Pub Date : 2015-05-26DOI: 10.1109/APEMC.2015.7175407
Kangrong Li, K. See
To demonstrate the impact of the line impedance stabilization network (LISN) on conducted electromagnetic interference (EMI) measurement, an in-circuit impedance extraction method based on inductive coupling approach is developed to extract the common mode (CM) and the differential mode (DM) noise impedances of AC mains, LISN, and switched-mode power supply (SMPS) under operating condition. By treating two inductive coupling probes and the device-under-test (DUT) for impedance extraction as three cascaded two-port ABCD networks, the CM and DM noise impedances can be extracted with ease. The extracted CM/DM noise impedance of AC mains is compared with the extracted SMPS and LISN CM/DM noise impedances, respectively. By analyzing the impedance comparisons, the impact of LISN on conducted EMI measurement for EMI filter design under real operating condition is evaluated. Finally, the evaluation is validated with the conducted EMI currents measured with and without LISN.
{"title":"Evaluation of conducted EMI measurement without LISN using two-port ABCD network approach for EMI filter design under real operating condition","authors":"Kangrong Li, K. See","doi":"10.1109/APEMC.2015.7175407","DOIUrl":"https://doi.org/10.1109/APEMC.2015.7175407","url":null,"abstract":"To demonstrate the impact of the line impedance stabilization network (LISN) on conducted electromagnetic interference (EMI) measurement, an in-circuit impedance extraction method based on inductive coupling approach is developed to extract the common mode (CM) and the differential mode (DM) noise impedances of AC mains, LISN, and switched-mode power supply (SMPS) under operating condition. By treating two inductive coupling probes and the device-under-test (DUT) for impedance extraction as three cascaded two-port ABCD networks, the CM and DM noise impedances can be extracted with ease. The extracted CM/DM noise impedance of AC mains is compared with the extracted SMPS and LISN CM/DM noise impedances, respectively. By analyzing the impedance comparisons, the impact of LISN on conducted EMI measurement for EMI filter design under real operating condition is evaluated. Finally, the evaluation is validated with the conducted EMI currents measured with and without LISN.","PeriodicalId":325138,"journal":{"name":"2015 Asia-Pacific Symposium on Electromagnetic Compatibility (APEMC)","volume":"602 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2015-05-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131098242","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2015-05-26DOI: 10.1109/APEMC.2015.7175313
Bichen Chen, X. Ye, Bill Samaras, J. Fan
A novel de-embedding method on transmission line device under testing (DUT) is introduced in this paper. The technique can be used as an alternative to classic calibration approaches, such as SOLT, TRL, LRM, or LRRM whenever the de-embedded structure is a transmission line. The method only requires two measurement patterns: a true through as test fixture and a total pattern with targeting DUT embedded in. With a quasi-symmetry requirement in test fixtures, it is also a good substitute for newly released two-pattern de-embedding methodologies which have rigid symmetric demanding in text fixtures design and manufactures.
{"title":"A novel de-embedding method suitable for transmission-line measurement","authors":"Bichen Chen, X. Ye, Bill Samaras, J. Fan","doi":"10.1109/APEMC.2015.7175313","DOIUrl":"https://doi.org/10.1109/APEMC.2015.7175313","url":null,"abstract":"A novel de-embedding method on transmission line device under testing (DUT) is introduced in this paper. The technique can be used as an alternative to classic calibration approaches, such as SOLT, TRL, LRM, or LRRM whenever the de-embedded structure is a transmission line. The method only requires two measurement patterns: a true through as test fixture and a total pattern with targeting DUT embedded in. With a quasi-symmetry requirement in test fixtures, it is also a good substitute for newly released two-pattern de-embedding methodologies which have rigid symmetric demanding in text fixtures design and manufactures.","PeriodicalId":325138,"journal":{"name":"2015 Asia-Pacific Symposium on Electromagnetic Compatibility (APEMC)","volume":"191 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2015-05-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123761617","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2015-05-26DOI: 10.1109/APEMC.2015.7175281
Alexandre Boyer, B. Vrignon, M. Cavarroc, J. Shepherd
Near-field injection is a promising method in order to induce local faults in integrated circuits. This paper aims at proposing a model of the coupling between the injection probe and the circuit under test. This study relies on measurements performed on a test chip by on-chip voltage sensors.
{"title":"Near-field injection at die level","authors":"Alexandre Boyer, B. Vrignon, M. Cavarroc, J. Shepherd","doi":"10.1109/APEMC.2015.7175281","DOIUrl":"https://doi.org/10.1109/APEMC.2015.7175281","url":null,"abstract":"Near-field injection is a promising method in order to induce local faults in integrated circuits. This paper aims at proposing a model of the coupling between the injection probe and the circuit under test. This study relies on measurements performed on a test chip by on-chip voltage sensors.","PeriodicalId":325138,"journal":{"name":"2015 Asia-Pacific Symposium on Electromagnetic Compatibility (APEMC)","volume":"104 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2015-05-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122578125","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2015-05-26DOI: 10.1109/APEMC.2015.7175349
S. Sekioka
This paper discusses flashover on a medium voltage line caused by nearby lightning. Simulations are carried out using analytical formulas for the lightning-induced voltage and the ground potential rise as a fundamental study. A flashover is determined using an integration method, which is a flashover model and can consider an influence of voltage waveform on the flashover. From the simulation results, the lightning overvoltages and the flashover on a medium voltage line are affected by the ground potential rise as the soil resistivity becomes higher.
{"title":"Flashover analysis in distribution system affected by lightning-induced voltage and ground potential rise","authors":"S. Sekioka","doi":"10.1109/APEMC.2015.7175349","DOIUrl":"https://doi.org/10.1109/APEMC.2015.7175349","url":null,"abstract":"This paper discusses flashover on a medium voltage line caused by nearby lightning. Simulations are carried out using analytical formulas for the lightning-induced voltage and the ground potential rise as a fundamental study. A flashover is determined using an integration method, which is a flashover model and can consider an influence of voltage waveform on the flashover. From the simulation results, the lightning overvoltages and the flashover on a medium voltage line are affected by the ground potential rise as the soil resistivity becomes higher.","PeriodicalId":325138,"journal":{"name":"2015 Asia-Pacific Symposium on Electromagnetic Compatibility (APEMC)","volume":"3 5 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2015-05-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125994865","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2015-05-26DOI: 10.1109/APEMC.2015.7175290
Chi-Fang Huang, Cheng-Feng Li, H. Chao
The purpose of this paper is to evaluate the Specific Absorption Rate (SAR) distribution for tumour treatment when the electromagnetic field is emitted from a microwave ablation antenna operating in the 2.45 GHz. Firstly, the SAR distribution is simulated by CST Studio Suite, and the SAR measurement is carried out when the microwave antenna needle is inserted into a swine's liver. The microwave radiation power is transferred into thermal energy. Finally, the results in comparing simulated and measured tests of SAR distribution are demonstrated.
本文的目的是评估在2.45 GHz微波消融天线发射的电磁场对肿瘤治疗的比吸收率(SAR)分布。首先，利用CST Studio Suite模拟SAR分布，并将微波天线针插入猪肝进行SAR测量。微波辐射能转化为热能。最后，比较了SAR分布的模拟和实测结果。
{"title":"The study of SAR distribution in microwave ablation for tumours","authors":"Chi-Fang Huang, Cheng-Feng Li, H. Chao","doi":"10.1109/APEMC.2015.7175290","DOIUrl":"https://doi.org/10.1109/APEMC.2015.7175290","url":null,"abstract":"The purpose of this paper is to evaluate the Specific Absorption Rate (SAR) distribution for tumour treatment when the electromagnetic field is emitted from a microwave ablation antenna operating in the 2.45 GHz. Firstly, the SAR distribution is simulated by CST Studio Suite, and the SAR measurement is carried out when the microwave antenna needle is inserted into a swine's liver. The microwave radiation power is transferred into thermal energy. Finally, the results in comparing simulated and measured tests of SAR distribution are demonstrated.","PeriodicalId":325138,"journal":{"name":"2015 Asia-Pacific Symposium on Electromagnetic Compatibility (APEMC)","volume":"39 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2015-05-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122224858","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2015-05-26DOI: 10.1109/APEMC.2015.7175285
Chang-Lin Wu, S. Wu, Yu-Yung Wu
Technology of electrical characteristics extraction about FPC is proposed in this study. It makes use of the basic concepts of transmission line to derive the method of dielectric extraction.For analysis of single and composite about FPC material, that makes use of the different resonance point to extract the parameter of material for multiple samples. In order to prove the feasibility of extracted method, it would import the extracted parameter of material into simulation software to compare the difference between simulation and measurement, the range is 0.5GHz to 10 GHz. It can be discovered that the extracted method is accurate for comparing results. Finally, because of the complexity of composite material, this study will explain how to make use of simulation setting to improve the result of multi-tier architecture. These can help designers to design and analyze circuits.
{"title":"The electrical characteristics extracting technology for single and composite flexible print circuit materials","authors":"Chang-Lin Wu, S. Wu, Yu-Yung Wu","doi":"10.1109/APEMC.2015.7175285","DOIUrl":"https://doi.org/10.1109/APEMC.2015.7175285","url":null,"abstract":"Technology of electrical characteristics extraction about FPC is proposed in this study. It makes use of the basic concepts of transmission line to derive the method of dielectric extraction.For analysis of single and composite about FPC material, that makes use of the different resonance point to extract the parameter of material for multiple samples. In order to prove the feasibility of extracted method, it would import the extracted parameter of material into simulation software to compare the difference between simulation and measurement, the range is 0.5GHz to 10 GHz. It can be discovered that the extracted method is accurate for comparing results. Finally, because of the complexity of composite material, this study will explain how to make use of simulation setting to improve the result of multi-tier architecture. These can help designers to design and analyze circuits.","PeriodicalId":325138,"journal":{"name":"2015 Asia-Pacific Symposium on Electromagnetic Compatibility (APEMC)","volume":"35 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2015-05-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116816729","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2015-05-26DOI: 10.1109/APEMC.2015.7175292
F. Lafon, A. Ramanujan, P. Fernandez-Lopez
In order to perform EMC design activities, engineers need to have some tools for preliminary risk analysis to determine filters needs and/or architecture orientation choices. Huge variations in term of requirements between different carmakers can be observed (40 dB difference for example for a simple conducted emission test can be observed between OEMs). The product nature that we develop can be also very different (from small cameras to DC/DC converter for Electric Vehicle applications). As a consequence we decided to develop simulation capabilities based on Pspice, instead of using generic rules or simple return on experiences to design our products. This paper provides a synthesis of these capabilities, for emission, immunity and ESD testing, focusing on the latest modeling techniques developed for these different aspects.
{"title":"Pspice libraries development for EMC analysis","authors":"F. Lafon, A. Ramanujan, P. Fernandez-Lopez","doi":"10.1109/APEMC.2015.7175292","DOIUrl":"https://doi.org/10.1109/APEMC.2015.7175292","url":null,"abstract":"In order to perform EMC design activities, engineers need to have some tools for preliminary risk analysis to determine filters needs and/or architecture orientation choices. Huge variations in term of requirements between different carmakers can be observed (40 dB difference for example for a simple conducted emission test can be observed between OEMs). The product nature that we develop can be also very different (from small cameras to DC/DC converter for Electric Vehicle applications). As a consequence we decided to develop simulation capabilities based on Pspice, instead of using generic rules or simple return on experiences to design our products. This paper provides a synthesis of these capabilities, for emission, immunity and ESD testing, focusing on the latest modeling techniques developed for these different aspects.","PeriodicalId":325138,"journal":{"name":"2015 Asia-Pacific Symposium on Electromagnetic Compatibility (APEMC)","volume":"22 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2015-05-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131224708","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2015-05-26DOI: 10.1109/APEMC.2015.7175361
J. Hsu, T. Su, G. Ouyang, Patt Chang, Kai Xiao, Falconee Lee, Y. L. Li
Channel noise scan (CNS) approach is proposed in this paper to efficiently analyse the potential VR-signal coupling issue in the post-layout printed circuit board (PCB) check and the post-silicon debugging of the platform development. CNS is based on a new simulation methodology that includes the whole PCB with signals, voltage regulator (VR) networks, and the interaction. A frequency domain indicator is proposed to systematically analyse the VR-signal coupling problems. This methodology can also provide the ability for the designer to do performance/cost trade-off, layout optimization.
{"title":"Channel noise scan for post-layout check of printed circuit board","authors":"J. Hsu, T. Su, G. Ouyang, Patt Chang, Kai Xiao, Falconee Lee, Y. L. Li","doi":"10.1109/APEMC.2015.7175361","DOIUrl":"https://doi.org/10.1109/APEMC.2015.7175361","url":null,"abstract":"Channel noise scan (CNS) approach is proposed in this paper to efficiently analyse the potential VR-signal coupling issue in the post-layout printed circuit board (PCB) check and the post-silicon debugging of the platform development. CNS is based on a new simulation methodology that includes the whole PCB with signals, voltage regulator (VR) networks, and the interaction. A frequency domain indicator is proposed to systematically analyse the VR-signal coupling problems. This methodology can also provide the ability for the designer to do performance/cost trade-off, layout optimization.","PeriodicalId":325138,"journal":{"name":"2015 Asia-Pacific Symposium on Electromagnetic Compatibility (APEMC)","volume":"45 ","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2015-05-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131589546","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2015-05-26DOI: 10.1109/APEMC.2015.7175309
Ming-Shing Lin, Cyuan-Min He, C. G. Hsu
In this study, four H-field probes having different feeding structures, including a strip line, a microstrip line, a coplanar waveguide (CPW), and a conductor-backed CPW (CB-CPW), were investigated and compared. The sensitivity, calibration factor, E-field isolation, and spatial resolution of the magnetic probes were calculated and evaluated. It was found that all these probes can be used to measure the near-field radiation from and the RF current in an IC pin or a trace on a printed-circuit board (PCB).
{"title":"Study of magnetic probes used in EMI measurements","authors":"Ming-Shing Lin, Cyuan-Min He, C. G. Hsu","doi":"10.1109/APEMC.2015.7175309","DOIUrl":"https://doi.org/10.1109/APEMC.2015.7175309","url":null,"abstract":"In this study, four H-field probes having different feeding structures, including a strip line, a microstrip line, a coplanar waveguide (CPW), and a conductor-backed CPW (CB-CPW), were investigated and compared. The sensitivity, calibration factor, E-field isolation, and spatial resolution of the magnetic probes were calculated and evaluated. It was found that all these probes can be used to measure the near-field radiation from and the RF current in an IC pin or a trace on a printed-circuit board (PCB).","PeriodicalId":325138,"journal":{"name":"2015 Asia-Pacific Symposium on Electromagnetic Compatibility (APEMC)","volume":"54 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2015-05-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131882023","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2015-05-26DOI: 10.1109/APEMC.2015.7175304
S. van de Beek, R. Vogt-Ardatjew, F. Leferink
There is an increasing use of wireless applications in today's society. A big disadvantage of wireless communication is the high vulnerability to denial-of-service (DoS) attacks. Intentional electromagnetic interference can saturate, and thereby block and desensitize, the wireless receiver. This mechanism of causing a DoS is different from well-studied jamming attacks. It is important to determine and quantify saturation levels of a receiver. The saturation is quantified by the 1-dB compression point, P1-dB. An experimental method is presented that can determine P1-dB over a wide frequency band in a fast and accurate way. Results show the need for a high quality front door filter to be robust against out-of-band interference.
{"title":"Intentional electromagnetic interference through saturation of the RF front end","authors":"S. van de Beek, R. Vogt-Ardatjew, F. Leferink","doi":"10.1109/APEMC.2015.7175304","DOIUrl":"https://doi.org/10.1109/APEMC.2015.7175304","url":null,"abstract":"There is an increasing use of wireless applications in today's society. A big disadvantage of wireless communication is the high vulnerability to denial-of-service (DoS) attacks. Intentional electromagnetic interference can saturate, and thereby block and desensitize, the wireless receiver. This mechanism of causing a DoS is different from well-studied jamming attacks. It is important to determine and quantify saturation levels of a receiver. The saturation is quantified by the 1-dB compression point, P1-dB. An experimental method is presented that can determine P1-dB over a wide frequency band in a fast and accurate way. Results show the need for a high quality front door filter to be robust against out-of-band interference.","PeriodicalId":325138,"journal":{"name":"2015 Asia-Pacific Symposium on Electromagnetic Compatibility (APEMC)","volume":"47 10","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2015-05-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"113938954","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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