Pub Date : 2015-05-26DOI: 10.1109/APEMC.2015.7175397
V. Tomasevic, A. Boyer, S. Ben Dhia
In order to merge low power and high voltage devices on the same chip at competitive cost, Smart Power integrated circuits (ICs) are extensively used. Electrical noise induced by power stage switching or external disturbances generates parasitic substrate currents, leading to a local shift of the substrate potential which can severely disturb low voltage circuits. Nowadays this is the major cause of failure of Smart Power ICs, inducing costly circuit redesign. Modern CAD tools cannot accurately simulate this injection of minority carriers in the substrate and their propagation in the substrate. In order to create a link between circuit design, modelling and implementation in innovative CAD tools there is a need to validate these models by measuring the high voltage perturbations that activate parasitic structures in the substrate directly on the chip. This paper presents an on-chip noise sensor dedicated to measurements of transient voltage fluctuations induced by high voltage activity and coupled by the substrate.
{"title":"Development of an on-chip sensor for substrate coupling study in Smart Power mixed ICs","authors":"V. Tomasevic, A. Boyer, S. Ben Dhia","doi":"10.1109/APEMC.2015.7175397","DOIUrl":"https://doi.org/10.1109/APEMC.2015.7175397","url":null,"abstract":"In order to merge low power and high voltage devices on the same chip at competitive cost, Smart Power integrated circuits (ICs) are extensively used. Electrical noise induced by power stage switching or external disturbances generates parasitic substrate currents, leading to a local shift of the substrate potential which can severely disturb low voltage circuits. Nowadays this is the major cause of failure of Smart Power ICs, inducing costly circuit redesign. Modern CAD tools cannot accurately simulate this injection of minority carriers in the substrate and their propagation in the substrate. In order to create a link between circuit design, modelling and implementation in innovative CAD tools there is a need to validate these models by measuring the high voltage perturbations that activate parasitic structures in the substrate directly on the chip. This paper presents an on-chip noise sensor dedicated to measurements of transient voltage fluctuations induced by high voltage activity and coupled by the substrate.","PeriodicalId":325138,"journal":{"name":"2015 Asia-Pacific Symposium on Electromagnetic Compatibility (APEMC)","volume":"20 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2015-05-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126463605","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2015-05-26DOI: 10.1109/APEMC.2015.7175346
Gang-Wei Cao, Yen-Tang Chang, Kwong-Kau Tiong, Han-Nien Lin
An off-board direct RF power injection (DPI) method using a probe is proposed to investigate the IC immunity. The details of the measurement setup are outlined in this works. We also reviewed the conventional DPI method in addition to a discussion on the limitation of the test printed circuit board. The 3 dB bandwidth of this proposed probe is confirmed. A low dropout regulator (LDO) is used to compare the performance of the on-board injection network and the proposed scheme. The experimental result shows that the maximum deviation of the immunity level is less than 1 dB between the conventional and the proposed method.
{"title":"Investigation of off-board DPI method","authors":"Gang-Wei Cao, Yen-Tang Chang, Kwong-Kau Tiong, Han-Nien Lin","doi":"10.1109/APEMC.2015.7175346","DOIUrl":"https://doi.org/10.1109/APEMC.2015.7175346","url":null,"abstract":"An off-board direct RF power injection (DPI) method using a probe is proposed to investigate the IC immunity. The details of the measurement setup are outlined in this works. We also reviewed the conventional DPI method in addition to a discussion on the limitation of the test printed circuit board. The 3 dB bandwidth of this proposed probe is confirmed. A low dropout regulator (LDO) is used to compare the performance of the on-board injection network and the proposed scheme. The experimental result shows that the maximum deviation of the immunity level is less than 1 dB between the conventional and the proposed method.","PeriodicalId":325138,"journal":{"name":"2015 Asia-Pacific Symposium on Electromagnetic Compatibility (APEMC)","volume":"32 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2015-05-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126616991","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2015-05-26DOI: 10.1109/APEMC.2015.7175395
Minkang Moon, Hongseok Kim, Jinwook Song, Y. Kwack, Dong-Hyun Kim, Beomshik Kim, Eulyong Kim, Joungho Kim
In this paper, the equivalent circuit model of the return paths of common mode electromagnetic interference (EMI) noise currents from the motor drive system (MDS) in hybrid electric vehicle (HEV) is proposed. The proposed model includes three kinds of the return current paths: braided shield of three-phase cable, metallic vehicle body and the parasitic capacitance between the vehicle components. In order to extract the equivalent lumped circuit parameters, both the electrostatic simulation and impedance measurements were used. The simulation result of the entire MDS of HEV including the proposed return current path model shows that the main path of common mode EMI noise current at AM radio frequency range is the braided shield of the three-phase motor cable.
{"title":"Modeling and analysis of return paths of common mode EMI noise currents from motor drive system in hybrid electric vehicle","authors":"Minkang Moon, Hongseok Kim, Jinwook Song, Y. Kwack, Dong-Hyun Kim, Beomshik Kim, Eulyong Kim, Joungho Kim","doi":"10.1109/APEMC.2015.7175395","DOIUrl":"https://doi.org/10.1109/APEMC.2015.7175395","url":null,"abstract":"In this paper, the equivalent circuit model of the return paths of common mode electromagnetic interference (EMI) noise currents from the motor drive system (MDS) in hybrid electric vehicle (HEV) is proposed. The proposed model includes three kinds of the return current paths: braided shield of three-phase cable, metallic vehicle body and the parasitic capacitance between the vehicle components. In order to extract the equivalent lumped circuit parameters, both the electrostatic simulation and impedance measurements were used. The simulation result of the entire MDS of HEV including the proposed return current path model shows that the main path of common mode EMI noise current at AM radio frequency range is the braided shield of the three-phase motor cable.","PeriodicalId":325138,"journal":{"name":"2015 Asia-Pacific Symposium on Electromagnetic Compatibility (APEMC)","volume":"42 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2015-05-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121264665","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2015-05-26DOI: 10.1109/APEMC.2015.7175384
M. Ng,, Yi-Hsin Pang
This paper presents a miniaturized four-port crossover consisting two cascaded branch-line couplers implemented by dual transmission lines. A dual transmission line is composed of two parallel-connected transmission lines with high impedance and different electrical lengths. This design has the advantage of circuit layout flexibility and size reduction. The electrical size is 21% reduced comparing with the size of a crossover utilized with two cascaded branch-line couplers.
{"title":"A miniaturized planar crossover using dual transmission lines","authors":"M. Ng,, Yi-Hsin Pang","doi":"10.1109/APEMC.2015.7175384","DOIUrl":"https://doi.org/10.1109/APEMC.2015.7175384","url":null,"abstract":"This paper presents a miniaturized four-port crossover consisting two cascaded branch-line couplers implemented by dual transmission lines. A dual transmission line is composed of two parallel-connected transmission lines with high impedance and different electrical lengths. This design has the advantage of circuit layout flexibility and size reduction. The electrical size is 21% reduced comparing with the size of a crossover utilized with two cascaded branch-line couplers.","PeriodicalId":325138,"journal":{"name":"2015 Asia-Pacific Symposium on Electromagnetic Compatibility (APEMC)","volume":"4 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2015-05-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132529000","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2015-05-26DOI: 10.1109/APEMC.2015.7175307
A. Krayni, A. Hadjem, A. Sibille, C. Roblin, J. Wiart
With the rapid development of technology and the easy access to wireless services, children become more and more addicted to wireless technologies and increasingly exposed to electromagnetic waves. This tendency is reflected in the large researches carried in the study of child's exposure, wherein also the present paper is inscribed. This study dedicated to investigate the exposure of child to the electromagnetic radiations emitted by some wireless devices. Firstly, we give an overview of the numerical tools used in the assessment of the exposure. Secondly, we present some results obtained with a heterogeneous child model. Finally, we discuss the statistical approaches dedicated to analyze the exposure variability in realistic wireless networks.
{"title":"Assessment methodologies of child exposure in realistic wireless contexts","authors":"A. Krayni, A. Hadjem, A. Sibille, C. Roblin, J. Wiart","doi":"10.1109/APEMC.2015.7175307","DOIUrl":"https://doi.org/10.1109/APEMC.2015.7175307","url":null,"abstract":"With the rapid development of technology and the easy access to wireless services, children become more and more addicted to wireless technologies and increasingly exposed to electromagnetic waves. This tendency is reflected in the large researches carried in the study of child's exposure, wherein also the present paper is inscribed. This study dedicated to investigate the exposure of child to the electromagnetic radiations emitted by some wireless devices. Firstly, we give an overview of the numerical tools used in the assessment of the exposure. Secondly, we present some results obtained with a heterogeneous child model. Finally, we discuss the statistical approaches dedicated to analyze the exposure variability in realistic wireless networks.","PeriodicalId":325138,"journal":{"name":"2015 Asia-Pacific Symposium on Electromagnetic Compatibility (APEMC)","volume":"261 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2015-05-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133497384","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2015-05-26DOI: 10.1109/APEMC.2015.7175325
Jongwoo Jeong, Jingook Kim, N. Kang, K. Han
In this paper, an indirect contact probing method is presented to characterize vertical interconnects. By adopting a dielectric contactor, the indirect contact probing protects interconnects from the direct-contact of probe tips. Also, the dielectric contactor improves the measurement sensitivity. Moreover, providing the constant gap of the contactor omits additional control and sensor electronics. The procedure for the proposed method starts with one-port calibration enabling the dielectric contactor between the probe pads and the device-under-tests (DUT) characterized. Next, the indirect-contact measurement on the DUT is conducted. The DUT is finally extracted from de-embedding the dielectric contactor layer. We extend the proposed method from a single pair of vias to multiple vias, and multi-port network extraction to obtain coupling between vias is also carried out. In simulations the proposed method for a single pair of vias characterizes the vias from 0.8 GHz to 30 GHz, and for multi-via testing and multi-port extraction from 0.8 GHz to around 25 GHz. We have verified all via defects can be successfully identified from the indirect contact probing method.
{"title":"Multi-port characterization of vias using indirect contact probing method","authors":"Jongwoo Jeong, Jingook Kim, N. Kang, K. Han","doi":"10.1109/APEMC.2015.7175325","DOIUrl":"https://doi.org/10.1109/APEMC.2015.7175325","url":null,"abstract":"In this paper, an indirect contact probing method is presented to characterize vertical interconnects. By adopting a dielectric contactor, the indirect contact probing protects interconnects from the direct-contact of probe tips. Also, the dielectric contactor improves the measurement sensitivity. Moreover, providing the constant gap of the contactor omits additional control and sensor electronics. The procedure for the proposed method starts with one-port calibration enabling the dielectric contactor between the probe pads and the device-under-tests (DUT) characterized. Next, the indirect-contact measurement on the DUT is conducted. The DUT is finally extracted from de-embedding the dielectric contactor layer. We extend the proposed method from a single pair of vias to multiple vias, and multi-port network extraction to obtain coupling between vias is also carried out. In simulations the proposed method for a single pair of vias characterizes the vias from 0.8 GHz to 30 GHz, and for multi-via testing and multi-port extraction from 0.8 GHz to around 25 GHz. We have verified all via defects can be successfully identified from the indirect contact probing method.","PeriodicalId":325138,"journal":{"name":"2015 Asia-Pacific Symposium on Electromagnetic Compatibility (APEMC)","volume":"46 3 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2015-05-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134613114","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2015-05-26DOI: 10.1109/APEMC.2015.7175309
Ming-Shing Lin, Cyuan-Min He, C. G. Hsu
In this study, four H-field probes having different feeding structures, including a strip line, a microstrip line, a coplanar waveguide (CPW), and a conductor-backed CPW (CB-CPW), were investigated and compared. The sensitivity, calibration factor, E-field isolation, and spatial resolution of the magnetic probes were calculated and evaluated. It was found that all these probes can be used to measure the near-field radiation from and the RF current in an IC pin or a trace on a printed-circuit board (PCB).
{"title":"Study of magnetic probes used in EMI measurements","authors":"Ming-Shing Lin, Cyuan-Min He, C. G. Hsu","doi":"10.1109/APEMC.2015.7175309","DOIUrl":"https://doi.org/10.1109/APEMC.2015.7175309","url":null,"abstract":"In this study, four H-field probes having different feeding structures, including a strip line, a microstrip line, a coplanar waveguide (CPW), and a conductor-backed CPW (CB-CPW), were investigated and compared. The sensitivity, calibration factor, E-field isolation, and spatial resolution of the magnetic probes were calculated and evaluated. It was found that all these probes can be used to measure the near-field radiation from and the RF current in an IC pin or a trace on a printed-circuit board (PCB).","PeriodicalId":325138,"journal":{"name":"2015 Asia-Pacific Symposium on Electromagnetic Compatibility (APEMC)","volume":"54 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2015-05-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131882023","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2015-05-26DOI: 10.1109/APEMC.2015.7175290
Chi-Fang Huang, Cheng-Feng Li, H. Chao
The purpose of this paper is to evaluate the Specific Absorption Rate (SAR) distribution for tumour treatment when the electromagnetic field is emitted from a microwave ablation antenna operating in the 2.45 GHz. Firstly, the SAR distribution is simulated by CST Studio Suite, and the SAR measurement is carried out when the microwave antenna needle is inserted into a swine's liver. The microwave radiation power is transferred into thermal energy. Finally, the results in comparing simulated and measured tests of SAR distribution are demonstrated.
本文的目的是评估在2.45 GHz微波消融天线发射的电磁场对肿瘤治疗的比吸收率(SAR)分布。首先，利用CST Studio Suite模拟SAR分布，并将微波天线针插入猪肝进行SAR测量。微波辐射能转化为热能。最后，比较了SAR分布的模拟和实测结果。
{"title":"The study of SAR distribution in microwave ablation for tumours","authors":"Chi-Fang Huang, Cheng-Feng Li, H. Chao","doi":"10.1109/APEMC.2015.7175290","DOIUrl":"https://doi.org/10.1109/APEMC.2015.7175290","url":null,"abstract":"The purpose of this paper is to evaluate the Specific Absorption Rate (SAR) distribution for tumour treatment when the electromagnetic field is emitted from a microwave ablation antenna operating in the 2.45 GHz. Firstly, the SAR distribution is simulated by CST Studio Suite, and the SAR measurement is carried out when the microwave antenna needle is inserted into a swine's liver. The microwave radiation power is transferred into thermal energy. Finally, the results in comparing simulated and measured tests of SAR distribution are demonstrated.","PeriodicalId":325138,"journal":{"name":"2015 Asia-Pacific Symposium on Electromagnetic Compatibility (APEMC)","volume":"39 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2015-05-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122224858","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2015-05-26DOI: 10.1109/APEMC.2015.7175253
Shih-Chi Lai, Chi-Ming Chiang, Chia-Lun Tang
A novel SAR (specific absorption rate) reduced solution for tablet application is presented in this paper. The proposed antenna is constructed an IFA (inverted-F antenna) with a shorted loop structure and easy realized for tablet device applications. The antenna radiators are printed on a single layer FR4 substrate with small size of 51.2 × 8.2 × 0.4 mm3 and fed by a RF coaxial cable with I-PEX connector. The proposed antenna can support triplet-bands (850/1900/2100) of WWAN communication system that covers 824~894 MHz, 1850~1990 MHz and 1920~2170 MHz and operate with minimum 40% radiation efficiency across these bands. The active performance TRP are measured about 28.5 dBm and 27.5 dBm in GRPS 850/1900 channels respectively, and about 19.5 and 21.5 dBm in both WCDMA band II and band V. The SAR performance of tablet back and tip side that we measured are less than 1.3 mW/g in low and high band which can meet FCC SAR limitation within 1.6 mW/g. All simulation data are simulated by SEMCAD EM software tool [1] and SAR test results are measured by DASY5 SAR equipment.
{"title":"SAR reduced antenna solution for tablet application","authors":"Shih-Chi Lai, Chi-Ming Chiang, Chia-Lun Tang","doi":"10.1109/APEMC.2015.7175253","DOIUrl":"https://doi.org/10.1109/APEMC.2015.7175253","url":null,"abstract":"A novel SAR (specific absorption rate) reduced solution for tablet application is presented in this paper. The proposed antenna is constructed an IFA (inverted-F antenna) with a shorted loop structure and easy realized for tablet device applications. The antenna radiators are printed on a single layer FR4 substrate with small size of 51.2 × 8.2 × 0.4 mm3 and fed by a RF coaxial cable with I-PEX connector. The proposed antenna can support triplet-bands (850/1900/2100) of WWAN communication system that covers 824~894 MHz, 1850~1990 MHz and 1920~2170 MHz and operate with minimum 40% radiation efficiency across these bands. The active performance TRP are measured about 28.5 dBm and 27.5 dBm in GRPS 850/1900 channels respectively, and about 19.5 and 21.5 dBm in both WCDMA band II and band V. The SAR performance of tablet back and tip side that we measured are less than 1.3 mW/g in low and high band which can meet FCC SAR limitation within 1.6 mW/g. All simulation data are simulated by SEMCAD EM software tool [1] and SAR test results are measured by DASY5 SAR equipment.","PeriodicalId":325138,"journal":{"name":"2015 Asia-Pacific Symposium on Electromagnetic Compatibility (APEMC)","volume":"39 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2015-05-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"117171105","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2015-05-26DOI: 10.1109/APEMC.2015.7175285
Chang-Lin Wu, S. Wu, Yu-Yung Wu
Technology of electrical characteristics extraction about FPC is proposed in this study. It makes use of the basic concepts of transmission line to derive the method of dielectric extraction.For analysis of single and composite about FPC material, that makes use of the different resonance point to extract the parameter of material for multiple samples. In order to prove the feasibility of extracted method, it would import the extracted parameter of material into simulation software to compare the difference between simulation and measurement, the range is 0.5GHz to 10 GHz. It can be discovered that the extracted method is accurate for comparing results. Finally, because of the complexity of composite material, this study will explain how to make use of simulation setting to improve the result of multi-tier architecture. These can help designers to design and analyze circuits.
{"title":"The electrical characteristics extracting technology for single and composite flexible print circuit materials","authors":"Chang-Lin Wu, S. Wu, Yu-Yung Wu","doi":"10.1109/APEMC.2015.7175285","DOIUrl":"https://doi.org/10.1109/APEMC.2015.7175285","url":null,"abstract":"Technology of electrical characteristics extraction about FPC is proposed in this study. It makes use of the basic concepts of transmission line to derive the method of dielectric extraction.For analysis of single and composite about FPC material, that makes use of the different resonance point to extract the parameter of material for multiple samples. In order to prove the feasibility of extracted method, it would import the extracted parameter of material into simulation software to compare the difference between simulation and measurement, the range is 0.5GHz to 10 GHz. It can be discovered that the extracted method is accurate for comparing results. Finally, because of the complexity of composite material, this study will explain how to make use of simulation setting to improve the result of multi-tier architecture. These can help designers to design and analyze circuits.","PeriodicalId":325138,"journal":{"name":"2015 Asia-Pacific Symposium on Electromagnetic Compatibility (APEMC)","volume":"35 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2015-05-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116816729","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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