Pub Date : 2023-12-01DOI: 10.1007/s10836-023-06091-6
Gayathri Lakshmi, V. Udaya Sankar, Y. Siva Sankar
Printed circuit boards (PCBs) are the first stage in manufacturing any electronic product. The reliability of the electronic product depends on the PCB. The presence of manufacturing defects in PCBs might affect the performance of the PCB and thereby the reliability of the electronic products. In this paper, the various challenges faced in identifying manufacturing defects along with a review of various learning methods employed for defect detection are presented. We compare the various techniques available in the literature for further understanding of the accuracy of these techniques in defect detection.
{"title":"A Survey of PCB Defect Detection Algorithms","authors":"Gayathri Lakshmi, V. Udaya Sankar, Y. Siva Sankar","doi":"10.1007/s10836-023-06091-6","DOIUrl":"https://doi.org/10.1007/s10836-023-06091-6","url":null,"abstract":"<p>Printed circuit boards (PCBs) are the first stage in manufacturing any electronic product. The reliability of the electronic product depends on the PCB. The presence of manufacturing defects in PCBs might affect the performance of the PCB and thereby the reliability of the electronic products. In this paper, the various challenges faced in identifying manufacturing defects along with a review of various learning methods employed for defect detection are presented. We compare the various techniques available in the literature for further understanding of the accuracy of these techniques in defect detection.</p>","PeriodicalId":501485,"journal":{"name":"Journal of Electronic Testing","volume":"1 1","pages":""},"PeriodicalIF":0.0,"publicationDate":"2023-12-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"138535535","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2023-11-22DOI: 10.1007/s10836-023-06086-3
J. Paul Rajasingh, P. Senthil Kumar, S. Srinivasan
One of the significant features of software quality is software reliability. In the testing phase, faults are identified and corrected by integrating them into software development, thus obtaining better reliability. Here, by utilizing the Elliptical Distributions-centric Emperor Penguins Colony Algorithm (ED-EPCA)-based Test Case Prioritization (TCP), an effectual Fault Detection (FD) technique is proposed using Fishers Yates Shuffled Shepherd Optimization Algorithm (FY-SSOA)-based Test Case Selection (TCS). Initially, for the incoming source code, the Test Case (TC) is created. Then, the significant factors needed for TCS and prioritization are identified. Next, by utilizing the Log Scaling-centered Generalized Discriminant Analysis (LS-GDA) model, the estimated factors are abated further to enhance the TCS along with prioritization for the Fault Detection Process (FDP). Then, using the FY-SSOA, the optimized TCs are selected. Subsequently, with the help of ED-EPCA, the TCs being selected are ranked as well as prioritized. Finally, to validate the proposed system’s effectiveness, the model’s performance is evaluated in the working platform of Java and analogized with the traditional methodologies. The results indicate that the test case prioritization-based fault detection method is robust with a 99.23% fault detection rate and a small amount of memory usage, which is only 8245475 kb by generating a large number of test cases.
{"title":"Efficient Fault Detection by Test Case Prioritization via Test Case Selection","authors":"J. Paul Rajasingh, P. Senthil Kumar, S. Srinivasan","doi":"10.1007/s10836-023-06086-3","DOIUrl":"https://doi.org/10.1007/s10836-023-06086-3","url":null,"abstract":"<p>One of the significant features of software quality is software reliability. In the testing phase, faults are identified and corrected by integrating them into software development, thus obtaining better reliability. Here, by utilizing the Elliptical Distributions-centric Emperor Penguins Colony Algorithm (ED-EPCA)-based Test Case Prioritization (TCP), an effectual Fault Detection (FD) technique is proposed using Fishers Yates Shuffled Shepherd Optimization Algorithm (FY-SSOA)-based Test Case Selection (TCS). Initially, for the incoming source code, the Test Case (TC) is created. Then, the significant factors needed for TCS and prioritization are identified. Next, by utilizing the Log Scaling-centered Generalized Discriminant Analysis (LS-GDA) model, the estimated factors are abated further to enhance the TCS along with prioritization for the Fault Detection Process (FDP). Then, using the FY-SSOA, the optimized TCs are selected. Subsequently, with the help of ED-EPCA, the TCs being selected are ranked as well as prioritized. Finally, to validate the proposed system’s effectiveness, the model’s performance is evaluated in the working platform of Java and analogized with the traditional methodologies. The results indicate that the test case prioritization-based fault detection method is robust with a 99.23% fault detection rate and a small amount of memory usage, which is only 8245475 kb by generating a large number of test cases.</p>","PeriodicalId":501485,"journal":{"name":"Journal of Electronic Testing","volume":"28 1","pages":""},"PeriodicalIF":0.0,"publicationDate":"2023-11-22","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"138535536","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2020-05-31DOI: 10.1007/s10836-020-05881-6
Wendong Wang, Ujjwal Guin, A. Singh
{"title":"Aging-Resilient SRAM-based True Random Number Generator for Lightweight Devices","authors":"Wendong Wang, Ujjwal Guin, A. Singh","doi":"10.1007/s10836-020-05881-6","DOIUrl":"https://doi.org/10.1007/s10836-020-05881-6","url":null,"abstract":"","PeriodicalId":501485,"journal":{"name":"Journal of Electronic Testing","volume":"27 3","pages":"301 - 311"},"PeriodicalIF":0.0,"publicationDate":"2020-05-31","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"141201947","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2020-05-24DOI: 10.1007/s10836-020-05877-2
Min Ma, Jing Huang, Xiaolei Yang, Lingfan Tang
{"title":"A probability density estimation algorithm on multiwavelet for the high-resolution ADC","authors":"Min Ma, Jing Huang, Xiaolei Yang, Lingfan Tang","doi":"10.1007/s10836-020-05877-2","DOIUrl":"https://doi.org/10.1007/s10836-020-05877-2","url":null,"abstract":"","PeriodicalId":501485,"journal":{"name":"Journal of Electronic Testing","volume":"5 1","pages":"375 - 383"},"PeriodicalIF":0.0,"publicationDate":"2020-05-24","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"141203365","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2020-05-21DOI: 10.1007/s10836-020-05879-0
R. Jothin, M. P. Mohamed
{"title":"High Performance Approximate Memories for Image Processing Applications","authors":"R. Jothin, M. P. Mohamed","doi":"10.1007/s10836-020-05879-0","DOIUrl":"https://doi.org/10.1007/s10836-020-05879-0","url":null,"abstract":"","PeriodicalId":501485,"journal":{"name":"Journal of Electronic Testing","volume":"56 4","pages":"419 - 428"},"PeriodicalIF":0.0,"publicationDate":"2020-05-21","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"141203819","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2020-05-18DOI: 10.1007/s10836-020-05883-4
Bharat Garg, S. Patel, Sunil Dutt
{"title":"LoBA: A Leading One Bit Based Imprecise Multiplier for Efficient Image Processing","authors":"Bharat Garg, S. Patel, Sunil Dutt","doi":"10.1007/s10836-020-05883-4","DOIUrl":"https://doi.org/10.1007/s10836-020-05883-4","url":null,"abstract":"","PeriodicalId":501485,"journal":{"name":"Journal of Electronic Testing","volume":"45 25","pages":"429 - 437"},"PeriodicalIF":0.0,"publicationDate":"2020-05-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"141204211","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2020-04-27DOI: 10.1007/s10836-020-05878-1
Biswajit Bhowmik
{"title":"Maximal Connectivity Test with Channel-Open Faults in On-Chip Communication Networks","authors":"Biswajit Bhowmik","doi":"10.1007/s10836-020-05878-1","DOIUrl":"https://doi.org/10.1007/s10836-020-05878-1","url":null,"abstract":"","PeriodicalId":501485,"journal":{"name":"Journal of Electronic Testing","volume":"15 1","pages":"385 - 408"},"PeriodicalIF":0.0,"publicationDate":"2020-04-27","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"141209874","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2020-04-01DOI: 10.1007/s10836-020-05867-4
Ankush Srivastava, P. Ghosh
{"title":"A Novel Approach of Data Content Zeroization Under Memory Attacks","authors":"Ankush Srivastava, P. Ghosh","doi":"10.1007/s10836-020-05867-4","DOIUrl":"https://doi.org/10.1007/s10836-020-05867-4","url":null,"abstract":"","PeriodicalId":501485,"journal":{"name":"Journal of Electronic Testing","volume":"116 7","pages":"147 - 167"},"PeriodicalIF":0.0,"publicationDate":"2020-04-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"141217687","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2020-04-01DOI: 10.1007/s10836-020-05871-8
M. Fooladi, Arezoo Kamran
{"title":"Speed-Up in Test Methods Using Probabilistic Merit Indicators","authors":"M. Fooladi, Arezoo Kamran","doi":"10.1007/s10836-020-05871-8","DOIUrl":"https://doi.org/10.1007/s10836-020-05871-8","url":null,"abstract":"","PeriodicalId":501485,"journal":{"name":"Journal of Electronic Testing","volume":" 3","pages":"285 - 296"},"PeriodicalIF":0.0,"publicationDate":"2020-04-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"141218088","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2020-04-01DOI: 10.1007/s10836-020-05870-9
S. Rathnapriya, V. Manikandan
{"title":"Remaining Useful Life Prediction of Analog Circuit Using Improved Unscented Particle Filter","authors":"S. Rathnapriya, V. Manikandan","doi":"10.1007/s10836-020-05870-9","DOIUrl":"https://doi.org/10.1007/s10836-020-05870-9","url":null,"abstract":"","PeriodicalId":501485,"journal":{"name":"Journal of Electronic Testing","volume":" January","pages":"169 - 181"},"PeriodicalIF":0.0,"publicationDate":"2020-04-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"141218743","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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