Pub Date : 1996-01-22DOI: 10.1109/RAMS.1996.500677
R. W. Sears, A. Mankowski, M.C. Winebarger
Changes in the market for our products, and changes in our customers expectations (i.e. our business environment) will require significant changes in our approach to delivering reliable supportable products if we are to remain competitive. The traditional approaches to supportability engineering (reliability, maintainability and logistics engineering) must evolve to methodologies which are consistent with the emerging environment. Application of new methodologies will require new roles and responsibilities for specialists in the technical disciplines which comprise supportability engineering. To encourage thinking about fresh methodologies, we have examined difficulties associated with the traditional methodologies to determine what must be changed, and have outlined an approach which we believe to be consistent with the emerging environment. In the extreme, we believe that key elements of the traditional process-numerical requirements, predictive analysis and feedback to design, and qualification testing-will have to be abandoned in favor of a process which is highly concurrent with design. We outline trends in the business environment, examine conflicts with key elements of the traditional supportability engineering process, propose an alternative approach; and we show how key elements of the fresh approach support the emerging environment. We conclude with some observations on the roles and responsibilities, and on the skills required in the emerging environment.
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Pub Date : 1996-01-22DOI: 10.1109/RAMS.1996.500655
M. Shooman
This paper develops the probability of error expressions for parity bit codes and a single error correcting-single error detecting code, SECSED. A typical coding and decoding circuit involving standard ICs is developed for a parity bit code and a SECSED code. An expression was developed for the probability of undetected errors based on multiple bit errors or coder chip failure. Under certain conditions of bit transmission rate, B, and bit error probability, q, the simpler parity bit coding scheme is superior to the more complex Hamming code scheme. The general conclusion is that for more complex error detection schemes, one should evaluate the effects of generator and checker failures, since these may be of considerable importance for small values of q.
{"title":"The reliability of error correcting code implementations [IC reliability assessment]","authors":"M. Shooman","doi":"10.1109/RAMS.1996.500655","DOIUrl":"https://doi.org/10.1109/RAMS.1996.500655","url":null,"abstract":"This paper develops the probability of error expressions for parity bit codes and a single error correcting-single error detecting code, SECSED. A typical coding and decoding circuit involving standard ICs is developed for a parity bit code and a SECSED code. An expression was developed for the probability of undetected errors based on multiple bit errors or coder chip failure. Under certain conditions of bit transmission rate, B, and bit error probability, q, the simpler parity bit coding scheme is superior to the more complex Hamming code scheme. The general conclusion is that for more complex error detection schemes, one should evaluate the effects of generator and checker failures, since these may be of considerable importance for small values of q.","PeriodicalId":393833,"journal":{"name":"Proceedings of 1996 Annual Reliability and Maintainability Symposium","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"1996-01-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"114975306","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 1996-01-22DOI: 10.1109/RAMS.1996.500648
L.L. Means
A fault isolation procedure (FIP) was developed using a flow process in order to isolate a leak in the thermal control system (TCS) of the International Space Station Alpha. The FIP developed isolates the leak in less than three hours, while allowing for a rapid restoration of life and station critical functions. The FIP was also used to generate fault isolation times for repairable/replaceable units of the TCS. Documentation of an FIP in a process flow allows for less confusion in following instructions, making easier decisions and generating detailed fault isolation times. The flow process illustrated can be applied to any program in which a FIP is needed.
{"title":"Development of a fault isolation procedure [space station reliability]","authors":"L.L. Means","doi":"10.1109/RAMS.1996.500648","DOIUrl":"https://doi.org/10.1109/RAMS.1996.500648","url":null,"abstract":"A fault isolation procedure (FIP) was developed using a flow process in order to isolate a leak in the thermal control system (TCS) of the International Space Station Alpha. The FIP developed isolates the leak in less than three hours, while allowing for a rapid restoration of life and station critical functions. The FIP was also used to generate fault isolation times for repairable/replaceable units of the TCS. Documentation of an FIP in a process flow allows for less confusion in following instructions, making easier decisions and generating detailed fault isolation times. The flow process illustrated can be applied to any program in which a FIP is needed.","PeriodicalId":393833,"journal":{"name":"Proceedings of 1996 Annual Reliability and Maintainability Symposium","volume":null,"pages":null},"PeriodicalIF":0.0,"publicationDate":"1996-01-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"113963418","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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