A practical reliability analysis method is described for a reliability block diagram (RBD) in which some components appear more than once in the diagram, i.e. have multiple blocks. The reliability analysis method for a RBD with multiple blocks must include the effect of the multiple blocks, if not, the resulting downtime can be significantly underestimated. An example is given to show the effects of including and not including the multiple-block effect in the reliability analysis.<>
{"title":"Analysis of reliability block diagrams with multiple blocks per component","authors":"Robert F. Forche","doi":"10.1109/ARMS.1990.67947","DOIUrl":"https://doi.org/10.1109/ARMS.1990.67947","url":null,"abstract":"A practical reliability analysis method is described for a reliability block diagram (RBD) in which some components appear more than once in the diagram, i.e. have multiple blocks. The reliability analysis method for a RBD with multiple blocks must include the effect of the multiple blocks, if not, the resulting downtime can be significantly underestimated. An example is given to show the effects of including and not including the multiple-block effect in the reliability analysis.<<ETX>>","PeriodicalId":383597,"journal":{"name":"Annual Proceedings on Reliability and Maintainability Symposium","volume":"64 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1990-01-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133027554","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
A cost-effective method of qualifying and improving the reliability of adapted designs through the evaluation of design performance under simulated military environmental stresses is demonstrated. The example discussed is the implementation of an Avionics Instrument Incorporated AI/sup 2/ static inverter as part of the Traffic Jam electronic countermeasures system. In the case of the AI/sup 2/ static inverter employed in the AN/TLQ-17A(V)3 system, the iterative process of test and design modification has allowed the procurement of systems with the required functionality and reliability at minimum cost to the government.<>
{"title":"Reliability improvement of power inverters through environmental stress simulation","authors":"M. Delmont, S. Welby","doi":"10.1109/ARMS.1990.67933","DOIUrl":"https://doi.org/10.1109/ARMS.1990.67933","url":null,"abstract":"A cost-effective method of qualifying and improving the reliability of adapted designs through the evaluation of design performance under simulated military environmental stresses is demonstrated. The example discussed is the implementation of an Avionics Instrument Incorporated AI/sup 2/ static inverter as part of the Traffic Jam electronic countermeasures system. In the case of the AI/sup 2/ static inverter employed in the AN/TLQ-17A(V)3 system, the iterative process of test and design modification has allowed the procurement of systems with the required functionality and reliability at minimum cost to the government.<<ETX>>","PeriodicalId":383597,"journal":{"name":"Annual Proceedings on Reliability and Maintainability Symposium","volume":"140 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1990-01-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133075024","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Discussed is a retrospective study of the errors uncovered in developing a multiple-release industrial software product of some 60000 lines of C source code. The purpose of the study was to determine what changes in existing software development procedures would detect errors earlier in the life cycle, where they are less expensive to correct. The study procedure consisted of three tasks: establishing criteria for sorting the problems into software development errors and other problems/errors, determining error classes for categorizing the development errors, and identifying a series of ten error-detection steps within the software development process. A number of results specific to this study are presented, and conclusions are drawn and recommendations made regarding functional and design errors.<>
{"title":"Practical lessons for improving software quality","authors":"J. Bukowski, W. Goble","doi":"10.1109/ARMS.1990.67998","DOIUrl":"https://doi.org/10.1109/ARMS.1990.67998","url":null,"abstract":"Discussed is a retrospective study of the errors uncovered in developing a multiple-release industrial software product of some 60000 lines of C source code. The purpose of the study was to determine what changes in existing software development procedures would detect errors earlier in the life cycle, where they are less expensive to correct. The study procedure consisted of three tasks: establishing criteria for sorting the problems into software development errors and other problems/errors, determining error classes for categorizing the development errors, and identifying a series of ten error-detection steps within the software development process. A number of results specific to this study are presented, and conclusions are drawn and recommendations made regarding functional and design errors.<<ETX>>","PeriodicalId":383597,"journal":{"name":"Annual Proceedings on Reliability and Maintainability Symposium","volume":"18 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1990-01-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134061450","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
The Federal Aviation Administration (FAA) has recommended a nation-wide maintenance automation system (MAS), which will include maintenance control centers (MCCs). Three operational concepts were developed to consolidate the real-time monitoring, coordination, and remote maintenance at the MCCs. The three concepts were then evaluated both qualitatively and quantitatively. Surveys and questionnaires were used to develop the qualitative criteria for evaluation of the concepts and included such concerns as the service to air traffic controllers and the users of the National Airspace System, impact on the maintenance workforce and, impact on risks and costs. The remote-maintenance workload was then assigned to the MCC or the local work centers in order to compare the staffing implications. The results suggest an MCC starting with an initial staff-type facilitator MCC performing only monitoring and coordination and evolving into a super MCC responsible for most remote maintenance and control functions.<>
{"title":"Analysis of maintenance control center operations","authors":"R. Loh, P. Wroblewski","doi":"10.1109/ARMS.1990.67992","DOIUrl":"https://doi.org/10.1109/ARMS.1990.67992","url":null,"abstract":"The Federal Aviation Administration (FAA) has recommended a nation-wide maintenance automation system (MAS), which will include maintenance control centers (MCCs). Three operational concepts were developed to consolidate the real-time monitoring, coordination, and remote maintenance at the MCCs. The three concepts were then evaluated both qualitatively and quantitatively. Surveys and questionnaires were used to develop the qualitative criteria for evaluation of the concepts and included such concerns as the service to air traffic controllers and the users of the National Airspace System, impact on the maintenance workforce and, impact on risks and costs. The remote-maintenance workload was then assigned to the MCC or the local work centers in order to compare the staffing implications. The results suggest an MCC starting with an initial staff-type facilitator MCC performing only monitoring and coordination and evolving into a super MCC responsible for most remote maintenance and control functions.<<ETX>>","PeriodicalId":383597,"journal":{"name":"Annual Proceedings on Reliability and Maintainability Symposium","volume":"21 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1990-01-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121700591","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Logisticians at the Westinghouse Electronic Systems Group prepared a visual aid for their customers in the form of a spares calculator. The calculator portrays required spares quantities based upon the customer's required level of protection. The calculator is appropriate for users of a variety of commercial and defense products. Selected as most appropriate to the needs of the provisioner was a moving-scale device with numerical values appearing in an open window. For compactness, a circular slide rule 8 in. in diameter was selected. The Gothic font bolt black-on-white makes the device easily readable.<>
西屋电子系统集团(Westinghouse Electronic Systems Group)的物流人员为他们的客户准备了一个备件计算器的视觉辅助工具。计算器根据客户所需的保护级别描绘所需备件的数量。该计算器适用于各种商业和国防产品的用户。根据提供方的需要，选择了一种移动刻度装置，其数值显示在打开的窗口上。为了紧凑，一个8英寸的圆形计算尺。直径选择。黑配白的哥特字体使设备易于阅读。
{"title":"The spares calculator: a visual aid to provisioning","authors":"L. Mickel, R. Heim","doi":"10.1109/ARMS.1990.67993","DOIUrl":"https://doi.org/10.1109/ARMS.1990.67993","url":null,"abstract":"Logisticians at the Westinghouse Electronic Systems Group prepared a visual aid for their customers in the form of a spares calculator. The calculator portrays required spares quantities based upon the customer's required level of protection. The calculator is appropriate for users of a variety of commercial and defense products. Selected as most appropriate to the needs of the provisioner was a moving-scale device with numerical values appearing in an open window. For compactness, a circular slide rule 8 in. in diameter was selected. The Gothic font bolt black-on-white makes the device easily readable.<<ETX>>","PeriodicalId":383597,"journal":{"name":"Annual Proceedings on Reliability and Maintainability Symposium","volume":"24 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1990-01-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121401961","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
A procedure is described by which reliability and maintainability considerations can be taken into account when ranking options for the selection of built-in test (BIT) devices. The type of constraints that are likely to influence BIT selection usually fall into one of the following categories: money, space and weight, manpower, time, and computer power and memory. Quality measures-factors which influence the overall objectives sought when employing BIT-are increasing the availability and reliability of the system and decreasing the system's probability of a safety incident when the BIT is capable of detecting safety-critical failure modes.<>
{"title":"An approach to the selection of built-in-test devices","authors":"A. Rosin","doi":"10.1109/ARMS.1990.67981","DOIUrl":"https://doi.org/10.1109/ARMS.1990.67981","url":null,"abstract":"A procedure is described by which reliability and maintainability considerations can be taken into account when ranking options for the selection of built-in test (BIT) devices. The type of constraints that are likely to influence BIT selection usually fall into one of the following categories: money, space and weight, manpower, time, and computer power and memory. Quality measures-factors which influence the overall objectives sought when employing BIT-are increasing the availability and reliability of the system and decreasing the system's probability of a safety incident when the BIT is capable of detecting safety-critical failure modes.<<ETX>>","PeriodicalId":383597,"journal":{"name":"Annual Proceedings on Reliability and Maintainability Symposium","volume":"28 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1990-01-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126142126","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Criticality, as defined by K.K. Aggarwal (Proc. Ann. Reliability and Maintainability Symp., p.86-9, 1989), is shown to be an adaptation of conditional probability theory. Both of these methods are shown to be acceptable techniques for modeling a simple radio network. However, the equivalent parallel-configuration approach provided a much simpler way of modeling the radio network problem, by using standard techniques in a new way. The logical interpretation of not-fully-critical subunits is clearly modeled with a simple manipulation of the standard reliability block diagram. The equivalent parallel-configuration approach is shown to be useful in modeling any situation where failed components may or may not lead to system failure.<>
{"title":"Radio network modeling using criticality and conditional probability theory","authors":"P.A. Roman, B. Simms","doi":"10.1109/ARMS.1990.67946","DOIUrl":"https://doi.org/10.1109/ARMS.1990.67946","url":null,"abstract":"Criticality, as defined by K.K. Aggarwal (Proc. Ann. Reliability and Maintainability Symp., p.86-9, 1989), is shown to be an adaptation of conditional probability theory. Both of these methods are shown to be acceptable techniques for modeling a simple radio network. However, the equivalent parallel-configuration approach provided a much simpler way of modeling the radio network problem, by using standard techniques in a new way. The logical interpretation of not-fully-critical subunits is clearly modeled with a simple manipulation of the standard reliability block diagram. The equivalent parallel-configuration approach is shown to be useful in modeling any situation where failed components may or may not lead to system failure.<<ETX>>","PeriodicalId":383597,"journal":{"name":"Annual Proceedings on Reliability and Maintainability Symposium","volume":"70 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1990-01-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"126327864","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Finite element analysis (FEA) was performed on three different surface mounted designs: a leadless chip carrier, gull-wing chip carrier, and compliant S-lead leadless chip carrier. The output of the FEA was input into the Coffin-Manson model, and the number of thermal cycles to failure was estimated. The results indicated that the gull-wing and S-leads chip carriers would be reliable when placed in this temperature environment but the leadless chip carriers would have reliability problems after a short period of time.<>
{"title":"Predicting time-to-failure using finite element analysis","authors":"G. A. Bivens","doi":"10.1109/ARMS.1990.67976","DOIUrl":"https://doi.org/10.1109/ARMS.1990.67976","url":null,"abstract":"Finite element analysis (FEA) was performed on three different surface mounted designs: a leadless chip carrier, gull-wing chip carrier, and compliant S-lead leadless chip carrier. The output of the FEA was input into the Coffin-Manson model, and the number of thermal cycles to failure was estimated. The results indicated that the gull-wing and S-leads chip carriers would be reliable when placed in this temperature environment but the leadless chip carriers would have reliability problems after a short period of time.<<ETX>>","PeriodicalId":383597,"journal":{"name":"Annual Proceedings on Reliability and Maintainability Symposium","volume":"1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1990-01-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129246412","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
An overview is presented of the state of the art in generating analytical models for fatigue life estimation due to mechanical wear-out. The applicability of these models to reliability prediction for electronic packages is examined. In discussing the failure mechanics of common electronic materials, it is convenient to classify the fatigue damage models into brittle damage, ductile damage, and damage in heterogeneous composite materials. Often the failure may not be in the bulk of any individual material but at the interface of two or more materials, and may require a fourth type of damage model.<>
{"title":"Reliability prediction of electronic packages","authors":"A. Dasgupta, D. Barker, M. Pecht","doi":"10.1109/ARMS.1990.67977","DOIUrl":"https://doi.org/10.1109/ARMS.1990.67977","url":null,"abstract":"An overview is presented of the state of the art in generating analytical models for fatigue life estimation due to mechanical wear-out. The applicability of these models to reliability prediction for electronic packages is examined. In discussing the failure mechanics of common electronic materials, it is convenient to classify the fatigue damage models into brittle damage, ductile damage, and damage in heterogeneous composite materials. Often the failure may not be in the bulk of any individual material but at the interface of two or more materials, and may require a fourth type of damage model.<<ETX>>","PeriodicalId":383597,"journal":{"name":"Annual Proceedings on Reliability and Maintainability Symposium","volume":"25 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1990-01-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129362034","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
For equipment experiencing a constant failure rate, providing failure-free production for a given time results in greater customer satisfaction than providing a system with a high mean time between failures. A powerful tool in providing failure-free production for a given time is the capability to predict failure modes. In fact, major efforts to increase the mean time between failures while equipment is in a constant-failure-rate mode can result in increased customer frustration. The main task in improving customer satisfaction is identifying the real customer requirements and then providing for those requirements.<>
{"title":"Predicting failure modes to improve reliability","authors":"J.M. Reid","doi":"10.1109/ARMS.1990.68008","DOIUrl":"https://doi.org/10.1109/ARMS.1990.68008","url":null,"abstract":"For equipment experiencing a constant failure rate, providing failure-free production for a given time results in greater customer satisfaction than providing a system with a high mean time between failures. A powerful tool in providing failure-free production for a given time is the capability to predict failure modes. In fact, major efforts to increase the mean time between failures while equipment is in a constant-failure-rate mode can result in increased customer frustration. The main task in improving customer satisfaction is identifying the real customer requirements and then providing for those requirements.<<ETX>>","PeriodicalId":383597,"journal":{"name":"Annual Proceedings on Reliability and Maintainability Symposium","volume":"36 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1990-01-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129732285","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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