A six-port reflectometer technique is extended to make pulsed-RF measurements. It is shown that a time resolution of the order of 1 mu s is possible in both repetitive and single-shot mode of operation. A proof of principle of the method is obtained using passive and active loads. A simple method for the linearization of diode detector response is also presented. Because of its good time resolution, the proposed technique can be used to study thermal effects in high-power solid-state amplifiers or to characterize pulse devices used in phased-array radars.<>
{"title":"Wideband microwave pulsed reflectometer using a six-port junction","authors":"Y. Demers, R. Bosisio, F. Ghannouchi","doi":"10.1109/IMTC.1989.36916","DOIUrl":"https://doi.org/10.1109/IMTC.1989.36916","url":null,"abstract":"A six-port reflectometer technique is extended to make pulsed-RF measurements. It is shown that a time resolution of the order of 1 mu s is possible in both repetitive and single-shot mode of operation. A proof of principle of the method is obtained using passive and active loads. A simple method for the linearization of diode detector response is also presented. Because of its good time resolution, the proposed technique can be used to study thermal effects in high-power solid-state amplifiers or to characterize pulse devices used in phased-array radars.<<ETX>>","PeriodicalId":298343,"journal":{"name":"6th IEEE Conference Record., Instrumentation and Measurement Technology Conference","volume":"26 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1989-04-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122062655","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
A prototype sensing system for a robotic manipulator is described. The type of object encountered is identified by comparing the refractive index, dielectric permittivity and constant, and loss tangent values using an RF, millimeter-wave, or infrared techniques. The shape, thickness, diameter, and distance of the object is calculated using a CW He-Ne gas laser. The data are fed to a computer-aided system that determines the weight and orientation of the object; three-mode force control is then implemented, allowing the gripper to do the required job. This system can be applied to hollow objects, thin films, rigid bodies, ceramics, and biological objects of different geometry.<>
{"title":"Intelligent sensing and force control of a robotic arm manipulator","authors":"Z.H. Bhahi, A. Hussain","doi":"10.1109/IMTC.1989.36832","DOIUrl":"https://doi.org/10.1109/IMTC.1989.36832","url":null,"abstract":"A prototype sensing system for a robotic manipulator is described. The type of object encountered is identified by comparing the refractive index, dielectric permittivity and constant, and loss tangent values using an RF, millimeter-wave, or infrared techniques. The shape, thickness, diameter, and distance of the object is calculated using a CW He-Ne gas laser. The data are fed to a computer-aided system that determines the weight and orientation of the object; three-mode force control is then implemented, allowing the gripper to do the required job. This system can be applied to hollow objects, thin films, rigid bodies, ceramics, and biological objects of different geometry.<<ETX>>","PeriodicalId":298343,"journal":{"name":"6th IEEE Conference Record., Instrumentation and Measurement Technology Conference","volume":"29 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1989-04-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124922541","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
The perturbation technique and its approximation method are applied to the analysis of a phase-locked loop used in the clock recovery circuit of an optical receiver system. The detuned situation is considered, and the analysis results are applied to a specific optical receiver system. The phase error variance due to Gaussian, pattern, and shot noise are examined by computer simulation. It is found that as the detuning frequency becomes larger, the phase error variance due to each of these noises also increases.<>
{"title":"Noise spectral analysis of baseband optical receiver system via the perturbation techniques","authors":"Heung-Gyun Ryu, Hyundeok Bae","doi":"10.1109/IMTC.1989.36908","DOIUrl":"https://doi.org/10.1109/IMTC.1989.36908","url":null,"abstract":"The perturbation technique and its approximation method are applied to the analysis of a phase-locked loop used in the clock recovery circuit of an optical receiver system. The detuned situation is considered, and the analysis results are applied to a specific optical receiver system. The phase error variance due to Gaussian, pattern, and shot noise are examined by computer simulation. It is found that as the detuning frequency becomes larger, the phase error variance due to each of these noises also increases.<<ETX>>","PeriodicalId":298343,"journal":{"name":"6th IEEE Conference Record., Instrumentation and Measurement Technology Conference","volume":"52 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1989-04-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130136295","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
The ability of the six-port technique to perform simultaneous measurements of microwave impedance and power flow at an arbitrary reference plane has been bound to be directly applicable to load-pull characterization. This technique avoids the use of additional directional couplers and power meters generally needed in microwave power flow measurements. An experimental six-port network analyzer has been used as a load-pull system in an active load tuning configuration. Experimental results for a microwave transistor characterization confirm the validity of this method. This technique uses less hardware than conventional methods and provides a comparable accuracy.<>
{"title":"Load-pull characterization method using six-port techniques","authors":"F. Ghannouchi, R. Bosisio, Y. Demers","doi":"10.1109/IMTC.1989.36918","DOIUrl":"https://doi.org/10.1109/IMTC.1989.36918","url":null,"abstract":"The ability of the six-port technique to perform simultaneous measurements of microwave impedance and power flow at an arbitrary reference plane has been bound to be directly applicable to load-pull characterization. This technique avoids the use of additional directional couplers and power meters generally needed in microwave power flow measurements. An experimental six-port network analyzer has been used as a load-pull system in an active load tuning configuration. Experimental results for a microwave transistor characterization confirm the validity of this method. This technique uses less hardware than conventional methods and provides a comparable accuracy.<<ETX>>","PeriodicalId":298343,"journal":{"name":"6th IEEE Conference Record., Instrumentation and Measurement Technology Conference","volume":"2 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1989-04-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122426579","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
A temperature measurement technology using platinum precision resistors has been combined with thin-film technology, resulting in a highly precise of platinum temperature sensors. The author presents the production procedures and characteristics of the sensors for measurement technology. Their optimum adaptation to various measuring applications is shown, using examples from the fields of automobile technology and domestic, industrial, and production technology and electronics.<>
{"title":"Precious metal resistors-precise temperature sensors","authors":"H. Jacques","doi":"10.1109/IMTC.1989.36815","DOIUrl":"https://doi.org/10.1109/IMTC.1989.36815","url":null,"abstract":"A temperature measurement technology using platinum precision resistors has been combined with thin-film technology, resulting in a highly precise of platinum temperature sensors. The author presents the production procedures and characteristics of the sensors for measurement technology. Their optimum adaptation to various measuring applications is shown, using examples from the fields of automobile technology and domestic, industrial, and production technology and electronics.<<ETX>>","PeriodicalId":298343,"journal":{"name":"6th IEEE Conference Record., Instrumentation and Measurement Technology Conference","volume":"101 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1989-04-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124146689","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
A system consisting of four parallel digital signal processors that communicate with a computer host is proposed for implementing online fault detection and identification using industrial transducers. Programming of the fault detection algorithms is carried out in a block-diagram graphical language, specially designed for that purpose. The programming environment allows automatic program segmentation into parallel tasks, the generation of the corresponding code, the allocation of the coded tasks to the four processors, and simulation of the operation of the programmed system. An example (a turbine flow meter) is given to demonstrate the use of the software.<>
{"title":"A multiple DSP environment for on-line signature analysis of plant instrumentation","authors":"G. Hassapis","doi":"10.1109/IMTC.1989.36889","DOIUrl":"https://doi.org/10.1109/IMTC.1989.36889","url":null,"abstract":"A system consisting of four parallel digital signal processors that communicate with a computer host is proposed for implementing online fault detection and identification using industrial transducers. Programming of the fault detection algorithms is carried out in a block-diagram graphical language, specially designed for that purpose. The programming environment allows automatic program segmentation into parallel tasks, the generation of the corresponding code, the allocation of the coded tasks to the four processors, and simulation of the operation of the programmed system. An example (a turbine flow meter) is given to demonstrate the use of the software.<<ETX>>","PeriodicalId":298343,"journal":{"name":"6th IEEE Conference Record., Instrumentation and Measurement Technology Conference","volume":"42 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1989-04-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128248515","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
The authors review the history of miniature electric field probes. They begin by describing growing environmental concerns about the biological effects of electromagnetic radiation in the mid 1970s. The importance of lead structure and design is discussed, and examples of two lead structures are presented. Design considerations for probes used in electromagnetic pulse measurements are viewed. The discussion indicates that lead bandwidths as high as 16 MHz are required for measurements of very short pulses such as those generated by a nuclear blast.<>
{"title":"Miniature electric field probes","authors":"T. Batchman, D. P. Mulvey","doi":"10.1109/IMTC.1989.36885","DOIUrl":"https://doi.org/10.1109/IMTC.1989.36885","url":null,"abstract":"The authors review the history of miniature electric field probes. They begin by describing growing environmental concerns about the biological effects of electromagnetic radiation in the mid 1970s. The importance of lead structure and design is discussed, and examples of two lead structures are presented. Design considerations for probes used in electromagnetic pulse measurements are viewed. The discussion indicates that lead bandwidths as high as 16 MHz are required for measurements of very short pulses such as those generated by a nuclear blast.<<ETX>>","PeriodicalId":298343,"journal":{"name":"6th IEEE Conference Record., Instrumentation and Measurement Technology Conference","volume":"60 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1989-04-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127970215","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
A phase-compensated reflectometer designed for removing step error in frequency-domain reflectometry is applied to detect Fresnel reflection points in a short fiber (from 0.5 m to 2 km). This reflectometer makes it possible to distinguish multiple close reflections from one another. In addition, the signal/noise ratio is easily improved by narrowing the effective bandwidth of the receiver. By widening the swept bandwidth of the reflectometer, it is found that a break point in the graded-index fiber (125/150) and a joint close to it are distinguished clearly with +or-0.025 m accuracy and 0.25-m spatial resolution.<>
为消除频域反射测量中的阶跃误差，设计了相位补偿反射计，用于检测短光纤(0.5 m ~ 2 km)内的菲涅耳反射点。这种反射计可以区分多个彼此接近的反射。此外，通过缩小接收机的有效带宽，可以很容易地提高信噪比。通过扩大反射计的扫描带宽，可以清楚地分辨出渐变折射率光纤(125/150)中的断点及其附近的接头，精度为+或0.025 m，空间分辨率为0.25 m。
{"title":"Detection of faults in short fiber by the phase compensated reflectometer","authors":"S. Hangai, Y. Taki","doi":"10.1109/IMTC.1989.36875","DOIUrl":"https://doi.org/10.1109/IMTC.1989.36875","url":null,"abstract":"A phase-compensated reflectometer designed for removing step error in frequency-domain reflectometry is applied to detect Fresnel reflection points in a short fiber (from 0.5 m to 2 km). This reflectometer makes it possible to distinguish multiple close reflections from one another. In addition, the signal/noise ratio is easily improved by narrowing the effective bandwidth of the receiver. By widening the swept bandwidth of the reflectometer, it is found that a break point in the graded-index fiber (125/150) and a joint close to it are distinguished clearly with +or-0.025 m accuracy and 0.25-m spatial resolution.<<ETX>>","PeriodicalId":298343,"journal":{"name":"6th IEEE Conference Record., Instrumentation and Measurement Technology Conference","volume":"22 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1989-04-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132788118","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
A signal processing algorithm is developed to estimate the location of a discontinuity, e.g. a fault, on an electrical line. It is applied to fast sampled data and performs pecstral analysis of pulsed signals. The pecstrum algorithm is based on a transform similar to the one used in the cepstrum technique. It is demonstrated both theoretically and experimentally that the performance of the pecstrum estimator is significantly better than that of previously proposed methods. The proposed solution is operational in industrial digital reflectometers and has proved to be robust and successful in practice. With respect to cable-fault location, accuracies up to 30 cm are obtained when a fast, 20-MHz, 8-bit sampler is used for the acquisition of pulsed signals in a reflectogram.<>
{"title":"High accuracy location of faults on electrical lines using digital processing of sampled data records from a reflectogram","authors":"L. van Biesen, J. Renneboog, A. Barel","doi":"10.1109/IMTC.1989.36904","DOIUrl":"https://doi.org/10.1109/IMTC.1989.36904","url":null,"abstract":"A signal processing algorithm is developed to estimate the location of a discontinuity, e.g. a fault, on an electrical line. It is applied to fast sampled data and performs pecstral analysis of pulsed signals. The pecstrum algorithm is based on a transform similar to the one used in the cepstrum technique. It is demonstrated both theoretically and experimentally that the performance of the pecstrum estimator is significantly better than that of previously proposed methods. The proposed solution is operational in industrial digital reflectometers and has proved to be robust and successful in practice. With respect to cable-fault location, accuracies up to 30 cm are obtained when a fast, 20-MHz, 8-bit sampler is used for the acquisition of pulsed signals in a reflectogram.<<ETX>>","PeriodicalId":298343,"journal":{"name":"6th IEEE Conference Record., Instrumentation and Measurement Technology Conference","volume":"75 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1989-04-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129355069","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
The author describes a system that is designed to survey power disturbances at representative sites across the continental USA. Disturbance data gathered from remote power monitors are transmitted over telephone lines to a central personal computer to be processed and saved in a database for further analysis and study. A summary of the system architecture is given, and special features of programs and data are discussed.<>
{"title":"A system for surveying power quality","authors":"B. Hairabedian","doi":"10.1109/IMTC.1989.36893","DOIUrl":"https://doi.org/10.1109/IMTC.1989.36893","url":null,"abstract":"The author describes a system that is designed to survey power disturbances at representative sites across the continental USA. Disturbance data gathered from remote power monitors are transmitted over telephone lines to a central personal computer to be processed and saved in a database for further analysis and study. A summary of the system architecture is given, and special features of programs and data are discussed.<<ETX>>","PeriodicalId":298343,"journal":{"name":"6th IEEE Conference Record., Instrumentation and Measurement Technology Conference","volume":"2010 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1989-04-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125613380","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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