首页 > 最新文献

IEEE Design & Test最新文献

英文 中文
Testing for Electromigration in Sub-5nm FinFET Memories 5 纳米以下 FinFET 存储器的电迁移测试
IF 2 4区 工程技术 Q3 COMPUTER SCIENCE, HARDWARE & ARCHITECTURE Pub Date : 2024-06-10 DOI: 10.1109/mdat.2024.3411527
Mahta Mayahinia, Mehdi Tahoori, Grigor Tshagharyan, Karen Amirkhanyan, Artur Ghukasyan, Gurgen Harutyunyan, Yervant Zorian
{"title":"Testing for Electromigration in Sub-5nm FinFET Memories","authors":"Mahta Mayahinia, Mehdi Tahoori, Grigor Tshagharyan, Karen Amirkhanyan, Artur Ghukasyan, Gurgen Harutyunyan, Yervant Zorian","doi":"10.1109/mdat.2024.3411527","DOIUrl":"https://doi.org/10.1109/mdat.2024.3411527","url":null,"abstract":"","PeriodicalId":48917,"journal":{"name":"IEEE Design & Test","volume":"7 1","pages":""},"PeriodicalIF":2.0,"publicationDate":"2024-06-10","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"141938732","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Virtualizing USB Kernel Mode Debug (KMD) Class to Guest OS for native OS like debug experience. 将 USB 内核模式调试 (KMD) 类虚拟化到客户操作系统,以获得类似本地操作系统的调试体验。
IF 2 4区 工程技术 Q3 COMPUTER SCIENCE, HARDWARE & ARCHITECTURE Pub Date : 2024-06-04 DOI: 10.1109/mdat.2024.3409196
Rajaram Regupathy, Bhat M Uday, Nataraj Deshpande, Brandon Breitenstein, Mathias Nyman
{"title":"Virtualizing USB Kernel Mode Debug (KMD) Class to Guest OS for native OS like debug experience.","authors":"Rajaram Regupathy, Bhat M Uday, Nataraj Deshpande, Brandon Breitenstein, Mathias Nyman","doi":"10.1109/mdat.2024.3409196","DOIUrl":"https://doi.org/10.1109/mdat.2024.3409196","url":null,"abstract":"","PeriodicalId":48917,"journal":{"name":"IEEE Design & Test","volume":"141 1","pages":""},"PeriodicalIF":2.0,"publicationDate":"2024-06-04","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"141938874","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Open-Source Multilevel Converter Power IC Design and Test 开源多电平转换器功率集成电路设计与测试
IF 2 4区 工程技术 Q3 COMPUTER SCIENCE, HARDWARE & ARCHITECTURE Pub Date : 2024-05-27 DOI: 10.1109/mdat.2024.3405892
Jorge Marin, Joel Gak, Christian A. Rojas, Alan H. Wilson-Veas, Nicolas Calarco, Matias Miguez, Alejandro R. Oliva, Nelson Salvador
{"title":"Open-Source Multilevel Converter Power IC Design and Test","authors":"Jorge Marin, Joel Gak, Christian A. Rojas, Alan H. Wilson-Veas, Nicolas Calarco, Matias Miguez, Alejandro R. Oliva, Nelson Salvador","doi":"10.1109/mdat.2024.3405892","DOIUrl":"https://doi.org/10.1109/mdat.2024.3405892","url":null,"abstract":"","PeriodicalId":48917,"journal":{"name":"IEEE Design & Test","volume":"15 1","pages":""},"PeriodicalIF":2.0,"publicationDate":"2024-05-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"141171655","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Leveraging Generative AI for Rapid Design and Verification of a Vector Processor SoC 利用生成式人工智能快速设计和验证矢量处理器 SoC
IF 2 4区 工程技术 Q3 COMPUTER SCIENCE, HARDWARE & ARCHITECTURE Pub Date : 2024-05-22 DOI: 10.1109/mdat.2024.3404117
William Salcedo, Courtney McBeth, Sara Achour
{"title":"Leveraging Generative AI for Rapid Design and Verification of a Vector Processor SoC","authors":"William Salcedo, Courtney McBeth, Sara Achour","doi":"10.1109/mdat.2024.3404117","DOIUrl":"https://doi.org/10.1109/mdat.2024.3404117","url":null,"abstract":"","PeriodicalId":48917,"journal":{"name":"IEEE Design & Test","volume":"48 1","pages":""},"PeriodicalIF":2.0,"publicationDate":"2024-05-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"141150677","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Soft and Hard Error Correction Techniques in STT-MRAM STT-MRAM 中的软硬纠错技术
IF 2 4区 工程技术 Q3 COMPUTER SCIENCE, HARDWARE & ARCHITECTURE Pub Date : 2024-05-01 DOI: 10.1109/mdat.2024.3395972
Surendra Hemaram, Mehdi B Tahoori, Francky Catthoor, Siddharth Rao, Sebastien Couet, Valerio Pica, Gouri Sankar Kar
{"title":"Soft and Hard Error Correction Techniques in STT-MRAM","authors":"Surendra Hemaram, Mehdi B Tahoori, Francky Catthoor, Siddharth Rao, Sebastien Couet, Valerio Pica, Gouri Sankar Kar","doi":"10.1109/mdat.2024.3395972","DOIUrl":"https://doi.org/10.1109/mdat.2024.3395972","url":null,"abstract":"","PeriodicalId":48917,"journal":{"name":"IEEE Design & Test","volume":"17 1","pages":""},"PeriodicalIF":2.0,"publicationDate":"2024-05-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"140830988","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Secure FFT IP using C way Partitioning based Obfuscation and Fingerprint 使用基于 C 语言分区的混淆和指纹技术确保 FFT IP 安全
IF 2 4区 工程技术 Q3 COMPUTER SCIENCE, HARDWARE & ARCHITECTURE Pub Date : 2024-05-01 DOI: 10.1109/mdat.2024.3395981
Anirban Sengupta, Rahul Chaurasia
{"title":"Secure FFT IP using C way Partitioning based Obfuscation and Fingerprint","authors":"Anirban Sengupta, Rahul Chaurasia","doi":"10.1109/mdat.2024.3395981","DOIUrl":"https://doi.org/10.1109/mdat.2024.3395981","url":null,"abstract":"","PeriodicalId":48917,"journal":{"name":"IEEE Design & Test","volume":"61 1","pages":""},"PeriodicalIF":2.0,"publicationDate":"2024-05-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"140830977","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Crypto-DSEDA: A Domain-specific EDA Flow for CiM-based Cryptographic Accelerators Crypto-DSEDA:基于 CiM 的密码加速器的特定领域 EDA 流程
IF 2 4区 工程技术 Q3 COMPUTER SCIENCE, HARDWARE & ARCHITECTURE Pub Date : 2024-05-01 DOI: 10.1109/mdat.2024.3395987
Rui Liu, Zerun Li, Xiaoyu Zhang, Wanqian Li, Libo Shen, Rui Tang, Zhejian Luo, Xiaoming Chen, Yinhe Han, Minghua Tang
{"title":"Crypto-DSEDA: A Domain-specific EDA Flow for CiM-based Cryptographic Accelerators","authors":"Rui Liu, Zerun Li, Xiaoyu Zhang, Wanqian Li, Libo Shen, Rui Tang, Zhejian Luo, Xiaoming Chen, Yinhe Han, Minghua Tang","doi":"10.1109/mdat.2024.3395987","DOIUrl":"https://doi.org/10.1109/mdat.2024.3395987","url":null,"abstract":"","PeriodicalId":48917,"journal":{"name":"IEEE Design & Test","volume":"40 1","pages":""},"PeriodicalIF":2.0,"publicationDate":"2024-05-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"140830982","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Niklaus Wirth (1934–2024)—An Appreciation 尼克劳斯-沃思(1934-2024)--赏析
IF 2 4区 工程技术 Q3 COMPUTER SCIENCE, HARDWARE & ARCHITECTURE Pub Date : 2024-04-23 DOI: 10.1109/mdat.2024.3371372
Scott Davidson
Niklaus Wirth, the inventor of the languages Pascal and Modula, passed away on 1 January 2024, in Zurich. He was 89. His work, at the dawn of the structured programming revolution, affected many computer scientists deeply, and, I think, was a driver for our being able to produce amounts of working code that would be unimaginable in the 1960 s.
帕斯卡尔语言(Pascal)和莫杜拉语言(Modula)的发明者尼克劳斯-沃思(Niklaus Wirth)于 2024 年 1 月 1 日在苏黎世去世。享年 89 岁。他在结构化编程革命之初所做的工作深深影响了许多计算机科学家,我认为,他是我们能够生成大量工作代码的推动力,这在 20 世纪 60 年代是不可想象的。
{"title":"Niklaus Wirth (1934–2024)—An Appreciation","authors":"Scott Davidson","doi":"10.1109/mdat.2024.3371372","DOIUrl":"https://doi.org/10.1109/mdat.2024.3371372","url":null,"abstract":"Niklaus Wirth, the inventor of the languages Pascal and Modula, passed away on 1 January 2024, in Zurich. He was 89. His work, at the dawn of the structured programming revolution, affected many computer scientists deeply, and, I think, was a driver for our being able to produce amounts of working code that would be unimaginable in the 1960 s.","PeriodicalId":48917,"journal":{"name":"IEEE Design & Test","volume":"33 1","pages":""},"PeriodicalIF":2.0,"publicationDate":"2024-04-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"140800791","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
IEEE Design & Test Publication Information IEEE 设计与测试出版物信息
IF 2 4区 工程技术 Q3 COMPUTER SCIENCE, HARDWARE & ARCHITECTURE Pub Date : 2024-04-23 DOI: 10.1109/mdat.2024.3372179
{"title":"IEEE Design & Test Publication Information","authors":"","doi":"10.1109/mdat.2024.3372179","DOIUrl":"https://doi.org/10.1109/mdat.2024.3372179","url":null,"abstract":"","PeriodicalId":48917,"journal":{"name":"IEEE Design & Test","volume":"33 1","pages":""},"PeriodicalIF":2.0,"publicationDate":"2024-04-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"140800724","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
Robust and Secure Systems 稳健安全的系统
IF 2 4区 工程技术 Q3 COMPUTER SCIENCE, HARDWARE & ARCHITECTURE Pub Date : 2024-04-23 DOI: 10.1109/mdat.2024.3373750
Partha Pratim Pande
This Issue Consists of general interest articles. We also have one conference report in this issue.
本期内容包括一般趣味文章。本期还有一篇会议报告。
{"title":"Robust and Secure Systems","authors":"Partha Pratim Pande","doi":"10.1109/mdat.2024.3373750","DOIUrl":"https://doi.org/10.1109/mdat.2024.3373750","url":null,"abstract":"<fig orientation=\"portrait\" position=\"float\" xmlns:mml=\"http://www.w3.org/1998/Math/MathML\" xmlns:xlink=\"http://www.w3.org/1999/xlink\"> <graphic orientation=\"portrait\" position=\"float\" xlink:href=\"pande-3373750.tif\"/> </fig> This Issue Consists of general interest articles. We also have one conference report in this issue.","PeriodicalId":48917,"journal":{"name":"IEEE Design & Test","volume":"50 1","pages":""},"PeriodicalIF":2.0,"publicationDate":"2024-04-23","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"140800792","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
引用次数: 0
期刊
IEEE Design & Test
全部 Acc. Chem. Res. ACS Applied Bio Materials ACS Appl. Electron. Mater. ACS Appl. Energy Mater. ACS Appl. Mater. Interfaces ACS Appl. Nano Mater. ACS Appl. Polym. Mater. ACS BIOMATER-SCI ENG ACS Catal. ACS Cent. Sci. ACS Chem. Biol. ACS Chemical Health & Safety ACS Chem. Neurosci. ACS Comb. Sci. ACS Earth Space Chem. ACS Energy Lett. ACS Infect. Dis. ACS Macro Lett. ACS Mater. Lett. ACS Med. Chem. Lett. ACS Nano ACS Omega ACS Photonics ACS Sens. ACS Sustainable Chem. Eng. ACS Synth. Biol. Anal. Chem. BIOCHEMISTRY-US Bioconjugate Chem. BIOMACROMOLECULES Chem. Res. Toxicol. Chem. Rev. Chem. Mater. CRYST GROWTH DES ENERG FUEL Environ. Sci. Technol. Environ. Sci. Technol. Lett. Eur. J. Inorg. Chem. IND ENG CHEM RES Inorg. Chem. J. Agric. Food. Chem. J. Chem. Eng. Data J. Chem. Educ. J. Chem. Inf. Model. J. Chem. Theory Comput. J. Med. Chem. J. Nat. Prod. J PROTEOME RES J. Am. Chem. Soc. LANGMUIR MACROMOLECULES Mol. Pharmaceutics Nano Lett. Org. Lett. ORG PROCESS RES DEV ORGANOMETALLICS J. Org. Chem. J. Phys. Chem. J. Phys. Chem. A J. Phys. Chem. B J. Phys. Chem. C J. Phys. Chem. Lett. Analyst Anal. Methods Biomater. Sci. Catal. Sci. Technol. Chem. Commun. Chem. Soc. Rev. CHEM EDUC RES PRACT CRYSTENGCOMM Dalton Trans. Energy Environ. Sci. ENVIRON SCI-NANO ENVIRON SCI-PROC IMP ENVIRON SCI-WAT RES Faraday Discuss. Food Funct. Green Chem. Inorg. Chem. Front. Integr. Biol. J. Anal. At. Spectrom. J. Mater. Chem. A J. Mater. Chem. B J. Mater. Chem. C Lab Chip Mater. Chem. Front. Mater. Horiz. MEDCHEMCOMM Metallomics Mol. Biosyst. Mol. Syst. Des. Eng. Nanoscale Nanoscale Horiz. Nat. Prod. Rep. New J. Chem. Org. Biomol. Chem. Org. Chem. Front. PHOTOCH PHOTOBIO SCI PCCP Polym. Chem.
×
引用
GB/T 7714-2015
复制
MLA
复制
APA
复制
导出至
BibTeX EndNote RefMan NoteFirst NoteExpress
×
0
微信
客服QQ
Book学术公众号 扫码关注我们
反馈
×
意见反馈
请填写您的意见或建议
请填写您的手机或邮箱
×
提示
您的信息不完整,为了账户安全,请先补充。
现在去补充
×
提示
您因"违规操作"
具体请查看互助需知
我知道了
×
提示
现在去查看 取消
×
提示
确定
Book学术官方微信
Book学术文献互助
Book学术文献互助群
群 号:481959085
Book学术
文献互助 智能选刊 最新文献 互助须知 联系我们:info@booksci.cn
Book学术提供免费学术资源搜索服务,方便国内外学者检索中英文文献。致力于提供最便捷和优质的服务体验。
Copyright © 2023 Book学术 All rights reserved.
ghs 京公网安备 11010802042870号 京ICP备2023020795号-1