Pub Date : 2014-06-24DOI: 10.1109/NAECON.2014.7045829
Randall D. Deppensmith, Samuel J. Stone
Device discrimination has been effectively demonstrated using classification processes acting on RF-DNA features as input sequences. Device discrimination utilizing RF-DNA classifiers requires training signals representative of the expected test signals that capture device uniqueness. Current techniques divide collected signals into uniformly distributed and sized regions prior to generating the RF-DNA feature input sequences. This paper divided the collected signals using non-uniform regions tailored to the device operations. Early results indicate that using non-uniform regions for fingerprint generation do not result in increased detection performance for the specific signals considered.
{"title":"Optimized fingerprint generation using unintentional emission radio-frequency distinct native attributes (RF-DNA)","authors":"Randall D. Deppensmith, Samuel J. Stone","doi":"10.1109/NAECON.2014.7045829","DOIUrl":"https://doi.org/10.1109/NAECON.2014.7045829","url":null,"abstract":"Device discrimination has been effectively demonstrated using classification processes acting on RF-DNA features as input sequences. Device discrimination utilizing RF-DNA classifiers requires training signals representative of the expected test signals that capture device uniqueness. Current techniques divide collected signals into uniformly distributed and sized regions prior to generating the RF-DNA feature input sequences. This paper divided the collected signals using non-uniform regions tailored to the device operations. Early results indicate that using non-uniform regions for fingerprint generation do not result in increased detection performance for the specific signals considered.","PeriodicalId":318539,"journal":{"name":"NAECON 2014 - IEEE National Aerospace and Electronics Conference","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2014-06-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130917084","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2014-06-24DOI: 10.1109/NAECON.2014.7045847
Siyang Cao, Yuan F. Zheng, R. Ewing
The focus of this paper is on the development of Sband radar using the Lyrtech Small Form Factor (SFF) Software Defined Radio (SDR) for generating the Chirp-Z signal. The Lyrtech SDR platform has a high speed AD/DA conversion board and a tunable RF board, which enable a flexible radar design. To achieve a functional radar system, the development kids of the SFF SDR have to be fully utilized. This paper introduces the usage of both software and hardware resources of the SDR for converting the SDR into a waveform-programmable radar, which can benefit the study of radar systems using generic SDR platforms. Based on our approach, we develop an S-band radar which is used to transmit a Chirp-Z radar waveform modulated on a 2.2GHz carrier. The structure and the development kits of the SFF platform are introduced, and the development of the S-band radar by using the development kits discussed. Finally, both transmitted and received Chirp-Z signals using the developed radar system are demonstrated.
本文的重点是利用 Lyrtech Small Form Factor (SFF) Software Defined Radio (SDR) 技术开发 Sband 雷达，以产生 Chirp-Z 信号。Lyrtech SDR 平台有一个高速 AD/DA 转换板和一个可调谐射频板，可实现灵活的雷达设计。为了实现功能性雷达系统，必须充分利用 SFF SDR 的开发能力。本文介绍了如何利用 SDR 的软件和硬件资源，将 SDR 转换为波形可编程雷达，这将有助于使用通用 SDR 平台研究雷达系统。基于我们的方法，我们开发了一种 S 波段雷达，用于发射调制在 2.2GHz 载波上的 Chirp-Z 雷达波形。介绍了 SFF 平台的结构和开发套件，并讨论了使用开发套件开发 S 波段雷达的过程。最后，演示了使用开发的雷达系统发射和接收 Chirp-Z 信号的情况。
{"title":"S-band radar based on Lyrtech Software Defined Radio","authors":"Siyang Cao, Yuan F. Zheng, R. Ewing","doi":"10.1109/NAECON.2014.7045847","DOIUrl":"https://doi.org/10.1109/NAECON.2014.7045847","url":null,"abstract":"The focus of this paper is on the development of Sband radar using the Lyrtech Small Form Factor (SFF) Software Defined Radio (SDR) for generating the Chirp-Z signal. The Lyrtech SDR platform has a high speed AD/DA conversion board and a tunable RF board, which enable a flexible radar design. To achieve a functional radar system, the development kids of the SFF SDR have to be fully utilized. This paper introduces the usage of both software and hardware resources of the SDR for converting the SDR into a waveform-programmable radar, which can benefit the study of radar systems using generic SDR platforms. Based on our approach, we develop an S-band radar which is used to transmit a Chirp-Z radar waveform modulated on a 2.2GHz carrier. The structure and the development kits of the SFF platform are introduced, and the development of the S-band radar by using the development kits discussed. Finally, both transmitted and received Chirp-Z signals using the developed radar system are demonstrated.","PeriodicalId":318539,"journal":{"name":"NAECON 2014 - IEEE National Aerospace and Electronics Conference","volume":"12 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2014-06-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133834087","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2014-06-24DOI: 10.1109/NAECON.2014.7045789
K. Harrity, Soundararajan Ezekiel, A. Bubalo, Erik Blasch, M. Alford
For the past two decades, the Discrete Wavelet Transformation (DWT) has been successfully applied to many fields. For image processing applications, the DWT can produce non-redundant representations of an input image with greater performance than other wavelet methods. Further, the DWT provides a better spatial and spectral localization of image representation, capable of revealing smaller changes, trends, and breakdown points that classical methods often miss. However, the DWT has its own limitations and disadvantages such as lack of shift invariance. That is, if the input signal or image is shifted, then the wavelet coefficients will exacerbate that shift. The DWT also lacks the ability to represent directional cases. The Double Density Dual-Tree Discrete Wavelet Transformation (D3TDWT) is a relatively new and enhanced version of the DWT with two scaling functions and four distinct wavelets designed in such a way that one pair of wavelets is offset with another pair so that the first pair lies in between the second. In this paper, we propose a D3TDWT polarimetry analysis method to analyze Long Wave Infrared (LWIR) polarimetry imagery to discriminate objects such as people and vehicles from background clutter. The D3TDWT method can be applied to a wide range of applications such as change detection, shape extraction, target recognition, and simultaneous tracking and identification.
{"title":"Double-density dual-tree wavelet-based polarimetry analysis","authors":"K. Harrity, Soundararajan Ezekiel, A. Bubalo, Erik Blasch, M. Alford","doi":"10.1109/NAECON.2014.7045789","DOIUrl":"https://doi.org/10.1109/NAECON.2014.7045789","url":null,"abstract":"For the past two decades, the Discrete Wavelet Transformation (DWT) has been successfully applied to many fields. For image processing applications, the DWT can produce non-redundant representations of an input image with greater performance than other wavelet methods. Further, the DWT provides a better spatial and spectral localization of image representation, capable of revealing smaller changes, trends, and breakdown points that classical methods often miss. However, the DWT has its own limitations and disadvantages such as lack of shift invariance. That is, if the input signal or image is shifted, then the wavelet coefficients will exacerbate that shift. The DWT also lacks the ability to represent directional cases. The Double Density Dual-Tree Discrete Wavelet Transformation (D3TDWT) is a relatively new and enhanced version of the DWT with two scaling functions and four distinct wavelets designed in such a way that one pair of wavelets is offset with another pair so that the first pair lies in between the second. In this paper, we propose a D3TDWT polarimetry analysis method to analyze Long Wave Infrared (LWIR) polarimetry imagery to discriminate objects such as people and vehicles from background clutter. The D3TDWT method can be applied to a wide range of applications such as change detection, shape extraction, target recognition, and simultaneous tracking and identification.","PeriodicalId":318539,"journal":{"name":"NAECON 2014 - IEEE National Aerospace and Electronics Conference","volume":"61 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2014-06-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114956331","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2014-06-24DOI: 10.1109/NAECON.2014.7045787
Soundararajan Ezekiel, K. Harrity, Erik Blasch, A. Bubalo
Over the past decade the digital camera has become widely available in many devices such as cell phones, computers, etc. Therefore, the perceptual quality of digital images is an important and necessary requirement to evaluate digital images. To improve the quality of images captured with camera, we must identify and measure the artifacts that cause blur within the images. Blur is mainly caused by pixel intensity due to multiple sources. The most common types of blurs are known as object motion, defocus, and camera motion. In the last two decades, the discrete wavelet transformation (DWT) has become a cutting-edge technology in the signal and image processing field for such applications as denoising. The disadvantage of the DWT is that it is not able to directly observe blur coefficients. In this paper, we propose a novel framework for a blur metric for an image. Our approach is based on the double-density dual tree two dimensional wavelet transformations (D3TDWT) which simultaneously processes the properties of both the double-density DWT and dual tree DWT. We also utilize gradient to evaluate blurring artifacts and measure the image quality.
{"title":"No-reference blur metric using double-density and dual-tree two-dimensional wavelet transformation","authors":"Soundararajan Ezekiel, K. Harrity, Erik Blasch, A. Bubalo","doi":"10.1109/NAECON.2014.7045787","DOIUrl":"https://doi.org/10.1109/NAECON.2014.7045787","url":null,"abstract":"Over the past decade the digital camera has become widely available in many devices such as cell phones, computers, etc. Therefore, the perceptual quality of digital images is an important and necessary requirement to evaluate digital images. To improve the quality of images captured with camera, we must identify and measure the artifacts that cause blur within the images. Blur is mainly caused by pixel intensity due to multiple sources. The most common types of blurs are known as object motion, defocus, and camera motion. In the last two decades, the discrete wavelet transformation (DWT) has become a cutting-edge technology in the signal and image processing field for such applications as denoising. The disadvantage of the DWT is that it is not able to directly observe blur coefficients. In this paper, we propose a novel framework for a blur metric for an image. Our approach is based on the double-density dual tree two dimensional wavelet transformations (D3TDWT) which simultaneously processes the properties of both the double-density DWT and dual tree DWT. We also utilize gradient to evaluate blurring artifacts and measure the image quality.","PeriodicalId":318539,"journal":{"name":"NAECON 2014 - IEEE National Aerospace and Electronics Conference","volume":"275 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2014-06-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114651884","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2014-06-24DOI: 10.1109/NAECON.2014.7045819
Monish R. Chatterjee, Fathi H. A. Mohamed
Propagation of uniform and profiled electromagnetic beams through apertures with binary amplitude transmission and random phase distributions at the far field (Fraunhofer limit) is investigated, and simulation results based on two approaches, (a) using the Fresnel-Kirchhoff diffraction integral directly, and (b) using a split step propagation concept whereby the aperture or phase screen is placed at an arbitrary location along the propagation path, are applied separately and compared. Results for uniform, Gaussian and Bessel profile beams propagating through a variety of binary apertures are examined and compared with analytical predictions wherever feasible. A power spectrum density of the modified von Karman spectrum (MVKS) model is also used to describe a planar aperture as a random phase distribution. This approach is prompted by the problem of electromagnetic propagation through a turbulent medium. Simulation results are limited to the diffraction intensity calculation of the intensity in the far-field or Fraunhofer regime evaluated in the in the transverse (image) plane. Additional examples, including diffraction through thin sinusoidal amplitude grating and far-field diffraction following propagation through a random phase screen for profiled input beams are also presented. These results, derived serendipitously while examining turbulent propagation, provide insight into the mechanisms of diffraction through variable apertures, beam profiles and medium characteristics. It should therefore be of interest to the study in general of near-and far-field diffraction of electromagnetic waves taken as a whole.
{"title":"A numerical examination of the diffraction properties of profiled beam transmission through binary apertures and random phase screens using fresnel-kirchhoff diffraction theory","authors":"Monish R. Chatterjee, Fathi H. A. Mohamed","doi":"10.1109/NAECON.2014.7045819","DOIUrl":"https://doi.org/10.1109/NAECON.2014.7045819","url":null,"abstract":"Propagation of uniform and profiled electromagnetic beams through apertures with binary amplitude transmission and random phase distributions at the far field (Fraunhofer limit) is investigated, and simulation results based on two approaches, (a) using the Fresnel-Kirchhoff diffraction integral directly, and (b) using a split step propagation concept whereby the aperture or phase screen is placed at an arbitrary location along the propagation path, are applied separately and compared. Results for uniform, Gaussian and Bessel profile beams propagating through a variety of binary apertures are examined and compared with analytical predictions wherever feasible. A power spectrum density of the modified von Karman spectrum (MVKS) model is also used to describe a planar aperture as a random phase distribution. This approach is prompted by the problem of electromagnetic propagation through a turbulent medium. Simulation results are limited to the diffraction intensity calculation of the intensity in the far-field or Fraunhofer regime evaluated in the in the transverse (image) plane. Additional examples, including diffraction through thin sinusoidal amplitude grating and far-field diffraction following propagation through a random phase screen for profiled input beams are also presented. These results, derived serendipitously while examining turbulent propagation, provide insight into the mechanisms of diffraction through variable apertures, beam profiles and medium characteristics. It should therefore be of interest to the study in general of near-and far-field diffraction of electromagnetic waves taken as a whole.","PeriodicalId":318539,"journal":{"name":"NAECON 2014 - IEEE National Aerospace and Electronics Conference","volume":"36 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2014-06-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114682182","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2014-06-24DOI: 10.1109/NAECON.2014.7045786
K. Harrity, Soundararajan Ezekiel, M. Ferris, Maria Cornacchia, Erik Blasch
In recent years, digital cameras have been widely used for image capturing. These devices are equipped in cell phones, laptops, tablets, webcams, etc. Image quality is an important characteristic for any digital image analysis. Historically, techniques to assess image quality for these mobile products require a standard image to be used as a reference image. In this case, Root Mean Square Error and Peak Signal to Noise Ratio can be employed to measure the quality of the images. However, these methods are not valid if there is no reference image. Recent studies show that a Contourlet is a multi-scale transformation - which is an extension of two dimensional wavelet transformations - that can operate on an image at different noise levels without a reference image. In this paper, we develop a no-reference blur metric for digital images based on edges and noises in images. In our approach, a Contourlet transformation is applied to the blurred image, which applies a Laplacian Pyramid and Directional Filter Banks to get various image representations. The Laplacian Pyramid is a difference of Gaussian Pyramids between two consecutive levels. At each level in the Gaussian Pyramid, an image is smoothed with two Gaussians of different sizes then subtracted, subsampled and the input image is decomposed into directional sub-bands of images. Directional filter banks are designed to capture high frequency components representing directionality of the images which is similar to detailed coefficient in wavelet transformation. We focus on blur-measuring for each level and directions at the finest level of images to assess the image quality. Using the ratio of blur pixels to total pixels, we compare our results, which require no reference image, to standard full-reference image statistics. The results demonstrate that our proposed no reference metric has an increasing relationship with the blurriness of an image and is more sensitive to blur than the correlation full-reference metric.
{"title":"No-reference multi-scale blur metric","authors":"K. Harrity, Soundararajan Ezekiel, M. Ferris, Maria Cornacchia, Erik Blasch","doi":"10.1109/NAECON.2014.7045786","DOIUrl":"https://doi.org/10.1109/NAECON.2014.7045786","url":null,"abstract":"In recent years, digital cameras have been widely used for image capturing. These devices are equipped in cell phones, laptops, tablets, webcams, etc. Image quality is an important characteristic for any digital image analysis. Historically, techniques to assess image quality for these mobile products require a standard image to be used as a reference image. In this case, Root Mean Square Error and Peak Signal to Noise Ratio can be employed to measure the quality of the images. However, these methods are not valid if there is no reference image. Recent studies show that a Contourlet is a multi-scale transformation - which is an extension of two dimensional wavelet transformations - that can operate on an image at different noise levels without a reference image. In this paper, we develop a no-reference blur metric for digital images based on edges and noises in images. In our approach, a Contourlet transformation is applied to the blurred image, which applies a Laplacian Pyramid and Directional Filter Banks to get various image representations. The Laplacian Pyramid is a difference of Gaussian Pyramids between two consecutive levels. At each level in the Gaussian Pyramid, an image is smoothed with two Gaussians of different sizes then subtracted, subsampled and the input image is decomposed into directional sub-bands of images. Directional filter banks are designed to capture high frequency components representing directionality of the images which is similar to detailed coefficient in wavelet transformation. We focus on blur-measuring for each level and directions at the finest level of images to assess the image quality. Using the ratio of blur pixels to total pixels, we compare our results, which require no reference image, to standard full-reference image statistics. The results demonstrate that our proposed no reference metric has an increasing relationship with the blurriness of an image and is more sensitive to blur than the correlation full-reference metric.","PeriodicalId":318539,"journal":{"name":"NAECON 2014 - IEEE National Aerospace and Electronics Conference","volume":"60 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2014-06-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132783949","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2014-06-24DOI: 10.1109/NAECON.2014.7045844
Moussa Souare, C. Bates, C. Papachristou, R. Ewing
A composite film of Ag-Si was sputtered on the substrate of Si (111) to study the electrical properties using the Hall Effect. The composite is designed to be used to make a detector in the wavelength range of 8-14 microns. A volume fraction of 20% and 80% Ag and Si were used respectively. The sample of thickness of 2.0 microns was subjected to chemical cleaning until complete removal of the segregated layer, a thin conductive layer caused by the rising of Ag atoms to the surface. The following step after etching was the evaporation of 200Å chromium (Cr) and 2000Å gold (Au) in the chamber of the vacuum. To create lower resistance between the evaporated metals and composite, the sample was annealed at 7000°C in a RTA for 30 seconds. An I-V measurement was taken to ensure that the contacts were ohmic, i.e. linear. The final step before measuring the Hall Effect was to sand blast a cloverleaf pattern on the composite with the contact on the periphery of each leaf. Finally, Hall measurement showed average carrier concentration of 2.94E20 (cm3) and the average mobility of 86.4 (cm2/ volt-sec).
{"title":"Novel composite film of Ag-Si to develop an infrared (8–14 um) detector","authors":"Moussa Souare, C. Bates, C. Papachristou, R. Ewing","doi":"10.1109/NAECON.2014.7045844","DOIUrl":"https://doi.org/10.1109/NAECON.2014.7045844","url":null,"abstract":"A composite film of Ag-Si was sputtered on the substrate of Si (111) to study the electrical properties using the Hall Effect. The composite is designed to be used to make a detector in the wavelength range of 8-14 microns. A volume fraction of 20% and 80% Ag and Si were used respectively. The sample of thickness of 2.0 microns was subjected to chemical cleaning until complete removal of the segregated layer, a thin conductive layer caused by the rising of Ag atoms to the surface. The following step after etching was the evaporation of 200Å chromium (Cr) and 2000Å gold (Au) in the chamber of the vacuum. To create lower resistance between the evaporated metals and composite, the sample was annealed at 7000°C in a RTA for 30 seconds. An I-V measurement was taken to ensure that the contacts were ohmic, i.e. linear. The final step before measuring the Hall Effect was to sand blast a cloverleaf pattern on the composite with the contact on the periphery of each leaf. Finally, Hall measurement showed average carrier concentration of 2.94E20 (cm3) and the average mobility of 86.4 (cm2/ volt-sec).","PeriodicalId":318539,"journal":{"name":"NAECON 2014 - IEEE National Aerospace and Electronics Conference","volume":"17 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2014-06-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123874460","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2014-06-24DOI: 10.1109/NAECON.2014.7045775
K. Allen, Navid Farahi, Yangcheng Li, N. Limberopoulos, D. Walker, A. Urbas, V. Astratov
We fabricated thin-films made from polydimethylsiloxane (PDMS) with embedded high-index (n~1.9-2.2) microspheres for super-resolution imaging applications. To control the position of microspheres, such films can be translated along the surface of the nanoplasmonic structure to be imaged. Microsphere-assisted imaging, through these matrices, provided lateral resolution of ~λ/7 in nanoplasmonic dimer arrays with an illuminating wavelength λ=405 nm. Such thin films can be used as contact optical components to boost the resolution capability of conventional microscopes.
{"title":"Super-resolution imaging by arrays of high-index spheres embedded in transparent matrices","authors":"K. Allen, Navid Farahi, Yangcheng Li, N. Limberopoulos, D. Walker, A. Urbas, V. Astratov","doi":"10.1109/NAECON.2014.7045775","DOIUrl":"https://doi.org/10.1109/NAECON.2014.7045775","url":null,"abstract":"We fabricated thin-films made from polydimethylsiloxane (PDMS) with embedded high-index (n~1.9-2.2) microspheres for super-resolution imaging applications. To control the position of microspheres, such films can be translated along the surface of the nanoplasmonic structure to be imaged. Microsphere-assisted imaging, through these matrices, provided lateral resolution of ~λ/7 in nanoplasmonic dimer arrays with an illuminating wavelength λ=405 nm. Such thin films can be used as contact optical components to boost the resolution capability of conventional microscopes.","PeriodicalId":318539,"journal":{"name":"NAECON 2014 - IEEE National Aerospace and Electronics Conference","volume":"36 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2014-06-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124946447","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2014-06-24DOI: 10.1109/NAECON.2014.7045778
Leland Smith, G. Leung, Jonathan Lau, B. Kolasa, R. Burkholder, Michael Jack, B. Dunn, C. O. Chui
Capacitors are ubiquitous in signal processing circuits. Dielectric capacitors based on metal-oxide-semiconductor (MOS) and metal-insulator-metal (MIM) designs are currently the industry standard for on-chip charge storage. By comparison, electric double-layer capacitors (EDLC), or supercapacitors, offer capacitances that are orders of magnitude higher than dielectric capacitors. In this paper we present some early work in fabricating solid-state, on-chip EDLC.
{"title":"Scaled carbon-ionogel supercapacitors for electronic circuits","authors":"Leland Smith, G. Leung, Jonathan Lau, B. Kolasa, R. Burkholder, Michael Jack, B. Dunn, C. O. Chui","doi":"10.1109/NAECON.2014.7045778","DOIUrl":"https://doi.org/10.1109/NAECON.2014.7045778","url":null,"abstract":"Capacitors are ubiquitous in signal processing circuits. Dielectric capacitors based on metal-oxide-semiconductor (MOS) and metal-insulator-metal (MIM) designs are currently the industry standard for on-chip charge storage. By comparison, electric double-layer capacitors (EDLC), or supercapacitors, offer capacitances that are orders of magnitude higher than dielectric capacitors. In this paper we present some early work in fabricating solid-state, on-chip EDLC.","PeriodicalId":318539,"journal":{"name":"NAECON 2014 - IEEE National Aerospace and Electronics Conference","volume":"25 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2014-06-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130328825","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2014-06-24DOI: 10.1109/NAECON.2014.7045837
Yen-Ting Wang, Qianqian Wang, Degang Chen, R. Geiger
The circuit structures with positive feedback loops are likely to have multiple operating points, and the unwanted Trojan state is easy to be triggered by process, voltage, and temperature variation or user's action. In this paper, circuit-level Homotopy methods are used to find all operating points and detect Trojan states. Furthermore, the temperature characteristic of the positive feedback loop circuits can also identify the Trojan state. Examples are given to show both Homotopy and temperature methods are valid.
{"title":"Hardware trojan state detection for analog circuits and systems","authors":"Yen-Ting Wang, Qianqian Wang, Degang Chen, R. Geiger","doi":"10.1109/NAECON.2014.7045837","DOIUrl":"https://doi.org/10.1109/NAECON.2014.7045837","url":null,"abstract":"The circuit structures with positive feedback loops are likely to have multiple operating points, and the unwanted Trojan state is easy to be triggered by process, voltage, and temperature variation or user's action. In this paper, circuit-level Homotopy methods are used to find all operating points and detect Trojan states. Furthermore, the temperature characteristic of the positive feedback loop circuits can also identify the Trojan state. Examples are given to show both Homotopy and temperature methods are valid.","PeriodicalId":318539,"journal":{"name":"NAECON 2014 - IEEE National Aerospace and Electronics Conference","volume":"4 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2014-06-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130363129","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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