Pub Date : 2020-04-01DOI: 10.1007/s10836-020-05868-3
H. E. Badawi, F. Azaïs, S. Bernard, M. Comte, V. Kerzérho, F. Lefèvre
{"title":"Investigations on the Use of Ensemble Methods for Specification-Oriented Indirect Test of RF Circuits","authors":"H. E. Badawi, F. Azaïs, S. Bernard, M. Comte, V. Kerzérho, F. Lefèvre","doi":"10.1007/s10836-020-05868-3","DOIUrl":"https://doi.org/10.1007/s10836-020-05868-3","url":null,"abstract":"","PeriodicalId":501485,"journal":{"name":"Journal of Electronic Testing","volume":" 1120","pages":"189 - 203"},"PeriodicalIF":0.0,"publicationDate":"2020-04-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"141218403","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2020-04-01DOI: 10.1007/s10836-020-05870-9
S. Rathnapriya, V. Manikandan
{"title":"Remaining Useful Life Prediction of Analog Circuit Using Improved Unscented Particle Filter","authors":"S. Rathnapriya, V. Manikandan","doi":"10.1007/s10836-020-05870-9","DOIUrl":"https://doi.org/10.1007/s10836-020-05870-9","url":null,"abstract":"","PeriodicalId":501485,"journal":{"name":"Journal of Electronic Testing","volume":"2 ","pages":"169 - 181"},"PeriodicalIF":0.0,"publicationDate":"2020-04-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"141218988","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2020-04-01DOI: 10.1007/s10836-020-05872-7
Tanusree Kaibartta, G. P. Biswas, D. K. Das
{"title":"Co-Optimization of Test Wrapper Length and TSV for TSV Based 3D SOCs","authors":"Tanusree Kaibartta, G. P. Biswas, D. K. Das","doi":"10.1007/s10836-020-05872-7","DOIUrl":"https://doi.org/10.1007/s10836-020-05872-7","url":null,"abstract":"","PeriodicalId":501485,"journal":{"name":"Journal of Electronic Testing","volume":" 970","pages":"239 - 253"},"PeriodicalIF":0.0,"publicationDate":"2020-04-01","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"141218163","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2020-03-30DOI: 10.1007/s10836-020-05873-6
Jinqun Ge, T. Xia, Guoan Wang
{"title":"Design and Optimization Methodology of Coplanar Waveguide Test Structures for Dielectric Characterization of Thin Films","authors":"Jinqun Ge, T. Xia, Guoan Wang","doi":"10.1007/s10836-020-05873-6","DOIUrl":"https://doi.org/10.1007/s10836-020-05873-6","url":null,"abstract":"","PeriodicalId":501485,"journal":{"name":"Journal of Electronic Testing","volume":" 21","pages":"183 - 188"},"PeriodicalIF":0.0,"publicationDate":"2020-03-30","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"141217741","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2020-03-30DOI: 10.1007/s10836-020-05873-6
Jinqun Ge, T. Xia, Guoan Wang
{"title":"Design and Optimization Methodology of Coplanar Waveguide Test Structures for Dielectric Characterization of Thin Films","authors":"Jinqun Ge, T. Xia, Guoan Wang","doi":"10.1007/s10836-020-05873-6","DOIUrl":"https://doi.org/10.1007/s10836-020-05873-6","url":null,"abstract":"","PeriodicalId":501485,"journal":{"name":"Journal of Electronic Testing","volume":" 14","pages":"183 - 188"},"PeriodicalIF":0.0,"publicationDate":"2020-03-30","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"141220141","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
Pub Date : 2020-03-18DOI: 10.1007/s10836-020-05865-6
Xijun Huang, Chuan-pei Xu, Long Zhang
{"title":"An Efficient Algorithm for Optimizing the Test Path of Digital Microfluidic Biochips","authors":"Xijun Huang, Chuan-pei Xu, Long Zhang","doi":"10.1007/s10836-020-05865-6","DOIUrl":"https://doi.org/10.1007/s10836-020-05865-6","url":null,"abstract":"","PeriodicalId":501485,"journal":{"name":"Journal of Electronic Testing","volume":" 32","pages":"205 - 218"},"PeriodicalIF":0.0,"publicationDate":"2020-03-18","publicationTypes":"Journal Article","fieldsOfStudy":null,"isOpenAccess":false,"openAccessPdf":"","citationCount":null,"resultStr":null,"platform":"Semanticscholar","paperid":"141222170","PeriodicalName":null,"FirstCategoryId":null,"ListUrlMain":null,"RegionNum":0,"RegionCategory":"","ArticlePicture":[],"TitleCN":null,"AbstractTextCN":null,"PMCID":"","EPubDate":null,"PubModel":null,"JCR":null,"JCRName":null,"Score":null,"Total":0}
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