Pub Date : 2015-05-26DOI: 10.1109/APEMC.2015.7175372
W. Quenum, I. Junqua, J. Parmantier, O. Verstraete, D. Lemaire, F. Therond
This paper addresses the issue of transfer function measurements inside a structure in High Intensity Radiated Fields environment (HIRF). In this context, a simple reference test object was designed and used as a set up verification device to be tested before HIRF measurement campaigns on aircraft. In order to obtain a reference measured transfer function between the incident E-field and an internal induced current this object has been calibrated in laboratory using a strip-line which enables to fully control the incident EM field. We focus, here, on the need to perfectly control the whole measurement links and test setup to ensure a sufficient level of sensitivity and reproducibility.
{"title":"Reference box to control measurements of low frequency HIRF transfer functions","authors":"W. Quenum, I. Junqua, J. Parmantier, O. Verstraete, D. Lemaire, F. Therond","doi":"10.1109/APEMC.2015.7175372","DOIUrl":"https://doi.org/10.1109/APEMC.2015.7175372","url":null,"abstract":"This paper addresses the issue of transfer function measurements inside a structure in High Intensity Radiated Fields environment (HIRF). In this context, a simple reference test object was designed and used as a set up verification device to be tested before HIRF measurement campaigns on aircraft. In order to obtain a reference measured transfer function between the incident E-field and an internal induced current this object has been calibrated in laboratory using a strip-line which enables to fully control the incident EM field. We focus, here, on the need to perfectly control the whole measurement links and test setup to ensure a sufficient level of sensitivity and reproducibility.","PeriodicalId":325138,"journal":{"name":"2015 Asia-Pacific Symposium on Electromagnetic Compatibility (APEMC)","volume":"31 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2015-05-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122131597","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
An improved chassis countermeasure design that can reduce the noise radiation of Serial ATA Disk on Module (SATADOM) was presented in this article. When 3-Gbps signalling was used in SATADOM, the broadband noise will be induced and to cause radio frequency interference (RFI) problem in the WWAN band. The root-cause of the RFI issues will be analyzed based on the experimental study. The modified shielding chassis vent was presented to be one of the solutions. The simulation and measurement results are shown to verify the validity of theoretical work.
{"title":"Study on SATA-DOM RFI in compact server 3G communication platform","authors":"Wen-Po Ho, Chih-Hao Wang, Yung-Chiang Hsieh, Cheng-Hsiung Chiang","doi":"10.1109/APEMC.2015.7175263","DOIUrl":"https://doi.org/10.1109/APEMC.2015.7175263","url":null,"abstract":"An improved chassis countermeasure design that can reduce the noise radiation of Serial ATA Disk on Module (SATADOM) was presented in this article. When 3-Gbps signalling was used in SATADOM, the broadband noise will be induced and to cause radio frequency interference (RFI) problem in the WWAN band. The root-cause of the RFI issues will be analyzed based on the experimental study. The modified shielding chassis vent was presented to be one of the solutions. The simulation and measurement results are shown to verify the validity of theoretical work.","PeriodicalId":325138,"journal":{"name":"2015 Asia-Pacific Symposium on Electromagnetic Compatibility (APEMC)","volume":"145 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2015-05-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116629872","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2015-05-26DOI: 10.1109/APEMC.2015.7175367
Hui Min Lee, E. Liu, G. Samudra, E. Li
This paper presents power integrity modeling, measurement and analysis of a seven-chip stack for through-silicon via (TSV)-based 3D IC integration. A hybrid full-wave and circuit approach, combined with a cascaded scattering matrix technique, is proposed to model the multi-chip stack consisting of TSVs, on-chip power grids and on-chip decoupling capacitors. The hybrid approach leverages the accuracy of a full-wave approach and shorter computational time of a circuit approach. Modeling results show good correlation with measurement from 1.1 GHz to 20.1 GHz. Power integrity analysis is then performed on the seven-chip stack. To the best of our knowledge, this is the first power integrity modeling, measurement and analysis of seven-chip stack including on-chip decoupling capacitors.
{"title":"Power integrity modeling, measurement and analysis of seven-chip stack for TSV-based 3D IC integration","authors":"Hui Min Lee, E. Liu, G. Samudra, E. Li","doi":"10.1109/APEMC.2015.7175367","DOIUrl":"https://doi.org/10.1109/APEMC.2015.7175367","url":null,"abstract":"This paper presents power integrity modeling, measurement and analysis of a seven-chip stack for through-silicon via (TSV)-based 3D IC integration. A hybrid full-wave and circuit approach, combined with a cascaded scattering matrix technique, is proposed to model the multi-chip stack consisting of TSVs, on-chip power grids and on-chip decoupling capacitors. The hybrid approach leverages the accuracy of a full-wave approach and shorter computational time of a circuit approach. Modeling results show good correlation with measurement from 1.1 GHz to 20.1 GHz. Power integrity analysis is then performed on the seven-chip stack. To the best of our knowledge, this is the first power integrity modeling, measurement and analysis of seven-chip stack including on-chip decoupling capacitors.","PeriodicalId":325138,"journal":{"name":"2015 Asia-Pacific Symposium on Electromagnetic Compatibility (APEMC)","volume":"207 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2015-05-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115039349","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2015-05-26DOI: 10.1109/APEMC.2015.7175240
Yu Zhenyang, Wang Shi-shan, Song Zheng, Bor-Lin Lee
With the process of miniaturization, modularization and integration in power electronic systems, the requirements for EMI filters are much higher than before. However, the large volume and parasitic parameters of passive components have great influence in the high frequency performance of conventional EMI filters. With the development of electromagnetic integration technologies, integrated EMI filter with its advantage of highly integrated volume and small parasitic parameters has become a new research direction. At present, the research directions of integrated EMI filter include the integrated EMI filter based on flexible multi-layer foil, planar EMI filter, bus-bar EMI filter and so on. The structures and principles of the integrated EMI filter above are analyzed in this paper, and based on the analysis; the applicable occasions and future trends of these EMI filters are investigated.
{"title":"The reviews of integrated EMI filters applied in power electronic system","authors":"Yu Zhenyang, Wang Shi-shan, Song Zheng, Bor-Lin Lee","doi":"10.1109/APEMC.2015.7175240","DOIUrl":"https://doi.org/10.1109/APEMC.2015.7175240","url":null,"abstract":"With the process of miniaturization, modularization and integration in power electronic systems, the requirements for EMI filters are much higher than before. However, the large volume and parasitic parameters of passive components have great influence in the high frequency performance of conventional EMI filters. With the development of electromagnetic integration technologies, integrated EMI filter with its advantage of highly integrated volume and small parasitic parameters has become a new research direction. At present, the research directions of integrated EMI filter include the integrated EMI filter based on flexible multi-layer foil, planar EMI filter, bus-bar EMI filter and so on. The structures and principles of the integrated EMI filter above are analyzed in this paper, and based on the analysis; the applicable occasions and future trends of these EMI filters are investigated.","PeriodicalId":325138,"journal":{"name":"2015 Asia-Pacific Symposium on Electromagnetic Compatibility (APEMC)","volume":"110 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2015-05-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115542391","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2015-05-26DOI: 10.1109/APEMC.2015.7175316
P. Pelissou, B. Daout, K. J. Wolf
Satellite equipment needs to be immune to electrostatic discharges (ESD) likely to occur in flight. Testing the susceptibility against ESD on spacecraft equipment is therefore an important part of the EMC test program. The test method according ISO 14302 [1], which is commonly used in space industry, leaves a lot of freedom to the test conductor on how the test is performed, which in turn has an influence on the injected current and therefore on the test results. In this paper various standard ESD test methods, set-ups and instrumentation are assessed with respect to repeatability and influence factors and a new test method is proposed, overcoming the deficits of the standard methods while ensuring a very good reproducibility of the injected current waveform.
{"title":"Improved ESD test method for testing spacecraft equipment","authors":"P. Pelissou, B. Daout, K. J. Wolf","doi":"10.1109/APEMC.2015.7175316","DOIUrl":"https://doi.org/10.1109/APEMC.2015.7175316","url":null,"abstract":"Satellite equipment needs to be immune to electrostatic discharges (ESD) likely to occur in flight. Testing the susceptibility against ESD on spacecraft equipment is therefore an important part of the EMC test program. The test method according ISO 14302 [1], which is commonly used in space industry, leaves a lot of freedom to the test conductor on how the test is performed, which in turn has an influence on the injected current and therefore on the test results. In this paper various standard ESD test methods, set-ups and instrumentation are assessed with respect to repeatability and influence factors and a new test method is proposed, overcoming the deficits of the standard methods while ensuring a very good reproducibility of the injected current waveform.","PeriodicalId":325138,"journal":{"name":"2015 Asia-Pacific Symposium on Electromagnetic Compatibility (APEMC)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2015-05-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"130129682","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2015-05-26DOI: 10.1109/APEMC.2015.7175289
B. Menssen, D. Hamann, H. Garbe
The measurement procedures to determine the maximum emissions of electronic devices are described in different standards by CISPR. However, these standards only account for testing the equipment under test (EUT) while assuming that the engineer knows the direction corresponding to the highest level of emission. But, electronic devices act as unintentional radiators. This means that it is not possible to know the direction of maximum emission a priori without performing a complete 3-dimensional scan which is very time-consuming. In this paper, a stochastic approach for the maximum directivity of unintentional radiators is used to predict the maximum emissions from reduced sampling assumptions. This approach is applied to the simulation results of a generic EUT by the use of the software FEKO.
{"title":"Predicting the maximum radiated electric field strength from unintentional radiators","authors":"B. Menssen, D. Hamann, H. Garbe","doi":"10.1109/APEMC.2015.7175289","DOIUrl":"https://doi.org/10.1109/APEMC.2015.7175289","url":null,"abstract":"The measurement procedures to determine the maximum emissions of electronic devices are described in different standards by CISPR. However, these standards only account for testing the equipment under test (EUT) while assuming that the engineer knows the direction corresponding to the highest level of emission. But, electronic devices act as unintentional radiators. This means that it is not possible to know the direction of maximum emission a priori without performing a complete 3-dimensional scan which is very time-consuming. In this paper, a stochastic approach for the maximum directivity of unintentional radiators is used to predict the maximum emissions from reduced sampling assumptions. This approach is applied to the simulation results of a generic EUT by the use of the software FEKO.","PeriodicalId":325138,"journal":{"name":"2015 Asia-Pacific Symposium on Electromagnetic Compatibility (APEMC)","volume":"5 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2015-05-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128360805","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2015-05-26DOI: 10.1109/APEMC.2015.7175360
B. You, T. Xue, Yang Zhao, Jianhua Zhou, Tianshi Wang, Jie Li
We proposed a dual-band S-shaped fractal antenna with a compact orthogonal dipole for miniaturization and a reflection mirror for gain improvement. Considering the applications of vehicular navigation systems, the proposed antenna is designed to cover dual-band frequencies of L-Band (1.616 GHz ± 5 MHz) and S-Band (2.492 GHz ± 5 MHz). The -10 dB impedance bandwidths are 238 MHz and 340 MHz respectively for the lower band and the higher band, with an excellent isolation in the whole operating frequency range. The results of simulation and measurement agree with each other quite well.
{"title":"A dual-band S-shaped fractal orthogonal dipole antenna for vehicular navigation systems","authors":"B. You, T. Xue, Yang Zhao, Jianhua Zhou, Tianshi Wang, Jie Li","doi":"10.1109/APEMC.2015.7175360","DOIUrl":"https://doi.org/10.1109/APEMC.2015.7175360","url":null,"abstract":"We proposed a dual-band S-shaped fractal antenna with a compact orthogonal dipole for miniaturization and a reflection mirror for gain improvement. Considering the applications of vehicular navigation systems, the proposed antenna is designed to cover dual-band frequencies of L-Band (1.616 GHz ± 5 MHz) and S-Band (2.492 GHz ± 5 MHz). The -10 dB impedance bandwidths are 238 MHz and 340 MHz respectively for the lower band and the higher band, with an excellent isolation in the whole operating frequency range. The results of simulation and measurement agree with each other quite well.","PeriodicalId":325138,"journal":{"name":"2015 Asia-Pacific Symposium on Electromagnetic Compatibility (APEMC)","volume":"37 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2015-05-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121287256","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2015-05-26DOI: 10.1109/APEMC.2015.7175354
S. Kuehn, M. Wild, Mario Gomez, Eugene Grobbelaar, P. Sepan, Beyhan Kochali, Andreas Fuchs, J. Lienemann, N. Kuster
An automated near-field testbed for system- to chip-level EMC/EMI evaluations in the RF domain capable of precise EM phasor measurements is presented. The scanning system combines a large scanning volume with micrometre resolution. An optical surface reconstruction system allows measurement of the surface structure of the device under test (DUT) with better than 20μm uncertainty, allowing scans at a precisely known separation above arbitrary electronic components. Miniaturized active electro-optical time-domain ultra-wideband E- and H-field sensors for the frequency range from 0.01 to 6 GHz combined with a high speed vector signal analyser are applied to measure the EM phasor field distribution with a dynamic range of >120dB. The isolation of the probes eliminates perturbation of the EM field of the DUT compared to electrically connected probes and offers up to 60dB better sensitivity than passive electro-optical probes.
{"title":"EMC/EMI near-field testbed for EM phasor measurements using active optical sensors","authors":"S. Kuehn, M. Wild, Mario Gomez, Eugene Grobbelaar, P. Sepan, Beyhan Kochali, Andreas Fuchs, J. Lienemann, N. Kuster","doi":"10.1109/APEMC.2015.7175354","DOIUrl":"https://doi.org/10.1109/APEMC.2015.7175354","url":null,"abstract":"An automated near-field testbed for system- to chip-level EMC/EMI evaluations in the RF domain capable of precise EM phasor measurements is presented. The scanning system combines a large scanning volume with micrometre resolution. An optical surface reconstruction system allows measurement of the surface structure of the device under test (DUT) with better than 20μm uncertainty, allowing scans at a precisely known separation above arbitrary electronic components. Miniaturized active electro-optical time-domain ultra-wideband E- and H-field sensors for the frequency range from 0.01 to 6 GHz combined with a high speed vector signal analyser are applied to measure the EM phasor field distribution with a dynamic range of >120dB. The isolation of the probes eliminates perturbation of the EM field of the DUT compared to electrically connected probes and offers up to 60dB better sensitivity than passive electro-optical probes.","PeriodicalId":325138,"journal":{"name":"2015 Asia-Pacific Symposium on Electromagnetic Compatibility (APEMC)","volume":"99 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2015-05-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122974148","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2015-05-26DOI: 10.1109/APEMC.2015.7175225
Chu-Yeh Tien, Liann-Be Chang, P. Kuei, Chien-Fu Chih
A proposed gas discharge tube (GDT) including two electrodes and one hollow insulator ring with extra Zinc Oxide (ZnO) sputtered surface is studied. The insulating ring of a GDT has variable or non-linear resistance characteristics. In comparison to the conventional design, the proposed GDT can provide early triggering capability during fast IEMI introduced and results a smaller residual surge current.
{"title":"Enhance the protection capability of intentional electro magnetic interference with Zinc Oxide sintered gas discharge tube","authors":"Chu-Yeh Tien, Liann-Be Chang, P. Kuei, Chien-Fu Chih","doi":"10.1109/APEMC.2015.7175225","DOIUrl":"https://doi.org/10.1109/APEMC.2015.7175225","url":null,"abstract":"A proposed gas discharge tube (GDT) including two electrodes and one hollow insulator ring with extra Zinc Oxide (ZnO) sputtered surface is studied. The insulating ring of a GDT has variable or non-linear resistance characteristics. In comparison to the conventional design, the proposed GDT can provide early triggering capability during fast IEMI introduced and results a smaller residual surge current.","PeriodicalId":325138,"journal":{"name":"2015 Asia-Pacific Symposium on Electromagnetic Compatibility (APEMC)","volume":"71 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2015-05-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115783073","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2015-05-26DOI: 10.1109/APEMC.2015.7446233
Marcin Mleczko, D. Hamann, H. Garbe
Wireless communication systems are expected to operate reliably as the process of committing critical functions in traffic operations and public safety to wireless communication progresses rapidly. There have been several incidents in the past where wireless transmission systems were affected by electromagnetic interference (EMI). [1] reports cases where police radios and wireless car lock systems were disrupted by exposure to intentional or unintentional EMI. Therefore the implied reliability of these systems has to be rethought. Understanding the exact mechanisms of wireless data link distortion is crucial for identifying weak points and taking the appropriate counter measures to maintain reliable operation. Within this paper a typical wireless system setup is being analysed its susceptibility to EMI in mind.
{"title":"Analysis of IEMI induced distortion on wireless digital data transmission links","authors":"Marcin Mleczko, D. Hamann, H. Garbe","doi":"10.1109/APEMC.2015.7446233","DOIUrl":"https://doi.org/10.1109/APEMC.2015.7446233","url":null,"abstract":"Wireless communication systems are expected to operate reliably as the process of committing critical functions in traffic operations and public safety to wireless communication progresses rapidly. There have been several incidents in the past where wireless transmission systems were affected by electromagnetic interference (EMI). [1] reports cases where police radios and wireless car lock systems were disrupted by exposure to intentional or unintentional EMI. Therefore the implied reliability of these systems has to be rethought. Understanding the exact mechanisms of wireless data link distortion is crucial for identifying weak points and taking the appropriate counter measures to maintain reliable operation. Within this paper a typical wireless system setup is being analysed its susceptibility to EMI in mind.","PeriodicalId":325138,"journal":{"name":"2015 Asia-Pacific Symposium on Electromagnetic Compatibility (APEMC)","volume":"70 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2015-05-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126221148","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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