Pub Date : 2024-02-13DOI: 10.1109/mdat.2024.3365988
Dina A. Moussa, Michael Hefenbrock, Mehdi Tahoori
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Pub Date : 2024-01-17DOI: 10.1109/mdat.2023.3312570
Scott Davidson
I was happy to see the article on estimating memory usage by Yoon et al. in this issue of IEEE Design&Test . I have not seen much work on this subject lately. I have heard those who do software for embedded systems rightly express pride in how efficiently they write code but judging from the memory usage data on programs I run on my laptop, many modern software developers are allergic to the system call that frees up memory. I check this because my somewhat antiquated computer (eight years old) runs slowly. But what should I expect? It has only 6 GB of memory.
{"title":"Losing My Memory","authors":"Scott Davidson","doi":"10.1109/mdat.2023.3312570","DOIUrl":"https://doi.org/10.1109/mdat.2023.3312570","url":null,"abstract":"I was happy to see the article on estimating memory usage by Yoon et al. in this issue of <italic xmlns:mml=\"http://www.w3.org/1998/Math/MathML\" xmlns:xlink=\"http://www.w3.org/1999/xlink\">IEEE Design&Test</i>\u0000. I have not seen much work on this subject lately. I have heard those who do software for embedded systems rightly express pride in how efficiently they write code but judging from the memory usage data on programs I run on my laptop, many modern software developers are allergic to the system call that frees up memory. I check this because my somewhat antiquated computer (eight years old) runs slowly. But what should I expect? It has only 6 GB of memory.","PeriodicalId":48917,"journal":{"name":"IEEE Design & Test","volume":"223 1","pages":""},"PeriodicalIF":2.0,"publicationDate":"2024-01-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"139664323","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2024-01-17DOI: 10.1109/mdat.2023.3340991
Partha Pratim Pande
The articles in this issue are divided into three groups: 1) the first group comprises the Special Issue on Ethics in Computing articles; 2) the second group consists of general interest articles; and 3) additionally, we have a tutorial article in this issue.
{"title":"Ethics in Computing","authors":"Partha Pratim Pande","doi":"10.1109/mdat.2023.3340991","DOIUrl":"https://doi.org/10.1109/mdat.2023.3340991","url":null,"abstract":"<fig orientation=\"portrait\" position=\"float\" xmlns:mml=\"http://www.w3.org/1998/Math/MathML\" xmlns:xlink=\"http://www.w3.org/1999/xlink\"> <graphic orientation=\"portrait\" position=\"float\" xlink:href=\"pande-3340991.tif\"/> </fig> The articles in this issue are divided into three groups: 1) the first group comprises the Special Issue on Ethics in Computing articles; 2) the second group consists of general interest articles; and 3) additionally, we have a tutorial article in this issue.","PeriodicalId":48917,"journal":{"name":"IEEE Design & Test","volume":"297 2 1","pages":""},"PeriodicalIF":2.0,"publicationDate":"2024-01-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"139664331","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2024-01-17DOI: 10.1109/mdat.2023.3331319
Sudeep Pasricha, Marilyn Wolf
Computing systems are tightly integrated today into our professional, social, and private lives. These systems span the gamut of wearables and smart home Internet of Things (IoT) edge devices, to automotive cyber-physical systems (CPS), and massive cloud computing data center facilities. An important consequence of this growing ubiquity of computing is that it can have significant ethical implications, which computing professionals should carefully take into consideration. In most real-world scenarios, it is not immediately obvious how particular technical choices could be viewed from an ethical perspective.
{"title":"Special Issue on Ethics in Computing","authors":"Sudeep Pasricha, Marilyn Wolf","doi":"10.1109/mdat.2023.3331319","DOIUrl":"https://doi.org/10.1109/mdat.2023.3331319","url":null,"abstract":"Computing systems are tightly integrated today into our professional, social, and private lives. These systems span the gamut of wearables and smart home Internet of Things (IoT) edge devices, to automotive cyber-physical systems (CPS), and massive cloud computing data center facilities. An important consequence of this growing ubiquity of computing is that it can have significant ethical implications, which computing professionals should carefully take into consideration. In most real-world scenarios, it is not immediately obvious how particular technical choices could be viewed from an ethical perspective.","PeriodicalId":48917,"journal":{"name":"IEEE Design & Test","volume":"68 1","pages":""},"PeriodicalIF":2.0,"publicationDate":"2024-01-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"139664310","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2024-01-17DOI: 10.1109/mdat.2023.3324518
Axel Jantsch, Swaroop Ghosh, Umit Ogras, Pascal Meinerzhagen
The ISLPED 2023 conference was held as a presence-only event from 6 to 8 August 2023, at the premises of the Technische Universität TU Wien near the center of Vienna, Austria. It was the first presence-only meeting after the disruption due to the COVID-19 pandemic, which was very much enjoyed by all delegates. 35 full papers and 18 posters were presented in two parallel sessions. Also, two keynote presentations, one special session, and one panel were organized. In addition, a design contest with seven participants was conducted. Again, artificial neural network-based machine-learning topics have been prominently represented in both the technical and special sessions.
ISLPED 2023会议于2023年8月6日至8日在奥地利维也纳市中心附近的维也纳科技大学（Technische Universität TU Wien）举行。这是因 COVID-19 大流行而中断后的首次现场会议，所有代表都非常享受这次会议。两场平行会议共发表了 35 篇论文全文和 18 张海报。会议还组织了两次主旨报告、一次特别会议和一次小组讨论。此外，还举办了一次设计竞赛，共有 7 人参加。同样，基于人工神经网络的机器学习主题在技术会议和特别会议上都有突出表现。
{"title":"ISLPED 2023: International Symposium on Low-Power Electronics and Design","authors":"Axel Jantsch, Swaroop Ghosh, Umit Ogras, Pascal Meinerzhagen","doi":"10.1109/mdat.2023.3324518","DOIUrl":"https://doi.org/10.1109/mdat.2023.3324518","url":null,"abstract":"The ISLPED 2023 conference was held as a presence-only event from 6 to 8 August 2023, at the premises of the Technische Universität TU Wien near the center of Vienna, Austria. It was the first presence-only meeting after the disruption due to the COVID-19 pandemic, which was very much enjoyed by all delegates. 35 full papers and 18 posters were presented in two parallel sessions. Also, two keynote presentations, one special session, and one panel were organized. In addition, a design contest with seven participants was conducted. Again, artificial neural network-based machine-learning topics have been prominently represented in both the technical and special sessions.","PeriodicalId":48917,"journal":{"name":"IEEE Design & Test","volume":"296 2 1","pages":""},"PeriodicalIF":2.0,"publicationDate":"2024-01-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"139664312","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2024-01-17DOI: 10.1109/mdat.2023.3292800
Naghmeh Karimi
The 28th IEEE European Test Symposium (ETS) was held in Venice, Italy, 22–26 May 2023, in a hybrid format. This was the second hybrid venue for ETS since the COVID-19 pandemic. ETS is Europe’s premier forum in the area of electronic-based circuits and system testing, reliability, security, and validation. ETS’23 was arranged in five days and the program consisted of keynotes, scientific paper presentations, panels, workshops, highlights/demos from the industry, a PhD forum, and a McCluskey contest. It also included the Test Spring School (TSS). A total of 238 attendees (including both in-person and virtual) registered for the conference from 36 countries among which 102 were from industry and 135 were affiliated with academia (including 53 students).
{"title":"The 28th IEEE European Test Symposium","authors":"Naghmeh Karimi","doi":"10.1109/mdat.2023.3292800","DOIUrl":"https://doi.org/10.1109/mdat.2023.3292800","url":null,"abstract":"The 28th IEEE European Test Symposium (ETS) was held in Venice, Italy, 22–26 May 2023, in a hybrid format. This was the second hybrid venue for ETS since the COVID-19 pandemic. ETS is Europe’s premier forum in the area of electronic-based circuits and system testing, reliability, security, and validation. ETS’23 was arranged in five days and the program consisted of keynotes, scientific paper presentations, panels, workshops, highlights/demos from the industry, a PhD forum, and a McCluskey contest. It also included the Test Spring School (TSS). A total of 238 attendees (including both in-person and virtual) registered for the conference from 36 countries among which 102 were from industry and 135 were affiliated with academia (including 53 students).","PeriodicalId":48917,"journal":{"name":"IEEE Design & Test","volume":"5 1","pages":""},"PeriodicalIF":2.0,"publicationDate":"2024-01-17","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"139664317","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2024-01-15DOI: 10.1109/mdat.2024.3354569
Prabuddha Chakraborty, Jonathan Cruz, Rasheed Almawzan, Tanzim Mahfuz, Swarup Bhunia
This article argues the need for structural security in securing logic locking against learning-based attacks.
本文论证了在确保逻辑锁定免受基于学习的攻击时结构安全的必要性。
{"title":"Learning Your Lock: Exploiting Structural Vulnerabilities in Logic Locking","authors":"Prabuddha Chakraborty, Jonathan Cruz, Rasheed Almawzan, Tanzim Mahfuz, Swarup Bhunia","doi":"10.1109/mdat.2024.3354569","DOIUrl":"https://doi.org/10.1109/mdat.2024.3354569","url":null,"abstract":"This article argues the need for structural security in securing logic locking against learning-based attacks.","PeriodicalId":48917,"journal":{"name":"IEEE Design & Test","volume":"15 1","pages":""},"PeriodicalIF":2.0,"publicationDate":"2024-01-15","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"139951021","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":4,"RegionCategory":"工程技术","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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