M. Abé, H. Ikeda, Y. Higaki, M. Amano, M. Nakamichi
The authors describe a novel, indirect method for estimating the correlated color temperature of illuminants by using a color video camera and a set of several known color chips. The video camera can have arbitrary shooting chromaticity characteristics; however, it should be used in fixed white balance. The correlated color temperature of the light source illuminating the color chips is estimated. Using the method of least squares, an accuracy from 0.1% to 1.4% is achieved, depending on the spectral distribution of the illuminants. The method fully utilizes microcomputer capabilities in acquiring the camera outputs, solving a set of simultaneous linear equations, and searching for the nearest (U, nu ) coordinate values on the black-body locus.<>
{"title":"A method to estimate correlated color temperature of illuminant using color video camera","authors":"M. Abé, H. Ikeda, Y. Higaki, M. Amano, M. Nakamichi","doi":"10.1109/IMTC.1989.36813","DOIUrl":"https://doi.org/10.1109/IMTC.1989.36813","url":null,"abstract":"The authors describe a novel, indirect method for estimating the correlated color temperature of illuminants by using a color video camera and a set of several known color chips. The video camera can have arbitrary shooting chromaticity characteristics; however, it should be used in fixed white balance. The correlated color temperature of the light source illuminating the color chips is estimated. Using the method of least squares, an accuracy from 0.1% to 1.4% is achieved, depending on the spectral distribution of the illuminants. The method fully utilizes microcomputer capabilities in acquiring the camera outputs, solving a set of simultaneous linear equations, and searching for the nearest (U, nu ) coordinate values on the black-body locus.<<ETX>>","PeriodicalId":298343,"journal":{"name":"6th IEEE Conference Record., Instrumentation and Measurement Technology Conference","volume":"10 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1989-04-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115091266","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
The authors discuss the state of the art in tactile sensing technology and the ability of current sensors to meet the harsh environmental demands of space applications (e.g. the Space Station). The performance of the tactile sensor, both as a stand-alone feedback instrument and in cooperation with visual feedback, is discussed. The authors describe the implementation and perception problems associated with the development of an experimental matrix-type tactile sensor using force-sensitive transducers.<>
{"title":"Tactile sensing for space robotics","authors":"W. S. McMath, S. Yeung, E. Petriu","doi":"10.1109/IMTC.1989.36834","DOIUrl":"https://doi.org/10.1109/IMTC.1989.36834","url":null,"abstract":"The authors discuss the state of the art in tactile sensing technology and the ability of current sensors to meet the harsh environmental demands of space applications (e.g. the Space Station). The performance of the tactile sensor, both as a stand-alone feedback instrument and in cooperation with visual feedback, is discussed. The authors describe the implementation and perception problems associated with the development of an experimental matrix-type tactile sensor using force-sensitive transducers.<<ETX>>","PeriodicalId":298343,"journal":{"name":"6th IEEE Conference Record., Instrumentation and Measurement Technology Conference","volume":"9 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1989-04-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114506410","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
The design aspects and actual implementation phase of an expert system as an aid for the analysis and diagnostics of cardiac infirmities is presented. An IBM-PC compatible microcomputer containing the necessary interface cards for the acquisition of ECG (electrocardiograph) signals is used. The system provides electronic switching of the ECG lead configurations. A data and control flow diagram is used for the analysis of the software of the proposed system. Particular attention is given to signal acquisition, signal processing data, data management, the knowledge base inference engine, and the man-machine interface.<>
{"title":"An expert ECG acquisition and analysis system","authors":"A. Perkusich, G. S. Deep, M. Perkusich, M. Varani","doi":"10.1109/IMTC.1989.36848","DOIUrl":"https://doi.org/10.1109/IMTC.1989.36848","url":null,"abstract":"The design aspects and actual implementation phase of an expert system as an aid for the analysis and diagnostics of cardiac infirmities is presented. An IBM-PC compatible microcomputer containing the necessary interface cards for the acquisition of ECG (electrocardiograph) signals is used. The system provides electronic switching of the ECG lead configurations. A data and control flow diagram is used for the analysis of the software of the proposed system. Particular attention is given to signal acquisition, signal processing data, data management, the knowledge base inference engine, and the man-machine interface.<<ETX>>","PeriodicalId":298343,"journal":{"name":"6th IEEE Conference Record., Instrumentation and Measurement Technology Conference","volume":"104 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1989-04-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114443214","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
The authors describe a six-port reflectometer consisting of a symmetrical five-port waveguide junction and a directional coupler. Theoretical and experimental results show that such an instrument can yield optimum measurement performance over about 80% of the waveguide bandwidth. Measurements taken using the prototype reflectometer indicate that accuracies of +or-0.005 in magnitude and +or-0.5 degrees in phase are obtainable.<>
{"title":"Six-port reflectometer capable of optimum performance","authors":"S. Yeo, K.H. Lee","doi":"10.1109/IMTC.1989.36914","DOIUrl":"https://doi.org/10.1109/IMTC.1989.36914","url":null,"abstract":"The authors describe a six-port reflectometer consisting of a symmetrical five-port waveguide junction and a directional coupler. Theoretical and experimental results show that such an instrument can yield optimum measurement performance over about 80% of the waveguide bandwidth. Measurements taken using the prototype reflectometer indicate that accuracies of +or-0.005 in magnitude and +or-0.5 degrees in phase are obtainable.<<ETX>>","PeriodicalId":298343,"journal":{"name":"6th IEEE Conference Record., Instrumentation and Measurement Technology Conference","volume":"43 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1989-04-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116233127","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
To more accurately estimate the resistivity and permeability of a cylindrical conductor sample, a formula for obtaining the difference in the complex impedance between a circular multilayer solenoid coil having a conductor and a similar coil without a conductor is derived. In comparison with the conventional method using a single-layer solenoid coil, it is shown by experiment that a multilayer solenoid coil is extremely effective with regard to a short conductor sample because a larger difference in the complex impedance is obtained without increasing the width of the solenoid coil.<>
{"title":"A method for simultaneously measuring resistivity and permeability with a multi-layer solenoid coil","authors":"H. Nakane, Y. Sohara, S. Omori","doi":"10.1109/IMTC.1989.36871","DOIUrl":"https://doi.org/10.1109/IMTC.1989.36871","url":null,"abstract":"To more accurately estimate the resistivity and permeability of a cylindrical conductor sample, a formula for obtaining the difference in the complex impedance between a circular multilayer solenoid coil having a conductor and a similar coil without a conductor is derived. In comparison with the conventional method using a single-layer solenoid coil, it is shown by experiment that a multilayer solenoid coil is extremely effective with regard to a short conductor sample because a larger difference in the complex impedance is obtained without increasing the width of the solenoid coil.<<ETX>>","PeriodicalId":298343,"journal":{"name":"6th IEEE Conference Record., Instrumentation and Measurement Technology Conference","volume":"256 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1989-04-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123190034","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
It is well-known that in discrete-Fourier-transform- (DFT-) based waveform analysis of multifrequency signals, spectral parameter accuracy can be increased by windowing the time samples and interpolating the DFT coefficients. It is shown that some relationships used in interpolation are affected very little by the number of processed samples, so that only the characteristics of the analyzed signal and the required accuracy affect the choice of this parameter. In particular, this makes the approach well suited for real-time analysis of signals with slowly time-varying spectra. Polynomial approximations of some relationships reduce the processing effort and, allow a greater freedom in the choice of the window functions, improving both accuracy and frequency resolution.<>
{"title":"Interpolation techniques for real-time multifrequency waveform analysis","authors":"C. Offelli, D. Petri","doi":"10.1109/IMTC.1989.36879","DOIUrl":"https://doi.org/10.1109/IMTC.1989.36879","url":null,"abstract":"It is well-known that in discrete-Fourier-transform- (DFT-) based waveform analysis of multifrequency signals, spectral parameter accuracy can be increased by windowing the time samples and interpolating the DFT coefficients. It is shown that some relationships used in interpolation are affected very little by the number of processed samples, so that only the characteristics of the analyzed signal and the required accuracy affect the choice of this parameter. In particular, this makes the approach well suited for real-time analysis of signals with slowly time-varying spectra. Polynomial approximations of some relationships reduce the processing effort and, allow a greater freedom in the choice of the window functions, improving both accuracy and frequency resolution.<<ETX>>","PeriodicalId":298343,"journal":{"name":"6th IEEE Conference Record., Instrumentation and Measurement Technology Conference","volume":"23 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1989-04-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123527284","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
R. Dyer, S. Dyer, B. Harms, T. W. Johnson, J.B. Park
The multiplexing offered by Hadamard-transform spectrometry can improve the signal-to-noise ratio at the output of a spectrometer. Traditionally, the inverse Hadamard transform (IHT) has been used to recover the individual spectral components, but the IHT does not take into account the nonidealities associated with the multiplexing process. A system model has been developed which addresses nonidealities in the multiplexer, noise introduced at the detector, and choice of method for spectrum recovery. A computer simulation of the model has been developed and can be used to examine the effect of certain nonidealities that may typically be encountered. Three different spectrum-recovery schemes are examined, and their relative performance is compared with regard to mean-square error and to the computational efficiency of the algorithms necessary to implement them. An example application is described, and the performance of the three spectrum-recovery schemes is discussed.<>
{"title":"Implementation problems in Hadamard spectrometry","authors":"R. Dyer, S. Dyer, B. Harms, T. W. Johnson, J.B. Park","doi":"10.1109/IMTC.1989.36900","DOIUrl":"https://doi.org/10.1109/IMTC.1989.36900","url":null,"abstract":"The multiplexing offered by Hadamard-transform spectrometry can improve the signal-to-noise ratio at the output of a spectrometer. Traditionally, the inverse Hadamard transform (IHT) has been used to recover the individual spectral components, but the IHT does not take into account the nonidealities associated with the multiplexing process. A system model has been developed which addresses nonidealities in the multiplexer, noise introduced at the detector, and choice of method for spectrum recovery. A computer simulation of the model has been developed and can be used to examine the effect of certain nonidealities that may typically be encountered. Three different spectrum-recovery schemes are examined, and their relative performance is compared with regard to mean-square error and to the computational efficiency of the algorithms necessary to implement them. An example application is described, and the performance of the three spectrum-recovery schemes is discussed.<<ETX>>","PeriodicalId":298343,"journal":{"name":"6th IEEE Conference Record., Instrumentation and Measurement Technology Conference","volume":"34 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1989-04-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121674728","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
An AC voltage intercomparison was conducted to determine the consistency of AC voltage measurements made at various standards laboratories. The transport standard used for this purpose was a NIST-developed digitally synthesized sinusoidal voltage source whose RMS (root-mean-square) value was calculated by measuring the DC level of each of the steps used to synthesize the sine wave. The uncertainty of the calculated voltage at approximately 7 V RMS is typically within +or-10 parts per million (ppm) from 15 Hz to 7.8 kHz. This approach incorporates a measured standard DC voltage and is independent of the traditional thermal voltage converter approach. Preliminary measurements made at each of the participating laboratories agree with the calculated value to within +or-20 ppm. These results indicate that at 7 V, in the low audio frequency range, the AC voltage measurement techniques implemented at these laboratories are near the state of the art.<>
进行了交流电压比对，以确定在不同标准实验室进行的交流电压测量的一致性。用于此目的的传输标准是nist开发的数字合成正弦电压源，其RMS(均方根)值通过测量用于合成正弦波的每个步骤的直流电平来计算。在约7 V RMS下计算电压的不确定度通常在+或10百万分之一(ppm)范围内，从15 Hz到7.8 kHz。该方法采用测量的标准直流电压，独立于传统的热电压转换器方法。在每个参与实验室进行的初步测量与计算值一致，在+或20 ppm范围内。这些结果表明，在7 V的低音频范围内，在这些实验室实施的交流电压测量技术接近最先进的水平
{"title":"An intercomparison of AC voltage using a digitally synthesized source","authors":"N. Oldham, W. Bruce, C. Fu, A.G. Smith","doi":"10.1109/IMTC.1989.36843","DOIUrl":"https://doi.org/10.1109/IMTC.1989.36843","url":null,"abstract":"An AC voltage intercomparison was conducted to determine the consistency of AC voltage measurements made at various standards laboratories. The transport standard used for this purpose was a NIST-developed digitally synthesized sinusoidal voltage source whose RMS (root-mean-square) value was calculated by measuring the DC level of each of the steps used to synthesize the sine wave. The uncertainty of the calculated voltage at approximately 7 V RMS is typically within +or-10 parts per million (ppm) from 15 Hz to 7.8 kHz. This approach incorporates a measured standard DC voltage and is independent of the traditional thermal voltage converter approach. Preliminary measurements made at each of the participating laboratories agree with the calculated value to within +or-20 ppm. These results indicate that at 7 V, in the low audio frequency range, the AC voltage measurement techniques implemented at these laboratories are near the state of the art.<<ETX>>","PeriodicalId":298343,"journal":{"name":"6th IEEE Conference Record., Instrumentation and Measurement Technology Conference","volume":"5 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1989-04-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132745365","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Several smoothing nonrecursive filters, such as the rectangular, triangular, and Hanning filters and the exponential recursive filter with different coefficients, are analyzed and compared. These filters are applied to noisy sinusoidal waveforms with different frequencies and signal-to-noise ratios. Filter performance is based on the square of the error between the original signal considered for measurement and the clean one. The most appropriate filter to smooth such signals is determined for every frequency and for different signal-to-noise ratios. Theoretical and simulation results show that for large noise components (very low signal-to-noise ratios) the rectangular smoother gives the least amount of root-mean-square error. For signal-to-noise ratios in the range 0-10 dB, the performance of the exponential filter is better than the performance of the nonrecursive filters examined.<>
{"title":"Waveform smoothing: analysis and comparisons","authors":"H. H. Eilouti, A. Abu-El-Haija","doi":"10.1109/IMTC.1989.36877","DOIUrl":"https://doi.org/10.1109/IMTC.1989.36877","url":null,"abstract":"Several smoothing nonrecursive filters, such as the rectangular, triangular, and Hanning filters and the exponential recursive filter with different coefficients, are analyzed and compared. These filters are applied to noisy sinusoidal waveforms with different frequencies and signal-to-noise ratios. Filter performance is based on the square of the error between the original signal considered for measurement and the clean one. The most appropriate filter to smooth such signals is determined for every frequency and for different signal-to-noise ratios. Theoretical and simulation results show that for large noise components (very low signal-to-noise ratios) the rectangular smoother gives the least amount of root-mean-square error. For signal-to-noise ratios in the range 0-10 dB, the performance of the exponential filter is better than the performance of the nonrecursive filters examined.<<ETX>>","PeriodicalId":298343,"journal":{"name":"6th IEEE Conference Record., Instrumentation and Measurement Technology Conference","volume":"118 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1989-04-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116374532","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
The performance of manganin resistance gauges under high static pressure is evaluated. The accuracy of several interpolation- (or extrapolation-) based mathematical-models is compared. It is shown that if the gauges used at pressures below 1 GPa are calibrated at a given constant temperature and used at that temperature, the complete mathematical-model is unnecessary. However, a complete model for the variation of resistance with both pressure and temperature is required in the pressure range from 1 GPa up to 20 GPa, because the temperature changes due to compression or expansion of the pressure-transmitting medium can be quite pronounced.<>
{"title":"Performance comments on manganin resistance gauges under high static pressures","authors":"T. Yuan, Yan-Chong Lu, Bao-Hui Yuan","doi":"10.1109/IMTC.1989.36923","DOIUrl":"https://doi.org/10.1109/IMTC.1989.36923","url":null,"abstract":"The performance of manganin resistance gauges under high static pressure is evaluated. The accuracy of several interpolation- (or extrapolation-) based mathematical-models is compared. It is shown that if the gauges used at pressures below 1 GPa are calibrated at a given constant temperature and used at that temperature, the complete mathematical-model is unnecessary. However, a complete model for the variation of resistance with both pressure and temperature is required in the pressure range from 1 GPa up to 20 GPa, because the temperature changes due to compression or expansion of the pressure-transmitting medium can be quite pronounced.<<ETX>>","PeriodicalId":298343,"journal":{"name":"6th IEEE Conference Record., Instrumentation and Measurement Technology Conference","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1989-04-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115646862","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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