Pub Date : 2015-05-26DOI: 10.1109/APEMC.2015.7175312
Ken Tanaka, A. Nishikata
This paper proposes a non-destructive complex permittivity measurement method using circular TE01 mode. First, we discuss on the influence of gap by comparing conventional coaxial probe method and circular TE01 mode method that we propose. They are quantitatively compared based on the analysis with the help of EM-field simulator. It is shown that the proposed method is about 10 times insensitive to the air gap. Next, we show the actual TE01mode converter design. The structure consists of 16-dividing waveguide network and TE01mode excitation part. Two models are designed. First, X-band model is designed and manufactured. Whole structure analysis by the simulator result agreed well with measured S11 parameter. Next, K-band model is designed with improved reflection characteristics. Whole structure analysis showed that the relative bandwidth for reflection below -20dB achieved 37.8% within K-band frequencies.
{"title":"Gap influence and mode converter design for non-destructive complex permittivity measurement using circular TE01-mode open-end waveguide","authors":"Ken Tanaka, A. Nishikata","doi":"10.1109/APEMC.2015.7175312","DOIUrl":"https://doi.org/10.1109/APEMC.2015.7175312","url":null,"abstract":"This paper proposes a non-destructive complex permittivity measurement method using circular TE01 mode. First, we discuss on the influence of gap by comparing conventional coaxial probe method and circular TE01 mode method that we propose. They are quantitatively compared based on the analysis with the help of EM-field simulator. It is shown that the proposed method is about 10 times insensitive to the air gap. Next, we show the actual TE01mode converter design. The structure consists of 16-dividing waveguide network and TE01mode excitation part. Two models are designed. First, X-band model is designed and manufactured. Whole structure analysis by the simulator result agreed well with measured S11 parameter. Next, K-band model is designed with improved reflection characteristics. Whole structure analysis showed that the relative bandwidth for reflection below -20dB achieved 37.8% within K-band frequencies.","PeriodicalId":325138,"journal":{"name":"2015 Asia-Pacific Symposium on Electromagnetic Compatibility (APEMC)","volume":"221 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2015-05-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"123391174","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2015-05-26DOI: 10.1109/APEMC.2015.7175311
W. Lai, Jhin-Fang Huang
This paper describes PCB Layout for EMI (Electromagnetic Interference) design of grounding and connector relation, it will be reduced design cost and get a lower EMI emission and get passive ESD testing report, the theory is following EMI EN55022, EN55024 and EN60950 requirement to implement on testing result, it will be designed to high-frequency PCB for EMI concern. This provide also discuss an efficient and systematic technique for modeling pairs signal and finding EMI filter of differential signal. This analysis do correlation to demonstrate the validly of our signal model, than apply the simulation technique to find appropriate EMI filter for a physical circuit. This paper also provides troubleshooting between handheld system connector and grounding problems.
{"title":"A study of EMI and ESD troubleshooting between handheld connector and grounding","authors":"W. Lai, Jhin-Fang Huang","doi":"10.1109/APEMC.2015.7175311","DOIUrl":"https://doi.org/10.1109/APEMC.2015.7175311","url":null,"abstract":"This paper describes PCB Layout for EMI (Electromagnetic Interference) design of grounding and connector relation, it will be reduced design cost and get a lower EMI emission and get passive ESD testing report, the theory is following EMI EN55022, EN55024 and EN60950 requirement to implement on testing result, it will be designed to high-frequency PCB for EMI concern. This provide also discuss an efficient and systematic technique for modeling pairs signal and finding EMI filter of differential signal. This analysis do correlation to demonstrate the validly of our signal model, than apply the simulation technique to find appropriate EMI filter for a physical circuit. This paper also provides troubleshooting between handheld system connector and grounding problems.","PeriodicalId":325138,"journal":{"name":"2015 Asia-Pacific Symposium on Electromagnetic Compatibility (APEMC)","volume":"68 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2015-05-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115533270","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2015-05-26DOI: 10.1109/APEMC.2015.7175402
Yuwei He, Z. Fu, A. Jiang
Approximately 70% of cloud-to-ground lightning flashes are multi-stroke flash with an average stroke number of about four per flash. The main lightning current components found in natural lightning include first return stroke current, subsequent return stroke currents, intermediate currents and long-duration continuing current. For the purpose of engineering applications such as lightning arrester tests and material ablation tests, many types of single and multi-pulse surge current generators are developed. This paper reviews the waveform and amplitude requirements for such tests and corresponding techniques for developing those generators. The deficiencies of the existing surge current generators are analyzed and a new technique for full-scale lightning current effect simulation with a multi-waveform multi-pulse impulse current generator (MWMP ICG) is introduced. The potential application of such MWMP ICG is also discussed.
{"title":"On the simulation of lightning current for the application in lightning arrester and material ablation tests","authors":"Yuwei He, Z. Fu, A. Jiang","doi":"10.1109/APEMC.2015.7175402","DOIUrl":"https://doi.org/10.1109/APEMC.2015.7175402","url":null,"abstract":"Approximately 70% of cloud-to-ground lightning flashes are multi-stroke flash with an average stroke number of about four per flash. The main lightning current components found in natural lightning include first return stroke current, subsequent return stroke currents, intermediate currents and long-duration continuing current. For the purpose of engineering applications such as lightning arrester tests and material ablation tests, many types of single and multi-pulse surge current generators are developed. This paper reviews the waveform and amplitude requirements for such tests and corresponding techniques for developing those generators. The deficiencies of the existing surge current generators are analyzed and a new technique for full-scale lightning current effect simulation with a multi-waveform multi-pulse impulse current generator (MWMP ICG) is introduced. The potential application of such MWMP ICG is also discussed.","PeriodicalId":325138,"journal":{"name":"2015 Asia-Pacific Symposium on Electromagnetic Compatibility (APEMC)","volume":"9 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2015-05-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132626547","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2015-05-26DOI: 10.1109/APEMC.2015.7175299
JongTae Hwang, Wonjoo Jung, Soyoung Kim
As portable electronic devices are widely used in wireless communication, analysis of RF interference becomes an essential step for IC designers. In order to test electromagnetic compatibility (EMC) of IC operating at high frequencies, IC stripline method is proposed in IEC standard. This method can be applied up to 3 GHz and covers the testing of ICs and small component. This paper represents simulation results of the open version of IC stripline in 3D EM solver. Also, the coupling effect of IC stripline method is analyzed with S-parameter results. The distributed lumped-element equivalent model is presented for explaining coupling relation between IC stripline and package. This model can be used for quick analysis for EMC of ICs.
{"title":"Coupling analysis and equivalent circuit model of the IC stripline method","authors":"JongTae Hwang, Wonjoo Jung, Soyoung Kim","doi":"10.1109/APEMC.2015.7175299","DOIUrl":"https://doi.org/10.1109/APEMC.2015.7175299","url":null,"abstract":"As portable electronic devices are widely used in wireless communication, analysis of RF interference becomes an essential step for IC designers. In order to test electromagnetic compatibility (EMC) of IC operating at high frequencies, IC stripline method is proposed in IEC standard. This method can be applied up to 3 GHz and covers the testing of ICs and small component. This paper represents simulation results of the open version of IC stripline in 3D EM solver. Also, the coupling effect of IC stripline method is analyzed with S-parameter results. The distributed lumped-element equivalent model is presented for explaining coupling relation between IC stripline and package. This model can be used for quick analysis for EMC of ICs.","PeriodicalId":325138,"journal":{"name":"2015 Asia-Pacific Symposium on Electromagnetic Compatibility (APEMC)","volume":"18 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2015-05-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131472656","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2015-05-26DOI: 10.1109/APEMC.2015.7175259
Tse-Hsuan Wang, J. Chiang, D. Lin
The ground bounce noise (GBN) in high-integrative and high-complexity circuit designs is discussed in this paper. GBN doesn't only transmit its own power and ground plane but also couple to power and ground plane nearby. Therefore, power integrity (PI) will be affected by GBN. I use the segmentation method to cut off the cavity model of PCB. Here, I embed partial electromagnetic bandgap (EBG) structure and Z-shape power bus to isolate the noise power and ground planes. Then, partial EBG structure and Z-shape power bus are implanted to form stop-band characteristics. We can find noise isolation has the same effect as the period EBG structure. Through this modelling method, we can separate the stop-band and pass-band in Z-shape and EBG individually. In the model, the PCB is divided into five segments of different sizes and rectangular power and ground plane. Through the mushroom-shape (Mushroom-like) EBG, these structures are connected as part of a vertical blind hole, rectangular resonant cavity and the transmission line model to describe the Z-shape power bus. From practices and proposed methods, we can effectively improve result of isolating the power and ground noise simulation and implement.
{"title":"Combine partial EBG structure and Z-shape power bus for noise isolation in multi-layer PCBs","authors":"Tse-Hsuan Wang, J. Chiang, D. Lin","doi":"10.1109/APEMC.2015.7175259","DOIUrl":"https://doi.org/10.1109/APEMC.2015.7175259","url":null,"abstract":"The ground bounce noise (GBN) in high-integrative and high-complexity circuit designs is discussed in this paper. GBN doesn't only transmit its own power and ground plane but also couple to power and ground plane nearby. Therefore, power integrity (PI) will be affected by GBN. I use the segmentation method to cut off the cavity model of PCB. Here, I embed partial electromagnetic bandgap (EBG) structure and Z-shape power bus to isolate the noise power and ground planes. Then, partial EBG structure and Z-shape power bus are implanted to form stop-band characteristics. We can find noise isolation has the same effect as the period EBG structure. Through this modelling method, we can separate the stop-band and pass-band in Z-shape and EBG individually. In the model, the PCB is divided into five segments of different sizes and rectangular power and ground plane. Through the mushroom-shape (Mushroom-like) EBG, these structures are connected as part of a vertical blind hole, rectangular resonant cavity and the transmission line model to describe the Z-shape power bus. From practices and proposed methods, we can effectively improve result of isolating the power and ground noise simulation and implement.","PeriodicalId":325138,"journal":{"name":"2015 Asia-Pacific Symposium on Electromagnetic Compatibility (APEMC)","volume":"71 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2015-05-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128367854","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2015-05-26DOI: 10.1109/APEMC.2015.7175265
M. Tsai, Jun-De Jin, T. Yeh, C. Jou, Sally Liu, F. Hsueh
By co-design methodology, an integrated 2.4 GHz band-pass filter using grounded spiral inductors symmetrically at input/output ports for ESD protection is realized in integrated passive device (IPD) technology. With the novel input/output admittance-inverter (J-inverter) and the weakly coupled transformer, the transmission zeros can be introduced to increase the stop band attenuation. Also, the shunt inductor with enough vias in metal crossover is performed to enhance ESD current handling. It provides an effective bi-directional ESD protection to the ground. The experimental results demonstrate an over 8-kV HBM ESD protection can be achieved. The ESD-protected BPF presents an insertion loss of 1.6 dB at 2.4 GHz with only ~ 0.4 dB degradation compared to BPF without ESD protection.
{"title":"Band-pass filter co-designed with ESD protection using integrated passive device technology","authors":"M. Tsai, Jun-De Jin, T. Yeh, C. Jou, Sally Liu, F. Hsueh","doi":"10.1109/APEMC.2015.7175265","DOIUrl":"https://doi.org/10.1109/APEMC.2015.7175265","url":null,"abstract":"By co-design methodology, an integrated 2.4 GHz band-pass filter using grounded spiral inductors symmetrically at input/output ports for ESD protection is realized in integrated passive device (IPD) technology. With the novel input/output admittance-inverter (J-inverter) and the weakly coupled transformer, the transmission zeros can be introduced to increase the stop band attenuation. Also, the shunt inductor with enough vias in metal crossover is performed to enhance ESD current handling. It provides an effective bi-directional ESD protection to the ground. The experimental results demonstrate an over 8-kV HBM ESD protection can be achieved. The ESD-protected BPF presents an insertion loss of 1.6 dB at 2.4 GHz with only ~ 0.4 dB degradation compared to BPF without ESD protection.","PeriodicalId":325138,"journal":{"name":"2015 Asia-Pacific Symposium on Electromagnetic Compatibility (APEMC)","volume":"11 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2015-05-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126858845","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2015-05-26DOI: 10.1109/APEMC.2015.7175408
Tomoya Tanaka, Chie Okamura, Shinichi Okajima, Kazufumi Kato, S. Muroga, Y. Asazuma, M. Yamaguchi
A new noise suppressor made from metal-coated nonwoven fabrics is developed and studied by electromagnetic simulation and measurements. In the case of far fields, the shielding effectiveness to plane waves can be calculated using sheet resistance by regarding the non-woven fabric as a continuous metal sheet. Therefore, we show that the low wave impedance in the fine fiber layers generates a high shielding effectiveness. In the case of near fields, conductive noise suppression in a Microstrip line (MSL) with the non-woven fabric and with a continuous conductor is measured. Consequently, we clarify that there are some cases wherein the loss in the MSL while using the non-woven fabric is greater than that while using a continuous conductor in a specific frequency range. In this measurement, the loss from a noise suppression sheet (NSS) was 16% higher than that from a continuous film. From these results, we have successfully demonstrated the higher conductive noise suppression performance of the proposed thin, light, and flexible NSS.
{"title":"Radiated and conductive noise suppression of non-magnetic metal-coated non-woven fabric","authors":"Tomoya Tanaka, Chie Okamura, Shinichi Okajima, Kazufumi Kato, S. Muroga, Y. Asazuma, M. Yamaguchi","doi":"10.1109/APEMC.2015.7175408","DOIUrl":"https://doi.org/10.1109/APEMC.2015.7175408","url":null,"abstract":"A new noise suppressor made from metal-coated nonwoven fabrics is developed and studied by electromagnetic simulation and measurements. In the case of far fields, the shielding effectiveness to plane waves can be calculated using sheet resistance by regarding the non-woven fabric as a continuous metal sheet. Therefore, we show that the low wave impedance in the fine fiber layers generates a high shielding effectiveness. In the case of near fields, conductive noise suppression in a Microstrip line (MSL) with the non-woven fabric and with a continuous conductor is measured. Consequently, we clarify that there are some cases wherein the loss in the MSL while using the non-woven fabric is greater than that while using a continuous conductor in a specific frequency range. In this measurement, the loss from a noise suppression sheet (NSS) was 16% higher than that from a continuous film. From these results, we have successfully demonstrated the higher conductive noise suppression performance of the proposed thin, light, and flexible NSS.","PeriodicalId":325138,"journal":{"name":"2015 Asia-Pacific Symposium on Electromagnetic Compatibility (APEMC)","volume":"477 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2015-05-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127010006","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2015-05-26DOI: 10.1109/APEMC.2015.7175369
Jinliang He
The SPD has an effective protection distance under the condition of the specific load and the specific voltage protection level of SPD. If surge protection devices (SPDs) are installed without consideration of the distance between the SPD and the protected loads, the equipment to be protected might be damaged despite of the correct energy coordination of SPDs. The IEC estimation method for effective protection distance of SPD is too rough for the guide of SPD installation. This paper reviewed our works on the effective protection distance of SPD under different voltage protection levels and different loads. The equipment characteristics, which were simulated by loads with different impedance characteristics, have strong influence on the effective protection distance of SPD. When the maximum continuous operating voltage of the SPD is determined, the higher the voltage protection level of the SPD is, the longer its effective protection distance is. Secondly, different household appliances have very different impedance characteristics, this leads the effective protection distance of different appliance to be very different. Last, there exists a worst distance between a SPD and a protected device in a low-voltage circuit. If a protected device and a SPD are separated by this worst distance, the protected device will be subject to the most severe surge voltage.
{"title":"Discussions on factors influencing the effective protection distance of SPD to loads","authors":"Jinliang He","doi":"10.1109/APEMC.2015.7175369","DOIUrl":"https://doi.org/10.1109/APEMC.2015.7175369","url":null,"abstract":"The SPD has an effective protection distance under the condition of the specific load and the specific voltage protection level of SPD. If surge protection devices (SPDs) are installed without consideration of the distance between the SPD and the protected loads, the equipment to be protected might be damaged despite of the correct energy coordination of SPDs. The IEC estimation method for effective protection distance of SPD is too rough for the guide of SPD installation. This paper reviewed our works on the effective protection distance of SPD under different voltage protection levels and different loads. The equipment characteristics, which were simulated by loads with different impedance characteristics, have strong influence on the effective protection distance of SPD. When the maximum continuous operating voltage of the SPD is determined, the higher the voltage protection level of the SPD is, the longer its effective protection distance is. Secondly, different household appliances have very different impedance characteristics, this leads the effective protection distance of different appliance to be very different. Last, there exists a worst distance between a SPD and a protected device in a low-voltage circuit. If a protected device and a SPD are separated by this worst distance, the protected device will be subject to the most severe surge voltage.","PeriodicalId":325138,"journal":{"name":"2015 Asia-Pacific Symposium on Electromagnetic Compatibility (APEMC)","volume":"47 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2015-05-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114687450","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2015-05-26DOI: 10.1109/APEMC.2015.7175396
Shih-Hsien Wu, Yo-Shen Lin
In this paper, the capability of quarter-wavelength (λ/4) line based bandstop structure for wideband noise isolation in power delivery network (PDN) applications is investigated. Two test boards are implemented using the standard printed circuit board (PCB) fabrication process, and the measured results show extremely wide stopbands from 1 to 40 GHz with 60 to 70 dB isolation.
{"title":"Bandstop power delivery network with wideband noise isolation up to 40 GHz","authors":"Shih-Hsien Wu, Yo-Shen Lin","doi":"10.1109/APEMC.2015.7175396","DOIUrl":"https://doi.org/10.1109/APEMC.2015.7175396","url":null,"abstract":"In this paper, the capability of quarter-wavelength (λ/4) line based bandstop structure for wideband noise isolation in power delivery network (PDN) applications is investigated. Two test boards are implemented using the standard printed circuit board (PCB) fabrication process, and the measured results show extremely wide stopbands from 1 to 40 GHz with 60 to 70 dB isolation.","PeriodicalId":325138,"journal":{"name":"2015 Asia-Pacific Symposium on Electromagnetic Compatibility (APEMC)","volume":"102 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2015-05-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115893727","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2015-05-26DOI: 10.1109/APEMC.2015.7175371
Yinglei Ren, T. Su, J. Hsu, Bruce Liu, M. Wei, Wei Shen, Y. L. Li
With the increase of data rate, signal integrity (SI) becomes a bigger challenge for printed circuit board (PCB) designs. Power noise as well as signal loss, inter-symbol interference (ISI), crosstalk needs to be taken into account to ensure a good quality signal design. In this paper, a design case is shared where power noise greatly impacts SATA performance and leads to hard disk (HDD) disconnection. Noise source and noise coupling path are root-caused with simulation and measurement data. And learnings from this case is summarized for future attention.
{"title":"Case learnings of power noise impact on SATA","authors":"Yinglei Ren, T. Su, J. Hsu, Bruce Liu, M. Wei, Wei Shen, Y. L. Li","doi":"10.1109/APEMC.2015.7175371","DOIUrl":"https://doi.org/10.1109/APEMC.2015.7175371","url":null,"abstract":"With the increase of data rate, signal integrity (SI) becomes a bigger challenge for printed circuit board (PCB) designs. Power noise as well as signal loss, inter-symbol interference (ISI), crosstalk needs to be taken into account to ensure a good quality signal design. In this paper, a design case is shared where power noise greatly impacts SATA performance and leads to hard disk (HDD) disconnection. Noise source and noise coupling path are root-caused with simulation and measurement data. And learnings from this case is summarized for future attention.","PeriodicalId":325138,"journal":{"name":"2015 Asia-Pacific Symposium on Electromagnetic Compatibility (APEMC)","volume":"41 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2015-05-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"124079895","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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