T. Okuyama, Akinori Nakamura, K. Ohta, K. Matsuyama, H. Muto
{"title":"PM-15 ZnO nanoparticles with fluorescent properties suitable for modification on protein surfaces.","authors":"T. Okuyama, Akinori Nakamura, K. Ohta, K. Matsuyama, H. Muto","doi":"10.1093/jmicro/dfz096","DOIUrl":"https://doi.org/10.1093/jmicro/dfz096","url":null,"abstract":"","PeriodicalId":48655,"journal":{"name":"Microscopy","volume":" ","pages":""},"PeriodicalIF":1.8,"publicationDate":"2019-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1093/jmicro/dfz096","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"46340882","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Tomofumi Kurogane, Daisuke Tamaoki, S. Yano, Fumiaki Tanigaki, T. Shimazu, H. Kasahara, D. Yamauchi, K. Uesugi, M. Hoshino, S. Kamisaka, Y. Mineyuki, I. Karahara
{"title":"PB-11 3D-Modeling of Arabidopsis Root System Architecture by X-ray Micro-CT at SPring-8: Observation at Different Experimental Hutches","authors":"Tomofumi Kurogane, Daisuke Tamaoki, S. Yano, Fumiaki Tanigaki, T. Shimazu, H. Kasahara, D. Yamauchi, K. Uesugi, M. Hoshino, S. Kamisaka, Y. Mineyuki, I. Karahara","doi":"10.1093/jmicro/dfz076","DOIUrl":"https://doi.org/10.1093/jmicro/dfz076","url":null,"abstract":"","PeriodicalId":48655,"journal":{"name":"Microscopy","volume":" ","pages":""},"PeriodicalIF":1.8,"publicationDate":"2019-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1093/jmicro/dfz076","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"43739960","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"PM-14 Three Dimensional Observations and Quantitative Analysis of Functional Polymer Materials","authors":"F. Uehara, Masayo Muraoka, N. Kaneko, Y. Otsuka","doi":"10.1093/jmicro/dfz103","DOIUrl":"https://doi.org/10.1093/jmicro/dfz103","url":null,"abstract":"","PeriodicalId":48655,"journal":{"name":"Microscopy","volume":" ","pages":""},"PeriodicalIF":1.8,"publicationDate":"2019-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1093/jmicro/dfz103","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"45959786","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"LS-1 Local electronic structure analysis and its mapping by STEM-EELS","authors":"M. Haruta","doi":"10.1093/jmicro/dfz045","DOIUrl":"https://doi.org/10.1093/jmicro/dfz045","url":null,"abstract":"","PeriodicalId":48655,"journal":{"name":"Microscopy","volume":" ","pages":""},"PeriodicalIF":1.8,"publicationDate":"2019-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1093/jmicro/dfz045","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"42093216","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Ryōta Yamamoto, K. Hagita, Kazuya Morishita, Hirofumi Senga, T. Tominaga, H. Jinnai
{"title":"PM-12 3D-structural distributions of silica aggregates in styrene-butadiene rubber obtained by FIB-SEM","authors":"Ryōta Yamamoto, K. Hagita, Kazuya Morishita, Hirofumi Senga, T. Tominaga, H. Jinnai","doi":"10.1093/jmicro/dfz104","DOIUrl":"https://doi.org/10.1093/jmicro/dfz104","url":null,"abstract":"","PeriodicalId":48655,"journal":{"name":"Microscopy","volume":" ","pages":""},"PeriodicalIF":1.8,"publicationDate":"2019-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1093/jmicro/dfz104","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"48827469","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"SM-3 Noise Reduction Method Based on Machine Learnings for Electron Holography","authors":"Y. Asari","doi":"10.1093/jmicro/dfz056","DOIUrl":"https://doi.org/10.1093/jmicro/dfz056","url":null,"abstract":"","PeriodicalId":48655,"journal":{"name":"Microscopy","volume":" ","pages":""},"PeriodicalIF":1.8,"publicationDate":"2019-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1093/jmicro/dfz056","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"45407571","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"PM-13 Three-dimensional analysis of porous material by FIB/SEM and correlation with physical property measurement","authors":"Kazumi Takahashi, S. Yoshimoto, Y. Otsuka","doi":"10.1093/jmicro/dfz098","DOIUrl":"https://doi.org/10.1093/jmicro/dfz098","url":null,"abstract":"","PeriodicalId":48655,"journal":{"name":"Microscopy","volume":" ","pages":""},"PeriodicalIF":1.8,"publicationDate":"2019-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1093/jmicro/dfz098","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"47006447","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"K-1 Road to Electron Microscope Development","authors":"K. Fukushima","doi":"10.1093/jmicro/dfz039","DOIUrl":"https://doi.org/10.1093/jmicro/dfz039","url":null,"abstract":"","PeriodicalId":48655,"journal":{"name":"Microscopy","volume":"150 1","pages":""},"PeriodicalIF":1.8,"publicationDate":"2019-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1093/jmicro/dfz039","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"60941679","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"PM-22 Surveillance study on the SI-traceable nanometrology by transmission electron microscopy (TEM) and trial fabrication of reference materials for TEM","authors":"Keita Kobayashi","doi":"10.1093/jmicro/dfz089","DOIUrl":"https://doi.org/10.1093/jmicro/dfz089","url":null,"abstract":"","PeriodicalId":48655,"journal":{"name":"Microscopy","volume":" ","pages":""},"PeriodicalIF":1.8,"publicationDate":"2019-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1093/jmicro/dfz089","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"48312927","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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