Pub Date : 2023-07-25DOI: 10.3389/aot.2023.1237679
R. Laberdesque, Laura Loi, T. Guérineau, Alain Abou Khalil, S. Danto, T. Cardinal, L. Canioni, Y. Petit
A novel type of waveguide Bragg grating (WBG) is demonstrated based on femtosecond laser-induced Type A refractive index modifications, namely based of the photochemistry of silver species in a specialty ortho-phosphate glass matrix. First-order WBGs are reported in the near-infrared and down to 736 nm in the visible. Relative transmission measurements with a 500 µm long WBGs lead to narrow-bandwidth attenuations (sub-nm spectral FWHM) from 2.29 dB to 6.25 dB for periods from 240 nm to 280 nm, respectively. The corresponding estimated backward coupling coefficients show high values from 1.66 mm-1 up to 2.69 mm-1. Additionally, we report on a true 3D helix-shaped WBG that shows an even stronger relative attenuation of 10.3 dB for a 500 µm long WBG, equivalently corresponding to a backward coupling coefficient of 3.7 mm-1. These novel results pave the way for new silver-based laser-inscribed integrated photonic devices, among which the combination of Bragg gratings to form active/passive optical resonators, but also the direct inscription of WBG at the glass interface for enhanced sensing applications.
{"title":"Three-dimensional femtosecond laser inscription of type a-based high-efficiency first-order waveguide Bragg gratings","authors":"R. Laberdesque, Laura Loi, T. Guérineau, Alain Abou Khalil, S. Danto, T. Cardinal, L. Canioni, Y. Petit","doi":"10.3389/aot.2023.1237679","DOIUrl":"https://doi.org/10.3389/aot.2023.1237679","url":null,"abstract":"A novel type of waveguide Bragg grating (WBG) is demonstrated based on femtosecond laser-induced Type A refractive index modifications, namely based of the photochemistry of silver species in a specialty ortho-phosphate glass matrix. First-order WBGs are reported in the near-infrared and down to 736 nm in the visible. Relative transmission measurements with a 500 µm long WBGs lead to narrow-bandwidth attenuations (sub-nm spectral FWHM) from 2.29 dB to 6.25 dB for periods from 240 nm to 280 nm, respectively. The corresponding estimated backward coupling coefficients show high values from 1.66 mm-1 up to 2.69 mm-1. Additionally, we report on a true 3D helix-shaped WBG that shows an even stronger relative attenuation of 10.3 dB for a 500 µm long WBG, equivalently corresponding to a backward coupling coefficient of 3.7 mm-1. These novel results pave the way for new silver-based laser-inscribed integrated photonic devices, among which the combination of Bragg gratings to form active/passive optical resonators, but also the direct inscription of WBG at the glass interface for enhanced sensing applications.","PeriodicalId":46010,"journal":{"name":"Advanced Optical Technologies","volume":null,"pages":null},"PeriodicalIF":1.8,"publicationDate":"2023-07-25","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"47961548","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2023-07-11DOI: 10.3389/aot.2023.1237524
R. Stoian
Ultrafast lasers are now unanimously recognized as processing tools capable of providing utmost precision. This becomes key in the context of material processing as precise feature scales can render a range of new characteristics to the processed materials. These features redesign their properties optically, mechanically, electrically, or from a chemical point of view. Precision is often accompanied by an increase in resolution. The advances in optical beam engineering and irradiation strategies, alongside with controlled material responses, have put in sight the opportunity to reach record small feature sizes, below 100 nm. Is there an intrinsic limit to optical fabrication? What are the new opportunities provided by laser processing on these scales? How one can make light adapt to matter and at the same time control the matter’s response under light on the smallest scales? In this article I intend to provide a brief overview into the latest developments in ultrafast laser volume nanostructuring, fundamentals and applications alike, stressing out the prospective roadmap and the new potential emerging from super-resolved ultrafast smart laser processing technologies.
{"title":"Ultrafast laser volume nanostructuring; a limitless perspective","authors":"R. Stoian","doi":"10.3389/aot.2023.1237524","DOIUrl":"https://doi.org/10.3389/aot.2023.1237524","url":null,"abstract":"Ultrafast lasers are now unanimously recognized as processing tools capable of providing utmost precision. This becomes key in the context of material processing as precise feature scales can render a range of new characteristics to the processed materials. These features redesign their properties optically, mechanically, electrically, or from a chemical point of view. Precision is often accompanied by an increase in resolution. The advances in optical beam engineering and irradiation strategies, alongside with controlled material responses, have put in sight the opportunity to reach record small feature sizes, below 100 nm. Is there an intrinsic limit to optical fabrication? What are the new opportunities provided by laser processing on these scales? How one can make light adapt to matter and at the same time control the matter’s response under light on the smallest scales? In this article I intend to provide a brief overview into the latest developments in ultrafast laser volume nanostructuring, fundamentals and applications alike, stressing out the prospective roadmap and the new potential emerging from super-resolved ultrafast smart laser processing technologies.","PeriodicalId":46010,"journal":{"name":"Advanced Optical Technologies","volume":null,"pages":null},"PeriodicalIF":1.8,"publicationDate":"2023-07-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"48909714","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Abstract In the field of precision optics, more and more glass materials that are difficult to machine are being used because of their interesting optical properties. At the same time, the geometries are getting more demanding and the tolerances to be achieved are tighter. The establishment of an efficient process chain is therefore becoming an ever-greater challenge. Particularly in the field of CMP, knowledge of the machining properties of pads and slurries are required to design efficient processes. This knowledge has to be gained through time-consuming in-house tests, as the manufacturers of the consumables are usually only able to provide basic data. In addition, the boundary conditions under which the data were collected are often incomplete defined and thus not comparable. The novel methodical procedure presented here for the initial design of CMP processes is based on a standardized procedure for carrying out the tests. From the resulting database, a starting point for the design of own processes can be identified quickly and unerringly. This article describes the structure of the procedure as well as the necessary background. In addition, the visualization and the procedure for selecting start parameters are discussed using an example application.
{"title":"Novel procedure for the identification of a starting point for the CMP","authors":"C. Trum, Sebastian Sitzberger, R. Rascher","doi":"10.1515/aot-2022-0022","DOIUrl":"https://doi.org/10.1515/aot-2022-0022","url":null,"abstract":"Abstract In the field of precision optics, more and more glass materials that are difficult to machine are being used because of their interesting optical properties. At the same time, the geometries are getting more demanding and the tolerances to be achieved are tighter. The establishment of an efficient process chain is therefore becoming an ever-greater challenge. Particularly in the field of CMP, knowledge of the machining properties of pads and slurries are required to design efficient processes. This knowledge has to be gained through time-consuming in-house tests, as the manufacturers of the consumables are usually only able to provide basic data. In addition, the boundary conditions under which the data were collected are often incomplete defined and thus not comparable. The novel methodical procedure presented here for the initial design of CMP processes is based on a standardized procedure for carrying out the tests. From the resulting database, a starting point for the design of own processes can be identified quickly and unerringly. This article describes the structure of the procedure as well as the necessary background. In addition, the visualization and the procedure for selecting start parameters are discussed using an example application.","PeriodicalId":46010,"journal":{"name":"Advanced Optical Technologies","volume":null,"pages":null},"PeriodicalIF":1.8,"publicationDate":"2022-10-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"43022068","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Julia S. Kroisamer, F. Felberer, T. Klein, D. C. Adler, F. Trépanier, C. Eigenwillig, S. Karpf, J. M. Schmitt, R. Huber
{"title":"EOS annual meeting EOSAM 2022","authors":"Julia S. Kroisamer, F. Felberer, T. Klein, D. C. Adler, F. Trépanier, C. Eigenwillig, S. Karpf, J. M. Schmitt, R. Huber","doi":"10.1515/aot-2022-0036","DOIUrl":"https://doi.org/10.1515/aot-2022-0036","url":null,"abstract":"","PeriodicalId":46010,"journal":{"name":"Advanced Optical Technologies","volume":null,"pages":null},"PeriodicalIF":1.8,"publicationDate":"2022-10-12","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"49393669","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
P. Marsik, R. de Andrés Prada, Andreana Daniil, C. Bernhard
Abstract We performed infrared and time-domain terahertz spectroscopic ellipsometry measurements of thin films of the perovskite antiferromagnetic insulator SrMnO3 that were grown by pulsed laser deposition (PLD) on LaAlO3, SrLaGaO4, and LSAT substrates which yield an epitaxial strain ranging from −0.3 to 1.7%. Taking these thin films as a representative example, we discuss the strategies for analyzing the ellipsometry spectra and extracting the information about the thin film dielectric response that can be equally applied to a variety of oxide based thin films and heterostructures. In particular, for the room temperature spectra we show that the three infrared-active phonon modes of the cubic perovskite structure of SrMnO3 undergo the expected softening with increasing tensile strain. For the SrMnO3 film on SrLaGaO4, we find that the low-energy (TO1) phonon mode reveals anomalous temperature dependence in the vicinity of the Néel temperature of about 170 K that signifies a strong spin-phonon coupling. For the SrMnO3 film on LSAT, we identify some irreversible changes of the infrared ellipsometry spectra that occur as the sample is heated to elevated temperature up to 560 K. These changes of the ellipsometry spectra have been attributed to a partial oxygen loss of the SrMnO3 thin film since they can be reverted with a post annealing treatment under high oxygen pressure.
{"title":"Ellipsometry study of the infrared-active phonon modes in strained SrMnO3 thin films","authors":"P. Marsik, R. de Andrés Prada, Andreana Daniil, C. Bernhard","doi":"10.1515/aot-2022-0009","DOIUrl":"https://doi.org/10.1515/aot-2022-0009","url":null,"abstract":"Abstract We performed infrared and time-domain terahertz spectroscopic ellipsometry measurements of thin films of the perovskite antiferromagnetic insulator SrMnO3 that were grown by pulsed laser deposition (PLD) on LaAlO3, SrLaGaO4, and LSAT substrates which yield an epitaxial strain ranging from −0.3 to 1.7%. Taking these thin films as a representative example, we discuss the strategies for analyzing the ellipsometry spectra and extracting the information about the thin film dielectric response that can be equally applied to a variety of oxide based thin films and heterostructures. In particular, for the room temperature spectra we show that the three infrared-active phonon modes of the cubic perovskite structure of SrMnO3 undergo the expected softening with increasing tensile strain. For the SrMnO3 film on SrLaGaO4, we find that the low-energy (TO1) phonon mode reveals anomalous temperature dependence in the vicinity of the Néel temperature of about 170 K that signifies a strong spin-phonon coupling. For the SrMnO3 film on LSAT, we identify some irreversible changes of the infrared ellipsometry spectra that occur as the sample is heated to elevated temperature up to 560 K. These changes of the ellipsometry spectra have been attributed to a partial oxygen loss of the SrMnO3 thin film since they can be reverted with a post annealing treatment under high oxygen pressure.","PeriodicalId":46010,"journal":{"name":"Advanced Optical Technologies","volume":null,"pages":null},"PeriodicalIF":1.8,"publicationDate":"2022-08-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"48705285","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Abstract A method for the evaluation of experimental data from spectroscopic ellipsometry is proposed which combines the global-search optimization algorithm with statistical model selection criteria. The hybrid genetic-gradient search algorithm (HGGA) is applied to find the optical parameters and thickness of a diamond-like carbon (DLC) coating deposited on SW7M stainless steel. Akaike and Bayesian information criteria are used to evaluate the different dielectric function models. The method is able to find optical model parameters even in case of a limited initial knowledge about the material optical constants. At the same time, the optimal dielectric function model for the description of the material optical properties can be selected unambiguously from the set of candidate models.
{"title":"Combination of a global-search method with model selection criteria for the ellipsometric data evaluation of DLC coatings","authors":"K. Dorywalski, O. Lupicka, M. Grundmann, C. Sturm","doi":"10.1515/aot-2022-0014","DOIUrl":"https://doi.org/10.1515/aot-2022-0014","url":null,"abstract":"Abstract A method for the evaluation of experimental data from spectroscopic ellipsometry is proposed which combines the global-search optimization algorithm with statistical model selection criteria. The hybrid genetic-gradient search algorithm (HGGA) is applied to find the optical parameters and thickness of a diamond-like carbon (DLC) coating deposited on SW7M stainless steel. Akaike and Bayesian information criteria are used to evaluate the different dielectric function models. The method is able to find optical model parameters even in case of a limited initial knowledge about the material optical constants. At the same time, the optimal dielectric function model for the description of the material optical properties can be selected unambiguously from the set of candidate models.","PeriodicalId":46010,"journal":{"name":"Advanced Optical Technologies","volume":null,"pages":null},"PeriodicalIF":1.8,"publicationDate":"2022-07-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"45415804","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Conference and trade show reports","authors":"","doi":"10.1515/aot-2022-0026","DOIUrl":"https://doi.org/10.1515/aot-2022-0026","url":null,"abstract":"","PeriodicalId":46010,"journal":{"name":"Advanced Optical Technologies","volume":null,"pages":null},"PeriodicalIF":1.8,"publicationDate":"2022-07-14","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"44196125","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"Ellipsometry and polarimetry – classical measurement techniques with always new developments, concepts, and applications","authors":"R. Schmidt‐Grund, C. Sturm, A. Hertwig","doi":"10.1515/aot-2022-0025","DOIUrl":"https://doi.org/10.1515/aot-2022-0025","url":null,"abstract":"","PeriodicalId":46010,"journal":{"name":"Advanced Optical Technologies","volume":null,"pages":null},"PeriodicalIF":1.8,"publicationDate":"2022-07-11","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"47467067","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Abstract Dielectric function representation by a variety of polynomial spline functions provides a consistent and efficient method for accurate modeling of the material optical properties in the context of spectroscopic ellipsometry data interpretation. Splines as an elegant and purely mathematical way for such modeling task were introduced about three decades ago. In the following years the use of splines in the area of ellipsometric data analysis became widely utilized. The goal of this review is to provide a self-contained presentation on the current status of the dielectric function modeling by splines for advanced industrial ellipsometry users but, hopefully, it can be useful for some scholarly users as well. It is also intended to promote more extended recognition of the spline-based modeling among optical metrology professionals. Here, a brief description of different ways, – ordinary polynomials, piecewise polynomials (splines), and B(asis)-spline functions, – is presented to parameterize an arbitrary function which can be used as an analytic representation of the dielectric-function curves. A number of particular polynomial-based models for the optical functions of materials and how they may be used in applications are also discussed. Particular attention is paid to different concepts of the efficient and optimal spline construction.
{"title":"Certain topics in ellipsometric data modeling with splines: a review of recent developments","authors":"D. Likhachev","doi":"10.1515/aot-2022-0006","DOIUrl":"https://doi.org/10.1515/aot-2022-0006","url":null,"abstract":"Abstract Dielectric function representation by a variety of polynomial spline functions provides a consistent and efficient method for accurate modeling of the material optical properties in the context of spectroscopic ellipsometry data interpretation. Splines as an elegant and purely mathematical way for such modeling task were introduced about three decades ago. In the following years the use of splines in the area of ellipsometric data analysis became widely utilized. The goal of this review is to provide a self-contained presentation on the current status of the dielectric function modeling by splines for advanced industrial ellipsometry users but, hopefully, it can be useful for some scholarly users as well. It is also intended to promote more extended recognition of the spline-based modeling among optical metrology professionals. Here, a brief description of different ways, – ordinary polynomials, piecewise polynomials (splines), and B(asis)-spline functions, – is presented to parameterize an arbitrary function which can be used as an analytic representation of the dielectric-function curves. A number of particular polynomial-based models for the optical functions of materials and how they may be used in applications are also discussed. Particular attention is paid to different concepts of the efficient and optimal spline construction.","PeriodicalId":46010,"journal":{"name":"Advanced Optical Technologies","volume":null,"pages":null},"PeriodicalIF":1.8,"publicationDate":"2022-07-04","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"67327968","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
京公网安备 11010802042870号
京ICP备2023020795号-1
扫码关注我们
求助内容：
应助结果提醒方式：