Pub Date : 2015-05-26DOI: 10.1109/APEMC.2015.7175272
Sirui Luo, J. Salcedo, J. Hajjar, Y. Zhou, J. Liou
A new methodology for characterizing product-level failures due to the human metal model (HMM) stress is proposed and developed. This characterization framework is superior to the conventional leakage current-based approach, and it enables early wafer-level assessment of integrated circuits (ICs) HMM robustness. The new method is demonstrated in two amplifiers and is benchmarked versus the conventional leakage current method and the industry standard system-level IEC gun testing.
{"title":"A new methodology for human metal model characterization","authors":"Sirui Luo, J. Salcedo, J. Hajjar, Y. Zhou, J. Liou","doi":"10.1109/APEMC.2015.7175272","DOIUrl":"https://doi.org/10.1109/APEMC.2015.7175272","url":null,"abstract":"A new methodology for characterizing product-level failures due to the human metal model (HMM) stress is proposed and developed. This characterization framework is superior to the conventional leakage current-based approach, and it enables early wafer-level assessment of integrated circuits (ICs) HMM robustness. The new method is demonstrated in two amplifiers and is benchmarked versus the conventional leakage current method and the industry standard system-level IEC gun testing.","PeriodicalId":325138,"journal":{"name":"2015 Asia-Pacific Symposium on Electromagnetic Compatibility (APEMC)","volume":"65 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2015-05-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"115984530","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2015-05-26DOI: 10.1109/APEMC.2015.7175340
Huide Tang, Cheng-Nan Chiu
In this paper, a low-profile planar dual-band monopole antenna is proposed for modern digital devices having a high-speed Wireless Local-Area Network (WLAN) along with a mobile communication module. The proposed antenna is embedded with a chip inductor to produce the dual-band characteristic. As a special and attractive merit, its lower frequency band can be easily adjusted while its higher frequency band very far away is keeping steady. In addition, the profitable omni-directional radiation property is the direct nature of such a monopole antenna. A prototype of the antenna was constructed and studied. Measured and simulated results were obtained to demonstrate the promising performance required for practical uses.
{"title":"A new dual-band monopole antenna with a wide and adjustable emission-suppression band","authors":"Huide Tang, Cheng-Nan Chiu","doi":"10.1109/APEMC.2015.7175340","DOIUrl":"https://doi.org/10.1109/APEMC.2015.7175340","url":null,"abstract":"In this paper, a low-profile planar dual-band monopole antenna is proposed for modern digital devices having a high-speed Wireless Local-Area Network (WLAN) along with a mobile communication module. The proposed antenna is embedded with a chip inductor to produce the dual-band characteristic. As a special and attractive merit, its lower frequency band can be easily adjusted while its higher frequency band very far away is keeping steady. In addition, the profitable omni-directional radiation property is the direct nature of such a monopole antenna. A prototype of the antenna was constructed and studied. Measured and simulated results were obtained to demonstrate the promising performance required for practical uses.","PeriodicalId":325138,"journal":{"name":"2015 Asia-Pacific Symposium on Electromagnetic Compatibility (APEMC)","volume":"7 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2015-05-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125907552","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2015-05-26DOI: 10.1109/APEMC.2015.7175391
Chien-Chang Huang, Fang-Yi Lo, Wei-Che Lin
This paper presents RF characterization of flip-chip interconnection in complementary-metal-oxide-semiconductor (CMOS) and glass-integrated-passive-device (GIPD) substrates by means of on-wafer scattering parameter (S-parameter) measurements, with high-speed digital transmission performance evaluations. The off-chip calibration is done firstly to shift the measured reference plane to the probe tips using the commercial impedance standard substrate (ISS) with line-reflect-match (LRM) method. Then the L-2L deembedding technique is applied for the two GIPD transmission lines to extract the RF characteristics of GIPD probe pads and transmission lines. Finally the designed thru-reflect-line (TRL) calibration standards in the CMOS chip are measured for resolving the flip-chip interconnection characteristics with the previous acquired GIPD parameters. The extracted data in two-port S-parameter are thereby simulated in time-domain to observe the high-speed digital transmission performance in eye-diagram representation. The shown result indicates the transmission speed in 40 Gbps works well in this flip-chip interconnection case.
{"title":"Characterization of flip-chip interconnection for high speed digital transmission","authors":"Chien-Chang Huang, Fang-Yi Lo, Wei-Che Lin","doi":"10.1109/APEMC.2015.7175391","DOIUrl":"https://doi.org/10.1109/APEMC.2015.7175391","url":null,"abstract":"This paper presents RF characterization of flip-chip interconnection in complementary-metal-oxide-semiconductor (CMOS) and glass-integrated-passive-device (GIPD) substrates by means of on-wafer scattering parameter (S-parameter) measurements, with high-speed digital transmission performance evaluations. The off-chip calibration is done firstly to shift the measured reference plane to the probe tips using the commercial impedance standard substrate (ISS) with line-reflect-match (LRM) method. Then the L-2L deembedding technique is applied for the two GIPD transmission lines to extract the RF characteristics of GIPD probe pads and transmission lines. Finally the designed thru-reflect-line (TRL) calibration standards in the CMOS chip are measured for resolving the flip-chip interconnection characteristics with the previous acquired GIPD parameters. The extracted data in two-port S-parameter are thereby simulated in time-domain to observe the high-speed digital transmission performance in eye-diagram representation. The shown result indicates the transmission speed in 40 Gbps works well in this flip-chip interconnection case.","PeriodicalId":325138,"journal":{"name":"2015 Asia-Pacific Symposium on Electromagnetic Compatibility (APEMC)","volume":"27 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2015-05-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"125974171","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2015-05-26DOI: 10.1109/APEMC.2015.7175319
Jian Song, Yong-xin Guo
Several measurement uncertainties and errors associated with EMI measurement apparatus have been investigated in this paper. The standard uncertainties of different resolution bandwidth (RBW) selections and dwell time settings in the test receiver during calibration process are found to be comparably small. The signal synchronization between the signal generator and the test receiver is found to be an important factor in cable path attenuation measurement. The results obtained in this paper provide additional knowledge to the existing test standards used in the industry.
{"title":"Investigation of measurement uncertainties and errors in EMI measurement apparatus","authors":"Jian Song, Yong-xin Guo","doi":"10.1109/APEMC.2015.7175319","DOIUrl":"https://doi.org/10.1109/APEMC.2015.7175319","url":null,"abstract":"Several measurement uncertainties and errors associated with EMI measurement apparatus have been investigated in this paper. The standard uncertainties of different resolution bandwidth (RBW) selections and dwell time settings in the test receiver during calibration process are found to be comparably small. The signal synchronization between the signal generator and the test receiver is found to be an important factor in cable path attenuation measurement. The results obtained in this paper provide additional knowledge to the existing test standards used in the industry.","PeriodicalId":325138,"journal":{"name":"2015 Asia-Pacific Symposium on Electromagnetic Compatibility (APEMC)","volume":"28 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2015-05-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127024888","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2015-05-26DOI: 10.1109/APEMC.2015.7175294
A. Bréard, T. Hoang, Mario Dos Santos Alves, L. Krahenbuhl, C. Vollaire, C. Sartori
In EMC behavior of power electronic converters, it is important to predict near-field coupling between the complex components (e.g. in EMC filter). By using the components of near-field multipolar expansion of electromagnetic sources, the close magnetic coupling between two sources is determined from their equivalent model. It is shown that the complete identification of all components of multipolar expansion provides a more precise representation of the near-field around sources and thus a better accuracy of the near-field coupling prediction. Also theoretical and experimental developments are presented.
{"title":"Expansions in spherical harmonics for the modeling of near-field coupling in EMC","authors":"A. Bréard, T. Hoang, Mario Dos Santos Alves, L. Krahenbuhl, C. Vollaire, C. Sartori","doi":"10.1109/APEMC.2015.7175294","DOIUrl":"https://doi.org/10.1109/APEMC.2015.7175294","url":null,"abstract":"In EMC behavior of power electronic converters, it is important to predict near-field coupling between the complex components (e.g. in EMC filter). By using the components of near-field multipolar expansion of electromagnetic sources, the close magnetic coupling between two sources is determined from their equivalent model. It is shown that the complete identification of all components of multipolar expansion provides a more precise representation of the near-field around sources and thus a better accuracy of the near-field coupling prediction. Also theoretical and experimental developments are presented.","PeriodicalId":325138,"journal":{"name":"2015 Asia-Pacific Symposium on Electromagnetic Compatibility (APEMC)","volume":"56 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2015-05-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127114717","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2015-05-26DOI: 10.1109/APEMC.2015.7175347
D. Chang, Hsiao-Bin Liang, Jian-Ren Wang, Vito Chen, Jun-Pin Zhang, Yo‐Sheng Lin
Periodic impedance caused by periodic structure in transmission lines is simulated by high frequency 3-D EM simulators and RF/MMW circuit simulator. From the simulated data, the dip trend of insertion loss, which is also called as suck-out effect of high speed bulk cable, is presented. A simplified N-section LC lumped-circuit model with periodic circuit elements interpreting the periodic structure of transmission line is proposed for describing the dip trend, suck-out effect, of insertion loss. With proper number of sections, under the condition of quasi-static, the lumped circuit model could also perform the suck-out effect due to the periodic structure up to several tens GHz frequency range.
{"title":"High dip insertion loss due to periodic defect structure in high speed transmission line","authors":"D. Chang, Hsiao-Bin Liang, Jian-Ren Wang, Vito Chen, Jun-Pin Zhang, Yo‐Sheng Lin","doi":"10.1109/APEMC.2015.7175347","DOIUrl":"https://doi.org/10.1109/APEMC.2015.7175347","url":null,"abstract":"Periodic impedance caused by periodic structure in transmission lines is simulated by high frequency 3-D EM simulators and RF/MMW circuit simulator. From the simulated data, the dip trend of insertion loss, which is also called as suck-out effect of high speed bulk cable, is presented. A simplified N-section LC lumped-circuit model with periodic circuit elements interpreting the periodic structure of transmission line is proposed for describing the dip trend, suck-out effect, of insertion loss. With proper number of sections, under the condition of quasi-static, the lumped circuit model could also perform the suck-out effect due to the periodic structure up to several tens GHz frequency range.","PeriodicalId":325138,"journal":{"name":"2015 Asia-Pacific Symposium on Electromagnetic Compatibility (APEMC)","volume":"13 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2015-05-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"127470958","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2015-05-26DOI: 10.1109/APEMC.2015.7175224
Jui‐Hung Chou, D. Lin, S. Chen
In this paper, a near-field coupled transmitting-receiving antenna pair is proposed to achieve the maximum transmission efficiency. The antenna structure developed can achieve up to 77 % transmission efficiency in near-field coupling region. Additionally, through the rectifier circuit design, the front-end antenna pair will convert the radio frequency energy received into DC output. The maximum conversion efficiency of the proposed receiving rectenna is about 80% at the incident power level of 24 dBm and the load impedance of 1 kΩ. The output DC voltage of the rectenna is 13.12 V as the maximum conversion efficiency occurred.
{"title":"Near-field coupled antenna pair with transmission efficiency enhancement for WPT","authors":"Jui‐Hung Chou, D. Lin, S. Chen","doi":"10.1109/APEMC.2015.7175224","DOIUrl":"https://doi.org/10.1109/APEMC.2015.7175224","url":null,"abstract":"In this paper, a near-field coupled transmitting-receiving antenna pair is proposed to achieve the maximum transmission efficiency. The antenna structure developed can achieve up to 77 % transmission efficiency in near-field coupling region. Additionally, through the rectifier circuit design, the front-end antenna pair will convert the radio frequency energy received into DC output. The maximum conversion efficiency of the proposed receiving rectenna is about 80% at the incident power level of 24 dBm and the load impedance of 1 kΩ. The output DC voltage of the rectenna is 13.12 V as the maximum conversion efficiency occurred.","PeriodicalId":325138,"journal":{"name":"2015 Asia-Pacific Symposium on Electromagnetic Compatibility (APEMC)","volume":"96 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2015-05-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126960722","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
This study investigates how common-mode noise (CMN) is generated and reduced for the differential traces with adjacent ground lines were connected to a ground plane. Based on the resonant effects of ground line and parallel ground planes, the CMN generation mechanism is studied. Based on the analysis of the generation mechanism, a simple design guideline for CMN reduction is proposed for the differential traces with adjacent ground lines were connected to a ground plane.
{"title":"Common-mode noise effect for differential traces adjacent ground lines connection a ground plane","authors":"Hao-Che Hung, Syue-Liang Hong, Shu-An Chou, Zheng-Xiang Chen, Chu-Hsaio-Ting, Shen-Chien Hsu, Li-Chieh Chen, G. Shiue","doi":"10.1109/APEMC.2015.7175411","DOIUrl":"https://doi.org/10.1109/APEMC.2015.7175411","url":null,"abstract":"This study investigates how common-mode noise (CMN) is generated and reduced for the differential traces with adjacent ground lines were connected to a ground plane. Based on the resonant effects of ground line and parallel ground planes, the CMN generation mechanism is studied. Based on the analysis of the generation mechanism, a simple design guideline for CMN reduction is proposed for the differential traces with adjacent ground lines were connected to a ground plane.","PeriodicalId":325138,"journal":{"name":"2015 Asia-Pacific Symposium on Electromagnetic Compatibility (APEMC)","volume":"21 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2015-05-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131746208","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2015-05-26DOI: 10.1109/APEMC.2015.7175403
Tsai-Wen Hsiao, Meng-Jiun Jiang, H. Chou, Chien-De Yu
This document presents the design of a directional coupler that gives a relatively arbitrary power division ratio and identical output phases at the output ports. The arbitrary power ratio is realized by adopting broadside-coupled striplines. Improved Schiffman phase shifters are integrated into the circuit to achieve identical output phases within a certain frequency range. The circuit is also skillfully reshaped to ensure the two output ports lying on the same side with a compact size. Based on the simulation results by using the commercial EM software, the responses of the reshaped circuit have little difference compared with the traditional one.
{"title":"Design of directional coupler with an arbitrary realizable power ratio and identical output phase","authors":"Tsai-Wen Hsiao, Meng-Jiun Jiang, H. Chou, Chien-De Yu","doi":"10.1109/APEMC.2015.7175403","DOIUrl":"https://doi.org/10.1109/APEMC.2015.7175403","url":null,"abstract":"This document presents the design of a directional coupler that gives a relatively arbitrary power division ratio and identical output phases at the output ports. The arbitrary power ratio is realized by adopting broadside-coupled striplines. Improved Schiffman phase shifters are integrated into the circuit to achieve identical output phases within a certain frequency range. The circuit is also skillfully reshaped to ensure the two output ports lying on the same side with a compact size. Based on the simulation results by using the commercial EM software, the responses of the reshaped circuit have little difference compared with the traditional one.","PeriodicalId":325138,"journal":{"name":"2015 Asia-Pacific Symposium on Electromagnetic Compatibility (APEMC)","volume":"83 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2015-05-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"131749492","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2015-05-26DOI: 10.1109/APEMC.2015.7175251
Chia-Chi Liao, Jan-Dong Tseng, Chih-Kai Yang, Chien-Chun Ku
This paper proposes an adjustable output power ratio branch line design. By using the T-type equivalent circuit replaced the transmission lines of the branch line and changing the capacitors values in the T-type equivalent circuit, we could have different output power ratio. A 2:1 power ratio branch line adjusted to 1:1 or 3:1 power ratio is achieved by simply changing the capacitors values. The simulated and experimental results show a good agreement within the frequency of interest.
{"title":"An adjustable power ratio branch line design","authors":"Chia-Chi Liao, Jan-Dong Tseng, Chih-Kai Yang, Chien-Chun Ku","doi":"10.1109/APEMC.2015.7175251","DOIUrl":"https://doi.org/10.1109/APEMC.2015.7175251","url":null,"abstract":"This paper proposes an adjustable output power ratio branch line design. By using the T-type equivalent circuit replaced the transmission lines of the branch line and changing the capacitors values in the T-type equivalent circuit, we could have different output power ratio. A 2:1 power ratio branch line adjusted to 1:1 or 3:1 power ratio is achieved by simply changing the capacitors values. The simulated and experimental results show a good agreement within the frequency of interest.","PeriodicalId":325138,"journal":{"name":"2015 Asia-Pacific Symposium on Electromagnetic Compatibility (APEMC)","volume":"7 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2015-05-26","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129022030","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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