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Features of the melt–solution synthesis of the TbCr3(BO3)4 single crystals 熔融溶液合成 TbCr3(BO3)4 单晶的特点
IF 1.8 4区 材料科学 Q2 Physics and Astronomy Pub Date : 2024-04-18 DOI: 10.1016/j.jcrysgro.2024.127716
I.A. Gudim, N.V. Mikhashenok, A.D. Vasiliev, S.V. Melnikova, M.S. Pavlovskii, S.A. Skorobogatov, A.I. Pankrats

The phase formation of terbium chromoborate TbCr3(BO3)4 in the bismuth trimolybdate and lithium tungstate melt–solutions has been studied. The absence of the terbium chromoborate trigonal phase in the bismuth trimolybdate-based system at all component ratios has been shown. The component ratio in the lithium tungstate-based system has been found at which the TbCr3(BO3)4 trigonal crystals are formed at temperatures above 1100 °C; below this temperature, the monoclinic phase dominates. The structural and magnetic properties of the grown crystals have been studied. It has been established that the trigonal and monoclinic TbCr3(BO3)4 crystals synthesized from the lithium tungstate-based solvent exhibit identical magnetic properties. At the same time, a significant difference of the magnetic properties of the single crystals synthesized from the bismuth molybdate melt–solution has been observed. This difference has been attributed to the effect of Bi3+ ions that partially replace Tb3+ ions.

研究了铬硼酸铽 TbCr3(BO3)4 在三钼酸铋和钨酸锂熔融溶液中的相形成。结果表明,在以三钼酸铋为基础的体系中,在所有成分比率下都不存在三方铬硼酸铽相。在基于钨酸锂的体系中,已经找到了在温度高于 1100 °C 时形成 TbCr3(BO3)4 三方晶体的组分比率;在此温度以下,单斜相占据主导地位。我们对生长出的晶体的结构和磁性能进行了研究。结果表明,用钨酸锂溶剂合成的三方和单斜 TbCr3(BO3)4 晶体具有相同的磁性能。同时,从钼酸铋熔融溶液中合成的单晶体的磁性能也有显著差异。这种差异归因于部分取代 Tb3+ 离子的 Bi3+ 离子的影响。
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引用次数: 0
Rapid formation of imidazolium glutarate (IMGA) compound and investigation of its single crystal growth by modified vertical Bridgman technique for optical limiting applications 通过改进的垂直布里奇曼技术快速形成咪唑戊二酸(IMGA)化合物并研究其单晶生长在光学限幅上的应用
IF 1.8 4区 材料科学 Q2 Physics and Astronomy Pub Date : 2024-04-16 DOI: 10.1016/j.jcrysgro.2024.127707
Mohamad Asikali Abdul Hakkim, Rajesh Paulraj

In this paper, we have examined the formation of the imidazole glutarate adduct by protonation-deprotonation between imidazole and glutaric acid using a direct precipitation method within a short period. Following that, we have succeeded in growing imidazolium glutarate (IMGA) single crystal directly from synthesized material and we have also grown IMGA single crystal from the melt method using the vertical Bridgman technique for the first time in literature. A special Bridgman furnace was constructed with a slight modification in the winding section for this crystal growth. Crystal structure, phase purity, and growth plane were analyzed for the grown crystal from both single and powder XRD analysis. Functional groups were verified after the growth using FTIR transmittance analysis. The optical homogeneity and growth mechanism were scrutinized by birefringence interferogram and chemical etching studies, respectively. The grown IMGA has 80 % transparency in the entire visible region. The cut-off wavelength of the grown crystal is 235 nm, and the optical band gap energy of IMGA was found to be 5.26 eV. The photocurrent study reveals that IMGA has a negative photoconductivity nature. Third-order nonlinear parameters were found by the Z-scan technique. IMGA has a self-defocusing nature, negative non-linearity, and saturated absorption properties. The calculated χ(3) value is 2.045 x 10-8 esu.

本文研究了咪唑与戊二酸之间通过质子化-质子化作用在短时间内形成咪唑-戊二酸加合物的过程。随后,我们成功地从合成材料中直接生长出了谷氨酸咪唑(IMGA)单晶,并在文献中首次利用垂直布里奇曼技术从熔融法中生长出了 IMGA 单晶。为了实现这种晶体生长,我们建造了一个特殊的布里奇曼炉,并对绕组部分稍作改动。通过单晶和粉末 XRD 分析,对生长出的晶体进行了晶体结构、相纯度和生长面分析。晶体生长后,利用傅立叶变换红外透射率分析验证了功能基团。双折射干涉图和化学蚀刻研究分别对光学均匀性和生长机理进行了仔细研究。生长出的 IMGA 在整个可见光区域的透明度为 80%。生长出的晶体的截止波长为 235 nm,IMGA 的光带隙能为 5.26 eV。光电流研究表明,IMGA 具有负光电导性质。通过 Z 扫描技术发现了三阶非线性参数。IMGA 具有自失焦性、负非线性和饱和吸收特性。计算得出的 χ 值为 2.045 x 10 esu。
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引用次数: 0
Effective thermal conductivity of poly-silicon chunks and its size dependence in a melting process of silicon Czochralski crystal growth: Part 2. Numerical simulations and comparison with measurements 硅 Czochralski 晶体生长熔化过程中多晶硅块的有效热导率及其尺寸依赖性:第 2 部分。数值模拟及与测量结果的比较
IF 1.8 4区 材料科学 Q2 Physics and Astronomy Pub Date : 2024-04-16 DOI: 10.1016/j.jcrysgro.2024.127703
Michio Kida, Toshinori Taishi

In the article Part 1, experimental relation of a temperature distribution and a poly-silicon size in a melting process of silicon Czochralski (CZ) method is investigated. In this work, numerical simulations are performed to obtain temperature distributions in a crucible of a silicon CZ melting process. And applicability of International Atomic Energy Agency (IAEA) formula of effective thermal conductivity to poly-silicon chunks is examined. Calculations are done with a two-dimensional symmetric axis system and an explicit finite difference method. Samples are poly-silicon chunks of two sizes and small cylindrical graphite pellets of three sizes. Temperatures at 6 points in a crucible have been simulated. Simulations using IAEA formula give a good agreement with measured temperatures in the article Part 1. The experimental relation of temperature and a sample size is reproduced by simulations. Though IAEA formula is constructed for sphere particles, it serves in predicting an effective thermal conductivity of poly-silicon chunks. When applying the formula to chunks, a measured value of the porosity and an average size are used as parameters. The method of estimating an effective thermal conductivity is hoped to be applied to a large diameter silicon CZ growth.

文章第一部分研究了硅 Czochralski(CZ)法熔炼过程中温度分布与多晶硅尺寸的实验关系。在这项工作中,进行了数值模拟,以获得硅 CZ 熔化过程中坩埚内的温度分布。研究了国际原子能机构(IAEA)的有效热导率公式对多晶硅块的适用性。计算采用二维对称轴系统和显式有限差分法。样本为两种尺寸的多晶硅块和三种尺寸的圆柱形石墨小球。模拟了坩埚中 6 个点的温度。使用 IAEA 公式进行的模拟结果与文章第 1 部分中的测量温度十分吻合。模拟再现了温度与样品尺寸的实验关系。虽然 IAEA 公式是针对球形颗粒构建的,但它也可用于预测多晶硅块的有效热导率。在将该公式应用于硅块时,孔隙率的测量值和平均尺寸被用作参数。有效热导率的估算方法有望应用于大直径硅 CZ 生长。
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引用次数: 0
Effective thermal conductivity of poly-silicon chunks and its size dependence in a melting process of silicon Czochralski crystal growth: Part 1. Temperature measurements 硅 Czochralski 晶体生长熔化过程中多晶硅块的有效热导率及其尺寸依赖性:第 1 部分:温度测量温度测量
IF 1.8 4区 材料科学 Q2 Physics and Astronomy Pub Date : 2024-04-16 DOI: 10.1016/j.jcrysgro.2024.127704
Michio Kida, Toshinori Taishi

Relation between temperature distribution in a crucible and size of poly-silicon chunks is investigated in a melting process of silicon Czochralski (CZ) method. Five kinds of feedstocks with a different size are heated up to about 1,000 °C in a crucible and the temperature distributions and thermal gradients are measured with six thermocouples. Two sizes of commercial poly-silicon chunks and three sizes of cylindrical graphite pellets are tested. The result is that the lager the particle size is, the lager the thermal conductivity is for both poly-silicon chunks and graphite pellets. Averaged sizes of clashed poly-silicon are defined and measured, and also void porosities in various samples are measured. The results of these measurements are to be used in comparisons with numerical simulations in the article Part 2.

在硅 Czochralski(CZ)法熔炼过程中,研究了坩埚中的温度分布与多晶硅块尺寸之间的关系。在坩埚中将五种不同尺寸的原料加热至约 1,000 °C,并用六个热电偶测量温度分布和热梯度。测试了两种尺寸的商用多晶硅块和三种尺寸的圆柱形石墨颗粒。结果表明,多晶硅块和石墨颗粒的粒度越小,导热系数越小。对碰撞多晶硅的平均尺寸进行了定义和测量,还测量了各种样品的空隙率。这些测量结果将用于文章第 2 部分中与数值模拟的比较。
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引用次数: 0
Study on the facet effect in LEC-GaSb single crystals LEC-GaSb 单晶中的面效应研究
IF 1.8 4区 材料科学 Q2 Physics and Astronomy Pub Date : 2024-04-14 DOI: 10.1016/j.jcrysgro.2024.127706
Weimin Dong , Jun Jiang , Qianwen Peng , Chengao Liu , Deliang Chu , Biwen Duan , Henghao Feng , Jin Yang , Wei Guo , Jincheng Kong , Jun Zhao

The “facet effect” had an important impact on the growth and quality of III-V semiconductor crystals. Herein, Te-doped 〈1 1 1〉 and 〈1 0 0〉 GaSb single crystals were grown by the liquid-encapsulated Czochralski (LEC) method. The theoretical causes of the central facets of 〈1 1 1〉 GaSb and the edge facets of 〈1 0 0〉 GaSb were studied in detail. The Te component segregation, electrical parameter changes, infrared transmittance differences, and epitaxial film defects caused by the “facet effect” were comprehensively analyzed. The influence of the shoulder angle on the edge facets of 〈1 0 0〉 GaSb and the size differences of edge facets between the Ga-face and Sb-face were studied.

面效应 "对 III-V 族半导体晶体的生长和质量有重要影响。在此,我们采用液态包封佐赫拉尔斯基(LEC)方法生长了掺Te的〈1 1 1〉和〈1 0 0〉GaSb单晶。详细研究了〈1 1 1〉GaSb中心面和〈1 0 0〉GaSb边缘面的理论成因。全面分析了 "切面效应 "引起的 Te 成分偏析、电参数变化、红外透射率差异和外延薄膜缺陷。研究了肩角对〈1 0 0〉GaSb 边缘刻面的影响以及 Ga 面和 Sb 面边缘刻面的尺寸差异。
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引用次数: 0
Pinning/depinning dynamics of trijunction lines during faceted/nonfaceted eutectic growth 刻面/非刻面共晶生长过程中三结线的针状/细化动态变化
IF 1.8 4区 材料科学 Q2 Physics and Astronomy Pub Date : 2024-04-14 DOI: 10.1016/j.jcrysgro.2024.127705
S. Mohagheghi , M. Şerefoğlu , S. Akamatsu , S. Bottin-Rousseau

We present an in situ experimental study of decoupled- and coupled-growth patterns in a binary faceted/ nonfaceted (f/nf) eutectic alloy. Real-time optical observation is carried out at low growth velocity V (<0.3μms1) during directional solidification of the transparent AminoMethylPropaneDiol-Succinonitrile (AMPD-SCN) eutectic in thin samples. On a large scale, the two-phase growth front mostly exhibits irregularly spaced decoupled-growth patterns involving faceted fiber-like AMPD crystals that protrude in the liquid ahead of, and in weak diffusive interaction with the nonfaceted SCN solid. The morphological stability of low-velocity, steady-state decoupled-growth patterns is evidenced. In addition, three types of (f/nf) coupled-growth patterns with fiber-like, tubular (or “hollow”) and C-shaped morphologies, respectively, are identified. New light is cast on the pinning/depinning dynamics of trijunctions at which the two solid phases and the liquid meet in equilibrium. A discussion is initiated on the interplay between the interfacial kinetics of the more or less mobile facets and the solute diffusion field, and on the stability of triple junctions with strongly anisotropic interfaces.

我们对二元刻面/非刻面(f/nf)共晶合金中的解耦和耦合生长模式进行了现场实验研究。在透明的氨基甲基丙二醇-琥珀腈(AMPD-SCN)共晶薄样品定向凝固过程中,以较低的生长速度 V (<0.3μms-1)进行了实时光学观测。在大尺度上,两相生长前沿大多表现出不规则间距的解耦生长模式,涉及切面纤维状 AMPD 晶体,这些晶体先于非切面 SCN 固体在液体中突出,并与之发生微弱的扩散作用。低速、稳态解耦生长模式的形态稳定性得到了证明。此外,还发现了三种(f/nf)耦合生长模式,分别具有纤维状、管状(或 "空心")和 C 形形态。研究还为两固态和液体在平衡状态下相遇的三交界处的羽化/下沉动力学提供了新的视角。此外,还讨论了流动性较强或较弱的面的界面动力学与溶质扩散场之间的相互作用,以及具有强各向异性界面的三重连接的稳定性。
{"title":"Pinning/depinning dynamics of trijunction lines during faceted/nonfaceted eutectic growth","authors":"S. Mohagheghi ,&nbsp;M. Şerefoğlu ,&nbsp;S. Akamatsu ,&nbsp;S. Bottin-Rousseau","doi":"10.1016/j.jcrysgro.2024.127705","DOIUrl":"https://doi.org/10.1016/j.jcrysgro.2024.127705","url":null,"abstract":"<div><p>We present an in situ experimental study of decoupled- and coupled-growth patterns in a binary faceted/ nonfaceted (f/nf) eutectic alloy. Real-time optical observation is carried out at low growth velocity <span><math><mi>V</mi></math></span> (<span><math><mrow><mo>&lt;</mo><mn>0</mn><mo>.</mo><mn>3</mn><mspace></mspace><mi>μ</mi><msup><mrow><mi>ms</mi></mrow><mrow><mo>−</mo><mn>1</mn></mrow></msup></mrow></math></span>) during directional solidification of the transparent AminoMethylPropaneDiol-Succinonitrile (AMPD-SCN) eutectic in thin samples. On a large scale, the two-phase growth front mostly exhibits irregularly spaced decoupled-growth patterns involving faceted fiber-like AMPD crystals that protrude in the liquid ahead of, and in weak diffusive interaction with the nonfaceted SCN solid. The morphological stability of low-velocity, steady-state decoupled-growth patterns is evidenced. In addition, three types of (f/nf) coupled-growth patterns with fiber-like, tubular (or “hollow”) and C-shaped morphologies, respectively, are identified. New light is cast on the pinning/depinning dynamics of trijunctions at which the two solid phases and the liquid meet in equilibrium. A discussion is initiated on the interplay between the interfacial kinetics of the more or less mobile facets and the solute diffusion field, and on the stability of triple junctions with strongly anisotropic interfaces.</p></div>","PeriodicalId":353,"journal":{"name":"Journal of Crystal Growth","volume":null,"pages":null},"PeriodicalIF":1.8,"publicationDate":"2024-04-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"140638029","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"材料科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Design engineering of non-linear graded InAlAs metamorphic buffer layers for efficient reduction of misfit dislocation density 设计非线性分级 InAlAs 变质缓冲层,有效降低错位密度
IF 1.8 4区 材料科学 Q2 Physics and Astronomy Pub Date : 2024-04-12 DOI: 10.1016/j.jcrysgro.2024.127702
M.Yu. Chernov, N.D. Prasolov, S.V. Ivanov, V.A. Solov'ev

Metamorphic InxAl1-xAs (xmax > 0.75) buffer layer (MBL) grown on GaAs with an optimized non-linear graded composition profile along the growth direction is proposed for enhanced reduction of misfit dislocation (MD) density in highly mismatched III-V/GaAs metamorphic heterostructures. The equilibrium distributions of MD density throughout such InxAl1-xAs/GaAs MBLs are calculated. The influence of the initial composition (xmin) of MBL and the elastically strained thin GaAs layer embedded into the InxAl1-xAs MBL on the MD density distribution was studied. An optimum value of the inverse step (Δ), representing the difference between the top In content of the InxAl1-xAs MBL and that of a In0.75Al0.25As virtual substrate (VS) grown atop is determined. It was theoretically shown that Δ above 0.04 results in relaxation of the elastic stresses in VS via formation of the MDs, while the lower Δ values allow growing the VS completely free of MDs. Finally, the metamorphic In0.75Al0.25As/graded-InAlAs/GaAs heterostructures differing from each other by only the composition profile of the graded-InAlAs MBL were grown by MBE on GaAs (0 0 1) and studied by atomic force microscopy. The structure with proposed optimized non-linear graded (x = 0.05–0.77) MBL demonstrated the ∼ 1.5 times less MD density as compared to that with the convex-graded (x = 0.05–0.81) MBL, which was estimated to be at the level of ∼ 2·107 cm−2.

在砷化镓上生长的变质 InxAl1-xAs(xmax > 0.75)缓冲层 (MBL),沿生长方向具有优化的非线性分级成分剖面,用于增强降低高度失配的 III-V/GaAs 变质异质结构中的失配位错 (MD) 密度。计算了整个 InxAl1-xAs/GaAs MBL 中 MD 密度的平衡分布。研究了 MBL 的初始成分(xmin)和嵌入 InxAl1-xAs MBL 的 GaAs 弹性应变薄层对 MD 密度分布的影响。确定了代表 InxAl1-xAs MBL 顶部 In 含量与顶部生长的 In0.75Al0.25As 虚拟衬底 (VS) 顶部 In 含量之差的反步长 (Δ)的最佳值。理论证明,Δ 高于 0.04 会导致 VS 中的弹性应力通过 MD 的形成而松弛,而较低的Δ 值则允许生长完全不含 MD 的 VS。最后,通过 MBE 在 GaAs (0 0 1) 上生长了变质的 In0.75Al0.25As/ Gradeed-InAlAs/GaAs 异质结构,这些异质结构之间的差别仅在于分级 InAlAs MBL 的成分剖面,并通过原子力显微镜进行了研究。与凸分级(x = 0.05-0.81)MBL 相比,建议的优化非线性分级(x = 0.05-0.77)MBL 结构的 MD 密度低 1.5 倍,估计为 2-107 cm-2 左右。
{"title":"Design engineering of non-linear graded InAlAs metamorphic buffer layers for efficient reduction of misfit dislocation density","authors":"M.Yu. Chernov,&nbsp;N.D. Prasolov,&nbsp;S.V. Ivanov,&nbsp;V.A. Solov'ev","doi":"10.1016/j.jcrysgro.2024.127702","DOIUrl":"https://doi.org/10.1016/j.jcrysgro.2024.127702","url":null,"abstract":"<div><p>Metamorphic In<sub>x</sub>Al<sub>1-x</sub>As (<em>x</em><sub>max</sub> &gt; 0.75) buffer layer (MBL) grown on GaAs with an optimized non-linear graded composition profile along the growth direction is proposed for enhanced reduction of misfit dislocation (MD) density in highly mismatched III-V/GaAs metamorphic heterostructures. The equilibrium distributions of MD density throughout such In<sub>x</sub>Al<sub>1-x</sub>As/GaAs MBLs are calculated. The influence of the initial composition (<em>x</em><sub>min</sub>) of MBL and the elastically strained thin GaAs layer embedded into the In<sub>x</sub>Al<sub>1-x</sub>As MBL on the MD density distribution was studied. An optimum value of the inverse step (Δ), representing the difference between the top In content of the In<sub>x</sub>Al<sub>1-x</sub>As MBL and that of a In<sub>0.75</sub>Al<sub>0.25</sub>As virtual substrate (VS) grown atop is determined. It was theoretically shown that Δ above 0.04 results in relaxation of the elastic stresses in VS via formation of the MDs, while the lower Δ values allow growing the VS completely free of MDs. Finally, the metamorphic In<sub>0.75</sub>Al<sub>0.25</sub>As/graded-InAlAs/GaAs heterostructures differing from each other by only the composition profile of the graded-InAlAs MBL were grown by MBE on GaAs<!--> <!-->(0<!--> <!-->0<!--> <!-->1) and studied by atomic force microscopy. The structure with proposed optimized non-linear graded (<em>x</em> = 0.05–0.77) MBL demonstrated the ∼ 1.5 times less MD density as compared to that with the convex-graded (<em>x =</em> 0.05–0.81) MBL, which was estimated to be at the level of ∼ 2·10<sup>7</sup> cm<sup>−2</sup>.</p></div>","PeriodicalId":353,"journal":{"name":"Journal of Crystal Growth","volume":null,"pages":null},"PeriodicalIF":1.8,"publicationDate":"2024-04-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"140605319","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"材料科学","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Investigation of heat transfer mechanism affecting temperature homogeneity at polysilicon rods in a Siemens reduction furnace 西门子还原炉中影响多晶硅棒温度均匀性的传热机制研究
IF 1.8 4区 材料科学 Q2 Physics and Astronomy Pub Date : 2024-04-08 DOI: 10.1016/j.jcrysgro.2024.127693
Wei Si , Ning Wang , Yuan Zong , Gance Dai , Ling Zhao , Zhong Xin , Guangjing Jiang

The temperature homogeneity at polysilicon rods significantly affects the uniformity growth of the polysilicon rod and the product quality in reduction furnace. The heat transfer phenomena on the rod surface includes electric heating, radiation heat transfer, convection heat transfer, heat conduction and reaction heat. In this paper, a representative configuration (RC) of heat transfer model was selected from a “honeycomb” industrial furnace. The flow patterns with different outlets have been numerically investigated and the dependency of surface temperature distribution on the inlet velocity as well as the geometric parameters has been investigated. Gr/Red2 = 100 is set as the transition point determining the natural convection and mixed convection heat transfer. The results indicated that the axial temperature difference at the rod surface has close relationship with the complicated convection heat transfer. With rods growth, the main difference of local heat loss is caused by radiation rather than convection heat transfer.

多晶硅棒的温度均匀性对多晶硅棒的均匀生长和还原炉中的产品质量有很大影响。多晶硅棒表面的传热现象包括电加热、辐射传热、对流传热、热传导和反应热。本文从 "蜂窝 "工业炉中选取了一个具有代表性的传热模型配置(RC)。对不同出口的流动模式进行了数值研究,并探讨了表面温度分布与入口速度和几何参数的关系。Gr/Red2 = 100 被设定为决定自然对流和混合对流传热的过渡点。结果表明,棒表面的轴向温差与复杂对流传热关系密切。随着棒材的增长,局部热量损失的主要差异是由辐射而不是对流传热造成的。
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引用次数: 0
Evaluation of defect density in bulk gallium nitrides by photothermal deflection spectroscopy and steady-state photocapacitance methods 用光热偏转光谱法和稳态光电容法评估块状氮化镓中的缺陷密度
IF 1.8 4区 材料科学 Q2 Physics and Astronomy Pub Date : 2024-04-06 DOI: 10.1016/j.jcrysgro.2024.127701
Masatomo Sumiya , Hajime Fujikura , Yoshitaka Nakano , Shuhei Yashiro , Yasuo Koide , Tohru Honda

Bulk GaN samples were characterized by both photothermal deflection spectroscopy (PDS) and steady-state photocapacitance (SSPC) methods. The PDS signal intensity in the bandgap was found to correlate quantitatively with the defect density estimated by the SSPC method. The defect density of GaN bulks fabricated by hydride vapor phase epitaxy (HVPE) was decreased by controlling the incorporation of carbon and silicon impurities. Differences in the reciprocal of the slope near the valence band maximum and the signal intensity in the bandgap among HVPE GaN bulks could be detected by PDS, although they had the same crystalline quality. PDS can be used to evaluate the GaN bulks that have been improved with a highly insulative property caused by Fe- doping or low carbon incorporation.

采用光热偏转光谱法(PDS)和稳态光电容法(SSPC)对块状氮化镓样品进行了表征。发现带隙中的 PDS 信号强度与 SSPC 方法估计的缺陷密度存在定量相关性。通过控制碳和硅杂质的加入量,降低了氢化物气相外延(HVPE)法制备的 GaN 块体的缺陷密度。尽管 HVPE GaN 块体的结晶质量相同,但通过 PDS 可以检测到它们价带最大值附近斜率的倒数和带隙信号强度的差异。PDS 可用于评估因掺杂铁或低碳而具有高绝缘性能的 GaN 块体。
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引用次数: 0
Growth and characterization of 6LiI:Ag crystal scintillators for thermal and epithermal neutron detection on the lunar surface 用于月球表面热中子和表热中子探测的 6LiI:Ag 晶体闪烁体的生长和特性分析
IF 1.8 4区 材料科学 Q2 Physics and Astronomy Pub Date : 2024-04-03 DOI: 10.1016/j.jcrysgro.2024.127692
Nguyen Duy Quang , Phan Quoc Vuong , Nguyen Thanh Luan , Lam Tan Truc , Nguyen Duc Ton , S.C. Kang , Hwanbae Park , Uk-Won Nam , Won-Kee Park , Jongdae Sohn , Young-Jun Choi , Sukwon Youn , Sung-Joon Ye , Sunghwan Kim , Hongjoo Kim

This paper discusses crystal growth and characterization of 1.0-inch 6LiI:Ag scintillators for thermal and epithermal neutron detection on the lunar surface as part of the Lunar Vehicle Radiation Dosimeter project. Zone purification method was employed to purify the raw material of 6LiI, and the crystals were grown using the Bridgman method. X-ray luminescence spectrum was measured to confirm the presence of Ag+ in the crystal lattice of 6LiI. The feasibility of neutron detection under 252Cf fast neutron irradiation was investigated. A hydrogen-rich paraffin wax moderator was used to slow down fast neutrons to obtain thermal and epithermal neutrons. The charge comparison method was used to perform pulse shape discrimination. The maximum value of the Figure of Merit was obtained to be 1.3, which demonstrates the capability of using 6LiI:Ag crystal scintillators in high neutron and gamma mixed fields. The energy resolution of the thermal neutron peak varied with the thickness of scintillators, achieving 12.0 % for the 0.5 cm thick samples. The potential for further improvement of the scintillation performance of 6LiI:Ag crystal relies on reducing impurities and color centers.

本文讨论了 1.0 英寸 6LiI:Ag 闪烁器的晶体生长和表征,该闪烁器用于月球表面的热中子和表热中子探测,是月球车辐射剂量计项目的一部分。采用区带提纯法提纯 6LiI 原料,并使用布里奇曼法生长晶体。测量了 X 射线发光光谱,以确认 6LiI 晶格中存在 Ag+。研究了在 252Cf 快中子辐照下进行中子探测的可行性。使用富氢石蜡慢化剂使快中子减速,从而获得热中子和表观中子。利用电荷比较法进行脉冲形状判别。结果表明,6LiI:Ag 晶体闪烁体具有在高中子和伽马混合场中使用的能力。热中子峰的能量分辨率随闪烁体厚度的变化而变化,0.5 厘米厚的样品达到了 12.0%。要进一步提高 6LiI:Ag 晶体的闪烁性能,必须减少杂质和色心。
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引用次数: 0
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Journal of Crystal Growth
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