{"title":"PM-22 Surveillance study on the SI-traceable nanometrology by transmission electron microscopy (TEM) and trial fabrication of reference materials for TEM","authors":"Keita Kobayashi","doi":"10.1093/jmicro/dfz089","DOIUrl":"https://doi.org/10.1093/jmicro/dfz089","url":null,"abstract":"","PeriodicalId":48655,"journal":{"name":"Microscopy","volume":null,"pages":null},"PeriodicalIF":1.8,"publicationDate":"2019-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1093/jmicro/dfz089","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"48312927","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Ryōta Yamamoto, K. Hagita, Kazuya Morishita, Hirofumi Senga, T. Tominaga, H. Jinnai
{"title":"PM-12 3D-structural distributions of silica aggregates in styrene-butadiene rubber obtained by FIB-SEM","authors":"Ryōta Yamamoto, K. Hagita, Kazuya Morishita, Hirofumi Senga, T. Tominaga, H. Jinnai","doi":"10.1093/jmicro/dfz104","DOIUrl":"https://doi.org/10.1093/jmicro/dfz104","url":null,"abstract":"","PeriodicalId":48655,"journal":{"name":"Microscopy","volume":null,"pages":null},"PeriodicalIF":1.8,"publicationDate":"2019-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1093/jmicro/dfz104","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"48827469","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"PM-13 Three-dimensional analysis of porous material by FIB/SEM and correlation with physical property measurement","authors":"Kazumi Takahashi, S. Yoshimoto, Y. Otsuka","doi":"10.1093/jmicro/dfz098","DOIUrl":"https://doi.org/10.1093/jmicro/dfz098","url":null,"abstract":"","PeriodicalId":48655,"journal":{"name":"Microscopy","volume":null,"pages":null},"PeriodicalIF":1.8,"publicationDate":"2019-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1093/jmicro/dfz098","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"47006447","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"SM-3 Noise Reduction Method Based on Machine Learnings for Electron Holography","authors":"Y. Asari","doi":"10.1093/jmicro/dfz056","DOIUrl":"https://doi.org/10.1093/jmicro/dfz056","url":null,"abstract":"","PeriodicalId":48655,"journal":{"name":"Microscopy","volume":null,"pages":null},"PeriodicalIF":1.8,"publicationDate":"2019-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1093/jmicro/dfz056","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"45407571","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"LS-1 Local electronic structure analysis and its mapping by STEM-EELS","authors":"M. Haruta","doi":"10.1093/jmicro/dfz045","DOIUrl":"https://doi.org/10.1093/jmicro/dfz045","url":null,"abstract":"","PeriodicalId":48655,"journal":{"name":"Microscopy","volume":null,"pages":null},"PeriodicalIF":1.8,"publicationDate":"2019-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1093/jmicro/dfz045","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"42093216","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Hiroyuki Yamada, Kinuyo Chikamastu, A. Aono, K. Murata, N. Miyazaki, Yoko Kayama, N. Fujiwara, S. Maeda, S. Mitarai
{"title":"PB-01 Comparison of the fundamental cell morphological properties examined with whole-mount ice-embedded cryo-TEM between 5 genera in family Mycobacteriacea","authors":"Hiroyuki Yamada, Kinuyo Chikamastu, A. Aono, K. Murata, N. Miyazaki, Yoko Kayama, N. Fujiwara, S. Maeda, S. Mitarai","doi":"10.1093/jmicro/dfz084","DOIUrl":"https://doi.org/10.1093/jmicro/dfz084","url":null,"abstract":"","PeriodicalId":48655,"journal":{"name":"Microscopy","volume":null,"pages":null},"PeriodicalIF":1.8,"publicationDate":"2019-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1093/jmicro/dfz084","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"47994426","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Kohki Konishi, M. Mimura, T. Nonaka, I. Sase, K. Ohta, H. Nishioka, M. Suga
{"title":"SC-2 Segmentation Method of Three Dimensional SEM Images of Biological Tissue","authors":"Kohki Konishi, M. Mimura, T. Nonaka, I. Sase, K. Ohta, H. Nishioka, M. Suga","doi":"10.1093/jmicro/dfz053","DOIUrl":"https://doi.org/10.1093/jmicro/dfz053","url":null,"abstract":"","PeriodicalId":48655,"journal":{"name":"Microscopy","volume":null,"pages":null},"PeriodicalIF":1.8,"publicationDate":"2019-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1093/jmicro/dfz053","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"48018704","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
{"title":"K-1 Road to Electron Microscope Development","authors":"K. Fukushima","doi":"10.1093/jmicro/dfz039","DOIUrl":"https://doi.org/10.1093/jmicro/dfz039","url":null,"abstract":"","PeriodicalId":48655,"journal":{"name":"Microscopy","volume":null,"pages":null},"PeriodicalIF":1.8,"publicationDate":"2019-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1093/jmicro/dfz039","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"60941679","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
K. Ngo-Huynh, T. Okuyama, Koreaki Koizumi, M. Kudo
{"title":"PM-10 Effect of microstructure on creep property of W-added heat resistant cast steel","authors":"K. Ngo-Huynh, T. Okuyama, Koreaki Koizumi, M. Kudo","doi":"10.1093/jmicro/dfz094","DOIUrl":"https://doi.org/10.1093/jmicro/dfz094","url":null,"abstract":"","PeriodicalId":48655,"journal":{"name":"Microscopy","volume":null,"pages":null},"PeriodicalIF":1.8,"publicationDate":"2019-11-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"https://sci-hub-pdf.com/10.1093/jmicro/dfz094","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"45375741","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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