A microstep controller of a DC servomotor has been developed for accurate positioning and smooth movement at low-speed rotation. It consists of digital and analog positioning loops. Dividing one period of quadrature sinusoidal signals, generated by an incremental encoder attached to a motor shaft, into four quarter sections, the digital loop controls the movement between the sections. The analog loop divides each section further into N equiangle segments, to control the movement within it. The effective angle resolution is thus 90 degrees /MN, with M being the number of slits etched on an incremental encoder. A prototype controller, assembled using monolithic and hybrid integrated components, has confirmed the principles of operation. Experimental results are presented to demonstrate its capabilities. The positioning accuracy of the prototype controller was 0.009 degrees +or-0.002 degrees .<>
{"title":"A microstep controller of a DC servomotor","authors":"Kenzo Watanabe, M. Suzuki, H. Yokote","doi":"10.1109/IMTC.1990.65959","DOIUrl":"https://doi.org/10.1109/IMTC.1990.65959","url":null,"abstract":"A microstep controller of a DC servomotor has been developed for accurate positioning and smooth movement at low-speed rotation. It consists of digital and analog positioning loops. Dividing one period of quadrature sinusoidal signals, generated by an incremental encoder attached to a motor shaft, into four quarter sections, the digital loop controls the movement between the sections. The analog loop divides each section further into N equiangle segments, to control the movement within it. The effective angle resolution is thus 90 degrees /MN, with M being the number of slits etched on an incremental encoder. A prototype controller, assembled using monolithic and hybrid integrated components, has confirmed the principles of operation. Experimental results are presented to demonstrate its capabilities. The positioning accuracy of the prototype controller was 0.009 degrees +or-0.002 degrees .<<ETX>>","PeriodicalId":404761,"journal":{"name":"7th IEEE Conference on Instrumentation and Measurement Technology","volume":"47 1 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1990-02-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"134051702","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
The authors discuss the architecture of transformer ratio bridges for measuring the loss angles of low-loss dielectrics and describe the development of a sensitive and accurate bridge, capable of measuring loss angles with a sensitivity of 1*10/sup -8/ (S/N=1 at a detector bandwidth of 1 Hz) and an accuracy of a few parts in 10/sup -7/. The bridge is computer controlled and has an automatic capacitive balance. Its main characteristics and their influence on sensitivity and accuracy are discussed. As an example, measurements as functions of temperature and frequency are presented.<>
{"title":"A ratio transformer bridge for the measurement of low-loss tangents","authors":"T. Kwaaitaal, W. van den Eijnden","doi":"10.1109/IMTC.1990.65951","DOIUrl":"https://doi.org/10.1109/IMTC.1990.65951","url":null,"abstract":"The authors discuss the architecture of transformer ratio bridges for measuring the loss angles of low-loss dielectrics and describe the development of a sensitive and accurate bridge, capable of measuring loss angles with a sensitivity of 1*10/sup -8/ (S/N=1 at a detector bandwidth of 1 Hz) and an accuracy of a few parts in 10/sup -7/. The bridge is computer controlled and has an automatic capacitive balance. Its main characteristics and their influence on sensitivity and accuracy are discussed. As an example, measurements as functions of temperature and frequency are presented.<<ETX>>","PeriodicalId":404761,"journal":{"name":"7th IEEE Conference on Instrumentation and Measurement Technology","volume":"28 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1990-02-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"133721716","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
An application of a standard testability bus to the design of a next-generation automatic test system is described. The target system that must be made testable consists of multiple printed circuit boards that can be functionally reconfigured at start-up time via downloading of specific operating parameters to the on-board RAM. The result of the application was the ability to meet the system-level testability specifications, while at the same time reducing the time and cost associated with design verification, logic and fault simulation, capital equipment cost for external ATE (automatic test equipment), and on-going factory and field testing and troubleshooting.<>
{"title":"Standard testability bus-an applications example","authors":"J. Turino","doi":"10.1109/IMTC.1990.65961","DOIUrl":"https://doi.org/10.1109/IMTC.1990.65961","url":null,"abstract":"An application of a standard testability bus to the design of a next-generation automatic test system is described. The target system that must be made testable consists of multiple printed circuit boards that can be functionally reconfigured at start-up time via downloading of specific operating parameters to the on-board RAM. The result of the application was the ability to meet the system-level testability specifications, while at the same time reducing the time and cost associated with design verification, logic and fault simulation, capital equipment cost for external ATE (automatic test equipment), and on-going factory and field testing and troubleshooting.<<ETX>>","PeriodicalId":404761,"journal":{"name":"7th IEEE Conference on Instrumentation and Measurement Technology","volume":"42 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1990-02-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"122217568","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
E. Petriu, M. A. Greenspan, W. S. McMath, S. Yeung
An experimental robotic tactile system is under development to characterize and identify three-dimensional (3-D) objects through a procedure of active sequential exploration. The experimental setup is described, and a data fusion technique for precise object identification is presented. Preliminary test results demonstrate that overlapping tactile exploration allows recovery from sensor/target misalignment, enables improved data correlation, and consequently produces a more precise 3-D object identification. Only quasi-static (static kinesthetic plus robot kinematic) tactile sensing has been considered, with the objective of better establishing global 3-D geometric features of the target object.<>
{"title":"A robotic tactile perception system concept","authors":"E. Petriu, M. A. Greenspan, W. S. McMath, S. Yeung","doi":"10.1109/IMTC.1990.65982","DOIUrl":"https://doi.org/10.1109/IMTC.1990.65982","url":null,"abstract":"An experimental robotic tactile system is under development to characterize and identify three-dimensional (3-D) objects through a procedure of active sequential exploration. The experimental setup is described, and a data fusion technique for precise object identification is presented. Preliminary test results demonstrate that overlapping tactile exploration allows recovery from sensor/target misalignment, enables improved data correlation, and consequently produces a more precise 3-D object identification. Only quasi-static (static kinesthetic plus robot kinematic) tactile sensing has been considered, with the objective of better establishing global 3-D geometric features of the target object.<<ETX>>","PeriodicalId":404761,"journal":{"name":"7th IEEE Conference on Instrumentation and Measurement Technology","volume":"66 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1990-02-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128156407","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
The authors present some TDR (time-domain-reflectometry) applications for complex permittivity measurements for strong polar liquid in the frequency range of 1 to 35 GHz, liquid crystal from 100 kHz to 1 GHz, and ionic microemulsion at frequencies between 30 MHz and 20 GHz. In each case, the necessary TDR techniques for optimal condition are given. The new TDR system (HP54120A+HP54121A) used has excellent stability compared with the earlier TDR system (HP181). It was found that, for methanol, the TDR system implemented can obtain information about the complex permittivity in the frequency range up to 25 GHz with sufficient accuracy and can possibly go up to 35 GHz using a bilinear correction. In the case of the liquid crystal, it is shown that the method is powerful not only in the microwave range but also in the radio frequency range. From the measurement of the ionic microemulsion system, it is clear that the TDR technique is applicable to the measurement of the complex permittivity of a sample with high DC conductivity.<>
{"title":"Measurement of the dielectric properties of materials by using time domain reflectometry","authors":"R. Nozaki, T. Bose","doi":"10.1109/IMTC.1990.66014","DOIUrl":"https://doi.org/10.1109/IMTC.1990.66014","url":null,"abstract":"The authors present some TDR (time-domain-reflectometry) applications for complex permittivity measurements for strong polar liquid in the frequency range of 1 to 35 GHz, liquid crystal from 100 kHz to 1 GHz, and ionic microemulsion at frequencies between 30 MHz and 20 GHz. In each case, the necessary TDR techniques for optimal condition are given. The new TDR system (HP54120A+HP54121A) used has excellent stability compared with the earlier TDR system (HP181). It was found that, for methanol, the TDR system implemented can obtain information about the complex permittivity in the frequency range up to 25 GHz with sufficient accuracy and can possibly go up to 35 GHz using a bilinear correction. In the case of the liquid crystal, it is shown that the method is powerful not only in the microwave range but also in the radio frequency range. From the measurement of the ionic microemulsion system, it is clear that the TDR technique is applicable to the measurement of the complex permittivity of a sample with high DC conductivity.<<ETX>>","PeriodicalId":404761,"journal":{"name":"7th IEEE Conference on Instrumentation and Measurement Technology","volume":"25 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1990-02-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"129041602","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
The authors review the fundamentals of Josephson voltage standards and show how computer control makes these standards simple to use in a variety of applications. It is noted that the accuracy and stability of voltage standards based on the Josephson effect far surpass those of all other voltage-standard devices. The voltage generated is independent of environmental and material characteristics because it is based on a fundamental constant, the ratio of the elementary charge to Planck's constant. International agreement on the value of this constant ensures uniformity and reproducibility throughput the world. In 1990. there are about 25 laboratories in the world with Josephson voltage standard systems. These systems realize the intrinsic definition of the volt with an accuracy that is far above what can be achieved with transfer standards.<>
{"title":"Voltage calibration systems using Josephson junction arrays","authors":"C. Burroughs, C. Hamilton","doi":"10.1109/IMTC.1990.66020","DOIUrl":"https://doi.org/10.1109/IMTC.1990.66020","url":null,"abstract":"The authors review the fundamentals of Josephson voltage standards and show how computer control makes these standards simple to use in a variety of applications. It is noted that the accuracy and stability of voltage standards based on the Josephson effect far surpass those of all other voltage-standard devices. The voltage generated is independent of environmental and material characteristics because it is based on a fundamental constant, the ratio of the elementary charge to Planck's constant. International agreement on the value of this constant ensures uniformity and reproducibility throughput the world. In 1990. there are about 25 laboratories in the world with Josephson voltage standard systems. These systems realize the intrinsic definition of the volt with an accuracy that is far above what can be achieved with transfer standards.<<ETX>>","PeriodicalId":404761,"journal":{"name":"7th IEEE Conference on Instrumentation and Measurement Technology","volume":"2 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1990-02-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132546756","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
A characterization concept for high-speed lightwave components based on high-frequency RF modulation of the test signals is introduced. The concept is first explained by using the example of optical transmission measurements covering optical loss, modulation bandwidth, and length measurements. Subsequently, optical reflection measurements with the capability of separating multiple reflections with millimeter resolution and kilometer range without a dead zone are investigated. In addition, responsivity measurements of electrooptical devices, such as lasers and photodiodes, are investigated.<>
{"title":"Optical measurements based on RF modulation techniques","authors":"Hugo Vifian","doi":"10.1109/IMTC.1990.66033","DOIUrl":"https://doi.org/10.1109/IMTC.1990.66033","url":null,"abstract":"A characterization concept for high-speed lightwave components based on high-frequency RF modulation of the test signals is introduced. The concept is first explained by using the example of optical transmission measurements covering optical loss, modulation bandwidth, and length measurements. Subsequently, optical reflection measurements with the capability of separating multiple reflections with millimeter resolution and kilometer range without a dead zone are investigated. In addition, responsivity measurements of electrooptical devices, such as lasers and photodiodes, are investigated.<<ETX>>","PeriodicalId":404761,"journal":{"name":"7th IEEE Conference on Instrumentation and Measurement Technology","volume":"172 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1990-02-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"132419985","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
The authors have developed a 200-M sample/s digital oscilloscope that realizes the multigate triggering function and incorporates a 32-b RISC-(reduction-instruction-set-computer-) type processor and a floating-point coprocessor to execute various functional calculations and to display data on the screen. They describe a unique waveform triggering system (multigate triggering) and discuss the implementation and applications of a RISC-type processor for sophisticated signal processing functions. Multigate triggering is a real-time qualifying system that enhances the conventional level-crossing trigger. In digital oscilloscopes the digitized data are prestored in acquisition memory before the trigger occurs. In multigate triggering these prestored data are used by the digital comparator array for selecting the desired waveform. The RISC-type processing system has realized fast and accurate computations, including the Hilbert transform and digital filtering.<>
{"title":"New triggering system and signal processing in digital oscilloscopes","authors":"S. Shimada, K. Chujoh, K. Takaoka, S. Miyake","doi":"10.1109/IMTC.1990.65987","DOIUrl":"https://doi.org/10.1109/IMTC.1990.65987","url":null,"abstract":"The authors have developed a 200-M sample/s digital oscilloscope that realizes the multigate triggering function and incorporates a 32-b RISC-(reduction-instruction-set-computer-) type processor and a floating-point coprocessor to execute various functional calculations and to display data on the screen. They describe a unique waveform triggering system (multigate triggering) and discuss the implementation and applications of a RISC-type processor for sophisticated signal processing functions. Multigate triggering is a real-time qualifying system that enhances the conventional level-crossing trigger. In digital oscilloscopes the digitized data are prestored in acquisition memory before the trigger occurs. In multigate triggering these prestored data are used by the digital comparator array for selecting the desired waveform. The RISC-type processing system has realized fast and accurate computations, including the Hilbert transform and digital filtering.<<ETX>>","PeriodicalId":404761,"journal":{"name":"7th IEEE Conference on Instrumentation and Measurement Technology","volume":"23 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1990-02-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"128390831","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
A ratiometric optical proximity sensor which measures the distance between an approaching object and the sensor within a range of 1 cm to about 10 cm is described. With the proposed method, the influence of the reflection coefficient and the orientation of the object is strongly reduced. The sensor can be used in robot grippers and in other applications where contactless measurement of short distances is required. The output of the optical proximity detector depends on the reflectivity of the target material. This dependence can be reduced by using two receivers at some distance apart along the optical axis of the system. The ratio between the two outputs is independent of the reflection coefficient of the target and of the intensity of the power source. The sensitivity of the sensor system and the range are fixed by the geometrical configuration and the radiant properties of the source and detectors. Major design parameters are the angles between the optical axes of the transmitter and receivers and the distances between these optical components. The ratiometric output is achieved by dividing the difference between the two receiver outputs by one of the outputs or their sum. To eliminate the influence of environmental light, it is advisable to use a modulated light source and synchronous detection of the receiver outputs.<>
{"title":"Accurate optical proximity detector","authors":"P. Regtien","doi":"10.1109/IMTC.1990.65984","DOIUrl":"https://doi.org/10.1109/IMTC.1990.65984","url":null,"abstract":"A ratiometric optical proximity sensor which measures the distance between an approaching object and the sensor within a range of 1 cm to about 10 cm is described. With the proposed method, the influence of the reflection coefficient and the orientation of the object is strongly reduced. The sensor can be used in robot grippers and in other applications where contactless measurement of short distances is required. The output of the optical proximity detector depends on the reflectivity of the target material. This dependence can be reduced by using two receivers at some distance apart along the optical axis of the system. The ratio between the two outputs is independent of the reflection coefficient of the target and of the intensity of the power source. The sensitivity of the sensor system and the range are fixed by the geometrical configuration and the radiant properties of the source and detectors. Major design parameters are the angles between the optical axes of the transmitter and receivers and the distances between these optical components. The ratiometric output is achieved by dividing the difference between the two receiver outputs by one of the outputs or their sum. To eliminate the influence of environmental light, it is advisable to use a modulated light source and synchronous detection of the receiver outputs.<<ETX>>","PeriodicalId":404761,"journal":{"name":"7th IEEE Conference on Instrumentation and Measurement Technology","volume":"81 3 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1990-02-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"121095282","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
H. Zaghloul, T.H.T. van Kalleveen, C. Hansen, H. Buckmaster
The authors describe a novel method for the evaluation of the various microwave (MW) mixer diodes which can be used in electron paramagnetic resonance (EPR) spectrometers. The advantage of this method over other methods is that it is optimized for EPR applications and determines the optimum operating conditions for each MW diode. The authors describe the instrumentation and the experimental procedure used and report the results of performing such an evaluation on various MW diodes. The results presented show that some Schottky-barrier diodes perform as well as tunnel diodes in EPR spectrometers using a magnetic field modulation frequency of less than 1 kHz.<>
{"title":"A simple method for the evaluation of microwave mixer diodes","authors":"H. Zaghloul, T.H.T. van Kalleveen, C. Hansen, H. Buckmaster","doi":"10.1109/IMTC.1990.65975","DOIUrl":"https://doi.org/10.1109/IMTC.1990.65975","url":null,"abstract":"The authors describe a novel method for the evaluation of the various microwave (MW) mixer diodes which can be used in electron paramagnetic resonance (EPR) spectrometers. The advantage of this method over other methods is that it is optimized for EPR applications and determines the optimum operating conditions for each MW diode. The authors describe the instrumentation and the experimental procedure used and report the results of performing such an evaluation on various MW diodes. The results presented show that some Schottky-barrier diodes perform as well as tunnel diodes in EPR spectrometers using a magnetic field modulation frequency of less than 1 kHz.<<ETX>>","PeriodicalId":404761,"journal":{"name":"7th IEEE Conference on Instrumentation and Measurement Technology","volume":"187 1","pages":"0"},"PeriodicalIF":0.0,"publicationDate":"1990-02-13","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"116661029","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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