Pub Date : 2013-10-01DOI: 10.1109/ICAT.2013.6684031
Iman Samizadeh, H. Kazemian, K. Fisher, K. Ouazzane
The IEEE 802.15.4 standard, known as ZigBee, is limited to a through-rate of 250kbps providing support for small packet file transitions and it is designed to provide highly efficient connectivity with low power-usage. ZigBee is commonly used in wireless architecture and in controlling and monitoring applications. ZigBee's cost effective potential makes it highly likely that it will soon be used to transfer large amounts of data or stream video. However, ZigBee's current bandwidth is very low for video transmissions over IEEE 802.15.4 networks, therefore this will be difficult to achieve. Additionally, the ZigBee limitation could become a real problem if the user wishes to transmit a large amount of data in a very short time. Hence, in this paper a solution has been accomplished by applying Particle Swarm Optimization to Scalable Rate Control in order to increase the available bandwidth, which leads to both an improvement in the quality of picture and a reduction in the data loss when transmitting MPEG-4 video over the ZigBee wireless sensor networks.
{"title":"Adaptive scalable rate control over IEEE 802.15.4 using particle swarm optimization","authors":"Iman Samizadeh, H. Kazemian, K. Fisher, K. Ouazzane","doi":"10.1109/ICAT.2013.6684031","DOIUrl":"https://doi.org/10.1109/ICAT.2013.6684031","url":null,"abstract":"The IEEE 802.15.4 standard, known as ZigBee, is limited to a through-rate of 250kbps providing support for small packet file transitions and it is designed to provide highly efficient connectivity with low power-usage. ZigBee is commonly used in wireless architecture and in controlling and monitoring applications. ZigBee's cost effective potential makes it highly likely that it will soon be used to transfer large amounts of data or stream video. However, ZigBee's current bandwidth is very low for video transmissions over IEEE 802.15.4 networks, therefore this will be difficult to achieve. Additionally, the ZigBee limitation could become a real problem if the user wishes to transmit a large amount of data in a very short time. Hence, in this paper a solution has been accomplished by applying Particle Swarm Optimization to Scalable Rate Control in order to increase the available bandwidth, which leads to both an improvement in the quality of picture and a reduction in the data loss when transmitting MPEG-4 video over the ZigBee wireless sensor networks.","PeriodicalId":348701,"journal":{"name":"2013 XXIV International Conference on Information, Communication and Automation Technologies (ICAT)","volume":"197 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2013-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116146940","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2013-10-01DOI: 10.1109/ICAT.2013.6684032
M. Franceschinis, F. Mauro, C. Pastrone, M. Spirito, Mario Rossi
Predictive monitoring of train wagons can allow to anticipate possible malfunctioning due to wear and avoid potential accidents. In this paper some network architectures adopting low-power wireless communication technologies are introduced. A performance comparison is provided based on ns-2 simulation results, suggesting that the combined use of WSN and WiFi in a hierarchical architecture is adequate for long trains with several coaches and a large number of sensing nodes.
{"title":"Predictive monitoring of train wagons conditions using wireless network technologies","authors":"M. Franceschinis, F. Mauro, C. Pastrone, M. Spirito, Mario Rossi","doi":"10.1109/ICAT.2013.6684032","DOIUrl":"https://doi.org/10.1109/ICAT.2013.6684032","url":null,"abstract":"Predictive monitoring of train wagons can allow to anticipate possible malfunctioning due to wear and avoid potential accidents. In this paper some network architectures adopting low-power wireless communication technologies are introduced. A performance comparison is provided based on ns-2 simulation results, suggesting that the combined use of WSN and WiFi in a hierarchical architecture is adequate for long trains with several coaches and a large number of sensing nodes.","PeriodicalId":348701,"journal":{"name":"2013 XXIV International Conference on Information, Communication and Automation Technologies (ICAT)","volume":"2015 10","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2013-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132575566","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2013-10-01DOI: 10.1109/ICAT.2013.6684088
R. Lepratti, U. Berger, T. Creutznacher, S. Minhas
The automotive industry has to deal with an increasing complexity of production processes and various kinds of disturbances along the supply chain. This requires a higher level of flexibility through an intelligent production planning from the engineering phase. Today's manufacturing flexibility is mostly provided during the operational phase (so-called runtime) by methodologies for order re-scheduling and re-sequencing. The focus of this paper is a novel concept, which adds the intelligent production planning to these methodologies and uses the synergies of the holistic system. This approach enables flexible automated manufacturing processes by the dynamic use of machine capabilities during run-time. The paper shows in details how the adaption of operating speeds both in manufacturing and material handling processes leads to dynamic cycle times with maximized Key Performance Indicators (KPIs). This concept is based on so-called production variants defined and validated during the engineering phase. First results show stability and good response of the test system.
{"title":"Dynamic cycle times for adaptive manufacturing control in automotive flow shops","authors":"R. Lepratti, U. Berger, T. Creutznacher, S. Minhas","doi":"10.1109/ICAT.2013.6684088","DOIUrl":"https://doi.org/10.1109/ICAT.2013.6684088","url":null,"abstract":"The automotive industry has to deal with an increasing complexity of production processes and various kinds of disturbances along the supply chain. This requires a higher level of flexibility through an intelligent production planning from the engineering phase. Today's manufacturing flexibility is mostly provided during the operational phase (so-called runtime) by methodologies for order re-scheduling and re-sequencing. The focus of this paper is a novel concept, which adds the intelligent production planning to these methodologies and uses the synergies of the holistic system. This approach enables flexible automated manufacturing processes by the dynamic use of machine capabilities during run-time. The paper shows in details how the adaption of operating speeds both in manufacturing and material handling processes leads to dynamic cycle times with maximized Key Performance Indicators (KPIs). This concept is based on so-called production variants defined and validated during the engineering phase. First results show stability and good response of the test system.","PeriodicalId":348701,"journal":{"name":"2013 XXIV International Conference on Information, Communication and Automation Technologies (ICAT)","volume":" 4","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2013-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"120833295","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2013-10-01DOI: 10.1109/ICAT.2013.6684090
C. Ulu, M. Güzelkaya, I. Eksin
In literature, there is no exact inversion method for TSK fuzzy systems with linear consequents. In this study, an analytical method is proposed for the exact inversion of TSK fuzzy systems with linear consequents of which input variables are described using strong triangular partitions. When strong triangular partitions are used, the universes of discourse of input variables are divided into specific regions. In the proposed method, linear equations of triangular membership functions of inversion variable and the rule consequents are directly used in the analytical formulation of TSK fuzzy system output. In this way, the output of the TSK fuzzy system can be expressed in a unique quadratic form in terms of the inversion variable for any region where only the parameters of the appropriate equations of triangular membership functions are embedded. Thus, the inverse solution is easily obtained for any region by using explicit solution of the quadratic equation. An illustrative example has been given to validate the proposed method.
{"title":"Exact inversion of TSK fuzzy systems with linear consequents","authors":"C. Ulu, M. Güzelkaya, I. Eksin","doi":"10.1109/ICAT.2013.6684090","DOIUrl":"https://doi.org/10.1109/ICAT.2013.6684090","url":null,"abstract":"In literature, there is no exact inversion method for TSK fuzzy systems with linear consequents. In this study, an analytical method is proposed for the exact inversion of TSK fuzzy systems with linear consequents of which input variables are described using strong triangular partitions. When strong triangular partitions are used, the universes of discourse of input variables are divided into specific regions. In the proposed method, linear equations of triangular membership functions of inversion variable and the rule consequents are directly used in the analytical formulation of TSK fuzzy system output. In this way, the output of the TSK fuzzy system can be expressed in a unique quadratic form in terms of the inversion variable for any region where only the parameters of the appropriate equations of triangular membership functions are embedded. Thus, the inverse solution is easily obtained for any region by using explicit solution of the quadratic equation. An illustrative example has been given to validate the proposed method.","PeriodicalId":348701,"journal":{"name":"2013 XXIV International Conference on Information, Communication and Automation Technologies (ICAT)","volume":"28 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"2013-10-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133210174","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1900-01-01DOI: 10.1109/ICAT.2013.6684080
Jian Wan, B. Honari, S. McLoone
Plasma etch is a key process in modern semiconductor manufacturing facilities as it offers process simplification and yet greater dimensional tolerances compared to wet chemical etch technology. The main challenge of operating plasma etchers is to maintain a consistent etch rate spatially and temporally for a given wafer and for successive wafers processed in the same etch tool. Etch rate measurements require expensive metrology steps and therefore in general only limited sampling is performed. Furthermore, the results of measurements are not accessible in real-time, limiting the options for run-to-run control. This paper investigates a Virtual Metrology (VM) enabled Dynamic Sampling (DS) methodology as an alternative paradigm for balancing the need to reduce costly metrology with the need to measure more frequently and in a timely fashion to enable wafer-to-wafer control. Using a Gaussian Process Regression (GPR) VM model for etch rate estimation of a plasma etch process, the proposed dynamic sampling methodology is demonstrated and evaluated for a number of different predictive dynamic sampling rules.
{"title":"A dynamic sampling methodology for plasma etch processes using Gaussian process regression","authors":"Jian Wan, B. Honari, S. McLoone","doi":"10.1109/ICAT.2013.6684080","DOIUrl":"https://doi.org/10.1109/ICAT.2013.6684080","url":null,"abstract":"Plasma etch is a key process in modern semiconductor manufacturing facilities as it offers process simplification and yet greater dimensional tolerances compared to wet chemical etch technology. The main challenge of operating plasma etchers is to maintain a consistent etch rate spatially and temporally for a given wafer and for successive wafers processed in the same etch tool. Etch rate measurements require expensive metrology steps and therefore in general only limited sampling is performed. Furthermore, the results of measurements are not accessible in real-time, limiting the options for run-to-run control. This paper investigates a Virtual Metrology (VM) enabled Dynamic Sampling (DS) methodology as an alternative paradigm for balancing the need to reduce costly metrology with the need to measure more frequently and in a timely fashion to enable wafer-to-wafer control. Using a Gaussian Process Regression (GPR) VM model for etch rate estimation of a plasma etch process, the proposed dynamic sampling methodology is demonstrated and evaluated for a number of different predictive dynamic sampling rules.","PeriodicalId":348701,"journal":{"name":"2013 XXIV International Conference on Information, Communication and Automation Technologies (ICAT)","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1900-01-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116092168","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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