A thermometry method using resonator self-temperature-sensing is described. The method uses a harmonically related pair of c-modes of an SC-cut that is simultaneously excited in a dual-mode oscillator, and then combined to produce a thermometric frequency having a monotonic and nearly linear dependence on temperature. It avoids the activity dip problems of the b-mode and overcomes limitations of using external sensors that are subject to thermal lab and temperature gradients. This method provides a means of measuring resonator temperature with high accuracy, limited only by the stability difference between the c-mode frequencies. The concept for this dual c-mode thermometry method is presented and its implementation in a microcomputer-compensated crystal oscillator discussed.<>
{"title":"Resonator self-temperature-sensing using a dual-harmonic-mode crystal oscillator","authors":"S.S. Schodowski","doi":"10.1109/FREQ.1989.68851","DOIUrl":"https://doi.org/10.1109/FREQ.1989.68851","url":null,"abstract":"A thermometry method using resonator self-temperature-sensing is described. The method uses a harmonically related pair of c-modes of an SC-cut that is simultaneously excited in a dual-mode oscillator, and then combined to produce a thermometric frequency having a monotonic and nearly linear dependence on temperature. It avoids the activity dip problems of the b-mode and overcomes limitations of using external sensors that are subject to thermal lab and temperature gradients. This method provides a means of measuring resonator temperature with high accuracy, limited only by the stability difference between the c-mode frequencies. The concept for this dual c-mode thermometry method is presented and its implementation in a microcomputer-compensated crystal oscillator discussed.<<ETX>>","PeriodicalId":294361,"journal":{"name":"Proceedings of the 43rd Annual Symposium on Frequency Control","volume":"158 8 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1989-05-31","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128891481","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
A device is presented that combines the output power of several millimeter-wavelength devices in a single step by means of a dielectric resonator (DR) with whispering-gallery modes. After a brief description of whispering-gallery modes, definitions are given for both electromagnetic and electrical parameters of these resonators when they are coupled with transmission lines. The design and the test results of the W-band whispering-gallery mode DR power combiner are then given.<>
{"title":"W-band dielectric resonator power combiner","authors":"D. Cros, P. Guillon, X. Jiao","doi":"10.1109/FREQ.1989.68845","DOIUrl":"https://doi.org/10.1109/FREQ.1989.68845","url":null,"abstract":"A device is presented that combines the output power of several millimeter-wavelength devices in a single step by means of a dielectric resonator (DR) with whispering-gallery modes. After a brief description of whispering-gallery modes, definitions are given for both electromagnetic and electrical parameters of these resonators when they are coupled with transmission lines. The design and the test results of the W-band whispering-gallery mode DR power combiner are then given.<<ETX>>","PeriodicalId":294361,"journal":{"name":"Proceedings of the 43rd Annual Symposium on Frequency Control","volume":"56 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1989-05-31","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132997577","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
A history is given of the Master Clock Upgrade Program at USNO and the current status of the program is described. Performance data on the hydrogen masers and stored ion devices are presented. Current projects are described including a time difference measurement system, time scale algorithm test bed, and the novel masers to be added over the next 18 months. A prediction of the status and performance of the program in two years is made.<>
{"title":"Report on the master clock upgrade program at USNO","authors":"G. A. Gifford, P. Wheeler","doi":"10.1109/FREQ.1989.68858","DOIUrl":"https://doi.org/10.1109/FREQ.1989.68858","url":null,"abstract":"A history is given of the Master Clock Upgrade Program at USNO and the current status of the program is described. Performance data on the hydrogen masers and stored ion devices are presented. Current projects are described including a time difference measurement system, time scale algorithm test bed, and the novel masers to be added over the next 18 months. A prediction of the status and performance of the program in two years is made.<<ETX>>","PeriodicalId":294361,"journal":{"name":"Proceedings of the 43rd Annual Symposium on Frequency Control","volume":"265 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1989-05-31","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133166808","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Phase noise measurements are presented for a microwave oscillator whose frequency is stabilized by a whispering-gallery mode sapphire ring resonator with Q of 2*10/sup 5/. Isolation of RF fields by the special nature of the electromagnetic mode allows the very low loss of the sapphire itself to be realized. Several mode families have been identified with fairly good agreement with calculated frequency predictions. Waveguide coupling parameters have been characterized for the principal (lowest frequency) mode family, for n=5 to n=10 full waves around the perimeter. Based on the measurements and on the performance of commercially available phase detectors, the performance for a cooled resonator operating at 77 K with a Q of 3*10/sup 7/ is projected to be -85 dB/Hz at an offset of 1 Hz. This value is 30 dB below that of the best X-band source presently available, a frequency-multiplied quartz crystal oscillator.<>
{"title":"Measurement and analysis of a microwave oscillator stabilized by a sapphire dielectric ring resonator for ultra-low noise","authors":"J. Dick, J. Saunders","doi":"10.1109/FREQ.1989.68843","DOIUrl":"https://doi.org/10.1109/FREQ.1989.68843","url":null,"abstract":"Phase noise measurements are presented for a microwave oscillator whose frequency is stabilized by a whispering-gallery mode sapphire ring resonator with Q of 2*10/sup 5/. Isolation of RF fields by the special nature of the electromagnetic mode allows the very low loss of the sapphire itself to be realized. Several mode families have been identified with fairly good agreement with calculated frequency predictions. Waveguide coupling parameters have been characterized for the principal (lowest frequency) mode family, for n=5 to n=10 full waves around the perimeter. Based on the measurements and on the performance of commercially available phase detectors, the performance for a cooled resonator operating at 77 K with a Q of 3*10/sup 7/ is projected to be -85 dB/Hz at an offset of 1 Hz. This value is 30 dB below that of the best X-band source presently available, a frequency-multiplied quartz crystal oscillator.<<ETX>>","PeriodicalId":294361,"journal":{"name":"Proceedings of the 43rd Annual Symposium on Frequency Control","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1989-05-31","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131374474","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
A general coupling-of-modes analysis of SAW transducers and gratings is presented. The analysis is applicable to the complete continuum of SAW devices, from transducers with or without internal reflections to grating reflectors comprised of grooves or metallic stripes. The analysis incorporates several important phenomena not previously included in analyses of this type. Both the effects of finite-electrode resistivity and spatially varying propagation loss are accounted for. In addition, the analysis is sufficiently general to permit the modeling of complex devices on relatively arbitrary crystal orientations. Three coupled first-order differential equations are obtained relating the forward and reverse propagating acoustic-wave amplitudes i the device and the current on the busbars. These equations lead directly to simple expressions for some very fundamental characteristics of SAW devices.<>
{"title":"A new generalized modeling of SAW transducers and gratings","authors":"P. Wright","doi":"10.1109/FREQ.1989.68920","DOIUrl":"https://doi.org/10.1109/FREQ.1989.68920","url":null,"abstract":"A general coupling-of-modes analysis of SAW transducers and gratings is presented. The analysis is applicable to the complete continuum of SAW devices, from transducers with or without internal reflections to grating reflectors comprised of grooves or metallic stripes. The analysis incorporates several important phenomena not previously included in analyses of this type. Both the effects of finite-electrode resistivity and spatially varying propagation loss are accounted for. In addition, the analysis is sufficiently general to permit the modeling of complex devices on relatively arbitrary crystal orientations. Three coupled first-order differential equations are obtained relating the forward and reverse propagating acoustic-wave amplitudes i the device and the current on the busbars. These equations lead directly to simple expressions for some very fundamental characteristics of SAW devices.<<ETX>>","PeriodicalId":294361,"journal":{"name":"Proceedings of the 43rd Annual Symposium on Frequency Control","volume":"19 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1989-05-31","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131964783","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
The MCXO uses a novel technique to achieve temperature compensation without the use of ovens or conventional temperature-compensating components. The crystal oscillator in the MCXO, which is free to vary with temperature, operates on two modes simultaneously-the fundamental and the third overtone. Several advantages accrue because this method of temperature compensation does not resort to frequency pulling. The authors presents the details of how the MCXO operates and the details of the performance of the delivered systems.<>
{"title":"The microcomputer compensated crystal oscillator (MCXO)","authors":"M. Bloch, M. Meirs, J. Ho","doi":"10.1109/FREQ.1989.68853","DOIUrl":"https://doi.org/10.1109/FREQ.1989.68853","url":null,"abstract":"The MCXO uses a novel technique to achieve temperature compensation without the use of ovens or conventional temperature-compensating components. The crystal oscillator in the MCXO, which is free to vary with temperature, operates on two modes simultaneously-the fundamental and the third overtone. Several advantages accrue because this method of temperature compensation does not resort to frequency pulling. The authors presents the details of how the MCXO operates and the details of the performance of the delivered systems.<<ETX>>","PeriodicalId":294361,"journal":{"name":"Proceedings of the 43rd Annual Symposium on Frequency Control","volume":"60 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1989-05-31","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122339764","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
It is argued that (1) shear-mode grinding of glass occurs with abrasive particle sizes less than 1 mu m, that it is the mechanical limit of the more common mechanical-chemical glass polishing, and that the debris is insufficient in size to perform the function of eroding the binder in the grinding wheel and thus necessitates the addition of an abrasive and/or chemical additions to the coolant to effect wheel-dressing. The work groups together a series of observations and work by authors and others which, when taken together, forms a picture of shear and mode grinding in a production environment.<>
{"title":"Shear mode griding","authors":"N. Brown, B. Fuchs","doi":"10.1109/FREQ.1989.68921","DOIUrl":"https://doi.org/10.1109/FREQ.1989.68921","url":null,"abstract":"It is argued that (1) shear-mode grinding of glass occurs with abrasive particle sizes less than 1 mu m, that it is the mechanical limit of the more common mechanical-chemical glass polishing, and that the debris is insufficient in size to perform the function of eroding the binder in the grinding wheel and thus necessitates the addition of an abrasive and/or chemical additions to the coolant to effect wheel-dressing. The work groups together a series of observations and work by authors and others which, when taken together, forms a picture of shear and mode grinding in a production environment.<<ETX>>","PeriodicalId":294361,"journal":{"name":"Proceedings of the 43rd Annual Symposium on Frequency Control","volume":"41 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1989-05-31","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116488242","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
An analysis is presented of the effect of the linewidth of a single-longitudinal-mode semiconductor laser on the frequency stability of a frequency reference transmitted over single-mode optical fiber. The interaction of the random laser frequency deviations with the dispersion of the optical fiber is considered to determine theoretically the effect on the Allan deviation of the transmitted frequency reference. It is shown that the magnitude of this effect may determine the limit on the ultimate stability possible for frequency reference transmission on optical fiber, although it is not a serious limitation to present system performance.<>
{"title":"Impact of semiconductor laser frequency deviations on fiber optic frequency reference distribution systems","authors":"R. Logan, G. Lutes, L. Maleki","doi":"10.1109/FREQ.1989.68867","DOIUrl":"https://doi.org/10.1109/FREQ.1989.68867","url":null,"abstract":"An analysis is presented of the effect of the linewidth of a single-longitudinal-mode semiconductor laser on the frequency stability of a frequency reference transmitted over single-mode optical fiber. The interaction of the random laser frequency deviations with the dispersion of the optical fiber is considered to determine theoretically the effect on the Allan deviation of the transmitted frequency reference. It is shown that the magnitude of this effect may determine the limit on the ultimate stability possible for frequency reference transmission on optical fiber, although it is not a serious limitation to present system performance.<<ETX>>","PeriodicalId":294361,"journal":{"name":"Proceedings of the 43rd Annual Symposium on Frequency Control","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1989-05-31","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125916074","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
A method is described for manufacturing AT-cut high-frequency-fundamental crystals up to 150 MHz. Individual samples at fundamental frequencies up to 500 MHz have also been fabricated, demonstrating that batch production of crystals with very high fundamental frequencies is also feasible. Plasma etching is used for recessing blanks to the desired thickness. High-quality quartz is essential as the starting material and careful preparation of the blanks prior to plasma etching is required. Examples of electrical parameter measurements on production batches of crystals at fundamental frequencies between 60 MHz and 150 MHz are given, together with results from sample crystals at frequencies up to 500 MHz.<>
{"title":"The fabrication of high frequency fundamental crystals by plasma etching","authors":"F. Stern, J. Dowsett, D. Carter, R. Williamson","doi":"10.1109/FREQ.1989.68926","DOIUrl":"https://doi.org/10.1109/FREQ.1989.68926","url":null,"abstract":"A method is described for manufacturing AT-cut high-frequency-fundamental crystals up to 150 MHz. Individual samples at fundamental frequencies up to 500 MHz have also been fabricated, demonstrating that batch production of crystals with very high fundamental frequencies is also feasible. Plasma etching is used for recessing blanks to the desired thickness. High-quality quartz is essential as the starting material and careful preparation of the blanks prior to plasma etching is required. Examples of electrical parameter measurements on production batches of crystals at fundamental frequencies between 60 MHz and 150 MHz are given, together with results from sample crystals at frequencies up to 500 MHz.<<ETX>>","PeriodicalId":294361,"journal":{"name":"Proceedings of the 43rd Annual Symposium on Frequency Control","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1989-05-31","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128937073","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
J. Détaint, H. Carru, J. Schwartzel, C. Joly, B. Capelle, A. Zarka
A method is proposed for obtaining precise measurements of the cutoff frequencies of unelectroded plates. These quantities can then be used in a model, similar to that which has permitted the extraction of the cutoff frequency, to determine the other parameters of the resonator (electrode geometry and mass loading). Two successive applications of these models permit one to remove most of the uncertainties relative to the material constants and to obtain precise values of the equivalent scheme and, if necessary, a response free from anharmonic modes. A model of the resonators with embedded electrodes proposed by T.J. Lukaszek (1971) has been constructed and the properties of this type of resonators computed. The models made for the three types of resonators described here are based on the approximate equations governing the thickness vibrations of piezoelectric plates established by H.F. Tiersten and coworkers (1979). Two methods of resolution of these equations were used: a semialgebraical one and the finite-elements method.<>
{"title":"Air-gap determination of the cut-off frequency of unelectroded plates and effects of local thickness modifications in plane resonators","authors":"J. Détaint, H. Carru, J. Schwartzel, C. Joly, B. Capelle, A. Zarka","doi":"10.1109/FREQ.1989.68928","DOIUrl":"https://doi.org/10.1109/FREQ.1989.68928","url":null,"abstract":"A method is proposed for obtaining precise measurements of the cutoff frequencies of unelectroded plates. These quantities can then be used in a model, similar to that which has permitted the extraction of the cutoff frequency, to determine the other parameters of the resonator (electrode geometry and mass loading). Two successive applications of these models permit one to remove most of the uncertainties relative to the material constants and to obtain precise values of the equivalent scheme and, if necessary, a response free from anharmonic modes. A model of the resonators with embedded electrodes proposed by T.J. Lukaszek (1971) has been constructed and the properties of this type of resonators computed. The models made for the three types of resonators described here are based on the approximate equations governing the thickness vibrations of piezoelectric plates established by H.F. Tiersten and coworkers (1979). Two methods of resolution of these equations were used: a semialgebraical one and the finite-elements method.<<ETX>>","PeriodicalId":294361,"journal":{"name":"Proceedings of the 43rd Annual Symposium on Frequency Control","volume":"117 2-3","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1989-05-31","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114012469","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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