measurements of a multi-ratio 3000 A reference DC CT.","PeriodicalId":256575,"journal":{"name":"29th Conference on Precision Electromagnetic Measurements (CPEM 2014)","volume":"35 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2014-10-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133941372","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2014-10-02DOI: 10.1109/CPEM.2014.6898455
Zengmin Wang, Yuan Gao, Honghui Li
A new record of magnetic flux measurement of 1 Wb with the type A uncertainty of less than 1 ppm was presented, which is an improvement over the result that was achieved with our previous magnetic flux measurement circuit with Josephson system. The flux difference measured between the rectangular pulse synthesized with the Josephson system and the flux under test (around 1 Wb) is less than 4 mWb, which significantly reduces the impact of the flux meter reading error on the measurement results.
{"title":"Progress on flux measurement with Josephson system at NIM","authors":"Zengmin Wang, Yuan Gao, Honghui Li","doi":"10.1109/CPEM.2014.6898455","DOIUrl":"https://doi.org/10.1109/CPEM.2014.6898455","url":null,"abstract":"A new record of magnetic flux measurement of 1 Wb with the type A uncertainty of less than 1 ppm was presented, which is an improvement over the result that was achieved with our previous magnetic flux measurement circuit with Josephson system. The flux difference measured between the rectangular pulse synthesized with the Josephson system and the flux under test (around 1 Wb) is less than 4 mWb, which significantly reduces the impact of the flux meter reading error on the measurement results.","PeriodicalId":256575,"journal":{"name":"29th Conference on Precision Electromagnetic Measurements (CPEM 2014)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2014-10-02","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132000088","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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